FN ISI Export Format VR 1.0 PT J AU Wilkinson, KM Lei, QF Bain, CD TI Freezing transitions in mixed surfactant/alkane monolayers at the air-solution interface SO SOFT MATTER LA English DT Article ID FREQUENCY VIBRATIONAL SPECTROSCOPY; DODECANE LAYERS SPREAD; X-RAY REFLECTIVITY; WATER-INTERFACE; NEUTRON REFLECTION; PHASE-TRANSITION; HEXADECYLTRIMETHYLAMMONIUM BROMIDE; AQUEOUS-SOLUTIONS; NORMAL-ALKANES; DODECYLTRIMETHYLAMMONIUM BROMIDE AB Mixed monolayers at the air-water interface of the cationic surfactant, hexadecyltrimethylammonium bromide (CTAB), with alkanes show a first-order freezing transition as a function of temperature. Sum-frequency spectra and ellipsometric measurements are consistent with a structure in which the high-temperature phase is liquid-like and the low-temperature phase has all-trans, upright chains. There are strong structural similarities between the low-temperature phase in the mixed monolayers and frozen monolayers at the alkane-air and alkane-CTAB solution interfaces. The difference between the surface freezing point T, and the freezing point of the bulk alkane T-b ranges from 1 degrees C for alkane chain length m = 17, to 28 degrees C for m = 11. Surface freezing is more favourable in mixed monolayers at the air-water interface than at the bulk alkane-water interface for the same surfactant concentration. Long-chain alkanes do not wet water, but it is postulated that if they did, they would also show surface freezing analogously to alkanes on silica. The surfactant plays the dual role of enhancing wetting and surface freezing of the alkane on water. C1 Univ Oxford, Dept Chem, Chem Res Lab, Oxford OX1 3TA, England. RP Bain, CD, Univ Oxford, Dept Chem, Chem Res Lab, Mansfield Rd, Oxford OX1 3TA, England. EM c.d.bain@durham.ac.uk CR ARATONO M, 2001, LANGMUIR, V17, P7344 ATKINS PW, 1986, PHYS CHEM ATKINS PW, 1994, PHYS CHEM AVEYARD R, 1990, ADV COLLOID INTERFAC, V33, P59 AVEYARD R, 1990, J CHEM SOC FARADAY T, V86, P3623 AVEYARD R, 1990, PROG COLLOID POLYM S, V81, P36 BAIN CD, 1991, LANGMUIR, V7, P1563 BAIN CD, 1995, J CHEM SOC FARADAY T, V91, P1281 BAIN CD, 1999, MODERN CHARACTERIZAT, P335 BEAGLEHOLE D, 1983, J PHYS-PARIS, V44, P147 BEATTIE DA, 2002, HDB VIBRATIONAL SPEC, V1, P801 BELL GR, 1996, J CHEM SOC FARADAY T, V92, P515 BELL GR, 1998, J PHYS CHEM B, V102, P218 BERCEGOL H, 1989, J PHYS, V50, P2227 BONN D, 2001, REP PROG PHYS, V64, P1085 BORN M, 1980, PRINCIPLES OPTICS BROCHARDWYART F, 1991, LANGMUIR, V7, P335 CASSON BD, 1996, FARADAY DISCUSS, V104, P209 CASSON BD, 1997, LANGMUIR, V13, P5465 CASSON BD, 1998, J PHYS CHEM B, V102, P7434 CASSON BD, 1999, J PHYS CHEM B, V103, P4678 COLUSSI AJ, 2000, LANGMUIR, V16, P5213 DORSET DL, 1991, J PHYS CHEM-US, V95, P938 DRUDE P, 1891, ANN PHYS, V43, P126 EARNSHAW JC, 1992, PHYS REV A, V46, R4494 GAINES GLJ, 1966, INSOLUBLE MONOLAYERS GILANYI T, 2000, LANGMUIR, V16, P3200 GOATES SR, 1999, LANGMUIR, V15, P1400 HOSSAIN MM, 1998, COLLOID SURF A, V198, P53 HOSSAIN MM, 2000, COLLOID SURFACE A, V171, P105 HOSSAIN MM, 2000, LANGMUIR, V16, P10175 HOSSAIN MM, 2000, LANGMUIR, V16, P9109 ISLAM MN, 2003, J PHYS CHEM B, V107, P965 LEI Q, 2004, PHYS REV LETT, V92 LIDE DR, 1993, CRC HDB CHEM PHYS LU JR, 1992, J PHYS CHEM-US, V96, P10971 LU JR, 1994, J PHYS CHEM-US, V98, P11519 LU JR, 1994, PHYSICA B, V198, P120 LU JR, 1995, J PHYS CHEM-US, V99, P4113 LU JR, 1995, J PHYS CHEM-US, V99, P8233 LYTTLE DJ, 1995, LANGMUIR, V11, P1001 MACPHAIL RA, 1984, J PHYS CHEM-US, V88, P334 MANNINGBENSON S, 1998, LANGMUIR, V14, P990 MATSUBARA H, 2003, LANGMUIR, V19, P2249 MCKENNA CE, 2000, LANGMUIR, V16, P5853 MELZER V, 1996, PHYS REV LETT, V76, P3770 MERKL C, 1997, PHYS REV LETT, V79, P4625 MEUNIER J, 1987, J PHYS-PARIS, V48, P1819 MIRANDA PB, 1999, J PHYS CHEM B, V103, P3292 MO H, 2003, CHEM PHYS LETT, V377, P99 OCKO BM, 1997, PHYS REV E B, V55, P3164 PETERSON IR, 1994, LANGMUIR, V10, P4645 POLLARD ML, 1998, LANGMUIR, V14, P7222 RENAULT A, 1993, J PHYS II, V3, P761 RICHMOND GL, 2002, CHEM REV, V102, P2693 RIEU JP, 1995, J PHYS II, V5, P607 SEFLER GA, 1995, CHEM PHYS LETT, V235, P347 SHEN YR, 1989, NATURE, V337, P519 SMALL DM, 1986, PHYS CHEM LIPIDS ALK TIKHONOV AM, 2000, J PHYS CHEM B, V104, P6336 TKACHENKO A, 1997, PHYS REV LETT, V79, P532 TKACHENKO AV, 1996, PHYS REV LETT, V76, P2527 VIDAL F, 2005, REP PROG PHYS, V68, P1095 VOLKMANN UG, 2002, J CHEM PHYS, V116, P2107 VOLLHARDT D, 1999, ADV COLLOID INTERFAC, V79, P19 WARD RN, 1993, THESIS CAMBRIDGE U WARD RN, 1994, J PHYS CHEM-US, V98, P8536 WU XZ, 1993, PHYS REV LETT, V70, P958 NR 68 TC 0 PU ROYAL SOC CHEMISTRY PI CAMBRIDGE PA THOMAS GRAHAM HOUSE, SCIENCE PARK, MILTON RD, CAMBRIDGE CB4 0WF, CAMBS, ENGLAND SN 1744-683X J9 SOFT MATTER JI Soft Matter PD JAN 7 PY 2006 VL 2 IS 1 BP 66 EP 76 PG 11 GA 002BM UT ISI:000234586400011 ER PT J AU Scheffler, M Dressel, M Jourdan, M Adrian, H TI Extremely slow Drude relaxation of correlated electrons SO NATURE LA English DT Article ID ELECTRODYNAMIC RESPONSE; UPD2AL3; SUPERCONDUCTIVITY; CEPD3 AB The electrical conduction of metals is governed by how freely mobile electrons can move throughout the material. This movement is hampered by scattering with other electrons, as well as with impurities or thermal excitations (phonons). Experimentally, the scattering processes of single electrons are not observed, but rather the overall response of all mobile charge carriers within a sample. The ensemble dynamics can be described by the relaxation rates, which express how fast the system approaches equilibrium after an external perturbation(1-3). Here we measure the frequency-dependent microwave conductivity of the heavy-fermion metal UPd2Al3 ( ref. 4), finding that it is accurately described by the prediction for a single relaxation rate ( the so-called Drude response(5)). This is notable, as UPd2Al3 has strong interactions among the electrons(4) that might be expected to lead to more complex behaviour. Furthermore, the relaxation rate of just a few gigahertz is extremely low - this is several orders of magnitude below those of conventional metals ( which are typically around 10 THz), and at least one order of magnitude lower than previous estimates for comparable metals. These observations are directly related to the high effective mass of the charge carriers in this material and reveal the dynamics of interacting electrons. C1 Univ Mainz, Inst Phys, D-55099 Mainz, Germany. Univ Stuttgart, Inst Phys, D-70550 Stuttgart, Germany. RP Scheffler, M, Univ Stuttgart, Inst Phys, D-70550 Stuttgart, Germany. EM scheffl@pi1.physik.uni-stuttgart.de CR ASHCORFT NW, 1976, SOLID STATE PHYS AWASTHI AM, 1993, PHYS REV B, V48, P10692 BEYERMANN WP, 1988, PHYS REV LETT, V60, P216 BONN DA, 1988, PHYS REV LETT, V61, P1305 BURKE PJ, 2000, APPL PHYS LETT, V76, P745 DEGIORGI L, 1997, Z PHYS B CON MAT, V102, P367 DEGIORGI L, 1999, REV MOD PHYS, V71, P687 DONOVAN S, 1997, PHYS REV LETT, V79, P1401 DORDEVIC SV, 2001, PHYS REV LETT, V86, P684 DRESSEL M, 2002, ELECTRODYNAMICS SOLI DRESSEL M, 2002, PHYS REV LETT, V88 DRUDE P, 1900, PHYS Z, V1, P161 GEIBEL C, 1991, Z PHYS B CON MAT, V84, P1 GREWE N, 1991, HDB PHYSICS CHEM RAR, V14, P343 HOLDEN AAB, 2003, PHYS REV LETT, V91 HUTH M, 1993, SOLID STATE COMMUN, V87, P1133 JOURDAN M, 1999, NATURE, V398, P47 MILLIS AJ, 1987, PHYS REV B, V35, P3394 PINES D, 1966, THEORY QUANTUM LIQUI, V1 SCHEFFLER M, 2005, REV SCI INSTRUM, V76 SINGLEY EJ, 2002, PHYS REV B, V65 TRAN P, 2002, PHYS REV B, V65 VARMA CM, 1985, PHYS REV LETT, V55, P2723 WEBB BC, 1986, PHYS REV LETT, V57, P1951 ZIMAN JM, 1972, PRINCIPLES THEORY SO NR 25 TC 0 PU NATURE PUBLISHING GROUP PI LONDON PA MACMILLAN BUILDING, 4 CRINAN ST, LONDON N1 9XW, ENGLAND SN 0028-0836 J9 NATURE JI Nature PD DEC 22 PY 2005 VL 438 IS 7071 BP 1135 EP 1137 PG 3 SC Multidisciplinary Sciences GA 995OF UT ISI:000234111500045 ER PT J AU Piacente, G Peeters, FM TI Pinning and depinning of a classic quasi-one-dimensional Wigner crystal in the presence of a constriction SO PHYSICAL REVIEW B LA English DT Article ID CHARGE-DENSITY WAVES; DISORDERED VORTEX LATTICE; FLUX-LINE-LATTICE; 4-EPSILON DIMENSIONS; II SUPERCONDUCTORS; CRITICAL-BEHAVIOR; RANDOM-MEDIA; DYNAMICS; FLOW; TRANSITION AB We studied the dynamics of a quasi-one-dimensional chain-like system of charged particles at low temperature, interacting through a screened Coulomb potential in the presence of a local constriction. The response of the system when an external electric field is applied was investigated. We performed Langevin molecular dynamics simulations for different values of the driving force and for different temperatures. We found that the friction together with the constriction pins the particles up to a critical value of the driving force. The system can depin elastically or quasielastically depending on the strength of the constriction. The elastic (quasielastic) depinning is characterized by a critical exponent beta similar to 0.66 (beta similar to 0.95). The dc conductivity is zero in the pinned regime, it has non-Ohmic characteristics after the activation of the motion and then it is constant. Furthermore, the dependence of the conductivity with temperature and strength of the constriction was investigated in detail. We found interesting differences between the single-chain and the multichain regimes as the temperature is increased. C1 Univ Antwerp, Dept Phys, B-2020 Antwerp, Belgium. RP Piacente, G, Univ Antwerp, Dept Phys, Campus Middleheim,Groenenborgerlaan 171, B-2020 Antwerp, Belgium. EM piacente@ua.ac.be francois.peeters@ua.ac.be CR ANDREI EY, 1988, PHYS REV LETT, V60, P2765 BESSELING R, 2003, PHYS REV LETT, V91 BHATTACHARYA S, 1993, PHYS REV LETT, V70, P2617 BHATTACHARYA S, 1994, PHYS REV B, V49, P10005 BRANDT EH, 1983, PHYS REV LETT, V50, P1599 BROWN ID, 1974, CAN J CHEM, V52, P791 CANDIDO L, 1998, J PHYS-CONDENS MAT, V10, P11627 CAO YG, 1999, PHYSICA C, V321, P177 CAO YG, 2000, PHYS REV B, V62, P4163 CARPENTIER D, 1998, PHYS REV LETT, V81, P1881 CHARALAMBOUS M, 1992, PHYS REV B, V45, P5091 CHEN JX, 2004, PHYS REV E 1, V69 CHU JH, 1994, PHYS REV LETT, V72, P4009 DAGOTTO E, 2001, PHYS REP, V344, P1 DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 FALESKI MC, 1996, PHYS REV B, V54, P12427 FISHER DS, 1985, PHYS REV B, V31, P1396 FISHER DS, 1985, PHYS REV B, V31, P1396 FOGLE W, 1972, PHYS REV B, V6, P1402 GLASSON P, 2001, PHYS REV LETT, V87 HELLERQVIST MC, 1996, PHYS REV LETT, V76, P4022 HOOVER WG, 1985, PHYS REV A, V31, P1695 JENSEN HJ, 1988, PHYS REV LETT, V60, P1676 KOSHELEV AE, 1994, PHYS REV LETT, V73, P3580 KOVDRYA YZ, 2003, LOW TEMP PHYS, V29, P77 KUBO R, 1992, NONEQUILIBRIUM STAT LARKIN AI, 1974, SOV PHYS JETP, V38, P854 LEDOUSSAL P, 1998, PHYS REV B, V57, P11356 LILLY MP, 1999, PHYS REV LETT, V82, P394 LITTLEWOOD PB, 1985, CHARG DENS WAV SOL P LIU B, 2003, PHYS REV LETT, V91 MANNELLA R, 2002, INT J MOD PHYS C, V13, P1177 MANNELLA R, 2004, PHYS REV E 1, V69 MIDDLETON AA, 1993, PHYS REV LETT, V71, P3198 MYERS CR, 1993, PHYS REV B, V47, P11171 NARAYAN O, 1992, PHYS REV B, V46, P11520 NARAYAN O, 1992, PHYS REV LETT, V68, P3615 NARAYAN O, 1993, PHYS REV B, V48, P7030 NATTERMANN T, 1992, J PHYS II, V2, P1483 NOSE S, 1991, PROG THEORY PHYS SUP, P1 OLSON CJ, 1998, PHYS REV LETT, V81, P3757 PERTSINIDIS A, 2001, B AM PHYS SOC, V46, P181 PIACENTE G, 2003, SOLID STATE COMMUN, V128, P57 PIACENTE G, 2004, PHYS REV B, V69 PRUYMBOOM A, 1988, PHYS REV LETT, V60, P1430 REICHHARDT C, 2002, PHYS REV LETT, V89 RYU S, 1996, PHYS REV LETT, V77, P5114 SCHMID A, 1973, J LOW TEMP PHYS, V11, P667 SEGOVIA P, 1999, NATURE, V402, P504 SNEDDON L, 1982, PHYS REV LETT, V49, P292 TONOMURA A, 1999, NATURE, V397, P308 WATSON J, 1997, PHYS REV B, V55, P14909 WHITESIDES GM, 2001, PHYS TODAY, V54, P42 WIGNER E, 1934, PHYS REV, V46, P1002 YARON U, 1994, PHYS REV LETT, V73, P2748 ZAHN K, 1999, PHYS REV LETT, V82, P2721 NR 56 TC 0 PU AMERICAN PHYSICAL SOC PI COLLEGE PK PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA SN 1098-0121 J9 PHYS REV B JI Phys. Rev. B PD NOV PY 2005 VL 72 IS 20 AR 205208 DI ARTN 205208 PG 17 SC Physics, Condensed Matter GA 988LY UT ISI:000233603900053 ER PT J AU Oates, TWH Mucklich, A TI Evolution of plasmon resonances during plasma deposition of silver nanoparticles SO NANOTECHNOLOGY LA English DT Article ID SPECTROSCOPIC ELLIPSOMETRY; OPTICAL-PROPERTIES; NOBLE-METALS; THIN-FILMS; ABSORPTION AB In situ real-time spectroscopic ellipsometry is used to monitor the growth of magnetron sputtered silver nanoparticles on SiO2 substrates, through the percolation threshold and into the bulk film regime. The plasmon polariton resonances in the natioparticulate regime are effectively modelled by a Lorentz oscillator. The resonance energy of the oscillator is observed to reduce to zero shortly after the percolation threshold, whereby the oscillation is described by Drude free electron theory. From the Drude theory, the electronic mean free path is observed to increase dramatically at the percolation threshold, to a value of 16 nm in the bulk regime, in good agreement with x-ray diffraction and transmission electron microscope measurements of the crystallite size in the films. Shortly before the percolation threshold the data is better modelled by two Lorentz oscillators, attributed to coupling between the plasmon polaritons. The onset of the coupling is determined to occur at a surface area coverage of 52%. C1 Forschungszentrum Rossendorf EV, Inst Ion Beam Phys & Mat Res, D-01314 Dresden, Germany. RP Oates, TWH, Forschungszentrum Rossendorf EV, Inst Ion Beam Phys & Mat Res, POB 510119, D-01314 Dresden, Germany. EM t.oates@fz-rossendorf.de CR AN IS, 1996, J KOREAN PHYS SOC, V29, P370 ARWIN H, 1984, THIN SOLID FILMS, V113, P101 BARNES WL, 2003, NATURE, V424, P824 DOREMUS R, 1998, THIN SOLID FILMS, V326, P205 DOREMUS RH, 1966, J APPL PHYS, V37, P2775 DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 HILGER A, 2001, APPL PHYS B-LASERS O, V73, P361 HOLLSTEIN T, 1977, PHYS STATUS SOLIDI B, V82, P545 HUTTER E, 2004, ADV MATER, V16, P1685 JOHNSON PB, 1972, PHYS REV B, V6, P4370 KITTEL C, 1996, INTRO SOLID STATE PH KREIBIG U, 1995, OPTICAL PROPERTIES M MARTINPALMA RJ, 2004, J PHYS D APPL PHYS, V37, P1554 MATHEWSON AG, 1972, J PHYS F MET PHYS, V2, L39 NGUYEN HV, 1993, PHYS REV B, V47, P3947 NONAKA S, 2002, JPN J APPL PHYS 1, V41, P4538 OATES TWH, 2004, PHYS REV B, V70 OATES TWH, 2005, SENSOR ACTUAT B-CHEM, V109, P146 PALIK ED, 1985, HDB OPTICAL CONSTANT PATSALAS P, 2003, J APPL PHYS, V93, P989 RYVES L, 2005, THIN SOLID FILMS, V482, P133 VODINH T, 1999, J RAMAN SPECTROSC, V30, P785 NR 22 TC 0 PU IOP PUBLISHING LTD PI BRISTOL PA DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND SN 0957-4484 J9 NANOTECHNOL JI Nanotechnology PD NOV PY 2005 VL 16 IS 11 BP 2606 EP 2611 PG 6 SC Engineering, Multidisciplinary; Materials Science, Multidisciplinary; Physics, Applied GA 987BX UT ISI:000233494500023 ER PT J AU Rossow, U Goldhahn, R Fuhrmann, A Hangleiter, A TI Reflectance difference spectroscopy RDS/RAS combined with spectroscopic ellipsometry for a quantitative analysis of optically anisotropic materials SO PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS LA English DT Article ID ROTATING-COMPENSATOR-ELLIPSOMETERS; MUELLER MATRIX ELLIPSOMETRY; ERROR ANALYSIS; ALXGA1-XN-COMPOUND LAYERS; OPTIMIZING PRECISION; DIELECTRIC RESPONSE; POLARIZATION; POLARIMETER; CRYSTALS; SURFACES AB We discuss various aspects of the characterization of optically anisotropic materials by spectroscopic ellipsometry (SE) and reflectance-difference/anisotropy-spectroscopy (RDS/RAS). The main focus is on the limitation of quantitative analysis, and will be discussed in detail for two different examples: group-III-nitride layers and ZnO. We suggest that a combination of SE and RDS is a good choice to determine the 14 components of the dielectric tensor (here epsilon(vertical bar vertical bar),epsilon(perpendicular to)) and allows also to determine important parameters such as thickness or sample orientation. C1 Tech Univ Carolo Wilhelmina Braunschweig, Inst Angew Phys, D-38106 Braunschweig, Germany. Tech Univ Ilmenau, Inst Phys Expt, D-98684 Ilmenau, Germany. RP Rossow, U, Tech Univ Carolo Wilhelmina Braunschweig, Inst Angew Phys, Mendelssohnstr 2, D-38106 Braunschweig, Germany. EM u.rossow@tu-bs.de CR ACHER O, 1989, REV SCI INSTRUM, V60, P65 AGRANOVICH VM, 1984, CRYSTAL OPTICSL SPAT ASAR M, 2004, THIN SOLID FILMS, V455, P50 ASPNES DE, 1974, J OPT SOC AM, V64, P639 ASPNES DE, 1975, APPL OPTICS, V14, P220 ASPNES DE, 1980, J OPT SOC AM, V70, P1275 ASPNES DE, 1983, PHYS REV B, V27, P983 ASPNES DE, 1985, J VAC SCI TECHNOL B, V3, P1498 ASPNES DE, 1987, J VAC SCI TECHNOL A, V5, P546 ASPNES DE, 1988, J VAC SCI TECHNOL 2, V6, P1327 ASPNES DE, 2004, J OPT SOC AM A, V21, P403 AZZAM RMA, 1977, ELLIPSOMETRY PLOARIZ AZZAM RMA, 1978, OPT LETT, V2, P148 AZZAM RMA, 1993, THIN SOLID FILMS, V234, P371 BANG KY, 2004, J KOREAN PHYS SOC, V45, P185 BAUER G, 1995, CHARACTERISATION EPI BEREK M, 1931, Z KRISTALLOGR, V80, P18 BEREK M, 1936, Z KRISTALLOGR, V93, P116 BOND WL, 1965, J APPL PHYS, V36, P1674 BOULBRY B, 2002, MEAS SCI TECHNOL, V13, P1563 DRUDE P, 1888, ANN PHYS, V34, P489 DRUDE P, 1889, WIED ANN, V36, P532 DRUDE P, 1890, ANN PHYS CHEM, V39, P481 EBERT K, 2004, THIN SOLID FILMS, V455, P779 FRIED M, 2004, THIN SOLID FILMS, V455 FUKAZAWA T, 1993, THIN SOLID FILMS, V234, P390 GOLDHAHN R, 2004, SUPERLATTICE MICROST, V36, P591 GOLDSTEIN DH, 1990, J OPT SOC AM A, V7, P693 GOLDSTEIN DH, 1992, APPL OPTICS, V31, P6676 HAMBY DW, 2003, J APPL PHYS, V93, P3214 HAUGE PS, 1978, J OPT SOC AM, V68, P1519 HEPPEL S, 1999, PHYS STATUS SOLIDI A, V176, P73 HERMAN MA, 2004, SPRINGER SERIES MAT, V62 JAMIN J, 1850, ANN CHIM PHYS, V29, P263 JELLISON GE, 1990, APPL OPTICS, V29, P959 JELLISON GE, 1998, PHYS REV B, V58, P3586 KALUZA N, 2004, J CRYST GROWTH, V272, P100 LEE J, 2001, REV SCI INSTRUM, V72, P1742 MORI T, 2004, THIN SOLID FILMS, V455, P33 NAKAMURA S, 2000, INTRO NITRIDE SEMICO NEE SMF, 2003, J OPT SOC AM A, V20, P1651 NYE JF, 1985, PHYS PROPERTIES CRYS RAMSEY DA, 1994, REV SCI INSTRUM, V65, P2874 RICHTER W, 1986, ADV SOLID STATE PHYS, V26, P335 RICHTER W, 1993, PHILOS T ROY SOC A, V344, P453 ROSSOW U, 1998, THIN SOLID FILMS, V314, P98 ROSSOW U, 1998, THIN SOLID ILMS, V313, P98 ROSSOW U, 1999, PHYS STATUS SOLIDI B, V216, P215 ROSSOW U, 2000, PHYS STATUS SOLIDI A, V177, P157 ROSSOW U, 2001, PHYS STATUS SOLIDI A, V184, P51 SANFORD NA, 2003, J APPL PHYS, V94, P2980 SCHUBERT M, 1996, PHYS REV B, V53, P4265 VANHELLEMONT J, 1993, APPL SURF SCI, V63, P45 WEBER WH, 1992, PHYS REV B, V46, P15085 WILLIAMS MW, 1986, APPL OPTICS, V25, P3616 YAO HD, 1997, PHYS REV B, V56, P9414 NR 56 TC 0 PU WILEY-V C H VERLAG GMBH PI WEINHEIM PA PO BOX 10 11 61, D-69451 WEINHEIM, GERMANY SN 0370-1972 J9 PHYS STATUS SOLIDI B-BASIC SO JI Phys. Status Solidi B-Basic Solid State Phys. PD NOV PY 2005 VL 242 IS 13 BP 2617 EP 2626 PG 10 SC Physics, Condensed Matter GA 983KD UT ISI:000233229400013 ER PT J AU Chelli, R Barducci, A Bellucci, L Schettino, V Procacci, P TI Behavior of polarizable models in presence of strong electric fields. I. Origin of nonlinear effects in water point-charge systems SO JOURNAL OF CHEMICAL PHYSICS LA English DT Article ID ELECTRONEGATIVITY EQUALIZATION METHOD; MOLECULAR-DYNAMICS SIMULATIONS; FORCE-FIELD; FLUCTUATING CHARGE; POTENTIAL FUNCTION; MECHANICS; DIPOLE; PHASE; REPRODUCE; DENSITY AB In the current opinion, the inclusion of polarization response in classical computer simulations is considered as one of the most important and urgent improvements to be implemented in modern empirical potential models. In this work we focus on the capability of polarizable models, based on the pairwise Coulomb interactions, to model systems where strong electric fields enter into play. As shown by Masia, Probst, and Rey (MPR) [in J. Chem. Phys. 121, 7362 (2004)], when a molecule interacts with point charges, polarizable models show underpolarization with respect to ab initio methods. We prove that this underpolarization, clearly related to nonlinear polarization effects, cannot be simply ascribed to the lack of hyperpolarization in the polarizable models, as suggested by MPR. Analysis of the electron-density rearrangement induced on a water molecule by a point charge reveals a twofold level of polarization response. One level involves intramolecular charge transfer on the whole molecular volume, with the related polarization exhibiting a seemingly linear behavior with the external electric field. The other nonlinear polarization level occurs only at strong electric fields and is found to be strictly correlated to the quantum-mechanical nature of the water molecule. The latter type of polarization has a local character, being limited to the space region of the water lone pairs. (c) 2005 American Institute of Physics. C1 Univ Florence, Dipartimento Chim, I-50019 Sesto Fiorentino, Italy. European Lab Nonlinear Spect LENS, I-50019 Sesto Fiorentino, Italy. Consorzio Interuniv Nazl Sci & Tecnol Mat INSTM, I-50132 Florence, Italy. RP Chelli, R, Univ Florence, Dipartimento Chim, Via Lastruccia 3, I-50019 Sesto Fiorentino, Italy. EM chelli@chim.unifi.it CR BADENHOOP JK, 1997, J CHEM PHYS, V107, P5422 BECKE AD, 1988, PHYS REV A, V38, P3098 CASEWIT CJ, 1992, J AM CHEM SOC, V114, P10035 CHELLI R, 2002, J CHEM PHYS, V117, P9175 CHELLI R, 2005, J CHEM PHYS, V122 CHELLI R, 2005, J CHEM PHYS, V122 CHEN B, 2000, J PHYS CHEM B, V104, P2391 CHIALVO AA, 1998, FLUID PHASE EQUILIBR, V150, P73 DRUDE P, 1902, THEORY OPTICS FRISCH MJ, 2003, GAUSSIAN 03 REVISION GIESE TJ, 2004, J CHEM PHYS, V120, P9903 GRESH N, 1997, J PHYS CHEM A, V101, P8680 HARIHARAN PC, 1973, THEOR CHIM ACTA, V28, P213 KAMINSKI GA, 2004, J PHYS CHEM A, V108, P621 LEE C, 1988, PHYS REV B, V37, P785 MASIA M, 2004, J CHEM PHYS, V121, P7362 MORTIER WJ, 1986, J AM CHEM SOC, V108, P4315 PARICAUD P, 2005, J CHEM PHYS, V122 PATEL S, 2004, J COMPUT CHEM, V25, P1504 RAPPE AK, 1992, J AM CHEM SOC, V114, P10024 RICK SW, 1994, J CHEM PHYS, V101, P6141 SHIMIZU K, 2004, J PHYS CHEM B, V108, P4171 SILVESTRELLI PL, 1999, PHYS REV LETT, V82, P3308 STERN HA, 2001, J CHEM PHYS, V115, P2237 TABACCHI G, 2002, J CHEM PHYS, V117, P1416 THOLE BT, 1981, CHEM PHYS, V59, P341 VANDUIJNEN PT, 1998, J PHYS CHEM A, V102, P2399 YANG ZZ, 2004, J CHEM PHYS, V120, P2541 YORK DM, 1996, J CHEM PHYS, V104, P159 NR 29 TC 0 PU AMER INST PHYSICS PI MELVILLE PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA SN 0021-9606 J9 J CHEM PHYS JI J. Chem. Phys. PD NOV 15 PY 2005 VL 123 IS 19 AR 194109 DI ARTN 194109 PG 8 SC Physics, Atomic, Molecular & Chemical GA 985CH UT ISI:000233353200009 ER PT J AU Choi, K Kim, H Lim, Y Kim, S Lee, B TI Analytic design and visualization of multiple surface plasmon resonance excitation using angular spectrum decomposition for a Gaussian input beam SO OPTICS EXPRESS LA English DT Article AB We propose an exact design, analysis, and visualization method for multiple surface plasmon resonance (MSPR) mode excitation phenomena for a structure composed of an optimized-thickness polymethylmethacrylate layer and a gold thin-film layer. The proposed simulation method is based on a recursive transfer matrix method (R-TMM) and Gaussian angular spectrum decomposition. Our method illustrates, under the Kretchmann-Raether attenuated total reflection (ATR) geometry, the response for an angle-modulated Gaussian incident beam. To verify the simulation results we also performed experiments to excite MSPR modes under the ATR geometry. Our fast and exact R-TMM with the Gaussian angular spectrum method can be widely applied to the design and analysis of metal- and dielectric-composed thin film structures. (c) 2005 Optical Society of America. C1 Seoul Natl Univ, Sch Elect Engn, Seoul 151744, South Korea. RP Choi, K, Seoul Natl Univ, Sch Elect Engn, Seoul 151744, South Korea. EM byoungho@snu.ac.kr CR ANDREW P, 2004, SCIENCE, V306, P1002 BAIDA FI, 1999, OPT COMMUN, V171, P317 BAIDA FI, 1999, PHYS REV B, V60, P7812 BARNES WL, 2003, NATURE, V424, P824 CHIEN FC, 2004, BIOSENS BIOELECTRON, V20, P633 DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 HAFNER C, 1990, GENERALIZED MULTIPLE HOMOLA J, 1999, SENSOR ACTUAT B-CHEM, V54, P3 MARTIN OJF, 1995, PHYS REV LETT, V74, P526 MIE G, 1908, ANN PHYS-BERLIN, V25, P377 PALIK ED, 1985, HDB OPTICAL CONSTANT RAETHER H, 1988, SURFACE PLASMONS SMO ROTHENHAUSLER B, 1988, NATURE, V332, P615 SALEH BEA, 1991, FUNDAMENTALS PHOTONI TAFLOVE A, 2000, COMPUTATIONAL ELECTR XIE Y, 2005, OPT EXPRESS, V13, P4485 ZAYATS AV, 2005, PHYS REP, V408, P131 NR 17 TC 0 PU OPTICAL SOC AMER PI WASHINGTON PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA SN 1094-4087 J9 OPT EXPRESS JI Opt. Express PD OCT 31 PY 2005 VL 13 IS 22 BP 8866 EP 8874 PG 9 SC Optics GA 979XE UT ISI:000232977500020 ER PT J AU Beyer, AD Koesters, M Libbrecht, KG Black, ED TI Macroscopic coherence effects in a mesoscopic system: Weak localization of thin silver films SO AMERICAN JOURNAL OF PHYSICS LA English DT Article AB We present an advanced undergraduate experiment on weak localization in thin silver films with a thickness between 60-200 angstrom, a mesoscopic length scale. At low temperatures, the inelastic dephasing length for electrons exceeds the film thickness, and the film becomes quasi-two-dimensional. In this limit, theory predicts corrections to the Drude conductivity due to the coherent interference between the wave functions of the conducting electrons, a macroscopically observable effect known as weak localization. This correction can be destroyed by the application of a magnetic field, and the resulting magnetoresistance curve provides information about electron transport in the film. (c) 2005 American Association of Physics Teachers. C1 CALTECH, Dept Phys, Pasadena, CA 91125 USA. RP Beyer, AD, CALTECH, Dept Phys, Pasadena, CA 91125 USA. EM beyer@its.caltech.edu CR BERGMANN G, 1984, PHYS REP, V107, P1 CHAKRAVARTY S, 1986, PHYS REP, V140, P193 DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 DRUDE P, 1900, ANN PHYSIK, V3, P369 GERSHENZON ME, 1982, JETP LETT, V35, P576 LIBBRECHT KG, 2003, AM J PHYS, V71, P1208 NR 6 TC 0 PU AMER ASSOC PHYSICS TEACHERS AMER INST PHYSICS PI MELVILLE PA STE 1 NO 1, 2 HUNTINGTON QUADRANGLE, MELVILLE, NY 11747-4502 USA SN 0002-9505 J9 AMER J PHYS JI Am. J. Phys. PD NOV PY 2005 VL 73 IS 11 BP 1014 EP 1019 PG 6 SC Education, Scientific Disciplines; Physics, Multidisciplinary GA 980CJ UT ISI:000232991200005 ER PT J AU Reed, JR TI Analytical expression for the output voltage of the triple resonance Tesla transformer SO REVIEW OF SCIENTIFIC INSTRUMENTS LA English DT Article AB An analytical expression for the time-dependent output voltage of the triple resonance Tesla transformer is presented. Presently there does not exist any closed-form solution for the output voltage, and the investigators must use circuit simulators to examine the transformer's performance. Such simulators are satisfactory in many regards, but they cannot furnish physical insight into the triple resonance device. A governing equation provides this needed insight and opens the way for obtaining optimal high-performance transformers. The present analysis treats the transformer as three oscillatory LC tank circuits feeding a load capacitance. The circuit is assumed to have a very high Q, which is a fundamental design practice for these pulsed power supplies. The formula is exercised using a known triple resonance circuit, and the results closely agree with the analysis of an industry standard circuit simulator. (c) 2005 American Institute of Physics. C1 Univ Cent Florida, Dept Comp Engn & Sci, Orlando, FL 32816 USA. RP Reed, JR, Univ Cent Florida, Dept Comp Engn & Sci, 400 Cent Florida Blvd, Orlando, FL 32816 USA. CR ABRAMYAN EA, 1971, IEEE T NUCL SCI, V18, P447 BIENIOSEK FM, 1987, P 6 IEEE PULS POW C BIENIOSEK FM, 1989, 4833421, US BIENIOSEK FM, 1990, REV SCI INSTRUM, V61, P1717 DRUDE P, 1904, ANN PHYS-BERLIN, V13, P512 ERDELYI A, 1954, TABLES INTEGAL TRANS, V1 EVERITT W, 1956, COMMUNICATION ENG, CH11 FINKELSTEIN D, 1966, REV SCI INSTRUM, V53, P694 GARDNER MF, 1961, TRANSIENTS LINEAR SY KURTZ EB, 1953, INTRO ELECT TRANSIEN ROHWEIN GJ, 1979, SAND790813 TESLA N, 1914, 1119732, US NR 12 TC 0 PU AMER INST PHYSICS PI MELVILLE PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA SN 0034-6748 J9 REV SCI INSTR JI Rev. Sci. Instrum. PD OCT PY 2005 VL 76 IS 10 AR 104702 DI ARTN 104702 PG 4 SC Physics, Applied; Instruments & Instrumentation GA 978EH UT ISI:000232855900027 ER PT J AU Sarauli, D Meier, R Liu, GF Ivanovic-Burmazovic, I van Eldik, R TI Effect of pressure on proton-coupled electron transfer reactions of seven-coordinate iron complexes in aqueous solutions SO INORGANIC CHEMISTRY LA English DT Article ID PENTAGONAL-BIPYRAMIDAL COMPLEXES; TRANSITION-METAL-COMPLEXES; REACTION VOLUMES; CRYSTAL-STRUCTURE; CYTOCHROME-C; CHARGE; STATE; 2,6-DIACETYLPYRIDINE; COORDINATION; VOLTAMMETRY AB For the first time, the effect of pressure on proton-coupled electron-transfer reactions of two selected seven-coordinate Fe-III/II(H2L)(H2O)(2) systems [where H2L = 2,6-diacetylpyridine-bis(semicarbazone) and 2,6-diacetylpyridine-bis(semioxamazide), respectively] was examined. The acid-base equilibria of the different Fe-III/II systems were investigated by spectrophotometric, potentiometric, and electrochemical titrations. On the basis of the obtained species distributions, the pH intervals in which the different protonated forms of the two studied systems exist were defined. In different pH ranges, a different number of protons (from 0 to 3 protons per electron) can be transferred during the redox process, which affects the change in the overall charge on the complexes. For all the different protonation forms of the studied complexes, the change in the redox potentials with pressure was measured and the redox reaction volume was obtained by high-pressure cyclic voltammetry. The results show that in the case of proton-coupled electron transfer, the reaction volume for the neutralization of protons contributes to the overall reaction volume. A linear correlation between Delta z(2) (change in the square of the charge) and the overall reaction volume of the complexes upon reduction, Delta V-complex, was found. The average value of the intrinsic volume change for the selected seven-coordinate iron complexes was estimated from the intercept of the Plot Of Delta Vc(omplex)(0) versus Delta z(2) to be 9.2 +/- 0.7 cm(3) mol(-1). For the combined redox and protonation processes, the data are discussed in terms of linear correlations between Delta z(2) and the redox and neutralization reaction volumes reported in the literature. C1 Univ Erlangen Nurnberg, Inst Inorgan Chem, D-91058 Erlangen, Germany. RP Ivanovic-Burmazovic, I, Univ Erlangen Nurnberg, Inst Inorgan Chem, Egerlandstr 1, D-91058 Erlangen, Germany. EM Ivana.lvanovic@chemie.uni-erlangen-de vaneldik@chemie.uni-erlangen.de CR *GPES, 2001, GEN PURP EL SYST WIN ANDJELKOVIC K, 2002, J COORD CHEM, V55, P1385 BABCOCK GT, 1992, NATURE, V356, P301 BAJAJ HC, 2004, INORG CHEM, V43, P1429 BREWER C, 2004, INORG CHEM, V43, P2402 BRITTON HTS, 1931, J CHEM SOC 1, P1456 BULL C, 1985, J AM CHEM SOC, V107, P3295 CHANG CJ, 2004, BBA-BIOENERGETICS, V1655, P13 DRUDE P, 1894, Z PHYS CHEM, V15, P79 FALLER P, 2003, P NATL ACAD SCI USA, V100, P8732 FU YS, 1997, J AM CHEM SOC, V119, P7137 GRAN G, 1952, ANALYST, V77, P661 HILLS G, 1972, CHEM-ING-TECH, V44, P216 HUHEEY JE, 1983, INORGANIC CHEM PRINC, CH7 IVANOVICBURMAZOVIC I, 2002, INORG CHEM, V41, P5150 IVANOVICBURMAZOVIC I, 2004, ADV INORG CHEM, V55, P315 KITAMURA Y, 1984, BER BUNSEN PHYS CHEM, V88, P418 KITAMURA Y, 1987, J SOLUTION CHEM, V16, P715 LAMBERT F, 2004, INORG CHEM, V43, P4178 LI J, 1996, INORG CHEM, V35, P4694 MACPHERSON BP, 2005, DALTON T, P1459 MALMSTROM BG, 1993, ACCOUNTS CHEM RES, V26, P332 MEIER R, 1999, EFIT GEN PROGRAM EVA MILLERO FJ, 1972, J SOLUTION CHEM, V1, P309 MILLERO FJ, 1972, WATER AQUEOUS SOLUTI, CH13 NOCERA DG, 2001, J INORG BIOCHEM, V86, P81 PALENIK GJ, 1976, INORG CHEM, V15, P1814 PALENIK GJ, 1978, INORG CHEM, V17, P864 ROTH JP, 2000, J AM CHEM SOC, V122, P5486 SACHINIDIS JI, 1994, INORG CHEM, V33, P6180 SLATTERY SJ, 1998, COORDIN CHEM REV, V174, P391 SOMMERER SO, 1992, INORG CHEM, V31, P563 STOKES RH, 1957, T FARADAY SOC, V53, P301 SUN J, 1995, J AM CHEM SOC, V117, P2600 SWADDLE TW, 1999, COORDIN CHEM REV, V187, P255 TRAN D, 1992, INORG CHEM, V31, P2460 ZHANG D, 1998, INORG CHEM, V37, P956 ZUBERBUHLER AD, 1982, TALANTA, V29, P201 NR 38 TC 0 PU AMER CHEMICAL SOC PI WASHINGTON PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA SN 0020-1669 J9 INORG CHEM JI Inorg. Chem. PD OCT 17 PY 2005 VL 44 IS 21 BP 7624 EP 7633 PG 10 SC Chemistry, Inorganic & Nuclear GA 974RS UT ISI:000232609700053 ER PT J AU Yu, HB van Gunsteren, WF TI Accounting for polarization in molecular simulation SO COMPUTER PHYSICS COMMUNICATIONS LA English DT Review DE molecular dynamics; polarization; fluctuation charges; polarizable dipole; Drude Oscillator; Charge-On-Spring; water ID MOBILE CHARGE-DENSITIES; HARMONIC-OSCILLATORS MODEL; INITIO QUANTUM-CHEMISTRY; PARTICLE-MESH EWALD; LIQUID WATER; DYNAMICS SIMULATIONS; FLUCTUATING CHARGE; FORCE-FIELDS; ELECTROSTATIC INTERACTIONS; DIELECTRIC-CONSTANTS AB Polarization plays an important role in the energetics of molecular systems, not the least in biomolecular systems. Most computer simulation studies of such systems do not treat electronic polarizability explicitly, but only implicitly using effective charges, dielectric permittivities or continuum electrostatics methods. Yet, the introduction of explicit polarizability into biomolecular models and force fields is unavoidable when more accurate simulation results are to be obtained. Various ways to account for polarizability in (bio)molecular simulation are reviewed with an eye to striking a balance between accuracy on the one hand and simplicity and computational efficiency on the other. The various choices to be made are listed and discussed. The most promising approach, the so-called Charge-On-Spring type of models, is treated in more detail and applied to liquid water as an example. Its implementation in the GROMOS biomolecular simulation software is sketched. (C) 2005 Elsevier B.V. All rights reserved. C1 ETH Honggerberg, Swiss Fed Inst Technol Zurich, Phys Chem Lab, CH-8093 Zurich, Switzerland. RP van Gunsteren, WF, ETH Honggerberg, Swiss Fed Inst Technol Zurich, Phys Chem Lab, CH-8093 Zurich, Switzerland. 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FJ, 1977, J COMPUT PHYS, V24, P361 VREVEN T, 2001, J CHEM PHYS, V115, P62 WARSHEL A, 1976, J MOL BIOL, V103, P227 WARSHEL A, 1979, J PHYS CHEM-US, V83, P1640 WARSHEL A, 1984, P NATL ACAD SCI-BIOL, V81, P4785 WARSHEL A, 1984, Q REV BIOPHYS, V17, P283 WARSHEL A, 1991, COMPUTER MODELLING C WEAST RC, 1983, HDB CHEM PHYS WILLIAMS DE, 1988, J COMPUT CHEM, V9, P745 YU HB, 2003, J CHEM PHYS, V118, P221 YU HB, 2004, J CHEM PHYS, V121, P9549 ZHU JA, 2002, J PHYS CHEM B, V106, P4844 NR 130 TC 0 PU ELSEVIER SCIENCE BV PI AMSTERDAM PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS SN 0010-4655 J9 COMPUT PHYS COMMUN JI Comput. Phys. Commun. PD NOV 1 PY 2005 VL 172 IS 2 BP 69 EP 85 PG 17 SC Computer Science, Interdisciplinary Applications; Physics, Mathematical GA 978UO UT ISI:000232898700001 ER PT J AU Rafai, S Bonn, D Meunier, J TI Long-range critical wetting: Experimental phase diagram SO PHYSICA A-STATISTICAL MECHANICS AND ITS APPLICATIONS LA English DT Article DE wetting; phase transitions; critical phenomena ID FORCES; WATER; ALKANES; SYSTEMS AB We present ellipsometry and interferrometry experiments which allow us to observe the transition point between the standard first-order wetting and the long-range critical wetting. Moreover we provide a direct measurement of the free-energy singularities in the sequential wetting scenario of alkanes on water. (c) 2005 Elsevier B.V.. All rights reserved. C1 ENS, Lab Phys Stat, F-75231 Paris, France. Univ Amsterdam, Waals Zeeman Inst, NL-1018 XE Amsterdam, Netherlands. RP Rafai, S, ENS, Lab Phys Stat, 24 Rue Lhomond, F-75231 Paris, France. EM rafai@lps.ens.fr CR BERGERON V, 2000, NATURE, V405, P772 BERTRAND E, 2000, PHYS REV LETT, V85, P1282 BERTRAND E, 2002, J PETROL SCI ENG, V33, P217 BONN D, 2001, REP PROG PHYS, V64, P1085 CAHN JW, 1977, J CHEM PHYS, V66, P3667 DEGENNES PG, 1985, REV MOD PHYS, V57, P827 DELCERRO C, 1980, J COLLOID INTERF SCI, V78, P362 DIETRICH S, 1985, PHYS REV B, V31, P4718 DRUDE P, 1959, THEORY OPTICS DZYALOSHINSKII IE, 1961, ADV PHYS, V10, P165 INDEKEU JO, 1999, J STAT PHYS, V95, P1009 ISRAELACHVILI JN, 1985, INTERMOLECULAR SURFA LIPOWSKY R, 1984, PHYS REV LETT, V52, P2303 RAFAI S, 2004, PHYS REV LETT, V92 RAGIL K, 1996, PHYS REV LETT, V77, P1532 ROWLINSON JS, 1982, MOL THEORY CAPILLARI SHAHIDZADEH N, 1998, PHYS REV LETT, V80, P3992 SHAHIDZADEH N, 2003, TRANSPORT POROUS MED, V52, P213 NR 18 TC 0 PU ELSEVIER SCIENCE BV PI AMSTERDAM PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS SN 0378-4371 J9 PHYSICA A JI Physica A PD DEC 1 PY 2005 VL 358 IS 1 BP 197 EP 204 PG 8 SC Physics, Multidisciplinary GA 976IO UT ISI:000232727100023 ER PT J AU Adamson, P TI Scanning angle differential reflectometry around the Brewster angle to probe ultrathin dielectric films SO THIN SOLID FILMS LA English DT Article DE dielectrics; ellipsometry; optical properties; reflection spectroscopy ID LONG-WAVELENGTH APPROXIMATION; N-LAYER SYSTEM; OPTICAL DIAGNOSTICS; SURFACE PHOTOABSORPTION; REFLECTION; LIGHT; EPITAXY; SUBSTRATE; GROWTH; GAAS AB An analysis is made of a differential reflection method for optical probing of ultrathin dielectric films on transparent substrates by depositing a second ultrathin dielectric layer with arbitrary parameters to the film under study and measuring, in the vicinity of the Brewster angle, the angular spectrum of the change in the reflectance of p-polarized light induced by the deposited layer. It is shown that in the long-wavelength approximation the half-width of this spectrum depends linearly on the thickness of the initial ultrathin film and is independent of the parameters of the second layer. A novel technique, which permits simultaneous determining the dielectric constant and thickness of homogeneous ultrathin dielectric films by differential reflectance measurements, is developed. (c) 2005 Elsevier B.V. All rights reserved. C1 Univ Tartu, Inst Phys, EE-51014 Tartu, Estonia. RP Adamson, P, Univ Tartu, Inst Phys, Riia 142, EE-51014 Tartu, Estonia. EM peep@fi.tartu.ee CR ABELES F, 1963, PROGR OPTICS, V2, P251 ADAMSON P, 2003, J OPT SOC AM B, V20, P752 ADAMSON P, 2004, J OPT SOC AM B, V21, P645 ADAMSON PV, 1997, OPT SPECTROSC, V83, P154 ASPNES DE, 1994, SURF SCI B, V307, P1017 AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ DHATHATHREYAN A, 1988, BIOCHIM BIOPHYS ACTA, V944, P265 DRUDE P, 1912, LEHRBUCH OPTIK HORIKOSHI Y, 1991, J CRYST GROWTH, V111, P200 KNITTL Z, 1976, OPTICS THIN FILMS KOBAYASHI N, 1990, JPN J APPL PHYS 2, V29, L702 KOBAYASHI N, 1993, THIN SOLID FILMS, V225, P32 MACLAUPIN RC, 1905, P R SOC LOND A-CONTA, V76, P49 SAKAMOTO A, 1993, JPN J APPL PHYS PT 2, V32, L1318 SCHAAF P, 1986, REV PHYS APPL, V21, P741 SCHAAF P, 1987, LANGMUIR, V3, P1131 SHELDON B, 1982, J OPT SOC AM, V72, P1049 VANDERZEEUW EA, 1996, J CHEM PHYS, V105, P1646 WARD L, 1994, OPTICAL CONSTANTS TH NR 19 TC 0 PU ELSEVIER SCIENCE SA PI LAUSANNE PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND SN 0040-6090 J9 THIN SOLID FILMS JI Thin Solid Films PD DEC 1 PY 2005 VL 492 IS 1-2 BP 221 EP 225 PG 5 SC Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter GA 974LD UT ISI:000232592100036 ER PT J AU Vorobyov, IV Anisimov, VM MacKerell, AD TI Polarizable empirical force field for alkanes based on the classical drude oscillator model SO JOURNAL OF PHYSICAL CHEMISTRY B LA English DT Review ID MOLECULAR-DYNAMICS SIMULATION; FREE-ENERGY CALCULATIONS; VAPOR-LIQUID-EQUILIBRIA; ALKYL FUNCTIONAL-GROUP; AB-INITIO CALCULATIONS; NUCLEIC-ACIDS; PHASE-EQUILIBRIA; BRANCHED ALKANES; CONDENSED-PHASE; VIBRATIONAL FREQUENCIES AB Recent extensions of potential energy functions used in empirical force field calculations have involved the inclusion of electronic polarizability. To properly include this extension into a potential energy function it is necessary to systematically and rigorously optimize the associated parameters based on model compounds for which extensive experimental data are available. In the present work, optimization of parameters for alkanes in a polarizable empirical force field based on a classical Drude oscillator is presented. Emphasis is placed on the development of parameters for CH3, CH2, and CH moieties that are directly transferable to long chain alkanes, as required for lipids and other biomolecules. It is shown that a variety of quantum mechanical and experimental target data are reproduced by the polarizable model. Notable is the proper treatment of the dielectric constant of pure alkanes by the polarizable force field, a property essential for the accurate treatment of, for example, hydrophobic solvation in lipid bilayers. The present alkane force field will act as the basis for the aliphatic moieties in an extensive empirical force field for biomolecules that includes the explicit treatment of electronic polarizability. C1 Univ Maryland, Sch Pharm, Dept Pharmaceut Sci, Baltimore, MD 21201 USA. RP MacKerell, AD, Univ Maryland, Sch Pharm, Dept Pharmaceut Sci, Baltimore, MD 21201 USA. 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Phys. Chem. B PD OCT 13 PY 2005 VL 109 IS 40 BP 18988 EP 18999 PG 12 SC Chemistry, Physical GA 972VU UT ISI:000232482100039 ER PT J AU Marcus, Y TI Electrostriction, ion solvation, and solvent release on ion pairing SO JOURNAL OF PHYSICAL CHEMISTRY B LA English DT Article ID STATIC RELATIVE PERMITTIVITIES; PARTIAL MOLAR VOLUMES; AQUEOUS-SOLUTIONS; 298.15 K; DIELECTRIC CONSTANT; ISOTHERMAL COMPRESSIBILITY; TEMPERATURE 298.15-K; MAGNESIUM-SULFATE; 2000 ATM; ASSOCIATION CONSTANT AB The theoretical mean molar electrostriction volume of electrolytic solvents, Delta V-el(solvent), was calculated from their properties: the relative pressure derivatives of the density (the compressibility) and permittivity and their second pressure derivatives. The molar electrostriction caused by ions at infinite dilution was taken as the differences of their standard partial molar volumes in the solution and their intrinsic volumes: Delta V-el(ion) = V-infinity(ion) - V-in(ion). The ratio n(infinity) = Delta V-el(ion)/Delta V-el(solvent) then represents the solvation number of the ion in the solvent at infinite dilution. Similarly, from the molar volume change on ion pair formation, Delta V-ip, the ratio Delta n(ip) = Delta V-ip/Delta V-el(solvent) represents the number of solvent molecules released thereby. These values were tabulated for those solvents, ions, and ion pairs for which the relevant information could be found, the extension to nonaqueous solvents not having been attempted previously. C1 Hebrew Univ Jerusalem, Dept Inorgan & Analyt Chem, IL-91904 Jerusalem, Israel. RP Marcus, Y, Hebrew Univ Jerusalem, Dept Inorgan & Analyt Chem, IL-91904 Jerusalem, Israel. 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Phys. Chem. B PD OCT 6 PY 2005 VL 109 IS 39 BP 18541 EP 18549 PG 9 SC Chemistry, Physical GA 970OC UT ISI:000232318500049 ER PT J AU Bhattacharjee, PR TI The generalized vectorial laws of reflection and refraction SO EUROPEAN JOURNAL OF PHYSICS LA English DT Article AB This paper discloses two important discoveries. These are: (i) discovery of ambiguity in the well-established laws of reflection and refraction of light which have been in regular use for many years, and (ii) discovery of generalized vectorial laws of reflection and refraction of light. The existing definitions of angle of incidence, angle of reflection and angle of refraction are considered first. Each of these definitions is found to be ambiguous, not in compliance with the fundamental definition of angle in geometry. Two typical questions (one in the case of reflection and the other for refraction) have been addressed, which cannot be dealt with by using the existing laws of reflection and refraction of light. Thus, the existing laws of reflection and refraction of light seem to be ambiguous in respect of generality and their validity in a broad sense is questionable. With a view to removing the ambiguities, proper definitions of the above three angles are given first and then the statement of the generalized vectorial law of reflection (as well as that of refraction) has been offered. C1 MBB Coll, Dept Phys, Agartala 799004, Tripura, India. RP Bhattacharjee, PR, MBB Coll, Dept Phys, Agartala 799004, Tripura, India. EM drpramode@rediffmail.com CR BARTON AW, 1949, TXB LIGHT CURRY C, 1962, GEOMETRICAL OPTICS DRUDE P, 1954, THEORY OPTICS EDSER E, 1946, LIGHT STUDENTS, P6 HECHT E, 1987, OPTICS JENKINS FA, 1957, FUNDAMENTALS OPTICS, P4 LONGHURST RS, 1974, GEOMETRICAL PHYS OPT MORGAN J, 1953, INTRO GEOMETRICAL PH, P2 NELKEN M, LIGHT SOUND, P5 SOUTHALL JPC, 1918, MIRRORS PRISMS LENSE STEWART RW, 1947, TXB LIGHT, P17 NR 11 TC 0 PU IOP PUBLISHING LTD PI BRISTOL PA DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND SN 0143-0807 J9 EUR J PHYS JI Eur. J. Phys. PD SEP PY 2005 VL 26 IS 5 BP 901 EP 911 PG 11 SC Education, Scientific Disciplines; Physics, Multidisciplinary GA 970PK UT ISI:000232321900032 ER PT J AU Sahnoun, M Daul, C Parlebas, JC Demangeat, C Driz, M TI Electronic structure and optical properties of TaC from the first principles calculation SO EUROPEAN PHYSICAL JOURNAL B LA English DT Article ID TANTALUM CARBIDE; BAND STRUCTURES; NITRIDES; SPECTRA; METALS; FILMS; HFC; ZRC AB The electronic and optical properties of tantalum carbide TaC have been calculated using the full-potential linearized augmented-plane-wave method within the local density approximation scheme for the exchange-correlation potential. We find that the optical spectra can be extremely sensitive to the Brillouin zone sampling. The influence of relativistic effects on the dielectric function is investigated. It is shown that the scalar-relativistic correction is much more important than spin-orbit coupling. Our results are found to be in good agreement with the available experimental data. The determinant role of a band structure computation with respect to the analysis of optical properties is discussed. C1 Univ Fribourg, Dept Chim, CH-1700 Fribourg, Switzerland. CNRS, UMR 7504, IPCMS GEMM, F-67034 Strasbourg, France. Univ Djillali Liabes, Mat Sci Lab, DZ-22000 Sidi Bel Abbes, Algeria. RP Sahnoun, M, Univ Fribourg, Dept Chim, CH-1700 Fribourg, Switzerland. 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Phys. J. B PD APR PY 2005 VL 44 IS 3 BP 281 EP 286 PG 6 SC Physics, Condensed Matter GA 966NE UT ISI:000232025900003 ER PT J AU Medebach, M Jordan, RC Reiber, H Schope, HJ Biehl, R Evers, M Hessinger, D Olah, J Palberg, T Schonberger, E Wette, P TI Drude-type conductivity of charged sphere colloidal crystals: Density and temperature dependence SO JOURNAL OF CHEMICAL PHYSICS LA English DT Article ID DOUBLE-LAYER THICKNESS; MIT SICHTBAREM LICHT; ELECTROPHORETIC MOBILITY; CONCENTRATED SUSPENSION; PHASE-DIAGRAM; MONODISPERSEN KUNSTSTOFFLATICES; ELECTROKINETIC PHENOMENA; DIELECTRIC SPECTROMETER; COMPUTER-SIMULATION; AQUEOUS SUSPENSIONS AB We report on extensive measurements in the low-frequency limit of the ac conductivity of colloidal fluids and crystals formed from charged colloidal spheres suspended in de-ionized water. Temperature was varied in a range of 5 degrees C 3 mum). On the contrary, for supenarrowslits (<0.1 mum), the X-ray flux spreads by the waveguide-resonance propagation. We called this waveguide-resonance unit the planar X-ray waveguide resonator (PXWR). Our experiments showed that, in conditions of X-ray waveguide-resonance propagation, a partial angular tunneling of the radiation flux in a gap between two PXWR placed one after another is observed. Based on the tunneling effect measurement, a hypothesis was proposed that X-ray flux can be manipulated by an external influence on the interference field of a standing wave initiated by the flux. The ways to upgrade the waveguide resonator are discussed briefly. Various fields of the efficient and practical usage of the waveguide resonator are pointed out. (C) 2004 Elsevier B.V. All rights reserved. C1 Russian Acad Sci, IMT, Chernogolovka 142432, Moscow, Russia. RP Egorov, VK, Russian Acad Sci, IMT, Chernogolovka 142432, Moscow, Russia. 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Acta Pt. B-Atom. Spectr. PD AUG 31 PY 2004 VL 59 IS 8 BP 1049 EP 1069 PG 21 SC Spectroscopy GA 864GS UT ISI:000224622600002 ER PT J AU Norton, JD TI Einstein's investigations of Galilean covariant electrodynamics prior to 1905 SO ARCHIVE FOR HISTORY OF EXACT SCIENCES LA English DT Article ID RADIATION PROBLEMS; LIGHT; RELATIVITY; ETHER AB Einstein learned from the magnet and conductor thought experiment how to use field transformation laws to extend the covariance of Maxwell's electrodynamics. If he persisted in his use of this device, he would have found that the theory cleaves into two Galilean covariant parts, each with different field transformation laws. The tension between the two parts reflects a failure not mentioned by Einstein: that the relativity of motion manifested by observables in the magnet and conductor thought experiment does not extend to all observables in electrodynamics. An examination of Ritz's work shows that Einstein's early view could not have coincided with Ritz's on an emission theory of light, but only with that of a conveniently reconstructed Ritz. One Ritz-like emission theory, attributed by Pauli to Ritz, proves to be a natural extension of the Galilean covariant part of Maxwell's theory that happens also to accommodate the magnet and conductor thought experiment. Einstein's famous chasing a light beam thought experiment fails as an objection to an ether-based, electrodynamical theory of light. However it would allow Einstein to formulate his general objections to all emission theories of light in a very sharp form. Einstein found two well known experimental results of 18th and 19th century optics compelling (Fizeau's experiment, stellar aberration), while the accomplished Michelson-Morley experiment played no memorable role. I suggest they owe their importance to their providing a direct experimental grounding for Lorentz' local time, the precursor of Einstein's relativity of simultaneity, and doing it essentially independently of electrodynamical theory. I attribute Einstein's success to his determination to implement a principle of relativity in electrodynamics, but I urge that we not invest this stubbornness with any mystical prescience. C1 Univ Pittsburgh, Dept Hist & Philosophy Sci, Pittsburgh, PA 15260 USA. RP Norton, JD, Univ Pittsburgh, Dept Hist & Philosophy Sci, Pittsburgh, PA 15260 USA. 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Hist. Exact Sci. PD NOV PY 2004 VL 59 IS 1 BP 45 EP 105 PG 61 SC Mathematics, Interdisciplinary Applications; History & Philosophy Of Science; History & Philosophy Of Science; History & Philosophy of Science GA 865FF UT ISI:000224687200002 ER PT J AU Campbell, RA Parker, SRW Day, JPR Bain, CD TI External reflection FTIR spectroscopy of the cationic surfactant hexadecyltrimethylammonium bromide (CTAB) on an overflowing cylinder SO LANGMUIR LA English DT Article ID AIR-WATER-INTERFACE; SODIUM DODECYL-SULFATE; INFRARED REFLECTION; AIR/WATER INTERFACE; ABSORPTION SPECTROSCOPY; NEUTRON REFLECTION; PHASE-TRANSITIONS; IR SPECTROSCOPY; MOLECULAR-ORIENTATION; INSOLUBLE MONOLAYERS AB External reflection Fourier transform infrared spectroscopy (ER-FTIRS) has been used to study the adsorption of the cationic surfactant hexadecyltrimethylammonium bromide (CTAB) at the air-water interface under nonequilibrium conditions. An overflowing cylinder (CFC) was used to generate a continually expanding liquid surface with a surface age of 0.1-1 s. ER-FTIR spectra were acquired by a single bounce of p- or s-polarized radiation from the flowing surface of the OFC. The C-H stretching region of CTAB spectra was analyzed both by subtraction of a reference spectrum of pure water and by a chemometric technique known as target factor analysis (TFA). The TFA method is shown to give lower scatter in the weight of the component assignable to the adsorbed CTAB monolayer and to permit analysis of spectra at lower bulk surfactant concentrations. The surface sensitivity of ER-FTIRS is demonstrated both experimentally and by theoretical modeling. Modeling shows that surfactant adsorbed at the surface and dissolved in the bulk solution can be distinguished by reflection spectroscopy but also highlights potential errors that can arise from the neglect of the bulk surfactant contribution to the ER-FTIR spectra. Polarized spectra are consistent with an isotropic distribution of transition dipole moments of the hydrocarbon chains in CTAB. Component weights of the CTAB monolayer determined by TFA are compared with an independent determination of values of the dynamic surface excess, Gamma(dyn), by neutron reflection and ellipsometry. The relationship between the component weights and Gamma(dyn) shows a small but significant deviation from linearity. Possible explanations for this deviation are discussed. The feasibility of using TFA to deconvolute ER-FTIR spectra of mixtures of hydrocarbon surfactants is demonstrated. C1 Univ Oxford, Dept Chem, Chem Res Lab, Oxford OX1 3TA, England. RP Bain, CD, Univ Oxford, Dept Chem, Chem Res Lab, Mansfield Rd, Oxford OX1 3TA, England. 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I. Water and carbon tetrachloride close to a point charge SO JOURNAL OF CHEMICAL PHYSICS LA English DT Review ID INITIO QUANTUM-CHEMISTRY; DIPOLE INTERACTION-MODEL; MANY-BODY POTENTIALS; GAUSSIAN-BASIS SETS; DYNAMICS SIMULATIONS; FLUCTUATING CHARGE; LIQUID WATER; FORCE-FIELD; ION SOLVATION; INTERMOLECULAR POTENTIALS AB The three main methods to implement molecular polarization (point dipoles, fluctuating charges, and shell model) are tested against high level ab initio calculations for a molecule (water, carbon tetrachloride) close to a point charge (at the distance of a lithium or magnesium ion). The goal is to check whether an approximation (linear polarization) strictly valid at large intermolecular distances is sufficiently accurate for liquid state molecular dynamics simulations, where strong polarization effects are to be expected at short separations. The monitored observable is the molecular dipole moment as a function of the charge-molecule distance for selected molecular orientations. Analytic formulas are derived for the components of the molecular polarization tensor, facilitating the optimization of the performance for each polarization method as a function of its underlying parameters. Overall, the methods studied provide a remarkably good representation of the induced dipole, with no divergences appearing even at the shortest distances. For water close to a monovalent point charge the point dipole model, implemented with one or three dipoles, accurately reproduces the water dipole moment at all distances. Deficiencies appear as the molecular polarizability and/or charge increase: basically, the ab initio induced moments grow faster at intermediate distances than the linear increase characteristic of the phenomenological polarization methods, suggesting that nonlinear effects (hyperpolarizability) cannot be neglected in these cases. Regarding the capabilities of each method, the point dipole method is the one that performs best overall, with the shell model achieving acceptable results in most instances. The fluctuating charge method shows some noticeable limitations for implementations of comparable complexity (in terms of the number of sites required). (C) 2004 American Institute of Physics. C1 Univ Politecn Catalunya, Dept Fis & Engn Nucl, Barcelona, Spain. Innsbruck Univ, Inst Ion Phys, A-6020 Innsbruck, Austria. RP Masia, M, Univ Politecn Catalunya, Dept Fis & Engn Nucl, Campus Nord B4-B5, Barcelona, Spain. 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Chem. Phys. PD OCT 15 PY 2004 VL 121 IS 15 BP 7362 EP 7378 PG 17 SC Physics, Atomic, Molecular & Chemical GA 859MW UT ISI:000224269300040 ER PT J AU Toussaint, KC Di Giuseppe, G Bycenski, KJ Sergienko, AV Saleh, BEA Teich, MC TI Quantum ellipsometry using correlated-photon beams SO PHYSICAL REVIEW A LA English DT Article ID SUB-POISSONIAN LIGHT; PARAMETRIC DOWNCONVERSION; NOISE AB We report ellipsometric measurements made on semiconductor samples using photon-correlated beams produced by the process of spontaneous parametric down-conversion. Such a source yields higher accuracy than its quantum-limited conventional counterpart. We also show that our approach has the added advantage of not requiring an external reference sample for calibration. C1 Boston Univ, Dept Elect & Comp Engn, Quantum Imaging Lab, Boston, MA 02215 USA. Boston Univ, Dept Phys, Quantum Imaging Lab, Boston, MA 02215 USA. RP Toussaint, KC, Boston Univ, Dept Elect & Comp Engn, Quantum Imaging Lab, 8 St Marys St, Boston, MA 02215 USA. 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Rev. A PD AUG PY 2004 VL 70 IS 2 AR 023801 DI ARTN 023801 PG 7 SC Physics, Atomic, Molecular & Chemical; Optics GA 851WO UT ISI:000223717400114 ER PT J AU Adamson, P TI Laser diagnostics of nanoscale dielectric films on transparent substrate by integrating differential reflectivity and ellipsometry SO OPTICS AND LASER TECHNOLOGY LA English DT Article DE optical diagnostics; nanoscale films; ellipsometry; differential reflectivity ID THIN-FILMS; SPECTROSCOPY; REFLECTANCE; SURFACE; LAYERS; THICKNESS; ANGLE; PHASE; LIGHT AB The effect of nanometer dielectric films on the differential reflection characteristics of linearly polarized light from non-absorbing materials is investigated in the long-wavelength approximation. The second-order formulas for changes in the reflectance of s- and p-polarized light caused by ultrathin layer are obtained. A detailed analysis of the influence of ultrathin film to the reflectivity of p-polarized light in the vicinity of the Brewster angle is carried out. The novel methods are developed for determining the thickness and refractive index of uniform (or the average values of refractive index of nonuniform) nanometer-scale films by differential reflectivity and ellipsometric measurements. (C) 2004 Elsevier Ltd. All rights reserved. C1 Univ Tartu, Inst Phys, EE-51014 Tartu, Estonia. RP Adamson, P, Univ Tartu, Inst Phys, Riia 142, EE-51014 Tartu, Estonia. 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Laser Technol. PD NOV PY 2004 VL 36 IS 8 BP 661 EP 668 PG 8 SC Optics GA 852LI UT ISI:000223756400011 ER PT J AU Brown, M Uran, S Law, B Marschand, L Lurio, L Kuzmenko, I Gog, T TI Ultra-stable oven designed for x-ray reflectometry and ellipsometry studies of liquid surfaces SO REVIEW OF SCIENTIFIC INSTRUMENTS LA English DT Article ID MIXTURE; ADSORPTION AB Stable temperature control is highly desirable for reflectivity studies of binary liquid mixtures. In this article we report on the construction of an oven that possesses good temperature stability (similar to1 mK/day) and small transverse temperature gradients (<1 mK/cm). The oven has a horizontal geometry and can be used for either x-ray reflectometry or ellipsometry measurements from the liquid/vapor surfaces of such systems. Details of the oven design together with test results are provided. (C) 2004 American Institute of Physics. C1 Kansas State Univ, Dept Phys, Manhattan, KS 66506 USA. No Illinois Univ, Dept Phys, De Kalb, IL 60115 USA. Argonne Natl Lab, Adv Photon Source, CMC CAT, Argonne, IL 60439 USA. RP Law, B, Kansas State Univ, Dept Phys, Cardwell Hall, Manhattan, KS 66506 USA. EM bmlaw@phys.ksu.edu CR *NAT SEM, 1986, LIN APPL HDB ADAMSON AW, 1982, PHYS CHEM SURFACES AZZAM RMA, 1987, ELLIPSOMETRY POLARIZ BEAGLEHOLE D, 1980, PHYSICA B, V100, P163 BEAGLEHOLE D, 1986, FLUID INTERFACIAL PH BORN M, 1980, PRINCIPLES OPTICS CHO JHJ, 2002, J CHEM PHYS, V116, P3058 CROXTON CA, 1986, FLUID INTERFACIAL PH DRUDE P, 1959, THEORY OPTICS KAYSER RF, 1986, PHYS REV B, V34, P3254 LAW BM, 1981, J PHYS D, V14, P115 LAW BM, 2001, PROG SURF SCI, V66, P159 PERSHAN PS, 1984, PHYS REV LETT, V52, P759 TOLAN M, 1999, SPRINGER TRACTS MODE, V148 TVEEKREM JL, 1983, PHYS REV A, V27, P2773 NR 15 TC 2 PU AMER INST PHYSICS PI MELVILLE PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA SN 0034-6748 J9 REV SCI INSTR JI Rev. Sci. Instrum. PD AUG PY 2004 VL 75 IS 8 BP 2536 EP 2540 PG 5 SC Physics, Applied; Instruments & Instrumentation GA 849QQ UT ISI:000223555300006 ER PT J AU Marcus, Y Hefter, G TI Standard partial molar volumes of electrolytes and ions in nonaqueous solvents SO CHEMICAL REVIEWS LA English DT Review ID VISCOSITY-B-COEFFICIENTS; ULTRASONIC VIBRATION POTENTIALS; DIMETHYL-SULFOXIDE SOLUTIONS; 25 DEGREES C; SYMMETRICAL TETRAALKYLAMMONIUM BROMIDES; ALKALI-METAL IODIDES; ACETONITRILE-WATER MIXTURES; MEDIUM DIELECTRIC-CONSTANT; BJERRUM ASSOCIATION MODEL; AQUEOUS-ORGANIC SOLVENTS C1 Hebrew Univ Jerusalem, Dept Inorgan & Analyt Chem, IL-91904 Jerusalem, Israel. RP Marcus, Y, Hebrew Univ Jerusalem, Dept Inorgan & Analyt Chem, IL-91904 Jerusalem, Israel. 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Rev. PD JUL PY 2004 VL 104 IS 7 BP 3405 EP 3452 PG 48 SC Chemistry, Multidisciplinary GA 839FO UT ISI:000222769100007 ER PT J AU Dahoo, PR Girard, A Dumond, Y Tessier, M Keller, N Guyot, M TI Characterizaton of pulsed laser deposited SmFeO3 morphology: effect of fluence, substrate temperature and oxygen pressure SO APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING LA English DT Article ID FILMS AB The morphology of SmFeO3 thin films grown on quartz substrate by pulsed laser ablation (PLD) is studied by ex situ spectroscopic ellipsometry (SE), as a function of oxygen pressure (P-O2) and substrate temperature (T-S). Analysis of the films is performed with commercial Sentech software using simplex algorithm and roughness is determined using standard Bruggemann model. Results compare well with those obtained on some samples by transmission electronic microscope (TEM) for roughness and thickness, on the one hand and atomic force microscope (AFM) for roughness, on the other. They show that relative roughness varies with P-O2, linearly below 100 mTorr and non linearly above, but not with T-S. Comparison with results obtained for YIG (Y3Fe5O12) samples shows similar linear relation with P-O2 but with a smaller slope. In terms of fluence, it has been determined that roughness increases linearly for low values. T-S effect is observed namely on the structure and Faraday magneto-optic response of the films. Structure is amorphous for T-S below 755 degreesC and crystalline above with two types of structures, cubic and orthorhombic as shown by TEM. Similarly, for T-S below 755 degreesC, no magneto-optic response is observed. SE analysis in terms of Cauchy model shows optical constants of thin films to be lower than for bulk crystal at all P-O2 and T-S . C1 LMOV, UMR 8634, F-75035 Versailles, France. Off Natl Etud & Rech Aerosp, LEM, CNRS, Unite Mixte, F-92320 Chatillon, France. RP Dahoo, PR, LMOV, UMR 8634, 45 AV Etats Unis, F-75035 Versailles, France. EM prd@physique.uvsq.fr CR ASPNES DE, 1975, APPL OPTICS, V14, P220 ASPNES DE, 1978, REV SCI INSTRUM, V49, P291 AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ BRUGGEMAN DAG, 1935, ANN PHYS-BERLIN, V24, P636 DAHOO PR, 1999, 31 EGAS C MARS FRANC DORSEY PC, 1993, J APPL PHYS, V74, P1242 DRUDE P, 1887, ANN PHYS, V32, P584 GLOBUS A, 1979, 2088689, FR IRENE EA, 1993, THIN SOLID FILMS, V233, P96 KAHN FJ, 1969, PHYS REV, V186, P891 KRISHNAN R, 1995, J MAGN MAGN MATER, V147, L221 MISTRIK Y, 2002, THESIS U VERSAILLES POPOVA O, 2001, THESIS U VERSAILLES SCHMOOL DS, 1999, J APPL PHYS, V86, P5712 YANG CJ, 1994, IEEE T MAGN 1, V30, P4527 NR 15 TC 0 PU SPRINGER PI NEW YORK PA 233 SPRING STREET, NEW YORK, NY 10013 USA SN 0947-8396 J9 APPL PHYS A-MAT SCI PROCESS JI Appl. Phys. A-Mater. Sci. Process. PD SEP PY 2004 VL 79 IS 4-6 BP 1399 EP 1403 PG 5 SC Materials Science, Multidisciplinary; Physics, Applied GA 839EL UT ISI:000222766100160 ER PT J AU Scholl, E TI Pattern formation in semiconductors: control of spatio-temporal dynamics SO ANNALEN DER PHYSIK LA English DT Article DE pattern formation; chaos control; delayed feedback; semiconductor nanostructures ID DELAYED FEEDBACK-CONTROL; GAS-DISCHARGE SYSTEM; REACTION-DIFFUSION SYSTEMS; DISSIPATIVE SOLITONS; SELF-OSCILLATIONS; CURRENT FILAMENTS; PERIODIC-ORBITS; CHAOS; SUPERLATTICES; DOMAINS AB Semiconductors driven far from thermodynamic equilibrium by an applied do voltage exhibit a variety of spatio-temporal electronic instabilities including complex and chaotic scenarios. We study stabilization of chaotic spatio-temporal patterns in spatially extended semiconductor models by time delayed feedback control. Different control schemes, e.g., a diagonal control matrix, or global control, or combinations of both, are compared. Specifically, we use two models of semiconductor nanostructures which are of particular current interest: (i) superlattice, (ii) double-barrier resonant-tunneling diode. (C) 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. C1 Tech Univ Berlin, Inst Theoret Phys, D-10623 Berlin, Germany. RP Scholl, E, Tech Univ Berlin, Inst Theoret Phys, Hardenbergstr 36, D-10623 Berlin, Germany. EM schoell@physik.tu-berlin.de CR ALEKSEEV A, 1998, PHYS REV E A, V57, P2640 AMANN A, 2001, PHYS REV E, V63 AMANN A, 2002, PHYS REV B, V65 AMMELT E, 1997, PHYS REV E A, V55, P6731 ASTROV YA, 1998, PHYS REV LETT, V80, P5341 BABA N, 2002, PHYS REV LETT, V89 BALANOV AG, 2004, UNPUB PHYSICA D BECK O, 2002, PHYS REV E 2, V66 BLEICH ME, 1996, PHYS LETT A, V210, P87 BODE M, 1995, PHYSICA D, V86, P53 BODE M, 2002, PHYSICA D, V161, P45 BODEKER HU, 2003, PHYS REV E 2, V67 BONILLA LL, 2002, J PHYS-CONDENS MAT, V14, R341 BRAUER I, 2000, PHYS REV LETT, V84, P4104 BULASHENKO OM, 1995, PHYS REV B, V52, P7849 BULASHENKO OM, 1999, PHYS REV B, V60, P5694 CHEIANOV V, 2000, PHYS REV B, V62, P9966 COOPER DP, 1995, Z NATURFORSCH A, V50, P117 DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 ESAKI L, 1970, IBM J RES DEV, V14, P61 FRANCESCHINI G, 1999, PHYS REV E, V60, P5426 HEIDEMANN G, 1993, PHYS LETT A, V177, P225 HOFBECK K, 1996, PHYS LETT A, V218, P349 JANSON NB, 2004, IN PRESS PHYS REV LE JUST W, 1997, PHYS REV LETT, V78, P203 JUST W, 1999, PHYS LETT A, V254, P158 JUST W, 2000, PHYS REV E A, V61, P5045 JUST W, 2003, PHYS REV E 2, V67 KASTRUP J, 1995, PHYS REV B, V52, P13761 LUO KJ, 1998, PHYS REV LETT, V81, P1290 MEIXNER M, 2000, EUR PHYS J B, V13, P157 MULLER I, 1999, PHYS REV LETT, V82, P3428 NAKAJIMA H, 1997, PHYS LETT A, V232, P207 NIEDERNOSTHEIDE FJ, 1992, PHYS REV B, V46, P7559 NIEDERNOSTHEIDE FJ, 1992, PHYS STATUS SOLIDI B, V172, P249 NIEDERNOSTHEIDE FJ, 1995, NONLINEAR DYNAMICS P NIEDERNOSTHEIDE FJ, 1997, PHYS REV E, V55, P4107 OTT E, 1990, PHYS REV LETT, V64, P1196 PURWINS HG, 1987, FESTKOR-ADV SOLID ST, V27, P27 PYRAGAS K, 1992, PHYS LETT A, V170, P421 RADEHAUS C, 1992, PHYS REV A, V45, P2546 SCHENK CP, 1997, PHYS REV LETT, V78, P3781 SCHLESNER J, 2003, PHYS REV E 2, V68 SCHOLL E, 1987, NONEQUILIBRIUM PHASE SCHOLL E, 1993, EUROPHYS LETT, V24, P159 SCHOLL E, 2001, NONLINEAR SPATIOTEMP SCHOLL E, 2002, PHYSICA B, V314, P113 SCHOMBURG E, 1999, ELECTRON LETT, V35, P1491 SCHUSTER HG, 1999, HDB CHAOS CONTROL SHAW MP, 1992, PHYS INSTABILITIES S SOCOLAR JES, 1994, PHYS REV E, V50, P3245 STRUMPEL C, 2002, PHYS REV E 2, V65 UNKELBACH J, 2003, PHYS REV E 2, V68 WACKER A, 2002, PHYS REP, V357, P1 ZHANG YH, 1996, PHYS REV LETT, V77, P3001 NR 55 TC 0 PU WILEY-V C H VERLAG GMBH PI WEINHEIM PA PO BOX 10 11 61, D-69451 WEINHEIM, GERMANY SN 0003-3804 J9 ANN PHYS-BERLIN JI Ann. Phys.-Berlin PD JUL-AUG PY 2004 VL 13 IS 7-8 BP 403 EP 413 PG 11 SC Physics, Multidisciplinary GA 837OH UT ISI:000222644300004 ER PT J AU Piekarski, H Piekarska, A Kubalczyk, K TI Single ionic volumes in acetonitrile-organic cosolvent mixtures at 298.15 K SO ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-INTERNATIONAL JOURNAL OF RESEARCH IN PHYSICAL CHEMISTRY & CHEMICAL PHYSICS LA English DT Article DE excess molar volume; apparent molar volume; TPTB assumption; preferential solvation; electrostriction ID PARTIAL MOLAL VOLUMES; DIPOLAR APROTIC-SOLVENTS; ULTRASONIC VIBRATION POTENTIALS; PROPYLENE CARBONATE; HEAT-CAPACITIES; DIMETHYL-SULFOXIDE; BINARY-MIXTURES; HEXAMETHYLPHOSPHORIC TRIAMIDE; WATER-ACETONITRILE; ELECTROLYTES AB Densities of binary nonaqueous mixtures of acetonitrile (AN) with 2-methoxyethanol (ME), N,N-dimethylacetamide (DMA) and propylene carbonate (PC) were determined over the whole composition range at 298.15 K. The excess molar volumes and the partial molar volumes of both components were calculated from these data. Densities of solutions of NaI, NaBPh4 and Ph4PI in solvent mixtures AN + ME and AN + DMA and of NaI solutions in mixtures of AN + PC were measured over the whole composition range of the mixed solvents at an electrolyte concentration equal 0.05 mol dm(-3). From these densities, apparent molar volumes of electrolytes and ions were evaluated and analyzed. the relationship between the apparent molar volumes of ions and (kappa(T)/epsilon) parameter was tested and discussed. C1 Univ Lodz, Dept Phys Chem, PL-90236 Lodz, Poland. RP Kubalczyk, K, Univ Lodz, Dept Phys Chem, Pomorska 165, PL-90236 Lodz, Poland. EM kchfpiek@uni.lodz.pl CR ALEXANDER R, 1967, J AM CHEM SOC, V89, P5549 ATKINS P, 1991, J SOLUTION CHEM, V20, P1059 AZNAREZ S, 2002, J SOLUTION CHEM, V31, P639 BAKSHI MS, 1996, J CHEM ENG DATA, V41, P1459 BARTHEL JMG, 1998, PHYS CHEM ELECTROLYT BENSON SW, 1963, J PHYS CHEM-US, V67, P1194 COMELLI F, 1998, J CHEM ENG DATA, V43, P333 COMELLI F, 1999, J CHEM ENG DATA, V44, P144 COX BG, 1984, J CHEM SOC FARAD T 1, V80, P1267 DACK MRJ, 1975, AUST J CHEM, V28, P955 DESNOYERS JE, 1976, ADV CHEM SER, V155, P274 DEVISSER C, 1978, J CHEM SOC FARAD T 1, V74, P1159 DRUDE P, 1894, Z PHYS CHEM, V15, P79 EIGEN M, 1954, J PHYS CHEM-US, V58, P702 FRANK HS, 1957, DISCUSS FARADAY SOC, P133 GURNEY RM, 1953, IONIC PROCESSES SOLU HANDA YP, 1981, J SOLUTION CHEM, V10, P291 HEFTER G, 1997, J SOLUTION CHEM, V26, P249 HEFTER GT, 1990, J SOLUTION CHEM, V19, P207 KAWAIZUMI F, 1991, B CHEM SOC JPN, V64, P510 KINART CM, 2001, PHYS CHEM LIQ, V39, P589 KOLKER AM, 1992, THERMOCHIM ACTA, V211, P73 KOLLING OW, 1987, ANAL CHEM, V59, P674 KRAKOWIAK J, 2000, J MOL LIQ, V88, P197 KRUMGALZ BS, 1980, J CHEM SOC F1, V76, P1887 LAWRENCE KG, 1989, J CHEM SOC FARAD T 1, V85, P23 MARCHESELLI L, 1992, J CHEM SOC FARADAY T, V88, P3159 MILLERO FJ, 1969, J PHYS CHEM-US, V73, P2417 MILLERO FJ, 1971, BIOPHYSICAL PROPERTI MILLERO FJ, 1971, CHEM REV, V71, P147 MILLERO FJ, 1972, STRUCTURE TRANSPORT MOUMOUZLAS G, 1991, J CHEM ENG DATA, V36, P20 PIEKARSKI H, IN PRESS J MOL LIQ PIEKARSKI H, 1990, J SOLUTION CHEM, V19, P923 PIEKARSKI H, 1992, J SOLUTION CHEM, V21, P6 RIDDICK JA, 1986, ORGANIC SOLENTS SEN U, 1978, INDIAN J CHEM A, V16, P104 SINGH P, 1983, AUST J CHEM, V36, P1675 TAMURA K, 1994, J SOLUTION CHEM, V23, P263 WEISSBERGER A, 1955, TECHNIQUE ORGANIC CH, V2 ZANA R, 1979, J SOLUTION CHEM, V8, P729 ZANA R, 1982, J PHYS CHEM-US, V86, P3996 ZHAO Y, 2000, J CHEM ENG DATA, V45, P440 NR 43 TC 1 PU R OLDENBOURG VERLAG PI MUNICH PA LEKTORAT MINT, POSTFACH 80 13 60, D-81613 MUNICH, GERMANY SN 0942-9352 J9 Z PHYS CHEM JI Z. Phys. Chemie-Int. J. Res. Phys. Chem. Chem. Phys. PY 2004 VL 218 IS 6 BP 679 EP 698 PG 20 SC Chemistry, Physical; Physics, Atomic, Molecular & Chemical GA 834AH UT ISI:000222383100005 ER PT J AU Rafai, S Bonn, D Bertrand, E Meunier, J Weiss, VC Indekeu, JO TI Long-range critical wetting: Observation of a critical end point SO PHYSICAL REVIEW LETTERS LA English DT Article ID WATER; TRANSITIONS; ALKANES; 1ST-ORDER; BEHAVIOR; PENTANE; FORCES; HEXANE AB Alkanes deposited on aqueous substrates exhibit two different types of wetting behavior: alternatively to the usual first-order wetting transition, a sequential-wetting scenario of a long-range critical wetting transition preceded by a first-order thin-thick transition may be observed. Here, we present the first successful experimental attempt to locate the transition point between the standard first-order wetting and the long-range critical wetting: a critical end point, observed in a mixture of pentane and hexane which is deposited on an aqueous solution of glucose. Furthermore, we present the first direct measurement of the contact angle in the intermediate wetting state (frustrated-complete wetting) in the sequential-wetting scenario of hexane on brine and compare to theoretical predictions. C1 Univ Paris 06, ENS, Lab Phys Stat, CNRS,UMR 8550, F-75231 Paris 05, France. Univ Paris 07, ENS, Lab Phys Stat, CNRS,UMR 8550, F-75231 Paris, France. Katholieke Univ Leuven, Lab Vaste Stoffys & Magnetisme, B-3001 Louvain, Belgium. Univ Amsterdam, WZI, Amsterdam, Netherlands. RP Rafai, S, Univ Paris 06, ENS, Lab Phys Stat, CNRS,UMR 8550, 24 Rue Lhomond, F-75231 Paris 05, France. CR BERGERON V, 2000, NATURE, V405, P772 BERTRAND E, 2000, PHYS REV LETT, V85, P1282 BERTRAND E, 2001, PHYS REV LETT, V86, P3208 BERTRAND E, 2002, J PETROL SCI ENG, V33, P217 BONN D, 2001, REP PROG PHYS, V64, P1085 BROCHARDWYART F, 1991, LANGMUIR, V7, P335 CAHN JW, 1977, J CHEM PHYS, V66, P3667 DELCERRO C, 1980, J COLLOID INTERF SCI, V78, P362 DIETRICH S, 1985, PHYS REV B, V31, P4718 DOBBS H, 2001, J CHEM PHYS, V114, P468 DRUDE P, 1920, THEORY OPTICS INDEKEU JO, 1999, J STAT PHYS, V95, P1009 ISRAELACHVILI JN, 1985, INTERMOLECULAR SURFA LEVIN Y, 2001, EUROPHYS LETT, V56, P187 NAKANISHI H, 1982, PHYS REV LETT, V49, P1565 RAGIL K, 1996, PHYS REV LETT, V77, P1532 ROSS D, 1999, NATURE, V400, P737 ROWLINSON JS, 1982, MOL THEORY CAPILLARI SAAM WF, 1995, J LOW TEMP PHYS, V101, P225 SHAHIDZADEH N, 1998, PHYS REV LETT, V80, P3992 SHAHIDZADEH N, 2003, TRANSPORT POROUS MED, V52, P213 SHENOY VB, 1995, PHYS REV LETT, V75, P4086 WEISS VC, 2001, PHYSICA A, V292, P137 WEISS VC, 2003, J CHEM PHYS, V118, P10741 NR 24 TC 3 PU AMERICAN PHYSICAL SOC PI COLLEGE PK PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA SN 0031-9007 J9 PHYS REV LETT JI Phys. Rev. Lett. PD JUN 18 PY 2004 VL 92 IS 24 AR 245701 DI ARTN 245701 PG 4 SC Physics, Multidisciplinary GA 830HO UT ISI:000222112900033 ER PT J AU Cruz, LR Legnani, C Matoso, IG Ferreira, CL Moutinho, HR TI Influence of pressure and annealing on the microstructural and electro-optical properties of RF magnetron sputtered ITO thin films SO MATERIALS RESEARCH BULLETIN LA English DT Article DE thin films; sputtering; microstructure; electrical properties; optical properties ID SUBSTRATE-TEMPERATURE; OXIDE; CRYSTALLIZATION; TARGET AB Indium tin oxide thin films were deposited at room temperature by RF magnetron sputtering, under different pressures, and annealed in vacuum (10(-6) Torr) in the 473-573 K temperature range. The microstructure of the films was analyzed in order to investigate its dependence on deposition pressure and annealing temperature. A correlation between microstructure and electro-optical properties was also established. Films produced at low pressures are crystalline and have higher conductivity than films deposited at high pressures. Films produced at high pressures are amorphous, but can be crystallized by annealing. With the increase in crystallinity, shifts of the absorption and plasma resonance edges to shorter wavelengths, attributed to an increase in carrier concentration, were observed at the transmittance spectra. (C) 2004 Elsevier Ltd. All rights reserved. C1 Inst Mil Engn, BR-22290270 Rio De Janeiro, Brazil. Natl Renewable Energy Lab, Golden, CO 80401 USA. RP Cruz, LR, Inst Mil Engn, Praca Gen Tiburcio 80, BR-22290270 Rio De Janeiro, Brazil. EM leilacruz@ime.eb.br CR BAIA I, 1999, THIN SOLID FILMS, V337, P171 BUBE RH, 1960, PHOTOCONDUCTIVITY SO BURSTEIN E, 1954, PHYS REV, V93, P632 DRUDE P, 1900, PHYS Z, V1, P161 KULKARNI AK, 1999, THIN SOLID FILMS, V345, P273 MATSUDA Y, 1999, THIN SOLID FILMS, V345, P167 MENG LJ, 1998, THIN SOLID FILMS, V322, P56 MORIKAWA H, 1999, THIN SOLID FILMS, V339, P309 MORIKAWA H, 2000, THIN SOLID FILMS, V359, P61 PANKOVE JJ, 1971, OPTICAL PROCESSES SE ROHDE D, 1997, THIN SOLID FILMS, V305, P164 TERZINI E, 2000, MAT SCI ENG B-SOLID, V77, P110 THILAKAN P, 2001, THIN SOLID FILMS, V388, P34 NR 13 TC 3 PU PERGAMON-ELSEVIER SCIENCE LTD PI OXFORD PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND SN 0025-5408 J9 MATER RES BULL JI Mater. Res. Bull. PD JUN 8 PY 2004 VL 39 IS 7-8 BP 993 EP 1003 PG 11 SC Materials Science, Multidisciplinary GA 828WW UT ISI:000222005400015 ER PT J AU Aspnes, DE TI Expanding horizons: new developments in ellipsometry and polarimetry SO THIN SOLID FILMS LA English DT Article DE ellipsometry; Mueller-matrix; polarimetry ID SPECTROSCOPIC ELLIPSOMETRY; POLARIZED-LIGHT; MUELLER MATRIX; ULTRAVIOLET; DESIGN; PARAMETERS; OPERATION; PRECISION; FILMS AB This is the eighth in the aperiodic series of ellipsometry conferences, and the third devoted specifically to spectroscopic ellipsometry. I discuss the evolution of the field mainly from a technological perspective, and the changes that must be made in analytic procedures as accuracy requirements are increased from 1 to 0.1%. The current interest in Mueller-matrix spectroscopy motivates a discussion on how to include depolarization artifacts in Mueller-matrix calculations from first principles. Representative applications include extensions to the far infrared and vacuum ultraviolet, the determination of all elements of the Mueller matrix with a stationary sample, and the determination of critical dimensions by scatterometry. (C) 2003 Elsevier B.V. All rights reserved. C1 N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA. RP Aspnes, DE, N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA. EM aspnes@unity.ncsu.edu CR ASPNES DE, 1973, OPT COMMUN, V8, P222 ASPNES DE, 2004, J OPT SOC AM A, V21, P403 AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ BARAKAT R, 1981, OPT COMMUN, V38, P159 BENFERHAT R, 1991, VIDE, V47, P264 BORN M, 1975, PRINCIPLES OPTICS BUDDE W, 1962, APPL OPTICS, V1, P201 CAHAN BD, 1969, SURF SCI, V16, P166 CHEN C, 2003, PHYS REV LETT, V90 COLLINS RW, 1999, J OPT SOC AM A, V16, P1997 DREVILLON B, 1993, PROG CRYST GROWTH CH, V27, P1 DRUDE P, 1887, ANN PHYS, V32, P584 DRUDE P, 1890, ANN PHYS CHEM, V39, P481 FAUCHER JA, 1958, J OPT SOC AM, V48, P51 HALL AC, 1969, SURF SCI, V16, P1 HAUGE PS, 1973, IBM J RES DEV, V17, P472 HAUGE PS, 1975, OPT COMMUN, V14, P431 HAUGE PS, 1976, SURF SCI, V56, P148 JELLISON GE, 1997, APPL OPTICS, V36, P8184 JELLISON GE, 1998, THIN SOLID FILMS, V313, P33 KENT CV, 1937, J OPT SOC AM, V27, P117 LENG JM, 1999, J VAC SCI TECHNOL A, V17, P380 OPSAL J, COMMUNICATION OPSAL J, 1998, THIN SOLID FILMS, V313, P58 OPSAL J, 2002, P SOC PHOTO-OPT INS, V4689, P163 PASSAGLIA E, 1964, ELLIPSOMETRY MEASURE ROTHEN A, 1945, REV SCI INSTRUM, V16, P26 ROTHEN A, 1964, ELLIPSOMETRY MEASURE, P7 SCHUBERT M, 1996, PHYS REV B, V53, P4265 SCHUBERT M, 2003, J OPT SOC AM A, V20, P347 SERKOWSKI K, 1974, PLANETS STARS NEBULA, P135 THOMPSON RC, 1980, APPL OPTICS, V19, P1323 TRONSTAD L, 1933, T FARADAY SOC, V29, P502 VEDAM K, 1998, THIN SOLID FILMS, V313, P1 WAGNER T, 2001, PHYS STATUS SOLIDI A, V188, P1553 NR 35 TC 3 PU ELSEVIER SCIENCE SA PI LAUSANNE PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND SN 0040-6090 J9 THIN SOLID FILMS JI Thin Solid Films PD MAY 1 PY 2004 VL 455-56 BP 3 EP 13 PG 11 SC Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter GA 824MF UT ISI:000221690000002 ER PT J AU Schubert, M Hofmann, T Herzinger, CM TI Far-infrared magnetooptic generalized ellipsometry: determination of free-charge-carrier parameters in semiconductor thin film structures SO THIN SOLID FILMS LA English DT Article DE free-charge-carrier; Mueller matrix; Drude model; generalized ellipsometry; magneto-optics ID EPITAXIAL-GROWTH; EFFECTIVE-MASS; DOPED GAAS; ALLOYS; SYSTEMS; BGAINAS AB We report on the application of generalized ellipsometry at far-infrared wavelengths (150-600 cm(-1)) for measurement of the anisotropic dielectric response of doped polar semiconductors in layered structures within an external magnetic field. Measurement of normalized Mueller matrix elements allows for independent determination of the free-charge-carrier parameters density, mobility and effective mass for semiconductor alloy materials in layered structures upon application of the Drude model, thereby dispensing with the need for electrical measurements. Examples reviewed here include n-type/i-type GaAs, n-type GaAs/n-type Al0.19Ga0.33In0.48P/i-type GaAs, and n-type B0.03In0.06Ga0.91As/i-type GaAs layer structures, measured at room-temperature and magnetic fields up to +/-3 T. (C) 2003 Elsevier B.V. All rights reserved. C1 Univ Leipzig, Fac Phys & Geosci, Inst Expt Phys 2, Leipzig, Germany. JA Woollam Co Inc, Lincoln, NE 68508 USA. RP Schubert, M, Univ Leipzig, Fac Phys & Geosci, Inst Expt Phys 2, Leipzig, Germany. EM mschub@physik.uni-leipzig.de CR ADACHI S, 1994, GAAS RELATED MAT ASPNES DE, 1998, HDB OPTICAL CONSTANT, V1, P89 AZZAM RMA, 1972, J OPT SOC AM, V62, P1521 AZZAM RMA, 1984, ELLIPSOMETRY POLARIZ BURSTEIN E, 1974, POLARITIONS CARDONA M, 1961, PHYS REV, V121, P756 DRUDE P, 2002, THEORY OPTICS EMANUELSSON P, 1994, APPL PHYS LETT, V64, P2849 GEISZ JF, 2000, APPL PHYS LETT, V76, P1443 GEISZ JF, 2001, J CRYST GROWTH, V225, P372 GOTTSCHALCH V, 2003, J CRYST GROWTH, V248, P468 HART GLW, 2000, PHYS REV B, V62, P13522 HOFMANN T, 2001, PHYS REV B, V64 HOFMANN T, 2003, APPL PHYS LETT, V82, P3463 HOKE WE, 1993, J VAC SCI TECHNOL B, V11, P902 JELLISON GE, 1998, THIN SOLID FILMS, V313, P33 KASIC A, 2000, PHYS REV B, V62, P7365 KITTLE C, 1985, INTRO SOLID STATE PH PIDGEON CR, 1980, HDB SEMICONDUCTORS, P2 RAETHER H, 1988, SURFACE POLARITIONS RAYMOND A, 1979, J PHYS C SOLID STATE, V12, P2289 ROSELER A, 1992, INFRARED SPECTROSCOP SCHUBERT M, THEORY APPL GEN ELLI SCHUBERT M, 1996, J OPT SOC AM A, V13, P875 SCHUBERT M, 1996, PHYS REV B, V53, P4265 SCHUBERT M, 1998, THIN SOLID FILMS, V313, P323 SCHUBERT M, 1999, PHYS REV B, V60, P16618 SCHUBERT M, 2000, PHYS REV B, V61, P8187 SCHUBERT M, 2003, INTRO COMPLEX MEDIUM SCHUBERT M, 2003, J OPT SOC AM A, V20, P347 SCHUBERT M, 2004, UNPUB PHONONS PLASMO TISCHLER MA, 1992, J APPL PHYS, V71, P984 VURGAFTMAN I, 2001, J APPL PHYS 1, V89, P5815 WOLFE CM, 1989, PHYS PROPERTIES SEMI WONG SL, 1995, 22ND P INT C PHYS SE, V2, P1272 WRIGHT GB, 1961, J APPL PHYS, V32, P2113 YU PY, 1999, FUNDAMENTALS SEMICON ZUNGER A, 1997, MRS BULL, V22, P20 NR 38 TC 0 PU ELSEVIER SCIENCE SA PI LAUSANNE PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND SN 0040-6090 J9 THIN SOLID FILMS JI Thin Solid Films PD MAY 1 PY 2004 VL 455-56 BP 563 EP 570 PG 8 SC Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter GA 824MF UT ISI:000221690000103 ER PT J AU Schubert, M Hofmann, T Herzinger, CM Dollase, W TI Generalized ellipsometry for orthorhombic, absorbing materials: dielectric functions, phonon modes and band-to-band transitions of Sb2S3 SO THIN SOLID FILMS LA English DT Article DE dielectric functions; band-to-band transitions; phonon modes; anisotropy; generalized ellipsometry; stibnite AB Generalized ellipsometry allows complete extraction of the dielectric function tensor, including orientation, from measurement of skew-cut single crystal orthorhombic absorbing materials. As an example, Stibnite (Sb2S3) is studied to determine fundamental phonon modes and band-to-band transitions, which are here provided for polarization along axes a, b, and c from lineshape analysis of the major dielectric function spectra. (C) 2003 Elsevier B.V. All rights reserved. C1 Univ Leipzig, Inst Expt Phys 2, D-04103 Leipzig, Germany. JA Woollam Co Inc, Lincoln, NE 68508 USA. Univ Calif Los Angeles, Dept Earth & Space Sci, Los Angeles, CA 90095 USA. RP Schubert, M, Univ Leipzig, Inst Expt Phys 2, Linnestr 5, D-04103 Leipzig, Germany. EM mschub@physik.uni-leipzig.de CR AZZAM RMA, 1972, J OPT SOC AM, V62, P1521 DRUDE P, 1887, ANN PHYS, V32, P584 DRUDE P, 1888, ANN PHYS, V34, P489 FUJITA T, 1987, J PHYS SOC JPN, V56, P3734 JELLISON GE, 2004, HDB ELLIPSOMETRY POERSCHKE R, 1992, DATA SCI TECHNOLOGY RIEDE V, 1970, ANN PHYS-LEIPZIG, V25, P415 SCHUBERT M, 2002, OPT LETT, V27, P2073 SCHUBERT M, 2003, INTRO COMPLEX MEDIUM SCHUBERT M, 2004, HDB ELLIPSOMETRY SCHUBERT M, 2004, UNPUB SERIES SPRINGE SHUTOV SD, 1969, PHYS STATUS SOLIDI, V31, K23 TYNDALL EPT, 1923, PHYS REV, V21, P162 VESDESHWAR AG, 1995, J PHYS III, V5, P1161 NR 14 TC 1 PU ELSEVIER SCIENCE SA PI LAUSANNE PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND SN 0040-6090 J9 THIN SOLID FILMS JI Thin Solid Films PD MAY 1 PY 2004 VL 455-56 BP 619 EP 623 PG 5 SC Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter GA 824MF UT ISI:000221690000114 ER PT J AU Brogren, M Karlsson, B Roos, A Werner, A TI Analysis of the effects of outdoor and accelerated ageing on the optical properties of reflector materials for solar energy applications SO SOLAR ENERGY MATERIALS AND SOLAR CELLS LA English DT Article DE reflector materials; optical properties; accelerated ageing; outdoor ageing; long-term; durability ID BOOSTER REFLECTORS; CONCENTRATORS; COLLECTORS AB Lifetime tests of solar reflector materials are eligible prior to application, to prove the stability of the optical properties. In this work, six reflector materials were aged outdoors and in a climatic test chamber. The surfaces of the samples were inspected using profilometry and optical microscopy. The total and specular reflectance spectra were measured using spectrophotometry and the weighted solar reflectance values were calculated before and after ageing. Reflectors of silvered glass, anodised aluminium, thin film-coated anodised aluminium, and lacquered rolled aluminium withstood accelerated testing well, while a laminated evaporated aluminium reflector, which was specular initially, became diffuse. Laminated and lacquered reflectors withstood outdoor ageing better than expected from accelerated ageing and better than unprotected thin film-coated and anodised aluminium, which degraded significantly outdoors. Thus, optical degradation depends on climatic conditions and on the protective layer, if applicable. The discrepancy between results from outdoor and accelerated ageing shows that a thorough understanding of corrosion processes is necessary for drawing conclusions about long-term performance from accelerated ageing tests. (C) 2004 Elsevier B.V. All rights reserved. C1 Univ Uppsala, Div Solid State Phys, Dept Engn Sci, SE-75121 Uppsala, Sweden. Vattenfall Utveckling AB, SE-81426 Alvkarleby, Sweden. Lund Univ, Dept Construct & Architecture, SE-22100 Lund, Sweden. RP Brogren, M, Univ Uppsala, Div Solid State Phys, Dept Engn Sci, POB 534, SE-75121 Uppsala, Sweden. EM maria.brogren@angstrom.uu.se CR *ASTM E, 1992, 892 ASTM E *ISO, 1992, 98451 ISO BROGREN M, IN PRESS PROGR PHOTO BROGREN M, IN PRESS SOLAR ENERG DRUDE P, 1990, LEHRBUCH OPTIK FEND T, 2000, SOL ENERGY A, V68, P361 KARLSSON B, 1995, OSTHAMMAR HOSP HOT W KOEHL M, 2001, RENEW ENERG, V24, P597 MORRIS VL, 1980, SOL ENERG MATER, V3, P35 NOSTELL P, 1998, SOL ENERG MAT SOL C, V54, P235 NUWAYHID RY, 2001, RENEW ENERG, V24, P207 PERERS B, 1994, SOL ENERGY, V53, P215 RONNELID M, 1999, SOL ENERGY, V65, P343 ROOS A, 1989, SOL ENERG MATER, V18, P233 SHANER WW, 1975, SOL ENERGY, V17, P351 SWANSON RM, 2000, PROG PHOTOVOLTAICS, V8, P93 WEDEPOHL KH, 1995, GEOCHIM COSMOCHIM AC, V59, P1217 WHITFIELD GR, 1995, RENEW ENERG, V6, P469 NR 18 TC 1 PU ELSEVIER SCIENCE BV PI AMSTERDAM PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS SN 0927-0248 J9 SOLAR ENERG MATER SOLAR CELLS JI Sol. Energy Mater. Sol. Cells PD MAY 30 PY 2004 VL 82 IS 4 BP 491 EP 515 PG 25 SC Materials Science, Multidisciplinary; Energy & Fuels GA 825AP UT ISI:000221728700002 ER PT J AU Gadomsky, ON Kadochkin, AS TI Method of optical near-field microscopy of foreign atoms on the surface of nonabsorbing dielectrics upon Brewster reflection of light SO OPTICS AND SPECTROSCOPY LA English DT Article ID FILMS AB It is shown that, by means of measuring the frequency dependence of the ellipticity of light reflected at the Brewster angle from the plane surface of a nonabsorbing dielectric, one can reveal on it nanostructural objects consisting of foreign atoms or molecules. They manifest themselves by the presence of size resonances, arising in these structures in a field of optical radiation because of the dipole-dipole interaction of the atoms (molecules). A theoretical justification of the experimental technique that takes into account the presence of a transition layer on the surface of the dielectric is proposed. (C) 2004 MAN "Nauka/Interperiodica". C1 Ulyanovsk State Univ, Ulyanovsk 432700, Russia. RP Gadomsky, ON, Ulyanovsk State Univ, Ulyanovsk 432700, Russia. CR BARNES WL, 1998, J MOD OPTIC, V45, P661 BONCHBRUEVICH AM, 2000, OPT SPECTROSC+, V89, P402 BONCHBRUEVICH AM, 2001, OPT SPECTROSC+, V91, P779 BORN M, 1969, PRINCIPLES OPTICS DRUDE P, 1894, WIED ANN, V51, P77 DRUDE P, 1935, LEHRBUCH OPTIK GADOMSKII ON, 2000, OPT SPECTROSC+, V89, P261 GADOMSKII ON, 2000, USP FIZ NAUK+, V170, P1145 GADOMSKY ON, 1996, J OPT SOC AM B, V13, P1679 GADOMSKY ON, 2001, J EXP THEOR PHYS+, V92, P1060 GADOMSKY ON, 2001, OPT SPECTROSC+, V91, P749 HILLENBRAND R, 2002, APPL PHYS LETT, V80, P25 HILLENBRAND R, 2002, NATURE, V418, P159 KIZEL VA, 1954, ZH EKSP TEOR FIZ, V26, P228 KIZEL VA, 1973, REFLECTION LIGHT KNOLL B, 1999, NATURE, V399, P134 KRUTITSKY KV, 1997, J PHYS B-AT MOL OPT, V30, P5341 POPPE GPM, 1991, PHYS REV B, V44, P7917 SIVUKHIN DV, 1956, ZH EKSP TEOR FIZ, V30, P374 SPEHT M, 1992, PHYS REV LETT, V68, P476 NR 20 TC 0 PU OPTICAL SOC AMER PI WASHINGTON PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA SN 0030-400X J9 OPT SPECTROSC JI Opt. Spectrosc. PD APR PY 2004 VL 96 IS 4 BP 586 EP 594 PG 9 SC Optics; Spectroscopy GA 824TY UT ISI:000221710800020 ER PT J AU Durose, K Asher, SE Jaegermann, W Levi, D McCandless, BE Metzger, W Moutinho, H Paulson, PD Perkins, CL Sites, JR Teeter, G Terheggen, M TI Physical characterization of thin-film solar cells SO PROGRESS IN PHOTOVOLTAICS LA English DT Review DE thin-film solar cell; characterization; chemical analysis; microstructure; optical properties; spatially resolved functionality ID BEAM-INDUCED CURRENT; SCANNING CAPACITANCE MICROSCOPY; DEPENDENT DEFECT FORMATION; ATOMIC-FORCE MICROSCOPY; X-RAY-DIFFRACTION; GRAIN-BOUNDARIES; PHOTOLUMINESCENCE SPECTROSCOPY; POTENTIAL DISTRIBUTION; ELECTRONIC-STRUCTURE; SURFACE OXIDATION AB The principal techniques used in the physical characterization of thin-film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X-ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), photoluminescence and time-resolved photoluminescence (TRPL), electron-beam-induced current (EBIC) and light-beam-induced current (LBIC). For each method the particular applicability to thin-film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III-V materials, systems. Copyright (C) 2004 John Wiley Sons, Ltd. C1 Univ Durham, Dept Phys, Durham DH1 3LE, England. ETH, Inst Angew Phys, CH-8093 Zurich, Switzerland. Colorado State Univ, Dept Phys, Ft Collins, CO 80523 USA. Univ Delaware, Inst Energy Convers, Newark, DE 19716 USA. Tech Univ Darmstadt, Inst Mat Sci, D-64287 Darmstadt, Germany. Natl Renewable Energy Lab, Golden, CO 80401 USA. RP Durose, K, Univ Durham, Dept Phys, South Rd, Durham DH1 3LE, England. 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TECHNIQUES THIN VANLEEUWEN M, 1999, J APPL PHYS, V86, P1904 VATEL O, 1995, J APPL PHYS, V77, P2358 VICKERMAN JC, 1997, SURFACE ANAL PRINCIP VISOLYFISHER I, 2003, APPL PHYS LETT, V82, P556 WARREN BE, 1990, XRAY DIFFRACTION, P253 WEI K, 1999, J APPL PHYS, V85, P7418 WEIGHTMAN P, 1998, J ELECTRON SPECTROSC, V93, P165 WEINHARDT L, 2003, APPL PHYS LETT, V82, P571 WILLIAMS CC, 1999, ANNU REV MATER SCI, V29, P471 WILLIAMS DB, 1987, PRACTICAL ANAL ELECT WILLIAMS DB, 1996, TXB MAT SCI WILSON RG, 1989, PRACTICAL HDB DEPTH WU CJ, 1978, J APPL PHYS, V49, P2827 XIONG YM, 1994, P 1 WCPEC HAW 5 9 DE, P1759 XU Q, 1999, J APPL PHYS, V85, P2465 YOUNG RA, 1982, J APPL CRYSTALLOGR, V15, P430 YU ET, 1996, MAT SCI ENG R, V17, P147 YU P, 1999, FUNDAMENTAL SEMICOND, P333 YUE GZ, 2000, APPL PHYS LETT, V77, P3185 ZALLAR A, 1987, J VAC SCI TECHNOL A, V5, P2979 ZANIO K, 1978, SEMICONDUCT SEMIMET, V13, P90 ZOOK JD, 1980, APPL PHYS LETT, V37, P223 NR 187 TC 5 PU JOHN WILEY & SONS LTD PI CHICHESTER PA THE ATRIUM, SOUTHERN GATE, CHICHESTER PO19 8SQ, W SUSSEX, ENGLAND SN 1062-7995 J9 PROG PHOTOVOLTAICS JI Prog. Photovoltaics PD MAR-MAY PY 2004 VL 12 IS 2-3 BP 177 EP 217 PG 41 SC Physics, Applied; Energy & Fuels GA 810VG UT ISI:000220731200007 ER PT J AU Peez-Morales, M Pedrosa, JM Martin-Romero, MT Mobius, D Camacho, L TI Reversible trilayer formation at the air-water interface from a mixed monolayer containing a cationic lipid and an anionic porphyrin SO JOURNAL OF PHYSICAL CHEMISTRY B LA English DT Article ID BREWSTER-ANGLE MICROSCOPY; SCANNING FORCE MICROSCOPY; AIR/WATER INTERFACE; PHASE-TRANSITIONS; LANGMUIR MONOLAYERS; SOLUBLE PORPHYRIN; ULTRATHIN FILMS; ORGANIZATION; COLLAPSE; AMPHIPHILES AB The molecular organization of a cationic matrix (DOMA) as influenced by the presence of an anionic water-soluble porphyrin (TSPP), in the mixed monolayer, molar ratio TSPP/DOMA = 1:4, has been studied by pi-A isotherms, the reflection spectra, BAM images, and imaging ellipsometry at the air-water interface. A reversible collapse of the mixed film at high surface pressures is observed. The formation of an aggregate of the porphyrin molecules under compression is inferred from the reflection spectra. BAM images show the spontaneous formation of domains at 35 mN/m that become bigger during the spontaneous dense process at constant surface pressure. The reversible character of that process was also observed by BAM: The evaluation of the reflection spectra as well as the area fraction of the domains and the surrounding dark regions have led us to consider a trilayer structure for the TSPP/DOMA domains emerging during the collapse process. By using imaging ellipsometry on selected regions of interest (few microns), the thicknesses of domains (d(dom) = 5.045 nm) and surrounding areas (d(dark) = 1.764 nm) were estimated. These thickness values are in good agreement with the trilayer architecture where the DOMA molecules have retained the TSPP molecules by electrostatic interactions. C1 Univ Cordoba, Dept Quim Fis & Termodinam Aplicada, E-14071 Cordoba, Spain. Univ Pablo Olavide, Dept Ciencias Ambientales, E-41013 Seville, Spain. Max Planck Inst Biophys Chem, Abt Nanobiophoton, D-37077 Gottingen, Germany. RP Martin-Romero, MT, Univ Cordoba, Dept Quim Fis & Termodinam Aplicada, Campus Univ Rabanales,Ed Marie Curie, E-14071 Cordoba, Spain. EM qflcadel@uco.es CR AZZAM RMA, 1999, ELLIPSOMETRY POLARIZ BIRDI KS, 1994, LANGMUIR, V10, P623 BUZIN AI, 1999, J PHYS CHEM B, V103, P11372 CZIKKELY V, 1970, CHEM PHYS LETT, V6, P207 DEMUL MNG, 1994, LANGMUIR, V10, P2311 DEMUL MNG, 1998, LANGMUIR, V14, P2455 DENG JJ, 2002, J AM CHEM SOC, V124, P15194 DRUDE P, 1889, WIEDEMANNS ANN PHYS, V39, P532 DRUDE P, 1889, WIEDEMANNS ANN PHYS, V39, P865 FANG JY, 1997, J PHYS CHEM B, V101, P3147 FERREIRA M, 2002, J PHYS CHEM B, V106, P10395 FRIEDENBERG MC, 1994, LANGMUIR, V10, P1251 GAINES GLJ, 1966, INSOLUBLE MONOLAYERS GOURIER C, 2002, LANGMUIR, V18, P9434 GRUNIGER H, 1983, J CHEM PHYS, V79, P3701 GRUNIGER H, 1986, J CHEM PHYS, V85, P4966 HADA H, 1985, J PHYS CHEM-US, V89, P560 HONIG D, 1992, THIN SOLID FILMS, V210, P64 HUO Q, 2000, J AM CHEM SOC, V122, P7890 KAGANER VM, 1999, REV MOD PHYS, V71, P779 KUHN H, 1965, PURE APPL CHEM, V11, P345 KUHN H, 1999, PRINCIPLES PHYSICAL MARTIN MT, 1996, LANGMUIR, V12, P6554 MARTIN MT, 1996, THIN SOLID FILMS, V284, P663 PEDROSA JM, 2002, J PHYS CHEM B, V106, P2583 PEDROSA JM, 2002, LANGMUIR, V18, P7594 PEDROSA JM, 2002, PHYS CHEM CHEM PHYS, V4, P2329 PRIETO I, 1998, LANGMUIR, V14, P4175 RAMOS S, 1999, J CHEM PHYS, V110, P7021 RAPAPORT H, 2001, BIOPHYS J, V81, P2729 RIES HE, 1979, NATURE, V281, P287 RIES HE, 1987, LANGMUIR, V3, P853 SIEGEL S, 1992, J PHYS CHEM-US, V96, P8157 TSUKRUK VV, 1997, PROG POLYM SCI, V22, P247 VOLLHARDT D, 1996, J PHYS CHEM-US, V100, P4141 XUE JZ, 1992, PHYS REV LETT, V69, P474 ZHANG L, 2003, J PHYS CHEM B, V107, P2565 NR 37 TC 0 PU AMER CHEMICAL SOC PI WASHINGTON PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA SN 1520-6106 J9 J PHYS CHEM B JI J. Phys. Chem. B PD APR 8 PY 2004 VL 108 IS 14 BP 4457 EP 4465 PG 9 SC Chemistry, Physical GA 809MH UT ISI:000220640300035 ER PT J AU Benia, HM Guemmaz, A Schmerber, G Mosser, A Parlebas, JC TI Optical and electrical properties of sputtered ZrN compounds SO CATALYSIS TODAY LA English DT Article DE zirconium nitrides; reflectance; resistivity; optical constants; Drude's model ID CU/SI CONTACT SYSTEMS; ZIRCONIUM NITRIDES; FILMS; TIN; COATINGS; HFN AB We studied zirconium nitride layers prepared by reactive direct current (dc) magnetron sputtering and synthesized with nitrogen gas flow ranging from 1 to 9 sccm (standard centimeter cube per minute) N-2. We measured their electrical resistivity and recorded their X-ray diffraction patterns as well as their RBS spectra and optical reflectance curves. Thus we could determine their crystallographic structure, their nitrogen content and their optical properties by simulating the reflectance curves with Drude's model for stoichiometric and sub-stoichiometric samples, and an extended Drude model for over-stoichiometric samples. In this work, we focus on our stoichiometric sample S4, in order to compare the dielectric function as well as the optical indexes n and k, deduced from fit optical parameters, with those given in literature. There is a good agreement between these results. Besides, we determined the "optical resistivity" of our several samples and compared them with the "electrical resistivity" measured by a four-probe method. Also, a good agreement is found between both curves, which confirms that the formalism used to simulate the reflectance curves is well adapted to these compounds. (C) 2004 Elsevier B.V. All rights reserved. C1 Univ Strasbourg 1, IPCMS, UMR 7504, CNRS, F-67034 Strasbourg 2, France. UFAS Univ, DAC Lab, Setif 19000, Algeria. RP Parlebas, JC, Univ Strasbourg 1, IPCMS, UMR 7504, CNRS, 23 Rue Loess,BP 43, F-67034 Strasbourg 2, France. EM jean-claude.parlebas@ipcms.u-strasbg.fr CR BENIA HM, 2002, APPL SURF SCI, V200, P231 BENIA HM, 2003, APPL SURF SCI, V201, P146 BLAHA P, 1985, PHYS REV B, V31, P2316 BURGHARTZ M, 2001, J NUCL MATER, V288, P233 CASAUX J, 1981, PHYSIQUE SOLIDE, P273 CHU WK, 1978, BACKSCATTERING SPECT DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 DRUDE P, 1900, ANN PHYSIK, V3, P369 DUNAND A, 1985, PHYS REV B, V31, P2299 IGARASHI Y, 1990, JPN J APPL PHYS, V29, P2337 JOHANSSON BO, 1986, J MATER RES, V1, P442 KARLSSON B, 1983, SOL ENERG MATER, V7, P401 MITTERER C, 1998, SURF COAT TECH, V108, P230 NECKEL A, 1983, INT J QUANTUM CHEM, V23, P1317 RUSSO RO, 1995, J SUSTAIN AGR, V5, P5 SCHWARZ K, 1985, PHYS REV B, V32, P8312 SPROUL WD, 1983, THIN SOLID FILMS, V107, P141 TAKEYAMA MB, 2000, J VAC SCI TECHNOL B, V18, P1333 TAKEYAMA MB, 2002, APPL SURF SCI, V190, P450 TANABE K, 1988, J APPL PHYS, V63, P1733 TOTH LE, 1971, TRANSITION METAL CAR VESZELEI M, 1994, APPL OPTICS, V33, P1993 WAUTELET M, 1996, J MATER RES, V11, P825 YOTSUYA T, 1997, CRYOGENICS, V37, P817 ZHITOMIRSKY VN, 1997, SURF COAT TECH, V94, P207 NR 25 TC 2 PU ELSEVIER SCIENCE BV PI AMSTERDAM PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS SN 0920-5861 J9 CATAL TODAY JI Catal. Today PD MAR 30 PY 2004 VL 89 IS 3 BP 307 EP 312 PG 6 SC Chemistry, Applied; Chemistry, Physical; Engineering, Chemical GA 808XR UT ISI:000220602300009 ER PT J AU Widmann, K Ao, T Foord, ME Price, DF Ellis, AD Springer, PT Ng, A TI Single-state measurement of electrical conductivity of warm dense gold SO PHYSICAL REVIEW LETTERS LA English DT Article ID STRONGLY COUPLED PLASMA; SIMPLE METAL; FEMTOSECOND; RESISTIVITY; 106-K AB We report on a single-state measurement of electrical conductivity of warm dense gold in the solid to plasma transition regime. This is achieved using the idealized slab plasma approach of isochoric heating of ultrathin samples by a femtosecond laser, coupled with femtosecond probe measurements of reflectivity and transmission. The experiment also reveals the time scale associated with the disassembly of laser heated solid. C1 Lawrence Livermore Natl Lab, Dept Phys & Adv Technol, Livermore, CA 94551 USA. Univ British Columbia, Dept Phys & Astron, Vancouver, BC V5Z 1M9, Canada. RP Widmann, K, Lawrence Livermore Natl Lab, Dept Phys & Adv Technol, Livermore, CA 94551 USA. CR *HIT DENSH CCTV, KP101A HIT DENSH CCT CAUBLE R, 1990, SPIE P, V1229, P221 DESILVA AW, 2000, J PHYS IV, V10, P209 DESJARLAIS MP, 2002, PHYS REV E 2, V66 DHARMAWARDANA MWC, 1992, PHYS LETT A, V163, P223 DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 FORSMAN A, 1998, PHYS REV E, V58, P1248 GINZBURG VL, 1970, PROPAGATION ELECTROM, P260 HOLIAN KS, 1984, LA10160MSUC34 LOS AL KLOSS A, 1996, PHYS REV E, V54, P5851 LEE YT, 1984, PHYS FLUIDS, V27, P1273 MEADEN GT, 1965, ELECT RESISTANCE MET MILCHBERG HM, 1988, PHYS REV LETT, V61, P2364 NG A, 1986, PHYS REV LETT, V57, P1595 NG A, 1994, PHYS REV LETT, V72, P3351 RINKER GA, 1985, PHYS REV B, V31, P4207 RINKER GA, 1985, PHYS REV B, V31, P4220 SALEEM S, 2001, PHYS REV E 2, V64 SCHOENLEIN RW, 1987, PHYS REV LETT, V58, P1680 NR 19 TC 1 PU AMERICAN PHYSICAL SOC PI COLLEGE PK PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA SN 0031-9007 J9 PHYS REV LETT JI Phys. Rev. Lett. PD MAR 26 PY 2004 VL 92 IS 12 AR 125002 DI ARTN 125002 PG 4 SC Physics, Multidisciplinary GA 807TU UT ISI:000220524600028 ER PT J AU Rynasiewicz, R TI Field unification in the Maxwell-Lorentz theory with absolute space SO PHILOSOPHY OF SCIENCE LA English DT Article AB Although Trautman (1966) appears to give a unified-field treatment of electrodynamics in Newtonian spacetime, there are difficulties in cogently interpreting it as such in relation to the facts of electromagnetic and magneto-electric induction. Presented here is a covariant, nonunified field treatment of the Maxwell-Lorentz theory with absolute space. This dispels a worry in Earman (1989) as to whether there are any historically realistic examples in which absolute space plays an indispensable role. It also shows how Trautman's formulation can be rendered coherent, albeit at the cost of deunification, by reinterpreting the Maxwell tensor as a composite object involving, in part, elements from Newtonian spacetime. C1 Johns Hopkins Univ, Dept Philosophy, Baltimore, MD 21218 USA. RP Rynasiewicz, R, Johns Hopkins Univ, Dept Philosophy, Baltimore, MD 21218 USA. EM ryno@lorentz.phl.jhu.edu CR DESCOUDRES T, 1889, ANN PHYS CHEM, V38, P71 DRUDE P, 2000, LEHRBUCH OPTIK EARMAN J, 1973, PHILOS SCI, V40, P329 EARMAN J, 1974, FDN PHYSICS, V4, P267 EARMAN J, 1989, WORLD ENOUGH SPACETI EINSTEIN A, 1905, ANN PHYS-BERLIN, V17, P891 FRIEDMAN M, 1983, FDN SPACETIME THEORI LORENTZ HA, 1904, P K AKAD WET-AMSTERD, V6, P809 LORENTZ HA, 1909, THEORY ELECT ITS APP LORENTZ HA, 1995, VERSUCH THEORIE ELEK RYNASIEWICZ R, 1988, PSA, V1, P67 TRAUTMAN A, 1966, PERSPECTIVES GEOMETR TROUTON FT, 1902, T R DUBLIN SOC, V7, P379 TROUTON FT, 1904, PHILOS T R SOC LOND, V202, P165 NR 14 TC 0 PU UNIV CHICAGO PRESS PI CHICAGO PA 1427 E 60TH ST, CHICAGO, IL 60637-2954 USA SN 0031-8248 J9 PHIL SCI JI Philos. Sci. PD DEC PY 2003 VL 70 IS 5 BP 1063 EP 1072 PG 10 SC History & Philosophy Of Science; History & Philosophy Of Science; History & Philosophy of Science GA 804BP UT ISI:000220274500018 ER PT J AU Singh, AV Mehra, RM Yoshida, A Wakahara, A TI Doping mechanism in aluminum doped zinc oxide films SO JOURNAL OF APPLIED PHYSICS LA English DT Article ID TRANSPARENT CONDUCTING OXIDES; CHEMICAL-VAPOR-DEPOSITION; ZNO THIN-FILMS; SPRAY PYROLYSIS; OPTICAL-PROPERTIES; TARGETS; AL AB The doping mechanism in aluminum doped zinc oxide films has been interpreted by considering the relationship between Hall mobility and effective mass of electrons with carrier concentrations. Both degeneracy and the nonparabolic nature of the conduction band are taken into account for determining the charge state of the dopant. It is ascertained that aluminum liberates one free carrier in the zinc oxide lattice by substituting the zinc atom. (C) 2004 American Institute of Physics. C1 Univ Delhi, Dept Elect Sci, New Delhi 110021, India. Toyohashi Univ Technol, Dept Elect & Elect Engn, Toyohashi, Aichi 4418580, Japan. RP Singh, AV, Univ Delhi, Dept Elect Sci, S Campus, New Delhi 110021, India. EM rammehra@netscape.net CR ADDONIZIO ML, 1999, THIN SOLID FILMS, V349, P93 AKTRAUZZAMAN AF, 1991, THIN SOLID FILMS, V198, P67 ALTAMIRANOJUARE.DC, 2001, SUPERFICIES VACIO, V13, P66 BURSTEIN E, 1954, PHYS REV, V93, P632 CMEN M, 1999, THESIS ACAD SINICA DRUDE P, 2000, Z PHYS, V1, P161 ELLMER K, 2001, J PHYS D APPL PHYS, V34, P3097 GORDON RG, 1997, P PHOTOVOLTAICS PROG, P39 GOYAL D, 1992, JPN J APPL PHYS PT 1, V31, P361 HARTNAGEL HL, 1955, SEMICONDUCTING TRANS HIELAND G, 1957, Z PHYS, V148, P15 HIRAMATSU M, 1998, J VAC SCI TECHNOL A, V16, P669 HU JH, 1991, SOL CELLS, V30, P437 HU JH, 1992, J APPL PHYS, V71, P880 JEONG WJ, 2001, SOL ENERG MAT SOL C, V65, P37 KIM H, 2000, APPL PHYS LETT, V76, P259 MAJOR S, 1983, THIN SOLID FILMS, V108, P333 MAJOR S, 1985, THIN SOLID FILMS, V125, P179 MINAMI T, 1985, JPN J APPL PHYS PT 1, V25, P781 MINAMI T, 2000, MRS BULL, V25, P38 NEWMAN G, 1981, PHY STATUS SOLIDI B, V105, P605 ODA S, 1985, JPN J APPL PHYS PT 1, V24, P1607 PEI ZL, 2001, J APPL PHYS, V90, P3432 PIDGEON CR, 1980, HDB SEMICONDUCTORS, V2, P231 PISARKIEWICZ T, 1989, THIN SOLID FILMS, V174, P271 SANCHEGJUAREZ A, 1992, SOL ENERG MAT SOL C, V52, P301 SINGH AV, 2001, J APPL PHYS, V90, P5661 SMITH RA, 1987, SEMICONDUCTORS+, P294 SUZUKI A, 1996, T MAT RES SOC JPN, V20, P526 TIBURCIOSILVER A, 1992, J PHYS III, V2, P1287 TOMINAGA K, 1997, J VAC SCI TECHNOL 1, V15, P1074 TOMINAGA K, 1998, J VAC SCI TECHNOL 1, V16, P1213 WU X, 1997, J VAC SCI TECHNOL 1, V15, P1057 ZAKRZEWSKA K, 1987, PHYS STATUS SOLIDI A, V99, P141 NR 34 TC 5 PU AMER INST PHYSICS PI MELVILLE PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA SN 0021-8979 J9 J APPL PHYS JI J. Appl. Phys. PD APR 1 PY 2004 VL 95 IS 7 BP 3640 EP 3643 PG 4 SC Physics, Applied GA 805BV UT ISI:000220342700060 ER PT J AU Kim, YS Yun, SS Park, CH Min, HS Park, YJ TI Influence of magnetic field on 1/f noise and thermal noise in multi-terminal homogeneous semiconductor resistors and discrimination between the number fluctuation model and the mobility fluctuation model for 1/f noise in bulk semiconductors SO SOLID-STATE ELECTRONICS LA English DT Article ID SINGLE INJECTION DIODES; 1-F NOISE; DIFFUSIVE CONDUCTORS; GAAS; UNIVERSALITY AB We have derived an accurate noise current density equation for homogeneous semiconductors under a constant magnetic field with three noise source terms which are the thermal noise source term and the two excess noise source terms due to either carrier number fluctuation or carrier mobility fluctuation. Based on Hooge's empirical relations for 1/f noise, the two excess noise source terms are shown to become equal to each other under zero magnetic field. Using the characteristic potential method and employing Hooge's empirical relations for 1/f noise, we have derived the formulas for the short-circuit terminal 1/f noise and thermal noise currents and the open-circuit terminal 1/f noise and thermal noise voltages of multi-terminal homogeneous semiconductor resistors with arbitrarily- shaped 2-D geometries under a constant magnetic field. We have shown that the derived formulas can explain the measured 1/f noise and thermal noise of n-GaAs rectangularly-shaped Hall devices and n-GaAs Corbino disks under magnetic field from 0 to 9 T at room temperature. It is also shown that the magnetic field dependence of 1/f noise in bulk semiconductors should be explained by the number fluctuation model rather than by the mobility fluctuation model. (C) 2003 Elsevier Ltd. All rights reserved. C1 Seoul Natl Univ, Sch Elect Engn, Kwannak Gu, Seoul 151600, South Korea. Seoul Natl Univ, ISRC, Kwannak Gu, Seoul 151600, South Korea. Kwangwoon Univ, Sch Elect Engn, Seoul 139701, South Korea. RP Min, HS, Seoul Natl Univ, Sch Elect Engn, Kwannak Gu, San 56-1,POB 34, Seoul 151600, South Korea. EM hsmin@amity.snu.ac.kr CR ASHCROFT NW, 1976, SOLID STTE PHYS BROPHY JJ, 1957, PHYS REV, V106, P675 BUTTIKER M, 1993, J PHYS-CONDENS MAT, V5, P9361 DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 HOOGE FN, 1969, PHYS LETT A, V29, P139 JACKSON J, 1975, CLASSICAL ELECTRODYN, P233 KLEINPENNING TGM, 1977, J APPL PHYS, V48, P2946 KLEINPENNING TGM, 1978, PHYSICA B, V94, P141 KLEINPENNING TGM, 1980, J APPL PHYS, V51, P3438 KLEINPENNING TGM, 1980, PHYSICA B, V98, P289 KUHN T, 1990, PHYS REV B, V42, P5702 NAH H, 1999, P 1999 INT SEM DEV R, P215 NOUGIER JP, 1991, EUROPEAN MAT RES SOC, V2, P183 PARK CH, 2002, J PHYS D APPL PHYS, V35, P637 REN L, 1991, PHYSICA B, V172, P319 REN L, 1993, PHYSICA B, V183, P40 SEEGER K, 1973, SEMICONDUCTOR PHYS SONG MH, 1985, J APPL PHYS, V58, P4221 SONG MH, 1988, J APPL PHYS, V64, P727 SUKHORUKOV EV, 1998, PHYS REV LETT, V80, P4959 SUKHORUKOV EV, 1999, PHYS REV B, V59, P13054 VANDERWEL AP, 2000, IEEE ELECTR DEVICE L, V21, P43 VANDERZIEL A, 1968, SOLID STATE ELECTRON, V11, P508 VANDERZIEL A, 1970, NOISE SOURCE CHARACT VANDEVOORDE P, 1981, PHYS REV B, V24, P4781 VANVLIET CM, 1985, PHYSICA A, V133, P35 VASE MJ, 1977, J APPL PHYS, V48, P5131 ZIJLSTRA RJJ, 1970, PHYSICA, V50, P331 NR 28 TC 2 PU PERGAMON-ELSEVIER SCIENCE LTD PI OXFORD PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND SN 0038-1101 J9 SOLID STATE ELECTRON JI Solid-State Electron. PD MAY PY 2004 VL 48 IS 5 BP 641 EP 654 PG 14 SC Engineering, Electrical & Electronic; Physics, Applied; Physics, Condensed Matter GA 801VL UT ISI:000220123300003 ER PT J AU Gelin, K Wackelgard, E TI Infrared emittance of Cu-x-Ni1-x alloys SO JOURNAL OF PHYSICS-CONDENSED MATTER LA English DT Article ID CU-NI ALLOYS; OPTICAL-ABSORPTION; RICH; STATES; PHOTOEMISSION; DENSITIES; COPPER; NICKEL; METALS AB The aim of this work was to study Cu-Ni alloys and establish a relation between alloy concentration and infrared emittance for wavelengths of the order 10 gm, which is of interest in room temperature applications. The resistivity was measured at room temperature for the same alloy compositions as the emittance in order to investigate the validity of the Hagen-Rubens relation in the infrared wavelength range for Cu-Ni. The Hagen-Rubens relation is verified for both the copper-rich and nickel-rich samples. We therefore assume strong electron scattering from impurities so that intraband transitions dominate over interband transitions in the infrared wavelength range. The validity of the Hagen-Rubens relation can, as a good approximation, also be used for the integrated thermal emittance. C1 Uppsala Univ, Dept Engn Sci, Div Solid State Phys, SE-75121 Uppsala, Sweden. RP Gelin, K, Uppsala Univ, Dept Engn Sci, Div Solid State Phys, Box 534, SE-75121 Uppsala, Sweden. EM Kristina.Gelin@angstrom.uu.se CR 1985, HDB OPTICAL CONSTANT 1992, HDB CHEM PHYS, V11 ANDERSON PW, 1961, PHYS REV, V124, P41 BEAGLEHOLE D, 1976, PHYS REV B, V14, P341 BEAGLEHOLE D, 1977, J PHYS F MET PHYS, V7, P1923 BOZORTH RM, 1951, FERROMAGNETISM CLINTON JR, 1974, J PHYS F MET PHYS, V4, P1162 DRUDE P, 1900, LEHRBUCH OPTIK DURHAM PJ, 1979, J PHYS F MET PHYS, V9, P1719 FRIEDEL J, 1958, NUOVO CIM SUPPL, V7, P287 GROSSE P, 1979, FREIE ELEKTRONEN FES KIM KJ, 1989, PHYS REV B, V39, P9882 KIRKPATRICK S, 1970, PHYS REV B, V1, P3250 KITTEL C, 1996, INTRO SOLID STATE PH LEGVOLD S, 1974, PHYS REV B, V9, P2386 LENHAM AP, 1966, OPTICAL PROPERTIES E LENHAM AP, 1967, J OPT SOC AM, V57, P473 LEVY A, 1987, PHYS REV B, V35, P9474 MOTT NF, 1958, THEORY PROPERTIES ME MUNOZ MC, 1982, J PHYS F MET PHYS, V12, P1497 ROSSITER PL, 1981, J PHYS F MET PHYS, P2105 SASOVSKAYA II, 1975, OPT SPECTROSC, V39, P64 SCHRODER K, 1967, PHYS REV, V162, P628 SEIB DH, 1970, PHYS REV B, V2, P1694 SEIB DH, 1970, PHYS REV B, V2, P1676 STOCKS GM, 1971, PHYS REV B-SOLID ST, V4, P4390 TOKUMOTO M, 1977, PHYS REV B, V16, P3497 NR 27 TC 2 PU IOP PUBLISHING LTD PI BRISTOL PA DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND SN 0953-8984 J9 J PHYS-CONDENS MATTER JI J. Phys.-Condes. Matter PD FEB 18 PY 2004 VL 16 IS 6 BP 833 EP 843 PG 11 SC Physics, Condensed Matter GA 800ID UT ISI:000220021100018 ER PT J AU Roberts, TM TI Measured and predicted behavior of pulses in Debye- and Lorentz-type materials SO IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION LA English DT Article DE electromagnetic propagation in dispersive media; microwave measurements; phase distortion; pulse analysis; pulse measurements AB Published laboratory measurements are found to agree with two groups' completely independent asymptotics for the decay and spread of transient pulses in a Debye model, and the spread in a Lorentz model. The measured dc-content pulses decay with depth nearly as x(-1/2) (water) and x(-1/3) (concrete) in coaxial cables. The measured full-widths at half-maximum spread nearly as the reciprocal of the decay rates. C1 USAF, Res Lab, SNHA, Hanscom AFB, MA 01731 USA. RP Roberts, TM, USAF, Res Lab, SNHA, Hanscom AFB, MA 01731 USA. EM Thomas.Roberts@hanscom.af.mil CR ADAIR RK, 1995, AVIAT SPACE ENVIR MD, V66, P792 AURAND JF, 1996, SAND962254 BIGELOW WS, 1999, 55 US AIR FORC RES L BRILLOUIN L, COMPT REND C INT EL, V2, P739 BRILLOUIN L, 1914, ANN PHYS-BERLIN, V44, P203 BRILLOUIN L, 1960, WAVE PROPAGATION GRO COURTNEY C, 1996, 48 US AIR FORC LAB D DEBIJE P, 1913, VERHANDLUNGEN DTSCH, V15, P777 DEBYE P, 1954, COLLECTED PAPERS P J, P158 DRUDE P, 1894, PHYS AETHERS, CH10 FARR EG, WLTR19977049, V2 FARR EG, WLTR19977050, V3 FARR EG, WLTR19977051, V4 FARR EG, 1997, ULTRA WIDEBAND ANTEN FOX M, 2001, OPTICAL PROPERTIES S, CH3 FRANKLIN S, 1984, AM J PHYS, V52, P786 FROST CA, 2002, 57 US AIR FORC RES L KELBERT M, 1996, PULSES OTHER WAVE PR LIN JC, 1975, IEEE T ELECTROMAGNET, V17, P93 LIN JC, 1976, J MICROWAVE POWER, V11, P67 PLESHKO P, 1969, PHYS REV LETT, V22, P1201 PLESHKO P, 1969, THESIS NY U NY ROBERTS T, PAVE PAWS RAD DECAYS ROBERTS TM, 1996, J OPT SOC AM A, V13, P1204 ROBERTS TM, 1999, J OPT SOC AM A, V16, P2799 ROBERTS TM, 2002, ELECTRON LETT, V38, P679 WIGINGTON RL, 1957, P IRE, V45, P166 NR 27 TC 2 PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC PI PISCATAWAY PA 445 HOES LANE, PISCATAWAY, NJ 08855 USA SN 0018-926X J9 IEEE TRANS ANTENNAS PROPAGAT JI IEEE Trans. Antennas Propag. PD JAN PY 2004 VL 52 IS 1 BP 310 EP 314 PG 5 SC Engineering, Electrical & Electronic; Telecommunications GA 778YQ UT ISI:000189269300035 ER PT J AU Mao, M Zhang, JH Yoon, RH Ducker, WA TI Is there a thin film of air at the interface between water and smooth hydrophobic solids? SO LANGMUIR LA English DT Article ID ATOMIC-FORCE MICROSCOPE; AQUEOUS-ELECTROLYTE SOLUTIONS; MULTIPLE-ANGLE ELLIPSOMETRY; PARAMETER-CORRELATION; ULTRATHIN FILMS; SURFACES; ATTRACTION; BUBBLE; LONG; NANOBUBBLES AB Optical measurements using an ellipsometer are inconsistent with the existence of continuous air films that are greater than about 0.1 nm in thickness at the interface between water and silicon wafers that have been rendered hydrophobic through the adsorption of silane agents. If adsorbed air consists of discrete bubbles, then the separation between the bubbles must be much greater than the radius of a bubble. For example, an approximate calculation for 80 nm radius bubbles that are attached with the macroscopic contact angle shows that the minimum spacing consistent with our data is in the range of 5 mum to infinite separation, depending on the sample. Although these putative bubbles would be sparsely distributed, we cannot rule out a density that is great enough to affect surface force apparatus measurements. A new variant of the multiple incidence method for ellipsometry is described and used to decrease the error in determining the thickness of adsorbed films. C1 Virginia Tech, Dept Chem, Blacksburg, VA 24060 USA. Virginia Tech, Dept Min & Minerals Engn, Blacksburg, VA 24060 USA. RP Ducker, WA, Virginia Tech, Dept Chem, Blacksburg, VA 24060 USA. 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RP Ihn, T, ETH Honggerberg, Solid State Lab, CH-8093 Zurich, Switzerland. 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DIMENSIONS; PROTEIN; MONOLAYERS; ELLIPSOMETRY AB A comparison of beta-casein and symmetrical triblock copolymer (PEO-PPO-PEO and PPO-PEO-PPO) adsorption layer properties at the air-water interface has been carried out by bubble tensiometry and ellipsometry. It has been verified that the equation of state parameters (pi similar to Gamma(y)) obtained from surface pressure (pi) and ellipticity in Brewster conditions ((ρ) over bar (B)), which is proportional to the surface concentration (Gamma) data, are the same as those obtained from dilational modulus epsilon and pi data. These two consistent approaches give further support to the theoretical model of block copolymers which has been previously developed for protein adsorption at fluid interfaces. It is shown that the interfacial behavior of the copolymer adsorption layer changes strongly as a function of the length of the hydrophilic and hydrophobic block sequences. The theoretical model may be used for the interpretation of the adsorption properties of the synthetic copolymers only when the size of the blocks is large enough. In the case of block copolymers, the coil is in a self-avoiding walk conformation (y = 3) whatever the temperature, while in the case of beta-casein, the polypeptide chain is partly collapsed at room temperature due to thermolabile noncovalent bonds. At the end of the first semidilute regime, there is clear evidence for a crossover toward a second semidilute regime for synthetic copolymers as well as for beta-casein but it is presently only partially characterized. C1 INRA, URCA, UMR FARE, Ctr Rech Environm & Agron, F-51686 Reims 2, France. CEA Saclay, Serv Phys Etat Condense, F-91191 Gif Sur Yvette, France. RP Douillard, R, INRA, URCA, UMR FARE, Ctr Rech Environm & Agron, 2 Espl Roland Garros,BP 224, F-51686 Reims 2, France. 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The formation and characteristics of these gels have been studied by combining surface tension, ellipsometry, and foam-film drainage experiments. Simultaneously, the solution electromotive force is measured and used to track the polymer-surfactant interactions in the bulk solution. We find that surface gelation occurs above the critical aggregation concentration in solution but before bulk precipitation of the polymer-surfactant complexes. Furthermore, we reveal that strong readsorption of polymer-surfactant complexes occurs during the resolubilization of the precipitated complexes at high surfactant concentrations (i.e., much greater thancritical micelle concentration). Seemingly overlooked in the past, this readsorption significantly influences the surface rheological properties and foam-film drainage of these systems. C1 Ecole Normale Super, Phys Stat Lab, UMR 8550, F-75005 Paris, France. Coll France, Lab Fluides Organ Phys Mat Condensee, UMR 7125, F-75005 Paris, France. Rhodia, F-93380 Aubervilliers, France. RP Bergeron, V, Ecole Normale Super, Phys Stat Lab, UMR 8550, 24 Rue Lhomond, F-75005 Paris, France. 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This was first predicted by Debye, but it was pointed out later by Kenneth and Robert Cole that when epsilon" is plotted against epsilon' for such a liquid, with frequency as parameter, then a semicircle results. However, for many liquids these predictions are not fulfilled. Debye himself only expected them to apply for frequencies lower than the mid-frequency of the dispersion region, and then only for liquids consisting of a weak solution of polar molecules in a solvent consisting of non-polar molecules. In fact, his predictions do hold for some liquids not conforming to those restrictions. The restrictions were felt by Debye to be necessary because he ignored dipolar inertia in his calculations, and he also ignored dipole-dipole interactions. They will also be ignored in this paper. However, a wide range of polar liquids exhibit dielectric characteristics which are not in conformity with Debye behavior, and for which no generally acceptable physical reasons have been put forward. When epsilon" is plotted against epsilon', sometimes a skewed arc results, which at low frequencies is semi-circular, but at high frequencies approximates to a straight line. Various empirical equations have been formulated to give the variation of epsilon" with epsilon' as the frequency is varied, and these equations can in general be analyzed to give a distribution of relaxation times, rather than the single relaxation time of ideal Debye behavior. Nevertheless, the replacement of the geometrical description by an algebraic description of the behavior does not explain the basic physical reason giving rise to it. In this paper, the hypothesis is put forward that the physical causes giving rise to the observation of the skewed arc, in particular to Cole-Davidson behavior, are the temporal and spatial fluctuations continuously occurring in the liquid, which at the molecular level is subject to severe turbulence. A consequence is that at any instant some dipoles will be more able than others to exhibit oscillatory rotary motion, i.e. to vibrate, under the influence of an applied sinusoidal field, and so to execute oscillations of greater magnitude. Even though such dipoles may be very few in number, the effect of their large oscillations could be very significant. The magnitude of the dipole oscillations might be expected to be smoothly distributed over a wide range, but for this preliminary investigation the approximation has been made that the great majority of dipoles will have the small oscillation amplitudes predicted by earlier work, while a small proportion of dipoles will be free to execute much larger oscillations. It is shown that this crude assumption does predict the observation of a skewed arc quite similar qualitatively to the Cole-Davidson plot. It is intended to refine the analysis in order to find whether the Cole-Davidson plot can be predicted quantitatively on the basis of instantaneous inhomogeneities in the liquid structure. C1 Bolton Inst, Bolton BL3 5AB, England. RP Calderwood, JH, Bolton Inst, Deane Rd, Bolton BL3 5AB, England. CR BOTTCHER CJF, 1978, THEORY ELECT POLARIZ, V2, P30 CALDERWOOD JH, 1977, C EL INS DIEL PHEN C, P13 CALDERWOOD JH, 1991, J MOL LIQ, V49, P119 CALDERWOOD JH, 1997, MCGRAWHILL ENCY SCI, P249 CALDERWOOD JH, 1998, IEEE T DIELECT EL IN, V5, P316 COLE KS, 1941, J CHEM PHYS, V9, P341 DAVIDSON DW, 1951, J CHEM PHYS, V19, P1484 DEBYE P, 1929, POLAR MOL DRUDE P, 1897, Z PHYS CHEM, V23, P267 GLARUM SH, 1960, J CHEM PHYS, V33, P639 JONSCHER AK, 1983, DIELECTRIC RELAXATIO, P87 KALINOVSKAYA OE, 2000, J CHEM PHYS, V112, P3262 KLIEM H, 1987, CEIDP ANN REP, P325 LANGEVIN MP, 1905, J PHYS-PARIS, V4, P678 LANGEVIN P, 1905, ANN CHIM PHYS, V5, P70 SCAIFE BKP, 1998, PRINCIPLES DIELECTRI, P113 NR 16 TC 1 PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC PI PISCATAWAY PA 445 HOES LANE, PISCATAWAY, NJ 08855 USA SN 1070-9878 J9 IEEE TRANS DIELECT ELECTR IN JI IEEE Trns. Dielectr. Electr. Insul. PD DEC PY 2003 VL 10 IS 6 BP 1006 EP 1011 PG 6 SC Engineering, Electrical & Electronic GA 757NR UT ISI:000187568800012 ER PT J AU Warshavsky, VB Zeng, XC TI Effect of external electric field on the bulk and interfacial properties of weakly dipolar fluid in slab-shaped and sphere-shaped systems SO PHYSICAL REVIEW E LA English DT Article ID LIQUID-VAPOR INTERFACE; DENSITY-FUNCTIONAL THEORY; SURFACE-TENSION; STOCKMAYER FLUIDS; POLAR FLUIDS; MOLECULAR FLUIDS; STATISTICAL-MECHANICS; ELECTROSTATIC FIELDS; PERTURBATION-THEORY; SALT SOLUTIONS AB The effect of a uniform electric field on the bulk and interfacial properties of a model dipolar fluid is investigated by using a modified mean-field density functional theory. Particular attention is given to the dependence of the vapor-liquid phase coexistence in a slab-shaped system on the direction of the electric field with respect to the slab surfaces, as well as in the sphere-shaped system on the surrounding dielectric permittivity. For planar vapor-liquid interfaces, the interfacial profiles of the orientation order parameters and components of the dielectric-permittivity tensor are calculated. Analytical expressions for these interfacial profiles and their dependence on the electric field are obtained. When the electric field is normal to the interface we find that the thermodynamic surface tension is lowered compared to that in zero field, and that when the electric field is parallel to the interface the surface tension is enhanced. In contrast, the mechanical surface tension at the equimolar dividing surface is always enhanced by the field regardless of the field direction, and it assumes its highest value when the field is parallel to the interface. C1 Univ Nebraska, Dept Chem, Lincoln, NE 68588 USA. RP Warshavsky, VB, Univ Nebraska, Dept Chem, Lincoln, NE 68588 USA. CR ABELES F, 1976, THIN SOLID FILMS, V34, P291 BEAGLEHOLE D, 1980, PHYSICA B, V100, P163 BODA D, 1996, MOL PHYS, V87, P601 BOTTCHER CJF, 1973, THEORY ELECT POLARIZ, V1 BRODSKAYA EN, 1983, COLLOID J USSR, V45, P558 BUFF F, 1966, SALINE WATER CONSERV, P26 BYKOV TV, 2001, J PHYS CHEM B, V105, P11586 CARNAHAN NF, 1969, J CHEM PHYS, V51, P635 CASTLE PJ, 1980, PHYSICA A, V101, P99 CHACON E, 1983, J CHEM PHYS, V79, P4426 DAMM EP, 1963, J ELECTROCHEM SOC, V110, P590 DELEEUW SW, 1980, P ROY SOC LOND A MAT, V373, P27 DRUDE P, 1959, THEORY OPTICS, P287 EGGEBRECHT J, 1987, J CHEM PHYS, V86, P2286 FRODL P, 1992, PHYS REV A, V45, P7330 FRODL P, 1993, PHYS REV E, V48, P3741 FRODL P, 1994, BER BUNSEN PHYS CHEM, V98, P503 GALLAGHER TJ, 1975, SIMPLE DIELECTRIC LI GOH MC, 1992, J PHYS CHEM-US, V96, P8488 GROH B, 1994, PHYS REV E, V50, P3814 GROH B, 1996, PHYS REV E, V53, P2509 HAYES CF, 1975, J PHYS CHEM-US, V79, P1689 HIRSCHFELDER JO, 1954, MOL THEORY GASES LIQ, P549 HOYE JS, 1980, J CHEM PHYS, V72, P1597 IATZEVICH S, 2000, MOD PHYS, V98, P1309 KASCH M, 1993, J CHEM PHYS, V99, P3037 KIYOHARA K, 1999, MOL SIMULAT, V23, P95 KUNI FM, 1969, RUSS J PHYS CHEM, V43, P700 KUSALIK PG, 1994, MOL PHYS, V81, P199 KUZMIN VL, 1982, COLLOID J USSR, V45, P592 LANDAU LD, 1984, ELECTRODYNAMICS CONT LEKNER J, 1983, MOL PHYS, V49, P1385 LIGGIERI L, 1994, PHYSICA A, V206, P299 PETERSEN HG, 1989, MOL PHYS, V66, P637 REED TM, 1973, APPL STAT MECH THERM, P117 RUSANOV AI, 1977, COLLOID J USSR, V39, P338 RUSANOV AI, 1977, J COLLOID INTERF SCI, V62, P542 SCHMID CM, 1961, SCIENCE, V135, P791 SCHMID GM, 1962, J ELECTROCHEM SOC, V109, P852 SHCHEKIN AK, 1996, COLLOID J RUSS ACAD+, V58, P564 STEVENS MJ, 1995, PHYS REV E A, V51, P5976 SUPERFINE R, 1991, PHYS REV LETT, V66, P1066 TALANQUER V, 1993, J CHEM PHYS, V99, P4670 TARAZONA P, 1982, MOL PHYS, V47, P1021 TEIXEIRA PI, 1991, J PHYS-CONDENS MAT, V3, P111 TEIXEIRA PIC, 1992, J PHYS CHEM-US, V96, P8488 VANLEEUWEN ME, 1994, FLUID PHASE EQUILIBR, V99, P1 WARSHAVSKY VB, 1999, COLLOID SURFACE A, V148, P283 WARSHAVSKY VB, 2001, J CHEM PHYS, V114, P504 WARSHAVSKY VB, 2002, J CHEM PHYS, V117, P3982 WARSHAVSKY VB, 2002, PHYS REV LETT, V89 WARSHAVSKY VB, 2003, PHYS REV E 1, V68 WOODWARD CE, 1988, J PHYS CHEM-US, V92, P501 YANG B, 1992, MOL PHYS, V76, P709 NR 54 TC 0 PU AMERICAN PHYSICAL SOC PI COLLEGE PK PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA SN 1063-651X J9 PHYS REV E JI Phys. Rev. E PD NOV PY 2003 VL 68 IS 5 PN Part 1 AR 051203 DI ARTN 051203 PG 13 SC Physics, Fluids & Plasmas; Physics, Mathematical GA 752TN UT ISI:000187183400014 ER PT J AU Ravindran, P Vidya, R Vajeeston, P Kjekshus, A Fjellvag, H TI Ground- and excited-state properties of inorganic solids from full-potential density-functional calculations SO JOURNAL OF SOLID STATE CHEMISTRY LA English DT Review ID TRANSITION-METAL OXIDES; BAND-STRUCTURE CALCULATIONS; X-RAY-ABSORPTION; MAGNETOCRYSTALLINE ANISOTROPY ENERGY; GENERALIZED GRADIENT APPROXIMATION; PERPENDICULAR MAGNETIC-ANISOTROPY; COLLECTIVE-ELECTRON TRANSITION; AUGMENTED-WAVE METHOD; SPIN-STATE; OPTICAL-PROPERTIES AB The development in theoretical condensed-matter science based on density-functional theory (DFT) has reached a level where it is possible, from "parameter-free" quantum mechanical calculations to obtain total energies, forces, vibrational frequencies, magnetic moments, mechanical and optical properties and so forth. The calculation of such properties are important in the analyses of experimental data and they can be predicted with a precision that is sufficient for comparison with experiments. It is almost impossible to do justice to all developments achieved by DFT because of its rapid growth. Hence, it has here been focused on a few advances, primarily from our laboratory. Unusual bonding behaviors in complex materials are conveniently explored using the combination of charge density, charge transfer, and electron-localization function along with crystal-orbital Hamilton-population analyses. It is indicated that the elastic properties of materials can reliably be predicted from DFT calculations if one takes into account the structural relaxations along with gradient corrections in the calculations. Experimental techniques have their limitations in studies of the structural stability and pressure-induced structural transitions in hydride materials whereas the present theoretical approach can be applied to reliably predict properties under extreme pressures. From the spin-polarized, relativistic full-potential calculations one can study novel materials such as ruthenates, quasi-one-dimensional oxides, and spin-, charge-, and orbital-ordering in magnetic perovskite-like oxides. The importance of orbital-polarization correction to the DFT to predict the magnetic anisotropy in transition-metal compounds and magnetic moments in lanthanides and actinides are emphasized. Apart from the full-potential treatment, proper magnetic ordering as well as structural distortions have to be taken into account to predict correctly the insulating behavior of transition-metal oxides. The computational variants LDA and GGA fail to predict insulating behavior of Mott insulators whereas electronic structures can be described correctly when correlation effects are taken into account through LDA + U or similar approaches to explain their electronic structures correctly. Excited-state properties such as linear optical properties, magneto-optical properties, XANES, XPS, UPS, BIS, and Raman spectra can be obtained from accurate DFT calculations. (C) 2003 Elsevier Inc. All rights reserved. C1 Univ Oslo, Dept Chem, N-0315 Oslo, Norway. RP Ravindran, P, Univ Oslo, Dept Chem, Box 1033 Blindern, N-0315 Oslo, Norway. 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Solid State Chem. PD DEC PY 2003 VL 176 IS 2 BP 338 EP 374 PG 37 SC Chemistry, Inorganic & Nuclear; Chemistry, Physical GA 750VE UT ISI:000187018500008 ER PT J AU Lisowski, M Loukakos, PA Bovensiepen, U Stahler, J Gahl, C Wolf, M TI Ultra-fast dynamics of electron thermalization, cooling and transport effects in Ru(001) SO APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING LA English DT Article ID FEMTOSECOND SURFACE-CHEMISTRY; METAL-SURFACES; DESORPTION; EXCITATION; CO; SPECTROSCOPY; RELAXATION; GOLD; AG AB Time-resolved two-photon photoelectron spectroscopy is used to study the dynamics of non-equilibrium electron and hole distributions at bare and D2O-covered Ru(001) following optical excitation (55-fs, 800-nm pulses) with variable fluence (0.04-0.6 mJ cm(-2)). Within the first 0.5 ps we observe an ultra-fast transient of the excited-carrier population and energy density at the surface which is accompanied by pronounced deviations of the electron-energy distribution from a (thermalized) Fermi-Dirac distribution. Comparison of the transient energy density of the photoexcited electrons at the surface with predictions of the two-temperature model provides fair agreement up to 400 fs, but exhibits a systematically lower energy density at later times, where electrons and phonons are equilibrated. We propose that this reduced energy density at the surface originates from ultra-fast energy transport of non-thermal electrons into the bulk in competition to electron-phonon coupling at the surface. This is corroborated by extending the two-temperature model to account for non-thermal, photoexcited electrons, whereby quantitative agreement with experiment can only be achieved if ballistic transport and reduced electron-phonon coupling is incorporated for non-thermal electrons. Implications for surface femtochemistry are discussed. C1 Free Univ Berlin, Fachbereich Phys, D-14195 Berlin, Germany. RP Lisowski, M, Free Univ Berlin, Fachbereich Phys, Arnimallee 14, D-14195 Berlin, Germany. 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Phys. A-Mater. Sci. Process. PD JAN PY 2004 VL 78 IS 2 BP 165 EP 176 PG 12 SC Materials Science, Multidisciplinary; Physics, Applied GA 742CH UT ISI:000186497500007 ER PT J AU Schwab, P Raimondi, R TI Quasiclassical theory of charge transport in disordered interacting electron systems SO ANNALEN DER PHYSIK LA English DT Review DE quantum transport; disorder; interactions; quasiclassical theory ID THIN METAL-FILMS; WEAK-LOCALIZATION; MESOSCOPIC SYSTEMS; SHOT-NOISE; QUANTUM DECOHERENCE; COHERENT TRANSPORT; TUNNEL-JUNCTIONS; MAGNETIC-FIELD; 2 DIMENSIONS; NONLINEAR CONDUCTIVITY AB We consider the corrections to the Boltzmann theory of electrical transport arising from the Coulomb interaction in disordered conductors. In this article the theory is formulated in terms of quasiclassical Green's functions. We demonstrate that the formalism is equivalent to the conventional diagrammatic technique by deriving the well-known Altshuler-Aronov corrections to the conductivity. Compared to the conventional approach, the quasiclassical theory has the advantage of being closer to the Boltzmann theory, and also allows description of interaction effects in the transport across interfaces, as well as non-equilibrium phenomena in the same theoretical framework. As an example, by applying the Zaitsev boundary conditions which were originally developed for superconductors, we obtain the P(E)-theory of the Coulomb blockade in tunnel junctions. Furthermore we summarize recent results obtained for the non-equilibrium transport in thin films, wires and fully coherent conductors. (C) 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. C1 Univ Augsburg, Inst Phys, D-86135 Augsburg, Germany. Univ Roma Tre, NEST, INFM, I-00146 Rome, Italy. Univ Roma Tre, Dipartimento Fis, I-00146 Rome, Italy. RP Schwab, P, Univ Augsburg, Inst Phys, D-86135 Augsburg, Germany. 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Phys.-Berlin PD JUL-AUG PY 2003 VL 12 IS 7-8 BP 471 EP 516 PG 46 SC Physics, Multidisciplinary GA 742CE UT ISI:000186497200007 ER PT J AU Lipperheide, R Wille, U TI Unified description of ballistic and diffusive carrier transport in semiconductor structures SO PHYSICAL REVIEW B LA English DT Article ID SPIN INJECTION; MODEL; ELECTRON AB A unified theoretical description of ballistic and diffusive carrier transport in parallel-plane semiconductor structures is developed within the semiclassical model. The approach is based on the introduction of a thermoballistic current consisting of carriers which move ballistically in the electric field provided by the band edge potential, and are thermalized at certain randomly distributed equilibration points by coupling to the background of impurity atoms and carriers in equilibrium. The sum of the thermoballistic and background currents is conserved and identified with the physical current. The current-voltage characteristic for nondegenerate systems and the zero-bias conductance for degenerate systems are expressed in terms of a reduced resistance. For arbitrary mean free path and arbitrary shape of the band edge potential profile, this quantity is determined from the solution of an integral equation, which also provides the quasi-Fermi level and the thermoballistic current. To illustrate the formalism, a number of simple examples are considered explicitly. The present work is compared with previous attempts towards a unified description of ballistic and diffusive transport. C1 Hahn Meitner Inst Berlin GmbH, Theoret Phys Abt, D-14109 Berlin, Germany. RP Lipperheide, R, Hahn Meitner Inst Berlin GmbH, Theoret Phys Abt, Glienicker Str 100, D-14109 Berlin, Germany. 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Rev. B PD SEP 15 PY 2003 VL 68 IS 11 AR 115315 DI ARTN 115315 PG 16 SC Physics, Condensed Matter GA 730KE UT ISI:000185829300067 ER PT J AU Binks, BP Clint, JH Dyab, AKF Fletcher, PDI Kirkland, M Whitby, CP TI Ellipsometric study of monodisperse silica particles at an oil-water interface SO LANGMUIR LA English DT Article ID EMULSIONS AB Results are reported for ellipsometric measurements of hydrophobized monodisperse silica particles, with a diameter of about 25 nm, spread at the toluene-water interface. Theoretical values for the ellipsometric parameters are derived by treating the particles as a core-shell model and performing integrations of the refractive index profile through the interface using Drude's equations. With justifiable choices of the fixed parameters for the system, the agreement is good between measured and calculated values for the ellipsometric parameter Delta as a function of the amount of silica particles added to the interface. However, the results at high particle concentration at the interface are consistent either with coverage greater than a close-packed monolayer or with a monolayer with corrugations whose amplitude is less than the radius of the particles. The results show that this is not a suitable method for the determination of the contact angle of the particles at the oil-water interface. C1 Univ Hull, Dept Chem, Surfactant & Colloid Grp, Kingston Upon Hull HU6 7RX, N Humberside, England. Unilever Res, Colworth Lab, Sharnbrook MK44 1LQ, Beds, England. RP Clint, JH, Univ Hull, Dept Chem, Surfactant & Colloid Grp, Kingston Upon Hull HU6 7RX, N Humberside, England. CR AVEYARD R, 2000, LANGMUIR, V16, P8820 AVEYARD R, 2003, PHYS CHEM CHEM PHYS, V5, P2398 BINKS BP, 2002, CURR OPIN COLLOID IN, V7, P21 BINKS BP, 2002, PHYS CHEM CHEM PHYS, V4, P3727 BRUGGEMAN DAG, 1935, ANN PHYS-BERLIN, V24, P636 DRUDE P, 1889, ANN PHYS CHEM, V36, P865 DRUDE P, 2002, THEORY OPTICS, P293 ISRAELACHVILI JN, 1992, INTERMOLECULAR SURFA, P333 KENNY MB, 1994, ADV CHEM SER, V234, P505 MEUNIER J, 1987, J PHYS-PARIS, V48, P1819 PICKERING SU, 1907, J CHEM SOC 2, V91, P2001 RAMSDEN W, 1903, P ROY SOC LOND B BIO, V72, P156 NR 12 TC 3 PU AMER CHEMICAL SOC PI WASHINGTON PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA SN 0743-7463 J9 LANGMUIR JI Langmuir PD OCT 14 PY 2003 VL 19 IS 21 BP 8888 EP 8893 PG 6 SC Chemistry, Physical GA 730LG UT ISI:000185831800042 ER PT J AU Poksinski, M Arwin, H TI In situ monitoring of metal surfaces exposed to milk using total internal reflection ellipsometry SO SENSORS AND ACTUATORS B-CHEMICAL LA English DT Article DE ellipsometry; total internal reflections; surface cleaning AB A technique combining ellipsometry with total internal reflection is presented. The method is called total internal reflection ellipsometry (TIRE) and is suitable for monitoring of internal surfaces which opens new possibilities for measuring adsorption on metal surfaces in opaque liquids. Results from measurements of adsorption of milk and subsequent cleaning with sodium hydroxide on metal surfaces are given. These include studies on gold, iron, and chromium surfaces. A schematic design of the instrument used in TIRE is included. The main advantages of the system are non-invasive probing, fast response, and high sensitivity. The method has potential for applications in monitoring of internal surfaces of pipelines in industrial processes. (C) 2003 Elsevier B.V All rights reserved. C1 Linkoping Univ, Dept Phys & Measurement Technol, Lab Appl Opt, SE-58183 Linkoping, Sweden. RP Poksinski, M, Linkoping Univ, Dept Phys & Measurement Technol, Lab Appl Opt, SE-58183 Linkoping, Sweden. CR ARWIN H, 2001, SENSOR ACTUAT A-PHYS, V92, P43 AZZAM RMA, 1987, ELLIPSOMETRY POLARIZ COLLINS RW, 1997, P 2 INT C SPECTR ELL DRUDE P, 1889, ANN PHYS CHEM, V36, P532 EING A, 2002, IMAGING ELLIPSOMETRY HECHT E, 2002, OPTICS, P122 JOHANSEN K, 2000, REV SCI INSTRUM, V71, P3530 LIEDBERG B, 1995, BIOSENS BIOELECTRON, V10, P1 MARSH RJ, 2002, COLLOID SURFACE B, V23, P31 POKSINSKI M, IN PRESS J ELECTROCH POKSINSKI M, UNPUB TOTAL INTERNAL POKSINSKI M, 2000, P 14 EUR TOT INT REF WANG G, 2002, P IEEE SENS FLOR US, P339 WESTPHAL P, 2002, SENSOR ACTUAT B-CHEM, V84, P278 NR 14 TC 4 PU ELSEVIER SCIENCE SA PI LAUSANNE PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND SN 0925-4005 J9 SENSOR ACTUATOR B-CHEM JI Sens. Actuator B-Chem. PD OCT 1 PY 2003 VL 94 IS 3 BP 247 EP 252 PG 6 SC Chemistry, Analytical; Electrochemistry; Instruments & Instrumentation GA 725YY UT ISI:000185571000002 ER PT J AU Law, BM Mukhopadhyay, A Henderson, JR Wang, JY TI Wetting of silicon wafers by n-alkanes SO LANGMUIR LA English DT Article ID LIFSHITZ THEORY; LINE TENSION; LIQUID; FILMS; INTERFACES; TRANSITION; SURFACES; FORCES; FLUCTUATIONS; ADSORPTION AB We examine the wetting behavior of various n-alkanes on both oxide-coated and silane-coated Si wafers. n-Hexane and n-heptane completely wet a silane-coated Si wafer while n-octane exhibits a wetting transition at T-w similar or equal to 60 degreesC. In the complete wetting region, the wetting layer thicknesses as a function of temperature and height are markedly thinner than that which would be predicted by a long-ranged nonretarded dispersion interaction in competition with a gravitationally determined chemical potential. By contrast, the isothermal pressure measurements of Beaglehole and Christenson (J. Phys. Chem. 1992, 96, 3395) for n-pentane on an oxide-coated Si wafer display a much thicker wetting film than would be predicted when the dispersion and pressure-induced chemical potential are taken into account. We resolve these disparate experimental results as a function of temperature, height, and pressure by considering the influence of a number of medium-ranged interactions. C1 Kansas State Univ, Dept Phys, Condensed Matter Lab, Manhattan, KS 66506 USA. Wayne State Univ, Dept Phys & Astron, Detroit, MI 48201 USA. Univ Leeds, Dept Phys & Astron, Leeds LS2 9JT, W Yorkshire, England. Max Planck Inst Met Res, D-70569 Stuttgart, Germany. RP Law, BM, Kansas State Univ, Dept Phys, Condensed Matter Lab, Cardwell Hall, Manhattan, KS 66506 USA. CR ADAMSON AW, 1982, PHYSICAL CHEM SURFAC AZZAM RMA, 1984, ELLIPSOMETRY POLARIZ BAIN CD, 1989, J AM CHEM SOC, V111, P321 BATCHELDER DN, 2000, MOL PHYS, V12, P807 BEAGLEHOLE D, 1980, PHYSICA B, V100, P163 BEAGLEHOLE D, 1986, FLUID INTERFACIAL PH BEAGLEHOLE D, 1991, PHYS REV LETT, V66, P2084 BEAGLEHOLE D, 1992, J PHYS CHEM-US, V96, P3395 BORN M, 1981, J PHYS D, V14, P115 BRZOSKA JB, 1994, LANGMUIR, V10, P4367 CHERNOV AA, 1988, PHYS REV LETT, V60, P2488 DAUM W, 1993, PHYS REV LETT, V71, P1234 DEGENNES PG, 1985, REV MOD PHYS, V57, P827 DIETRICH S, 1987, PHASE TRANSITIONS CR, V12 DRUDE P, 1959, THEORY OPTICS DZYALOSHINSKII IE, 1961, ADV PHYS, V10, P165 HENDERSON JR, 1994, PHYS REV E, V50, P4836 INDEKEU JO, 1994, INT J MOD PHYS B, V8, P309 ISRAELACHVILI JN, 1992, INTERMOLECULAR SURFA JONSSON B, 1983, J CHEM SOC FARAD T 2, V79, P19 KERN W, 1970, RCA REV, V31, P187 LAWNIK WH, 1995, LANGMUIR, V11, P3075 MECKE KR, 1996, PHYS REV B, V53, P2073 MERKL C, 1997, PHYS REV LETT, V79, P4625 MUKHOPADHYAY A, 2000, PHYS REV E B, V62, P5201 PANELLA V, 1996, PHYS REV LETT, V76, P3606 SABISKY ES, 1973, PHYS REV A, V7, P790 SCHICK M, 1990, LIQUIDS INTERFACES SCHMIDT JW, 1983, J CHEM PHYS, V79, P379 SHARMA A, 1998, LANGMUIR, V14, P4915 TARAZONA P, 2002, J CHEM PHYS, V117, P3941 TIDSWELL IM, 1991, PHYS REV LETT, V66, P2108 VORBERG J, 2001, PHYS REV LETT, V89 WANG JY, 1999, PHYS REV LETT, V83, P3677 WANG JY, 2001, LANGMUIR, V17, P2995 ZISMAN WA, 1964, ADV CHEM SER, V43, P1 NR 36 TC 3 PU AMER CHEMICAL SOC PI WASHINGTON PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA SN 0743-7463 J9 LANGMUIR JI Langmuir PD SEP 30 PY 2003 VL 19 IS 20 BP 8380 EP 8388 PG 9 SC Chemistry, Physical GA 727ZK UT ISI:000185690600037 ER PT J AU Rice, SA TI What can we learn from the structures of the liquid-vapor interfaces of metals alloys? SO MOLECULAR SIMULATION LA English DT Article DE Monte Carlo simulation; liquid-vapor interface; liquid metal; liquid alloy; surface segregation ID MONTE-CARLO SIMULATIONS; X-RAY REFLECTIVITY; TRANSVERSE DENSITY DISTRIBUTIONS; COMPUTER-SIMULATION; ION DISTRIBUTIONS; ALKALI-METALS; ELECTRONIC-STRUCTURE; BISMUTH-GALLIUM; SURFACE-TENSION; DILUTE ALLOY AB An overview of features of the structures of the liquid-vapor interfaces of metals and alloys is presented. The organizing theme of the overview is the role played by the inhomogeneous electron density distribution in the liquid-vapor interface, and how that distribution leads to atomic distributions that differ from those in the liquid-vapor interfaces of dielectric substances. The influence of the structure of the liquid-vapor interface on its electrical and optical properties is also briefly discussed. C1 Univ Chicago, Dept Chem, Chicago, IL 60637 USA. Univ Chicago, James Franck Inst, Chicago, IL 60637 USA. RP Rice, SA, Univ Chicago, Dept Chem, 5735 S Ellis Ave, Chicago, IL 60637 USA. CR BACHELET GB, 1982, PHYS REV B, V26, P4199 BLOCH AN, 1969, PHYS REV, V185, P933 BRESLAU A, 1985, PHYS REV LETT, V54, P114 CHEKMAREV D, 1998, J CHEM PHYS, V109, P768 CHEKMAREV DS, 1999, PHYS REV E A, V59, P479 CHEKMAREV DS, 2000, PHYS REV B, V61, P10116 CHEKMAREV DS, 2001, PHYS REV E 1, V63 DEVELYN MP, 1981, PHYS REV LETT, V47, P1844 DEVELYN MP, 1983, J CHEM PHYS, V78, P5081 DEVELYN MP, 1983, J CHEM PHYS, V78, P5225 DRUDE P, 1901, THEORY OPTICS, P287 FISCHER J, 1980, PHYS REV A, V22, P2836 FLOM EB, 1992, J CHEM PHYS, V96, P4743 FLOM EB, 1993, SCIENCE, V260, P332 GOMEZ MA, 1992, PHYS REV B, V46, P723 GOMEZ MA, 1994, J CHEM PHYS, V101, P8094 GRYKO J, 1982, J PHYS F MET PHYS, V12, L245 GRYKO J, 1984, J CHEM PHYS, V80, P6318 GRYKO J, 1984, J NONCRYST SOLIDS, V61, P703 GUIDOTTI D, 1974, SOLID STATE COMMUN, V15, P113 GUIDOTTI D, 1977, PHYS REV B, V15, P3796 HAFNER J, 1987, HAMILTONIANS PHASE D HARRIS JG, 1987, J CHEM PHYS, V86, P7531 HARRIS JG, 1987, J CHEM PHYS, V87, P3069 HARRIS JG, 1987, J STAT PHYS, V48, P1109 HARRISON WA, 1966, PSEUDOPOTENTIALS THE HUISMAN WJ, 1997, NATURE, V390, P379 KOHN W, 1965, PHYS REV, V140, A1133 LANG ND, 1970, PHYS REV B, V1, P4555 LEI N, 1996, J CHEM PHYS, V104, P4802 LEI N, 1997, J CHEM PHYS, V107, P4051 LI D, UNPUB REEXAMINATION LI DX, 2002, PHYS REV B, V65 MAGNUSSEN OM, 1995, PHYS REV LETT, V74, P4444 MATSUURA M, 1975, J PHYS F MET PHYS, V5, P1849 MOHANTY U, 1983, J CHEM PHYS, V79, P5652 OCKO BM, 1994, PHYS REV LETT, V72, P242 REGAN MJ, 1995, PHYS REV LETT, V75, P2498 REGAN MJ, 1996, J NONCRYST SOLIDS, V205, P762 REGAN MJ, 1996, PHYS REV B, V54, P9730 RICE SA, 1986, FLUID INTERFACIAL PH, P255 RICE SA, 1998, PHYS REV B, V57, P13501 RICE SA, 1999, J PHYS CHEM A, V103, P10159 ROWLINSON JS, 1982, MOL THEORY CAPILLARI SHAW RW, 1968, PHYS REV, V174, P769 SHAW RW, 1969, J PHYS C, V2, P2335 SHIMOJI M, 1977, LIQUID METALS, P7 THOMAS BN, 1987, J CHEM PHYS, V86, P1036 TOWNSEND RM, 1991, J CHEM PHYS, V94, P2207 TRIEZENBERG DG, 1972, PHYS REV LETT, V28, P1183 WOO CH, 1975, J PHYS F MET PHYS, V5, P1836 YANG B, UNPUB PHYS REV B YANG B, 2000, PHYS REV B, V62, P13111 ZHAO M, 1999, J CHEM PHYS, V109, P1959 ZHAO MS, 1997, PHYS REV E, V56, P7033 ZHAO MS, 1998, J CHEM PHYS, V108, P5055 ZHAO MS, 2001, PHYS REV B, V63 NR 57 TC 5 PU TAYLOR & FRANCIS LTD PI ABINGDON PA 4 PARK SQUARE, MILTON PARK, ABINGDON OX14 4RN, OXON, ENGLAND SN 0892-7022 J9 MOL SIMULAT JI Mol. Simul. PD OCT-NOV PY 2003 VL 29 IS 10-11 BP 593 EP 609 PG 17 SC Physics, Atomic, Molecular & Chemical GA 721MQ UT ISI:000185320500002 ER PT J AU Vagharchakian, L Henon, S TI Adsorption of poly(acrylic acid) at an oppositely charged Langmuir film: Surface-tension, ellipsometry, and elasticity measurements SO LANGMUIR LA English DT Article ID AIR-WATER-INTERFACE; POLYELECTROLYTE ADSORPTION; AIR/WATER INTERFACE; AQUEOUS-SOLUTION; PLANAR SURFACES; POLYMERS; KINETICS; HISTORY AB We have studied the adsorption of a weak polyelectrolyte at the free surface of water covered with an oppositely charged Langmuir film as a function of the surface density sigma of the Langmuir film. The adsorption is slow (a few hours). The equilibrium surface pressure pi of the mixed film and its compression elastic modulus epsilon are dominated by the contribution of the polyelectrolytes in a large range of a. In the entire range of sigma studied (0.20-1.1 molecule/nm(2)) pi scales as sigma(2). On the contrary, both epsilon and the ellipticity of the film (which is a measure of the adsorbed quantity) show a regime change at sigma approximate to 0.45 molecule/nm(2), presumably from polymers lying flat at the surface to polymers forming a "carpet", as was predicted by theory. C1 Univ Paris 07, CNRS, UMR 7057, Lab Biorheol & Hydrodynam Physico Chim, F-75251 Paris 05, France. RP Henon, S, Univ Paris 07, CNRS, UMR 7057, Lab Biorheol & Hydrodynam Physico Chim, FR 2438,Case Courrier 7056-2,Pl Jussieu, F-75251 Paris 05, France. CR AHRENS H, 2001, MACROMOLECULES, V34, P4504 ANDELMAN D, 2000, CR ACAD SCI IV-PHYS, V1, P1153 BOCK EJ, 1989, J COLLOID INTERF SCI, V129, P501 BORISOV OV, 2001, EUR PHYS J E, V5, P37 BRANDRUP J, 1999, POLYM HDB CARUSO F, 1998, J PHYS CHEM B, V102, P2011 DECHER G, 1997, SCIENCE, V277, P1232 DEFEIJTER JA, 1978, BIOPOLYMERS, V17, P1759 DEGENNES PG, 1979, SCALING CONCEPTS POL DOBRYNIN AV, 2000, PHYS REV LETT, V84, P3101 DOBRYNIN AV, 2001, J CHEM PHYS, V114, P8145 DRUDE P, 1891, ANN PHYS, V43, P126 FILIPPOVA NL, 1998, LANGMUIR, V14, P1162 FLEER GJ, 1993, POLYM INTERFACES HOOGEVEEN NG, 1996, J COLLOID INTERF SCI, V182, P133 ISHIMURO Y, 1980, COLLOID POLYM SCI, V258, P928 JOANNY JF, 1999, EUR PHYS J B, V9, P117 JOANNY JF, 2000, J PHYS-CONDENS MAT, V12, A1 LHEVEDER C, 1998, REV SCI INSTRUM, V69, P1446 MANGHI M, 2002, THESIS U GRENOBLE GR MEUNIER J, 1984, COLLOIDES INTERFACES, P181 MIYANO K, 1990, LANGMUIR, V6, P1254 NETZ RR, 1999, MACROMOLECULES, V32, P9013 NETZ RR, 2003, PHYS REP, V380, P1 OKUBO T, 1988, J COLLOID INTERF SCI, V125, P386 RUTHS J, 2000, LANGMUIR, V16, P8871 SAINTJALMES A, 1998, J PHYS CHEM B, V102, P5810 SCHNITTER M, 2000, MACROMOL CHEM PHYSIC, V201, P1504 SUKHISHVILI SA, 1999, LANGMUIR, V15, P8474 THEODOLY O, 2001, EUR PHYS J E, V5, P51 NR 30 TC 2 PU AMER CHEMICAL SOC PI WASHINGTON PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA SN 0743-7463 J9 LANGMUIR JI Langmuir PD SEP 16 PY 2003 VL 19 IS 19 BP 7989 EP 7994 PG 6 SC Chemistry, Physical GA 720ZX UT ISI:000185293500046 ER PT J AU Franta, D Ohlidal, I Bursikova, V Zajikova, L TI Optical properties of diamond-like carbon films containing SiOx SO DIAMOND AND RELATED MATERIALS LA English DT Article DE ellipsometry; density of states; diamond-like carbon; silicon ID A-C-H; MECHANICAL-PROPERTIES; THIN-FILMS; SILICON; IMPROVEMENT; COATINGS AB In this article the optical properties of amorphous diamond-like carbon (DLC) films containing SiOx (DLC:SiOx) prepared by plasma enhanced chemical vapour deposition are studied. For this study a combined optical method based on simultaneous interpretation of experimental data obtained within variable angle spectroscopic ellipsometry and near-normal spectroscopic reflectometry is used. The interpretation of these combined experimental data is performed using a new empirical dispersion model of the optical constants characterizing the films under investigation. This dispersion model is based on parameterizing the density of the electronic states belonging to both the valence and conduction bands. It is shown that there are strong differences between spectral dependences of the optical constants of the DLC films on the one hand and DLC:SiOx films on the other hand. Further, it is shown that the absorption of the DLC:SiOx films is smaller than the absorption of the pure DLC films in the visible. This is explained by the fact that the density of the pi electrons inside the DLC:SiOx films is lower than the density of these electrons in the pure DLC films. It is also found that the existence of small amounts of the silicon and oxygen impurities contained in the DLC films strongly influence their optical properties. (C) 2003 Elsevier Science B.V. All rights reserved. C1 Masaryk Univ, Fac Sci, Lab Plasma Phys & Plasma Sources, Brno 61137, Czech Republic. Masaryk Univ, Fac Sci, Joint Lab Modern Metrol, CS-60177 Brno, Czech Republic. Technol Univ Brno, Czech Metrol Inst, Brno, Czech Republic. Technol Univ Brno, Fac Mech Engn, Brno, Czech Republic. Masaryk Univ, Fac Sci, Dept Phys Elect, Brno 61137, Czech Republic. RP Zajikova, L, Masaryk Univ, Fac Sci, Lab Plasma Phys & Plasma Sources, Kotlarska 2, Brno 61137, Czech Republic. CR ADACHI S, 1999, OPTICAL PROPERTIES C BURSIKOVA V, 2002, J NON-CRYST SOLIDS B, V299, P1147 BURSIKOVA V, 2002, MAT SCI ENG A-STRUCT, V324, P251 CAMARGO SS, 1998, THIN SOLID FILMS, V332, P130 DEKRONIG R, 1926, J OPT SOC AM, V12, P547 DEMARTINO C, 1997, DIAM RELAT MATER, V6, P559 DRUDE P, 1891, WIED ANN, V43, P136 FRANTA D, 2001, APPL SURF SCI, V175, P555 FRANTA D, 2001, DIAM RELAT MATER, V11, P105 HERZINGER CM, 1998, J APPL PHYS, V83, P3323 MARQUARDT DW, 1963, J SOC IND APPL MATH, V11, P431 OHLIDAL I, 2000, ACTA PHYS SLOVACA, V50, P489 OHLIDAL I, 2000, PROGR OPTICS, V41, P181 TAUC J, 1972, OPTICAL PROPERTIES S, P291 NR 14 TC 4 PU ELSEVIER SCIENCE SA PI LAUSANNE PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND SN 0925-9635 J9 DIAM RELAT MATER JI Diam. Relat. Mat. PD SEP PY 2003 VL 12 IS 9 BP 1532 EP 1538 PG 7 SC Materials Science, Multidisciplinary GA 721GP UT ISI:000185308900015 ER PT S AU Leo, K TI Introduction: Basics of high field transport SO HIGH-FIELD TRANSPORT IN SEMICONDUCTOR SUPERLATTICES SE SPRINGER TRACTS IN MODERN PHYSICS LA English DT Editorial Material ID SEMICONDUCTORS C1 Tech Univ Dresden, Inst Angew Photophys, D-01062 Dresden, Germany. RP Leo, K, Tech Univ Dresden, Inst Angew Photophys, D-01062 Dresden, Germany. CR ASHCROFT NW, 1981, SOLID STATE PHYSICS, CH1 BLOCH F, 1928, Z PHYS, V52, P555 CHYNOWETH AG, 1960, PHYS REV LETT, V5, P57 CHYNOWETH AG, 1962, PHYS REV, V125, P877 DRUDE P, 1900, ANN PHYSIK, V3, P369 ESAKI L, 1970, IBM J RES DEV, V14, P61 GUNN JB, 1964, IBM J RES DEV, V8, P141 KOSS RW, 1972, PHYS REV B, V5, P1479 MAEKAWA S, 1970, PHYS REV LETT, V24, P1175 ZENER C, 1934, P ROY SOC LOND A MAT, V145, P523 NR 10 TC 0 PU SPRINGER-VERLAG BERLIN PI BERLIN PA HEIDELBERGER PLATZ 3, D-14197 BERLIN, GERMANY SN 0081-3869 J9 SPRING TRACT MOD PHYS PY 2003 VL 187 BP 1 EP 8 PG 8 GA BX40D UT ISI:000185149800001 ER PT J AU Lamoureux, G MacKerell, AD Roux, B TI A simple polarizable model of water based on classical Drude oscillators SO JOURNAL OF CHEMICAL PHYSICS LA English DT Article ID MOLECULAR-DYNAMICS SIMULATIONS; STATIC DIELECTRIC-CONSTANT; LIQUID-VAPOR INTERFACE; AB-INITIO; COMPUTER-SIMULATIONS; POTENTIAL FUNCTIONS; FLUCTUATING CHARGE; FIRST PRINCIPLES; FORCE-FIELDS; ELECTRONIC POLARIZATION AB A simple polarizable water model is developed and optimized for molecular dynamics simulations of the liquid phase under ambient conditions. The permanent charge distribution of the water molecule is represented by three point charges: two hydrogen sites and one additional M site positioned along the HOH bisector. Electronic induction is represented by introducing a classical charged Drude particle attached to the oxygen by a harmonic spring. The oxygen site carries an equal and opposite charge, and is the center of an intermolecular Lennard-Jones interaction. The HOH gas-phase experimental geometry is maintained rigidly and the dipole of the isolated molecule is 1.85 D, in accord with experiment. The model is simulated by considering the dynamics of an extended Lagrangian in which a small mass is attributed to the Drude particles. It is parametrized to reproduce the salient properties of liquid water under ambient conditions. The optimal model, refered to as SWM4-DP for "simple water model with four sites and Drude polarizability," yields a vaporization enthalpy of 10.52 kcal/mol, a molecular volume of 29.93 Angstrom(3), a static dielectric constant of 79+/-5, a self-diffusion constant of (2.30+/-0.04)x10(-5) cm(2)/s, and an air/water surface tension of 66.9+/-0.9 dyn/cm, all in excellent accord with experiments. The energy of the water dimer is -5.18 kcal/mol, in good accord with estimates from experiments and high level ab initio calculations. The polarizability of the optimal model is 1.04 Angstrom(3), which is smaller than the experimental value of 1.44 Angstrom(3) in the gas phase. It is likely that such a reduced molecular polarizability, which is essential to reproduce the properties of the liquid, arises from the energy cost of overlapping electronic clouds in the condensed phase due to Pauli's exclusion principle opposing induction. (C) 2003 American Institute of Physics. C1 Univ Montreal, Dept Phys, Montreal, PQ H3C 3J7, Canada. Univ Maryland, Sch Pharm, Dept Pharmaceut Sci, Baltimore, MD 21201 USA. Cornell Univ, Weill Med Coll, Dept Biochem, New York, NY 10021 USA. RP Lamoureux, G, Univ Montreal, Dept Phys, CP 6128,Succ Centreville, Montreal, PQ H3C 3J7, Canada. 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Chem. Phys. PD SEP 8 PY 2003 VL 119 IS 10 BP 5185 EP 5197 PG 13 SC Physics, Atomic, Molecular & Chemical GA 714EK UT ISI:000184899200022 ER PT J AU Schirrmacher, A TI Experimenting theory: The proofs of Kirchhoff's radiation law before and after Planck SO HISTORICAL STUDIES IN THE PHYSICAL AND BIOLOGICAL SCIENCES LA English DT Article ID PHYSICS; MATHEMATICS; HILBERT AB The role of experimental thinking and action in theorizing is investigated using an example from classical radiation theory. The history of Kirchhoff's law exhibits both the development of the views on radiation and the evolution of the content as well as the assumed foundational roots of this law. Planck's search for the correct justification of his radiation formula is placed into the context of the contemporary debate over his prerequisite. It is then asked what the analysis of the variety of approaches, arguments, and ontological claims that can be found in radiation theory can reveal to us concerning the conceptual framework that was available in Planck's researches. Next, the different forms of reasoning applied in proving a physical law will be exemplified, which range from procedures that are closely abstracted from experimental action like those found with Kirchhoff or Helmholtz, to a purely mathematical approach-as that of Hilbert-which is void of any experimental notion or object. This discussion shall finally both locate Planck's specific method and elucidate the great difficulties the establishment of a truly non-experimental, i.e., mathematical, theory in physics met before a new generation of quantum physicists appeared. C1 Deutsch Museum, Munich Ctr Hist Sci & Technol, Munich, Germany. RP Schirrmacher, A, Deutsch Museum, Munich Ctr Hist Sci & Technol, Munich, Germany. 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Stud. Phys. Biol. Sci. PY 2003 VL 33 PN Part 2 BP 299 EP 335 PG 37 SC History & Philosophy Of Science; History & Philosophy Of Science; History & Philosophy of Science GA 709ZG UT ISI:000184656000005 ER PT J AU Das, R Ray, S TI Zinc oxide - a transparent, conducting IR-reflector prepared by rf-magnetron sputtering SO JOURNAL OF PHYSICS D-APPLIED PHYSICS LA English DT Article ID ZNO THIN-FILMS; ELECTRICAL-PROPERTIES; AL FILMS; PLASMA; DEGRADATION; HYDROGEN AB Al doped zinc oxide thin films with different electrical and optical properties have been developed by both non-reactive and reactive rf-magnetron sputtering in Ar and Ar + H-2 atmospheres, respectively. The thin films prepared under Ar + H2 gas ambient at substrate temperatures of 100degreesC and 300degreesC show high conductivity and improved IR-reflectivity. The lowest resistivity obtained is 4.5 x 10(-4) Omega cm at 300degreesC. The transmission of the ZnO: Al film in the visible range is above 90% and that at 1400 nm is only 3.2%. Most of the IR-region is thus reflected. The carrier concentration of this transparent, conducting ZnO film prepared under Ar + H-2 atmosphere is 2.3 x 10(21) cm(-3). Tranmission electron micrographs reveal that the average crystallite of the sample deposited under Ar + H-2 ambient is smaller compared to those prepared under Ar ambient. The (100), (002) orientations of ZnO with wurtzite structure are observed from transmission electron diffraction pattern. C1 Indian Assoc Cultivat Sci, Energy Res Unit, Calcutta 700032, W Bengal, India. RP Das, R, Indian Assoc Cultivat Sci, Energy Res Unit, Calcutta 700032, W Bengal, India. 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PD JAN 21 PY 2003 VL 36 IS 2 BP 152 EP 155 PG 4 SC Physics, Applied GA 708EP UT ISI:000184554400013 ER PT J AU Sergienko, AV Jaeger, GS TI Quantum information processing and precise optical measurement with entangled-photon pairs SO CONTEMPORARY PHYSICS LA English DT Review ID PARAMETRIC DOWN-CONVERSION; ELLIPSOMETRIC MEASUREMENTS; LIGHT; INTERFERENCE; CRYPTOGRAPHY; DOWNCONVERSION; DISPERSION; PODOLSKY; EINSTEIN; STATES AB Two photons in a pair generated in the nonlinear optical process of spontaneous parametric down-conversion are, in general, strongly quantum entangled. Accordingly, they contain extremely strong energy, time, polarization and momentum quantum correlations. This entanglement involves more than one quantum variable and has served as a powerful tool in fundamental studies of quantum theory. It is now playing a large role in the development of novel information processing techniques and new optical measurement technologies. Here we review some of these technologies and their origins. C1 Boston Univ, Quantum Imaging Lab, Dept Elect & Comp Engn, Boston, MA 02215 USA. Boston Univ, Dept Phys, Boston, MA 02215 USA. RP Sergienko, AV, Boston Univ, Quantum Imaging Lab, Dept Elect & Comp Engn, 8 St Marys St, Boston, MA 02215 USA. 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Phys. PD JUL-AUG PY 2003 VL 44 IS 4 BP 341 EP 356 PG 16 SC Physics, Multidisciplinary GA 706KP UT ISI:000184453100004 ER PT J AU Shore, BW TI Coherence and transient nonlinearity in laser probing SO SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY LA English DT Article DE laser probing; excitation properties; coherent transients ID ELECTROMAGNETICALLY INDUCED TRANSPARENCY; STIMULATED RAMAN-SCATTERING; SELF-INDUCED TRANSPARENCY; RING-DOWN SPECTROSCOPY; POPULATION TRANSFER; CHEMICAL-REACTIONS; NEUTRAL ATOMS; PHOTOELECTRON-SPECTROSCOPY; MAGNETIC SUBLEVELS; MULTILEVEL SYSTEMS AB This review of laser probing first outlines some general aspects, noting a number of topics not covered in conference LAP2002. In more detail it describes the probing of atoms (or molecules) to determine excitation properties. This leads naturally to the consideration of ways in which coherent transients affect the response of matter to laser radiation. These include stimulated Raman adiabatic passage, with associated dark state, and electromagnetically induced modifications of transparency and refractive indices. (C) 2003 Elsevier Science B.V. All rights reserved. RP Shore, BW, 618 Escondidio Cir, Livermore, CA 94550 USA. 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Acta Pt. B-Atom. Spectr. PD JUN 30 PY 2003 VL 58 IS 6 BP 969 EP 998 PG 30 SC Spectroscopy GA 703VB UT ISI:000184301200002 ER PT J AU Lamoureux, G Roux, B TI Modeling induced polarization with classical Drude oscillators: Theory and molecular dynamics simulation algorithm SO JOURNAL OF CHEMICAL PHYSICS LA English DT Article ID STATIC DIELECTRIC-CONSTANT; WATER-WATER INTERACTION; PARTICLE-MESH EWALD; LIQUID WATER; SHELL-MODEL; POTENTIAL FUNCTIONS; COMPUTER-SIMULATION; ELECTRONEGATIVITY EQUALIZATION; CANONICAL ENSEMBLE; FLUCTUATING CHARGE AB A simple treatment for incorporating induced polarization in computer simulations is formulated on the basis of the classical Drude oscillator model. In this model, electronic induction is represented by the displacement of a charge-carrying massless particle attached to a polarizable atom under the influence of the local electric field. The traditional self-consistent field (SCF) regime of induced polarization is reproduced if these auxiliary particles are allowed to relax instantaneously to their local energy minima for any given fixed configuration of the atoms in the system. In practice, such treatment is computationally prohibitive for generating molecular dynamics trajectories because the electric field must be recalculated several times iteratively to satisfy the SCF condition, and it is important to seek a more efficient way to simulate the classical Drude oscillator model. It is demonstrated that a close approximation to the SCF regime can be simulated efficiently by considering the dynamics of an extended Lagrangian in which a small mass is attributed to the auxiliary particles, and the amplitude of their oscillations away from the local energy minimum is controlled with a low-temperature thermostat. A simulation algorithm in this modified two-temperature isobaric-isothermal ensemble is developed. The algorithm is tested and illustrated using a rigid three-site water model with one additional Drude particle attached to the oxygen which is closely related to the polarizable SPC model of Ahlstrom [Mol. Phys. 68, 563 (1989)]. The tests with the extended Lagrangian show that stable and accurate molecular dynamics trajectories for large integration time steps (1 or 2 fs) can be generated and that liquid properties equivalent to SCF molecular dynamics can be reproduced at a fraction of the computational cost. (C) 2003 American Institute of Physics. C1 Univ Montreal, Dept Phys, Montreal, PQ H3C 3J7, Canada. Cornell Univ, Dept Biochem, Weill Med Coll, New York, NY 10021 USA. RP Lamoureux, G, Univ Montreal, Dept Phys, CP 6128,Succ Ctr Ville, Montreal, PQ H3C 3J7, Canada. 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Chem. Phys. PD AUG 8 PY 2003 VL 119 IS 6 BP 3025 EP 3039 PG 15 SC Physics, Atomic, Molecular & Chemical GA 704QE UT ISI:000184350300010 ER PT J AU Gensch, T Viappiani, C TI Time-resolved photothermal methods: accessing time-resolved thermodynamics of photoinduced processes in chemistry and biology SO PHOTOCHEMICAL & PHOTOBIOLOGICAL SCIENCES LA English DT Review ID TRANSIENT GRATING METHOD; INDUCED OPTOACOUSTIC SPECTROSCOPY; PHOTOACTIVE YELLOW PROTEIN; STRUCTURAL VOLUME CHANGES; PHOTOSYNTHETIC REACTION CENTERS; ELECTRON-TRANSFER REACTIONS; PRESSURE PHOTOACOUSTIC CALORIMETRY; SPERM WHALE CARBOXYMYOGLOBIN; SENSORY RHODOPSIN-II; PHYTOCHROME-A PHOTOTRANSFORMATION AB Photothermal methods are currently being employed in a variety of research areas, ranging from materials science to environmental monitoring. Despite the common term which they are collected under, the implementations of these techniques are as diverse as the fields of application. In this review, we concentrate on the recent applications of time-resolved methods in photochemistry and photobiology. C1 KFA Julich GmbH, Forschungszentrum, Inst Biol Informat Verarbeitung 1, D-52425 Julich, Germany. Univ Parma, Dipartimento Fis, Ist Nazl Fis Mat, I-43100 Parma, Italy. RP Gensch, T, KFA Julich GmbH, Forschungszentrum, Inst Biol Informat Verarbeitung 1, Postfach 1913, D-52425 Julich, Germany. 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Photobiol. Sci. PY 2003 VL 2 IS 7 BP 699 EP 721 PG 23 SC Chemistry, Physical; Biochemistry & Molecular Biology; Biophysics GA 699GE UT ISI:000184047700002 ER PT J AU Losi, A Braslavsky, SE TI The time-resolved thermodynamics of the chromophore-protein interactions in biological photosensors as derived from photothermal measurements SO PHYSICAL CHEMISTRY CHEMICAL PHYSICS LA English DT Review ID PHOTOACTIVE YELLOW PROTEIN; SENSORY RHODOPSIN-II; BLUE-LIGHT RECEPTORS; PHYTOCHROME-A PHOTOTRANSFORMATION; PHOTOSYNTHETIC REACTION CENTERS; ENTROPY-ENTHALPY COMPENSATION; ELECTRON-TRANSFER REACTIONS; PLANT PHOTORECEPTOR DOMAIN; BACTERIAL REACTION CENTERS; STRUCTURAL VOLUME CHANGES AB Laser-induced optoacoustic spectroscopy, LIOAS, and photothermal beam deflection, PBD, were applied to the determination of the time ( nanosecond to millisecond) resolved enthalpy and structural volume changes photoinduced in various biological photosensors and in the phototriggered bacterial ion pump halorhodopsin. A brief section introduces the various photosensors, several of them recently discovered. The photosensors studied with photothermal methods ( LIOAS and PBD) have either a chromophore with an isomerizable double bond, such as phytochrome A of etiolated plants, sensory rhodopsins of Archaea, and photoactive yellow protein of Eubacteria, or an FMN (flavin mononucleotide) chromophore, such as the LOV ( light, oxygen, or voltage) sensing domains of phototropins and related proteins. In particular cases the data allow the evaluation of the entropy changes produced in some of the photoinduced steps, a quantity not available by other methods. In some cases UV-vis spectroscopically silent transient species could be observed. The molecular origin of the structural volume changes is analysed. The problems involved in the application of these techniques to several photosensors are addressed, such as their time limits and the determination of the absorption-determined refractive index changes in PBD. C1 Max Planck Inst Strahlenchem, D-45413 Mulheim, Germany. RP Braslavsky, SE, Max Planck Inst Strahlenchem, Postfach 10 13 65, D-45413 Mulheim, Germany. 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Chem. Chem. Phys. PY 2003 VL 5 IS 13 BP 2739 EP 2750 PG 12 SC Chemistry, Physical; Physics, Atomic, Molecular & Chemical GA 696YH UT ISI:000183914800002 ER PT J AU Battal, T Bain, CD Weiss, M Darton, RC TI Surfactant adsorption and Marangoni flow in liquid jets - I. Experiments SO JOURNAL OF COLLOID AND INTERFACE SCIENCE LA English DT Article DE liquid jet; surfactant; adsorption kinetics; Marangoni effect; ellipsometry; laser Doppler velocimetry; surface tension; surface excess ID DYNAMIC SURFACE; OVERFLOWING CYLINDER; NEWTONIAN LIQUIDS; ELLIPSOMETRY; INTERFACE; HYDRODYNAMICS; KINETICS; TENSION; MODELS; EXCESS AB The adsorption of surfactants at an expanding liquid surface has been studied in a gravity-driven laminar waterjet with Reynolds numbers in the range from 1000 to 2000. Surface concentrations of hexadecyltrimethyl ammonium bromide (C(16)TAB) were deduced from ellipsometric measurements, using a calibration made previously with neutron reflection. Simultaneous measurements of the velocity profile within the jet were made with laser Doppler velocimetry. These two noninvasive techniques were able to measure conditions to within 1 mm of the nozzle, where rates of surface expansion were as high as 300 s(-1). For the laminar jet without surfactant, the measurements are in excellent agreement with CFD calculations and with the theoretical result that the surface velocity varies as z(1/3), where z is the distance from the nozzle. Close to the nozzle the high rate of surface expansion drives both rapid diffusional transport to the surface, and rapid convection on the surface, resulting in a low concentration of surfactant. Higher concentrations of surfactant downstream cause a Marangoni stress which decelerates the surface-an effect clearly shown by the velocity data. In the presence of 0.2 M salt, which significantly depresses the cmc, the adsorption Of C(16)TAB is greatly reduced, probably because it forms cylindrical micelles, which diffuse much more slowly than free monomers. The apparatus is shown to be a very suitable platform for investigating surfactant adsorption and Marangoni flows under carefully controlled hydrodynamic conditions. (C) 2003 Elsevier Science (USA). All rights reserved. C1 Phys & Theoret Chem Lab, Oxford OX1 3QZ, England. Dept Engn Sci, Oxford OX1 3PJ, England. RP Bain, CD, Phys & Theoret Chem Lab, S Parks Rd, Oxford OX1 3QZ, England. 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Hist. Exact Sci. PD JUL PY 2003 VL 57 IS 5 BP 395 EP 431 PG 37 SC Mathematics, Interdisciplinary Applications; History & Philosophy Of Science; History & Philosophy Of Science; History & Philosophy of Science GA 691BL UT ISI:000183584900002 ER PT J AU Kahn, JG Monroy, F Mingotaud, C TI Adsorption of large inorganic polyanions under a charged Langmuir monolayer: an ellipsometric study SO PHYSICAL CHEMISTRY CHEMICAL PHYSICS LA English DT Article ID BLODGETT-FILMS; INTERFACE; SUBPHASE; MODEL AB In previous studies of Langmuir films made of the dimethyldioctadecylammonium bromide the exchange of small counter-ions against large inorganic anions type polyoxometalates induced a densification of the monolayer. However, when the polyanions concentration in the subphase exceeded a critical value the monolayer re-expanded. In this work, we demonstrate, by means of ellipsometric measurements, that those effects can be explained by the adsorption of a first layer of inorganic anion under the organic layer then by the formation of a second diffuse layer when the polyanion concentration continues to increase. This process can be detected and analyzed in our system because of the large size and relatively high refractive index of the inorganic anions. C1 CNRS, Ctr Rech Paul Pascal, F-33600 Pessac, France. Univ Complutense Madrid, Dept Quim Fis 1, E-28040 Madrid, Spain. Univ Toulouse 3, Lab IMRCP, F-31062 Toulouse, France. RP Kahn, JG, CNRS, Ctr Rech Paul Pascal, Av Docteur A Schweitzer, F-33600 Pessac, France. 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PY 2003 VL 5 IS 12 BP 2648 EP 2652 PG 5 SC Chemistry, Physical; Physics, Atomic, Molecular & Chemical GA 687RH UT ISI:000183390100026 ER PT J AU Benia, HM Guemmaz, M Schmerber, G Mosser, A Parlebas, JC TI Optical properties of non-stoichiometric sputtered zirconium nitride films SO APPLIED SURFACE SCIENCE LA English DT Article DE zirconium nitrides; reflectance; resistivity; optical constants; Drude's model ID CU/SI CONTACT SYSTEMS; ZR-N FILMS; NITROGEN PRESSURE; TIN; TEMPERATURE; HFN AB Non-stoichiometric do magnetron-sputtered ZrN films on silicon have been optically and electrically characterized through spectral reflectance measurements and a four-probe method, respectively. The deposition of the films was monitored by the nitrogen gas flow which has been increased from 1 to 11 sccm. Experimental results show that the reflectivity as well as the electrical resistivity strongly depends on the nitrogen concentration. In order to determine the optical constants of the various ZrN layers, Drude's model was used to fit the reflectance spectra of the films with a metallic behavior, and an extended model for the films with a more insulating behavior. The optical resistivity for the frequency omega = 0 was derived from the optical constants and compared to the electrical resistivity obtained by the four-probe method. A good agreement between electrical and optical resistivities was obtained. (C) 2003 Elsevier Science B.V. All rights reserved. C1 ULP, UMR7504 CNRS, IPCMS, F-67034 Strasbourg 2, France. UFAS Univ, DAC Lab, Setif 19000, Algeria. RP Parlebas, JC, ULP, UMR7504 CNRS, IPCMS, 23 Rue Loess, F-67034 Strasbourg 2, France. 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Surf. Sci. PD APR 30 PY 2003 VL 211 IS 1-4 BP 146 EP 155 PG 10 SC Chemistry, Physical; Materials Science, Coatings & Films; Physics, Applied; Physics, Condensed Matter GA 683UZ UT ISI:000183170000018 ER PT J AU Schirrmacher, A TI Planting in his neighbor's garden: David Hilbert and early Gottingen quantum physics SO PHYSICS IN PERSPECTIVE LA English DT Article DE David Hilbert; Woldemar Voigt; Hermann Minkowski; Peter Debye; Max Born; Gottingen; quantum physics; theoretical physics AB David Hilbert (1862-1943) played an important role in establishing quantum physics in Gottingen. I analyze the ways in which his influence was decisive by comparison with Woldemar Voigt (1850-1919). Voigt was the leading Gottingen theoretical physicist before the arrival of Peter Debye (1884-1966), who was appointed to a new professorship in 1914 at Hilbert's instigation. I portray the Gottingen mathematicians, above all Hermann Minkowski (1864-1909) and David Hilbert, as planting the seeds for the blossoming of quantum physics under their student Max Born (1882-1970) in the 1920s. 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Perspect. PD MAR PY 2003 VL 5 IS 1 BP 4 EP 20 PG 17 SC History & Philosophy Of Science; History & Philosophy Of Science; History & Philosophy of Science GA 677HM UT ISI:000182800900002 ER PT J AU Magnus, W TI Quantum mechanical momentum and energy balance equations for transport of charge carriers SO PHYSICA STATUS SOLIDI B-BASIC RESEARCH LA English DT Article ID NONLINEAR ELECTRONIC TRANSPORT; PHONON SYSTEM; FIELD; CONDUCTIVITY; CIRCUITS; SILICON; SOLIDS; BAND AB In this paper some basic features of electrical transport are discussed in terms of quantum mechanical energy and momentum balance equations. The latter are presented as an appropriate tool for the investigation of carrier transport in electric circuits containing mesoscopic active areas in the presence of inhomogeneous electromagnetic fields. C1 Interuniv Microelect Ctr, B-3001 Louvain, Belgium. RP Magnus, W, Interuniv Microelect Ctr, Kapeldreef 75, B-3001 Louvain, Belgium. 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Status Solidi B-Basic Res. PD MAY PY 2003 VL 237 IS 1 BP 341 EP 352 PG 12 SC Physics, Condensed Matter GA 677HX UT ISI:000182801800033 ER PT J AU Iuchi, T Furukawa, T Wada, SE TI Emissivity modeling of metals during the growth of oxide film and comparison of the model with experimental results SO APPLIED OPTICS LA English DT Article AB Emissivity modeling of metals has been developed to elucidate behavior during the growth of oxide film, and the modeling results have been compared with experimental results. To express emissivities, pseudo-optical constants of a bare metal and of an oxide film obtained by an ellipsometer are substituted into the model equations. Emissivity behavior during the growth of an oxide film upon the surface of a specimen is shown in terms of spectral, directional, and polarized characteristics, and it coincides with the experimental results, both quantitatively and qualitatively. The modeling is simple and provides useful guidance for the development of emissivity-compensated radiation thermometry. (C) 2003 Optical Society of America. C1 Toyo Univ, Dept Mech Engn, Kawagoe, Saitama 3508585, Japan. Chino Corp, Sensors Div, Kuki, Saitama 3460028, Japan. RP Iuchi, T, Toyo Univ, Dept Mech Engn, 2100 Kujirai, Kawagoe, Saitama 3508585, Japan. CR ASCHKINASS E, 1905, ANN PHYS-BERLIN, V17, P960 ASPNES DE, 1979, PHYS REV B, V16, P3513 AZZAM RMA, 1986, ELLIPSOMETRY POLARIZ BORN M, 1999, PRINCIPLES OPTICS, P735 BRANDENBERG WM, 1965, S THERM RAD SOL NASA, P313 DEWITT D, 1988, THEORY PRACTICE RAD, P91 DRUDE P, 1898, ANN PHYS, V64, P159 FURUKAWA T, 2000, 39 ANN C SOC INSTR C FURUKAWA T, 2000, REV SCI INSTRUM, V71, P2843 GARDON R, 1956, J AM CERAM SOC, V39, P278 HAGEN E, 2004, VERH DTSCH PHYS GES, V6, P128 IUCHI T, IN PRESS TEMPERATURE, V8 IUCHI T, 2000, P 16 IM WORLD C AUST, V6, P365 IUCHI T, 2001, T SOC INSTRUM CONTRO, V1, P305 KUBELKA P, 1948, J OPT SOC AM, V38, P448 NEUER G, 1988, THERMOCHIM ACTA, V133, P299 PARKER WJ, 1965, S THERM RAD SOL NASA, P11 PRICE DJ, 1947, P PHYS SOC LOND A, V59, P118 SIEGEL R, 1992, THERMAL RAD HEAT TRA, CH4 SIEVERS AJ, 1978, J OPT SOC AM, V68, P1505 TIWALD T, COMMUNICATION TIWALD T, 1999, MEASUREMENT REPORT NR 22 TC 2 PU OPTICAL SOC AMER PI WASHINGTON PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA SN 0003-6935 J9 APPL OPT JI Appl. Optics PD MAY 1 PY 2003 VL 42 IS 13 BP 2317 EP 2326 PG 10 SC Optics GA 672KN UT ISI:000182519900010 ER PT J AU Gadomskii, ON Kadochkin, AS TI Microscopic theory of a quasi-crystalline transition layer on the surface of semi-infinite liquid dielectrics upon Brewster light reflection and the near-field effect SO OPTICS AND SPECTROSCOPY LA English DT Article ID OPTICS AB An adequate theoretical interpretation of experiments on Brewster light reflection from the surfaces of liquids is given on the basis of the near-field effect in the transition layer. The analysis is carried out in terms of the model of a discrete-continuous dielectric, which takes into account the fields of atomic (molecular) dipoles discretely distributed inside the Lorentz sphere surrounding the point of observation. The liquids under consideration that have anisotropic molecules are characterized by a diagonal polarizability tensor within the transition layer and by scalar polarizability in the bulk of the liquid. It is shown that agreement between theoretical and experimental values of the ellipticity of reflected light is obtained due to a random change within a finite interval of the angle of orientation of molecules in the lattice sites in the transition layer. This makes it possible to conclude that the transition layer in the liquids under consideration is quasi-crystalline. (C) 2003 MAIK "Nauka/Interperiodica". C1 Ulyanovsk State Univ, Ulyanovsk 432700, Russia. RP Gadomskii, ON, Ulyanovsk State Univ, Ulyanovsk 432700, Russia. CR BORN M, 1969, PRINCIPLES OPTICS DRUDE P, 1894, WIED ANN, V51, P77 DRUDE P, 1906, LEHRBUCH OPTIK GADOMSKII ON, 1994, ZH EKSP TEOR FIZ, V106, P936 GADOMSKII ON, 1998, KVANTOVAYA ELEKTRON, V25, P529 GADOMSKII ON, 2000, OPT SPECTROSC+, V89, P261 GADOMSKII ON, 2000, USP FIZ NAUK+, V170, P1145 GADOMSKY ON, 1996, J OPT SOC AM B, V13, P1679 GADOMSKY ON, 2001, OPT SPECTROSC+, V91, P749 KIZEL VA, 1954, ZH EKSP TEOR FIZ, V26, P228 KIZEL VA, 1973, REFLECTION LIGHT KRUTITSKY KV, 1997, J PHYS B-AT MOL OPT, V30, P5341 LANDAU LD, 1976, MECHANICS LUMMER O, 1910, ANN PHYS-BERLIN, V31, P325 RAMAN CV, 1925, P ROY SOC LOND A MAT, V109, P252 RAMAN CV, 1927, PHILOS MAG, V3, P220 RAYLEIGH DW, 1892, PHILOS MAG, V16, P1 RAYLEIGH DW, 1908, PHILOS MAG, V33, P444 SCHMIDT KEF, 1894, ANN PHYS-LEIPZIG, V52, P75 SIVUKHIN DV, 1956, ZH EKSP TEOR FIZ, V30, P374 NR 20 TC 0 PU OPTICAL SOC AMER PI WASHINGTON PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA SN 0030-400X J9 OPT SPECTROSC JI Opt. Spectrosc. PD MAR PY 2003 VL 94 IS 3 BP 444 EP 452 PG 9 SC Optics; Spectroscopy GA 668KE UT ISI:000182289200023 ER PT J AU Smirnov, BM TI Kinetics of electrons in gases and condensed systems SO PHYSICS-USPEKHI LA English DT Review ID CROSS-SECTION MEASUREMENTS; QUASI-FREE-ELECTRON; FLUID ARGON; LIQUID XENON; TRANSPORT PARAMETERS; EXCIMER LUMINESCENCE; EXCESS ELECTRONS; DRIFT VELOCITY; EFFECTIVE-MASS; RARE-GASES AB Kinetics of electrons moving in a gas or a plasma under the action of external fields is considered. Elementary processes of elastic and inelastic electron-atom collisions responsible for electron kinetics in weakly ionized atomic gases are analyzed. Various regimes of evolution of electrons in a gas or a plasma in external fields are considered, and the character of atom excitations under these conditions is studied. Methods of describing the electron kinetics in gases and plasma are applied to modeling the electron drift in condensed systems. It is shown that the electric properties of metals and the behavior of an excess electron in dielectrics have common features with electron drift in gases and plasmas. The drift of an excess electron in condensed inert gases is reviewed. C1 Russian Acad Sci, Inst High Temp, Moscow 127412, Russia. RP Smirnov, BM, Russian Acad Sci, Inst High Temp, Izhorskaya Ul 13-19, Moscow 127412, Russia. 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Usp. PD DEC PY 2002 VL 45 IS 12 BP 1251 EP 1286 PG 36 SC Physics, Multidisciplinary GA 664LD UT ISI:000182061800003 ER PT J AU Adamson, P TI Reflection of light in a long-wavelength approximation from an N-layer system of inhomogeneous dielectric films and optical diagnostics of ultrathin layers. I. Absorbing substrate SO JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS LA English DT Article ID SURFACE AB The reflection of s- and p-polarized light from an N-layer system of inhomogeneous ultrathin dielectric films upon absorbing homogeneous substrates is investigated. The first-order approximate expressions for differential reflectance and changes in the ellipsometric parameters that are caused by a multilayer system are obtained in the long-wavelength limit. The possibilities of using these formulas for resolving the inverse problem for inhomogeneous ultrathin films are discussed. A number of novel options are developed for simultaneously determining the dielectric constant and thickness of a homogeneous ultrathin film by differential reflectance and ellipsometric measurements. (C) 2003 Optical Society of America. C1 Univ Tartu, Inst Phys, EE-51014 Tartu, Estonia. RP Adamson, P, Univ Tartu, Inst Phys, Riia 142, EE-51014 Tartu, Estonia. CR ABELES F, 1957, J OPT SOC AM, V47, P473 ADAMSON PV, 1996, OPT SPECTROSC, V80, P459 ARCHER RJ, 1965, J PHYS CHEM SOLIDS, V26, P343 AZZAM RMA, 1977, ELLIPSOMETRY POLARIX BAGCHI A, 1979, PHYS REV B, V20, P4824 BAUER G, 1996, OPTICAL CHARACTERIZA CAHAN BD, 1976, SURF SCI, V56, P354 DRUDE P, 1912, LEHRBUCH OPTIK LEKNER J, 1987, THEORY REFLECTION EL MCINTYRE JD, 1971, SURF SCI, V24, P417 OHANDLEY RC, 1974, SURF SCI, V46, P24 PAIK WK, 1971, SURF SCI, V28, P61 PLIETH WJ, 1977, SURF SCI, V64, P484 SAXENA AN, 1965, J OPT SOC AM, V55, P1061 SHELDON B, 1982, J OPT SOC AM, V72, P1049 TRETYAKOV SA, 2000, IEEE T ANTENN PROPAG, V48, P1858 TYRAS G, 1969, RAD PROPAGATION ELEC WARD L, 1988, OPTICAL CONSTANTS BU NR 18 TC 3 PU OPTICAL SOC AMER PI WASHINGTON PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA SN 0740-3224 J9 J OPT SOC AM B-OPT PHYSICS JI J. Opt. Soc. Am. B-Opt. Phys. PD APR PY 2003 VL 20 IS 4 BP 752 EP 759 PG 8 SC Optics GA 664LR UT ISI:000182063000015 ER PT J AU Mielenz, KD TI Optical diffraction in close proximity to plane apertures. II. Comparison of half-plane diffraction theories SO JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY LA English DT Article DE bidirectional fields; diffraction; half plane; irradiance; Kirchhoff; Maxwell; metallic screen; near zone; optics; Poynting; Rayleigh; scalar wave functions; Sommerfeld; wave equation AB The accuracy and physical significance of the classical Rayleigh-Sommerfeld and Kirchhoff diffraction integrals are assessed in the context of Sommerfeld's rigorous theory of half-plane diffraction and Maxwell's equations. It is shown that the Rayleigh-Sommerfeld integrals are in satisfactory agreement with Sommerfeld's theory in most of the positive near zone, except at sub-wavelength distances from the screen. On account of the bidirectional nature of diffraction by metallic screens the Rayleigh-Sommerfeld integrals themselves cannot be used for irradiance calculations, but must first be resolved into their forward and reverse components and it is found that Kirchhoff's integral is the appropriate measure of the forward irradiance. Because of the inadequate boundary conditions assumed in their derivation the Rayleigh-Sommerfeld and Kirchhoff integrals do not correctly describe the flow of energy through the aperture. C1 Natl Inst Stand & Technol, Phys Lab, Radiometr Phys Div, Gaithersburg, MD 20899 USA. RP Mielenz, KD, Natl Inst Stand & Technol, Phys Lab, Radiometr Phys Div, Gaithersburg, MD 20899 USA. CR BORN M, 1970, PRINCIPLES OPTICS BOUWKAMP CJ, 1954, REP PROGR PHYS, V17, P35 BRAUNBEK W, 1949, ANN PHYS, V6, P53 BRAUNBEK W, 1950, Z PHYS, V127, P381 BRAUNBEK W, 1950, Z PHYS, V127, P405 BRAUNBEK W, 1952, OPTIK, V9, P174 BRAUNBEK W, 1954, Z PHYS, V138, P80 DRUDE P, 1906, LEHRBUCH OPTIK MIELENZ KD, 2000, J RES NATL INST STAN, V105, P589 MIELENZ KD, 2000, J RES NATL INST STAN, V105, P81 MIELENZ KD, 2002, J RES NATL INST STAN, V107, P355 SOMMERFELD A, 1896, MATH ANN, V47, P317 SOMMERFELD A, 1950, OPTIK NR 13 TC 1 PU US GOVERNMENT PRINTING OFFICE PI WASHINGTON PA SUPERINTENDENT DOCUMENTS,, WASHINGTON, DC 20402-9325 USA SN 1044-677X J9 J RES NATL INST STAND TECHNOL JI J. Res. Natl. Inst. Stand. Technol. PD JAN-FEB PY 2003 VL 108 IS 1 BP 57 EP 68 PG 12 SC Engineering, Multidisciplinary; Multidisciplinary Sciences GA 660NV UT ISI:000181840000005 ER PT J AU Buchner, HJ Stiebig, H Mandryka, V Bunte, E Jager, G TI An optical standing-wave interferometer for displacement measurements SO MEASUREMENT SCIENCE & TECHNOLOGY LA English DT Article DE interferometer; optical standing wave; displacement measurement; transparent photodetector AB Laser interferometers have become an important instrument for the measurement of displacement. In future, there is likely to be ever greater importance set on those measuring tasks which use sensors taking up very little space. One solution, proposed here, is a standing-wave interferometer, with a novel photoelectric detector. The latter is 'partially transparent and photoelectrically active', and scans the intensity profile of an optical standing-wave pattern. Arranging two of these transparent photoelectric detectors on the optical axis of the standing wave with the phase shifted permits bidirectional fringe counting. The transparent photoelectric detectors are basically pin-photodiodes with transparent contacts. Two sets of measurements were obtained, the first on a single transparent photoelectric detector and the second on a pair of transparent photoelectric detectors in the standing-wave pattern, and the results are discussed. It is shown that two phase-shifted photoelectric signals (sine and cosine) from two transparent photodetectors in different spatial positions on the optical axis of the standing wave can be received, and that the phase relation between the signals is a function of the distance. C1 Tech Univ Ilmenau, Inst Measurement & Sensor Technol, D-98684 Ilmenau, Germany. KFA Julich GmbH, Forschungszentrum, Inst Photovolta, D-52425 Julich, Germany. RP Buchner, HJ, Tech Univ Ilmenau, Inst Measurement & Sensor Technol, D-98684 Ilmenau, Germany. EM Hans.Buechner@maschinenbau.tu-ilmenau.de CR BOBROFF N, 1993, MEAS SCI TECHNOL, V4, P907 BORN M, 1999, PRINCIPLES OPTICS BUCHNER H, 1983, 330369, DE BUCHNER H, 1988, MEASUREMENT, V6, P146 DRUDE P, 1892, WIED ANN, V45, P460 FUEST R, 1990, ESI PUBLICATION OPTO, S48 HEYDEMANN PLM, 1981, APPL OPTICS, V20, P3382 IVES HE, 1933, J OPT SOC AM, V23, P73 JAGER G, 2001, ANN M ASPE CRYST CIT JESTEL D, 1990, ELECTRON LETT, V26, P1144 KLUTH O, 2003, IN PRESS 17 EUR PHOT LUFT W, 1993, HYDROGENATED AMORPHO PARRIAUX O, 1991, TECH MESS, V58, P158 STEINMETZ CR, 1990, PRECIS ENG, V12, P12 STIEBIG H, 2003, IN PRESS THIN SOLID WIENER O, 1890, ANN PHYS-LEIPZIG, V40, P203 NR 16 TC 4 PU IOP PUBLISHING LTD PI BRISTOL PA DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND SN 0957-0233 J9 MEAS SCI TECHNOL JI Meas. Sci. Technol. PD MAR PY 2003 VL 14 IS 3 BP 311 EP 316 PG 6 SC Engineering, Multidisciplinary; Instruments & Instrumentation GA 659CU UT ISI:000181760600009 ER PT J AU Heringhaus, F Schneider-Muntau, HJ Gottstein, G TI Analytical modeling of the electrical conductivity of metal matrix composites: application to Ag-Cu and Cu-Nb SO MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING LA English DT Article DE composite; high-strength conductor; electrical conductivity; modeling ID IN-SITU COMPOSITES; HIGH-STRENGTH; MICROSTRUCTURE; WIRES; RESISTIVITY; SCALE AB Modeling the electrical conductivity of composite materials is a complex matter, particularly if microstructural features lead to a size effect in electronic conduction or create an anisotropy. The method described in this article accounts for these circumstances by incorporation of appropriate phenomenological models. It provides a means to analyze and estimate the resistive behavior of two-phase or multi-phase micro-composites and nano-composites. A comparison with experimental data is carried out for two high-strength conductors, Ag-Cu and Cu-Nb, both of which have undergone extensive quantitative microstructure analysis to provide the required input for the model. (C) 2002 Elsevier Science B.V. All rights reserved. C1 Natl High Magnet Field Lab, Tallahassee, FL USA. Rhein Westfal TH Aachen, Inst Met Kunde & Metallphys, D-5100 Aachen, Germany. RP Heringhaus, F, OMG AG & Co KG, Hanau, Germany. 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Sci. Eng. A-Struct. Mater. Prop. Microstruct. Process. PD APR 25 PY 2003 VL 347 IS 1-2 BP 9 EP 20 PG 12 SC Materials Science, Multidisciplinary GA 647WE UT ISI:000181116400003 ER PT J AU Churio, MS Brusa, MA Grela, MA Bertolotti, SG Previtali, CM TI Time-resolved photoacoustic calorimetry of aqueous peroxodisulfate photolysis in the presence of nitrite anions SO PHYSICAL CHEMISTRY CHEMICAL PHYSICS LA English DT Article ID VOLUME; WATER; ELECTROLYTES; ENERGETICS; ENTHALPY; DYNAMICS AB The photodissociation of aqueous peroxodisulfate in the presence of nitrite anions was studied between 282 and 292 K by time-resolved photoacoustic calorimetry at 266 nm. Aqueous peroxodisulfate was chosen as the calorimetric reference, thus enabling the measurement of the enthalpy and volume changes associated with the reaction of the photoproduced sulfate radicals with nitrite anions to form SO4-2 and NO2 in the submicrosecond time range. The enthalpy change obtained (-192 +/- 19 kJ mol(-1)) is consistent with available thermochemical data for related species. The interpretation of the measured reaction volume (-13.8 +/- 0.7 mL mol(-1)) points to the ionic charge accumulation on the sulfate anion as the dominating change causing the contraction of the solvent. The comparative analysis of our experimental result and data for partial molar volumes and electrostriction volumes of electrolytes, reinforces the concept that particularly in the case of water, more realistic models for the solvent are needed involving structure rather than continuous features. C1 Univ Nacl Mar del Plata, Fac Ciencias Exactas & Nat, Dept Quim, RA-7600 Mar Del Plata, Argentina. Univ Nacl Rio Cuarto, Dept Quim & Fis, Fac Ciencias Exactas Fisicoquim & Nat, RA-5800 Rio Cuarto, Argentina. RP Churio, MS, Consejo Nacl Invest Cient & Tecn, RA-1033 Buenos Aires, DF, Argentina. 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Chem. Chem. Phys. PY 2003 VL 5 IS 5 BP 902 EP 906 PG 5 SC Chemistry, Physical; Physics, Atomic, Molecular & Chemical GA 644VL UT ISI:000180940500016 ER PT J AU Sausse, P Aguie-Beghin, V Douillard, R TI Effects of epigallocatechin gallate on beta-casein adsorption at the air/water interface SO LANGMUIR LA English DT Article ID PROLINE-RICH PROTEINS; HUMAN SALIVARY HISTATINS; AIR-WATER-INTERFACE; POLYPHENOL; TANNIN; ELLIPSOMETRY; LAYERS; PRECIPITATION; COMPLEXATION; DENATURATION AB Protein adsorption at the air/water interface is of first interest in foam stabilization and has been much studied. Though interactions between polyphenols and proteins in solution have been demonstrated, their effects on protein adsorption properties are totally unknown. The aim of this work is to study the effect of epigallocatechin gallate on beta-casein adsorption. Protein adsorption from a polyphenol-protein solution was monitored by tensiometry and ellipsometry. The adsorption layer structure was measured by spectroscopic ellipsometry, and viscoelastic properties were monitored by an oscillating bubble method. Adsorption kinetics shows that protein adsorption is slowed by the polyphenol. While polyphenol adsorption from pure polyphenol solution is not observed, polyphenol adsorption from the mixture is observed. It seems that protein surface concentration is increased when polyphenol bulk concentration is smaller than 60 mg/L and that protein surface concentration is decreased when polyphenol bulk concentration is larger than 60 mg/L. Moreover, the elastic modulus of the layer increases after the formation of the layer. From these results, it can be concluded that beta-casein adsorption properties are greatly modified by the polyphenol. However, the mechanisms involved remain to be understood. C1 Ctr Rech Agron, URCA, UMR, FARE INRA Equipe Paroi & Mat Fibreux, F-51686 Reims 2, France. RP Douillard, R, Ctr Rech Agron, URCA, UMR, FARE INRA Equipe Paroi & Mat Fibreux, BP 224, F-51686 Reims 2, France. 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Upon determination of normalized Mueller matrix elements and subsequent derivation of the normalized complex Jones reflection matrix r of an n-type doped GaAs substrate covered by a highly resistive GaAs layer, the spectral dependence of the room-temperature magneto-optic dielectric function tensor of n-type GaAs with free-electron concentration of 1.6 x 10(18) cm(-3) at the magnetic field strength of 2.3 T is obtained on a wavelength-by-wavelength basis. These data are in excellent agreement with values predicted by the Drude model. From the magneto-optic generalized ellipsometry measurements of the layered structure, the free-carrier concentration, their optical mobility, the effective-mass parameters, and the sign of the charge carriers can be determined independently, which will be demonstrated. We propose magneto-optic generalized ellipsometry as a novel approach for exploration of free-carrier parameters in complex organic or inorganic semiconducting material heterostructures, regardless of the anisotropic properties of the individual constituents. (C) 2003 Optical Society of America. C1 Univ Nebraska, Dept Elect Engn, Lincoln, NE 68588 USA. JA Woollam Co Inc, Lincoln, NE 68508 USA. Univ Leipzig, Fac Phys & Geowissensch, Inst Expt Phys 2, D-04013 Leipzig, Germany. RP Schubert, M, Univ Leipzig, Fac Phys & Geowissensch, Inst Expt Phys 2, Linne Str 5, D-04013 Leipzig, Germany. 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Opt. Soc. Am. A-Opt. Image Sci. Vis. PD FEB PY 2003 VL 20 IS 2 BP 347 EP 356 PG 10 SC Optics GA 639RN UT ISI:000180643200016 ER PT J AU Muller, CA Miniatura, C TI Multiple scattering of light by atoms with internal degeneracy SO JOURNAL OF PHYSICS A-MATHEMATICAL AND GENERAL LA English DT Article ID COHERENT BACKSCATTERING; WEAK-LOCALIZATION; COLD ATOMS; RAYLEIGH-SCATTERING; CLASSICAL WAVES; MEDIA; PROPAGATION AB An analytical microscopic theory for the resonant multiple scattering of light by cold atoms with arbitrary internal degeneracy is presented. It permits us to calculate the average amplitude and the average intensity for one-photon states of the full transverse electromagnetic field in.-a dilute medium of unpolarized atoms. Special emphasis is laid upon an analysis in terms of irreducible representations of the rotation group.. It allows us to sum explicitly the ladder and maximally crossed diagrams, giving the average intensity in the Boltzmann approximation and the interference corrections responsible for weak localization and coherent backscattering. The exact decomposition into field modes shows that the atomic internal degeneracy contributes to the depolarization of the average intensity and suppresses the interference corrections. Static as well as dynamic quantities such as the transport velocity, diffusion constants and relaxation times for all field modes and all atomic transitions are derived. C1 CNRS, Lab Ondes & Desordre, FRE 2302, F-06560 Valbonne, France. Max Planck Inst Phys Komplexer Syst, D-01187 Dresden, Germany. RP Muller, CA, CNRS, Lab Ondes & Desordre, FRE 2302, 1361 Route des Lucioles, F-06560 Valbonne, France. 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Phys. A-Math. Gen. PD NOV 29 PY 2002 VL 35 IS 47 BP 10163 EP 10188 PG 26 SC Physics, Mathematical; Physics, Multidisciplinary GA 633NG UT ISI:000180288900020 ER PT J AU Greene, GA Finfrock, CC TI Measurements of the specific heat of high-purity copper at temperatures below 8 K by a modified pulse-heating technique SO EXPERIMENTAL THERMAL AND FLUID SCIENCE LA English DT Article DE copper; cryogenic; specific heat; electric pulse; liquid helium AB A precision calorimeter was used to measure the energy deposited in a liquid-helium-cooled copper target as a result of scattered nuclear radiation from an accelerator target in order to simulate the thermal response of a superconducting magnet under such conditions. The methodology selected for the accelerator application was to measure precisely the temperature rise of a copper target in a vacuum, and to convert the results into energy deposition using the specific heat. Therefore, precise measurements of the specific heat of the copper target were necessary to achieve the required precision and accuracy in the energy deposition measurements for the accelerator application. A pulse-heating technique to measure the specific heat was developed in which electrical square waves were delivered to a surface-mounted heater on the copper target, and the temperature rise of the copper target was measured. The specific heat of the copper was measured from 6 to 8 K and compared to data in the literature. The data were also used to infer the electronic- and lattice-specific-heat coefficients and the Debye temperature for the copper that was used. Comparisons of the data to the specific heat and specific-heat coefficients in the literature are presented. The present technique is shown to be useful for the measurement of the specific heat of good thermal conductors, especially metals at cryogenic temperatures, when very high precision is required. (C) 2002 Elsevier Science Inc. All rights reserved. C1 Brookhaven Natl Lab, Upton, NY 11973 USA. RP Greene, GA, Brookhaven Natl Lab, Bldg 703, Upton, NY 11973 USA. CR COLLINGS EW, 1986, APPL SUPERCONDUCTIVI, V1 DEBYE P, 1912, ANN PHYS-BERLIN, V39, P789 DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 DULONG P, 1819, ANN CHIM PHYS, V10, P395 EINSTEIN A, 1907, ANN PHYS-BERLIN, V22, P180 FRANCK JP, 1961, P ROY SOC LOND A MAT, V263, P494 GREENE GA, 2002, NUCL INSTRUMENTS M B KITTEL C, 1996, INTRO SOLID STATE PH ROSENBERG HM, 1963, LOW TEMPERATURE SOLI TOULOUKIAN YS, 1970, THERMOPHYSICAL PROPE, V4, P51 NR 10 TC 0 PU ELSEVIER SCIENCE INC PI NEW YORK PA 360 PARK AVE SOUTH, NEW YORK, NY 10010-1710 USA SN 0894-1777 J9 EXP THERM FLUID SCI JI Exp. Therm. Fluid Sci. PD DEC PY 2002 VL 27 IS 1 BP 111 EP 119 PG 9 SC Engineering, Mechanical; Physics, Fluids & Plasmas; Thermodynamics GA 623UN UT ISI:000179721400009 ER PT S AU Rick, SW Stuart, SJ TI Potentials and algorithms for incorporating polarizability in computer simulations SO REVIEWS IN COMPUTATIONAL CHEMISTRY, VOL 18 SE REVIEWS IN COMPUTATIONAL CHEMISTRY LA English DT Article ID MOLECULAR-DYNAMICS SIMULATIONS; DENSITY-FUNCTIONAL THEORY; POINT-CHARGE MODEL; WATER-WATER INTERACTION; MECHANICS FORCE-FIELDS; CELL MULTIPOLE METHOD; NET ATOMIC CHARGES; ELECTRONEGATIVITY EQUALIZATION METHOD; ELECTRONIC-STRUCTURE VARIATION; PHASE COEXISTENCE PROPERTIES C1 Univ New Orleans, Dept Chem, New Orleans, LA 70148 USA. So Univ New Orleans, Dept Chem, New Orleans, LA 70126 USA. Clemson Univ, Dept Chem, Clemson, SC 29634 USA. RP Rick, SW, Univ New Orleans, Dept Chem, New Orleans, LA 70148 USA. 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CHEM PHYS, V85, P627 NR 260 TC 5 PU WILEY-VCH, INC PI NEW YORK PA 605 THIRD AVE, NEW YORK, NY 10158-0012 USA SN 1069-3599 J9 REV COMP CH PY 2002 BP 89 EP 146 PG 58 GA BV60T UT ISI:000179490700003 ER PT J AU Schubert, M Dollase, W TI Generalized ellipsometry for biaxial absorbing materials: determination of crystal orientation and optical constants of Sb2S3 SO OPTICS LETTERS LA English DT Article ID SYSTEMS AB We demonstrate generalized ellipsometry for precise measurement of the principal indices of refraction, the extinction coefficients, and the orientations of the crystal a, b, and c axes of orthorhombic absorbing materials. Stibnite (Sb2S3) single crystals cut approximately parallel to (100), (010), (001), and (313) are studied at a representative wavelength of 589 nm. The (313) surface is sufficient for retrieval of all optical constants. The expected effects of surface over-layer formation are removed numerically. We propose generalized ellipsometry as a powerful tool for measurement of anisotropic optical function spectra of biaxial materials. (C) 2002 Optical Society of America. C1 Univ Leipzig, Fak Phys & Geowissensch, Inst Expt Phys 2, D-04103 Leipzig, Germany. Lincoln Univ, Dept Elect Engn, Lincoln, NE 68588 USA. Univ Calif Los Angeles, Dept Earth & Space Sci, Los Angeles, CA 90095 USA. Univ Bayreuth, Bayer Geoinst, D-8580 Bayreuth, Germany. RP Schubert, M, Univ Leipzig, Fak Phys & Geowissensch, Inst Expt Phys 2, Linnestr 5, D-04103 Leipzig, Germany. 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Lett. PD DEC 1 PY 2002 VL 27 IS 23 BP 2073 EP 2075 PG 3 SC Optics GA 621AC UT ISI:000179565500005 ER PT J AU Mauzerall, D Hou, JM Boichenko, VA TI Volume changes and electrostriction in the primary photoreactions of various photosynthetic systems: estimation of dielectric coefficient in bacterial reaction centers and of the observed volume changes with the Drude-Nernst equation SO PHOTOSYNTHESIS RESEARCH LA English DT Article DE electrostriction; photoacoustics; reaction centers; thermodynamics; volume changes ID ELECTRON-TRANSFER REACTIONS; CYANOBACTERIUM SYNECHOCYSTIS PCC-6803; RHODOBACTER-SPHAEROIDES R-26; DEPLETED PHOTOSYSTEM-II; ENTROPY; ENTHALPY; ENERGY; THERMODYNAMICS; ABSORPTION; OXYGEN AB Photoacoustics (PA) allows the determination of enthalpy and volume changes of photoreactions in photosynthetic reaction centers on the 0.1-10 mus time scale. These include the bacterial centers from Rb. sphaeroides, PS I and PS II centers from Synechocystis and in whole cells. In vitro and in vivo PA data on PS I and PS II revealed that both the volume change (-26 A(3)) and reaction enthalpy (-0.4 eV) in PS I are the same as those in the bacterial centers. However the volume change in PS II is small and the enthalpy far larger, -1 eV. Assigning the volume changes to electrostriction allows a coherent explanation of these observations. One can explain the large volume decrease in the bacterial centers with an effective dielectric coefficient of similar to4. This is a unique approach to this parameter so important in estimation of protein energetics. The value of the volume contraction for PS I can only be explained if the acceptor is the super- cluster (Fe4S4)(Cys(4)) with charge change from -1 to -2. The small volume change in PS II is explained by sub-mus electron transfer from Y-Z anion to P-680 cation, in which charge is only moved from the Y-Z anion to the Q(A) with no charge separation or with rapid proton transfer from oxidized Y-Z to a polar region and thus very little change in electrostriction. At more acid pH equally rapid proton transfer from a neighboring histidine to a polar region may be caused by the electric field of the P-680 cation. C1 Rockefeller Univ, New York, NY 10021 USA. Russian Acad Sci, Inst Basic Biol Problems, Pushchino 142290, Russia. RP Mauzerall, D, Rockefeller Univ, 1230 York Ave, New York, NY 10021 USA. CR ARNAUT LG, 1992, REV SCI INSTRUM, V63, P5381 BOICHENKO VA, 2001, BIOCHEMISTRY-US, V40, P7126 BRASLAVSKY SE, 1992, CHEM REV, V92, P1381 BRETTEL K, 1997, BBA-BIOENERGETICS, V1318, P322 BUSER CA, 1990, BIOCHEMISTRY-US, V29, P8977 CHA Y, 1992, PLANT PHYSIOL, V100, P1869 DINER BA, 2001, BBA-BIOENERGETICS, V1503, P147 DRUDE P, 1894, Z PHYS CHEM, V15, P79 EDENS GJ, 2000, J AM CHEM SOC, V122, P1479 FALLER P, 2001, P NATL ACAD SCI USA, V98, P14368 FEITELSON J, 1996, J PHYS CHEM-US, V100, P7698 HOU JM, 2001, BIOCHEMISTRY-US, V40, P7109 HOU JM, 2001, BIOCHEMISTRY-US, V40, P7117 KLEINFELD D, 1979, TUNNELING BIOL SYSTE, P384 LEY AC, 1982, BIOCHIM BIOPHYS ACTA, V680, P95 LOGUNOV SL, 1997, J PHYS CHEM B, V101, P6629 LOSI A, 1999, BIOPHYS J, V77, P3277 MALKIN S, 1994, ANNU REV PLANT PHYS, V45, P493 MAUZERALL DC, 1995, BIOPHYS J, V68, P275 REINMAN S, 1981, BIOCHIM BIOPHYS ACTA, V635, P249 REINMAN S, 1981, BIOCHIM BIOPHYS ACTA, V635, P429 SARVAZYAN AP, 1979, BIOPOLYMERS, V18, P3015 SUN J, 1998, METHOD ENZYMOL, V297, P124 TANG XS, 1994, BIOCHEMISTRY-US, V33, P4594 TARS M, 1994, LITHUANIAN J PHYS, V34, P320 TOMMOS C, 2000, BBA-BIOENERGETICS, V1458, P199 VANGRONDELLE R, 1994, BBA-BIOENERGETICS, V1187, P1 XU Q, 2000, J PHYS CHEM B, V104, P8035 NR 28 TC 5 PU KLUWER ACADEMIC PUBL PI DORDRECHT PA VAN GODEWIJCKSTRAAT 30, 3311 GZ DORDRECHT, NETHERLANDS SN 0166-8595 J9 PHOTOSYNTH RES JI Photosynth. Res. PY 2002 VL 74 IS 2 BP 173 EP 180 PG 8 SC Plant Sciences GA 611EJ UT ISI:000179003200008 ER PT J AU De, A Puri, A TI Application of plasma resonance condition for prediction of large Kerr effects SO JOURNAL OF APPLIED PHYSICS LA English DT Article ID ENHANCEMENT; ROTATION; FILMS AB Resonance like enhancement of magneto-optic Kerr effects (MOKEs) have been attributed to numerous effects, one of them being plasma resonance of free charge carriers, which is analytically and numerically investigated here. Analytical expressions for frequency dependent enhancement of MOKE are obtained in the general framework of the Drude model, which are then applied to well known expressions describing MOKE. The derived expressions are numerically tested for various optical constants. It is known that for certain materials, the resonance like enhancements in the Kerr spectrum occur in the near vicinity of Re[epsilon(xx)]=1, which is generally near the plasma edge. This is seen to be true when the plasma frequency omega(p) is greater in magnitude as compared to the cyclotron frequency omega(c), i.e., if omega(p)>omega(c), whereas in the event of a large reflection edge split, i.e., if omega(p)similar toomega(c) the resonance like peaks will occur near Re[epsilon(+).epsilon(-)]approximate to1, which is a relatively more general condition as compared to Re[epsilon(xx)]=1. Second, we see through model calculations that the spectral proximity of the MOKE resonance peak to the plasma edge is also subject to the magnitude of the background dielectric constant. Results are explained analytically and numerically. Good agreement is obtained between the expressions derived here and the numerically observed occurrence of resonance like peaks in the Kerr spectrum. (C) 2002 American Institute of Physics. C1 Univ New Orleans, Dept Phys, New Orleans, LA 70148 USA. RP Puri, A, Univ New Orleans, Dept Phys, New Orleans, LA 70148 USA. CR ARGYRES PN, 1955, PHYS REV, V97, P334 BENNETT HS, 1965, PHYS REV, V137, A448 BRANDLE H, 1989, HELV PHYS ACTA, V62, P199 BUCHSBAUM SJ, 1964, P INT C PHYS SEM S P DE A, 2002, J APPL PHYS, V91, P9777 DELIN A, 1999, PHYS REV B, V60, P14105 DRUDE P, 1959, THEORY OPTICS EGASHIRA K, 1974, J APPL PHYS, V45, P3643 ERSKINE JL, 1973, PHYS REV B, V8, P1239 FEIL H, 1988, PHYS REV LETT, V60, P1989 FIEL H, 1988, PHYS REV LETT, V58, P65 HAVROIDES JG, 1972, OPTICAL PROPERTIES S, CH7 KATAYAMA T, 1988, PHYS REV LETT, V60, P1426 LAX B, 1960, PHYS REV LETT, V4, P16 OPPENEER P, 1994, J PHYS CONDENS MATT, V6, P285 PALIK ED, 1962, P INT C PHYS SEM I P, P288 REIM W, 1984, J APPL PHYS, V55, P2155 REIM W, 1988, APPL PHYS LETT, V53, P2453 REIM W, 1990, FERROMAGNETIC MAT, V5 RUTKIN OG, 1993, PHYS SOLID STATE, V35, P900 SCHNATTERLY SE, 1969, PHYS REV, V183, P664 SCHOENES J, 1988, PHYS REV LETT, V60, P1988 WITTEKOEK S, 1975, PHYS REV B, V12, P2777 NR 23 TC 4 PU AMER INST PHYSICS PI MELVILLE PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA SN 0021-8979 J9 J APPL PHYS JI J. Appl. Phys. PD NOV 1 PY 2002 VL 92 IS 9 BP 5401 EP 5408 PG 8 SC Physics, Applied GA 607AA UT ISI:000178767200081 ER PT J AU Balakin, AB Lemos, JPS TI Optical activity induced by curvature in a gravitational pp-wave background SO CLASSICAL AND QUANTUM GRAVITY LA English DT Article ID QED VACUA; MEDIA; POLARIZATION; RADIATION; LIGHT AB We study the optical activity induced by curvature. The optical activity model we present has two phenomenological gyration parameters within which we analyse three model cases, namely, an exactly integrable model, the Landau-Lifshitz model and the Fedorov model; the latter two are solved in the short-wavelength approximation. The model background is a gravitational pp-wave. The solutions show that the optical activity induced by curvature leads to Faraday rotation. C1 Kazan VI Lenin State Univ, Kazan 420008, Russia. Inst Super Tecn, Dept Fis, CENTRA, Ctr Muntidisciplinar Astrofis, P-1049001 Lisbon, Portugal. MCT, Observ Nacl, BR-20921 Rio De Janeiro, Brazil. RP Balakin, AB, Kazan VI Lenin State Univ, Kremlevskaya St 18, Kazan 420008, Russia. 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Quantum Gravity PD OCT 7 PY 2002 VL 19 IS 19 BP 4897 EP 4908 PG 12 SC Physics, Multidisciplinary GA 606VN UT ISI:000178755400008 ER PT J AU Adamson, P TI Laser diagnostics of nanoscale dielectric films on absorbing substrate by differential reflectivity and ellipsometry SO OPTICS AND LASER TECHNOLOGY LA English DT Article DE optical diagnostics; nanoscale films; ellipsometry; differential reflectivity AB The differential reflection characteristics for ultrathin inhomogeneous dielectric film on absorbing substrate are investigated in the long-wavelength approximation. The obtained first-order expressions for differential reflectivity and changes in the ellipsometric angles caused by ultrathin layer are of immediate interest to the solution of the inverse problem. The method to determine the averaged values (not the realistic profile) of refractive index for inhomogeneous nanometric films are shown. The novel possibilities for determining the dielectric constant and thickness of nanoscale homogeneous films by the differential ellipsometric and reflectivity measurements are developed, and a simple method to estimate whether the nanometric film is homogeneous or not is also discussed. (C) 2002 Elsevier Science Ltd. All rights reserved. C1 Univ Tartu, Inst Phys, EE-51014 Tartu, Estonia. RP Adamson, P, Univ Tartu, Inst Phys, Riia 142, EE-51014 Tartu, Estonia. CR ABELES F, 1957, J OPT SOC AM, V47, P473 ADAMOV EO, 1997, ATOM ENERG, V82, P3 ADAMSON PV, 1996, OPT SPECTROSC, V80, P459 ADAMSON PV, 1996, TECH PHYS LETT, V22, P837 ADAMSON PV, 1997, OPT SPECTROSC, V83, P154 ARCHER RJ, 1965, J PHYS CHEM SOLIDS, V26, P343 AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ BORN M, 1969, PRINCIPLES OPTICS DRUDE P, 1912, LEHRBUCH OPTIK JACOBSSON R, 1966, PROGR OPTICS, V5, P247 LEKNER J, 1987, THEORY REFLECTION EL MCINTYRE JD, 1971, SURF SCI, V24, P417 SAXENA AN, 1965, J OPT SOC AM, V55, P1061 SHELDON B, 1982, J OPT SOC AM, V72, P1049 WARD L, 1988, OPTICAL CONSTANTS BU NR 15 TC 2 PU ELSEVIER SCI LTD PI OXFORD PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND SN 0030-3992 J9 OPT LASER TECHNOL JI Opt. Laser Technol. PD OCT PY 2002 VL 34 IS 7 BP 561 EP 568 PG 8 SC Optics GA 601GX UT ISI:000178439100010 ER PT S AU Keller, O TI Optical works of L.V. Lorenz SO PROGRESS IN OPTICS, VOLUME 43 SE PROGRESS IN OPTICS LA English DT Review ID LOCAL-FIELDS; ATOM C1 Univ Aalborg, Inst Phys, DK-9220 Aalborg, Denmark. RP Keller, O, Univ Aalborg, Inst Phys, Pontoppidanstraede 103, DK-9220 Aalborg, Denmark. 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These new measurements have extended our previous measurements of these glasses to high temperature and where the non-Arrhenius behavior becomes even more pronounced. The decrease in the conductivity amounts to approximately two orders of magnitude at the highest temperatures for the highest conductivity glasses. The non-Arrhenius behavior increases with increasing AgI concentration to the point that at highest temperature, the conductivity of the glass with highest AgI fraction is only marginally more conducting that the glass without any AgI dopant. A new model of the ionic dynamics in glass has been proposed to account for the non-Arrhenius conductivity in these glasses. The Drude scattering model of classically behaving particles was applied to the conductivity of these glasses. While this zeroth order model is not able to correctly predict the temperature dependence over the full temperature range, from Arrhenius at low temperature to strongly non-Arrhenius at elevated temperature, it does correctly predict the maximum conductivity that these glasses are tending toward, similar to1 (Omegacm)(-1), and correctly predicts the temperature range where ion scattering processes become strong enough to produce the non-Arrhenius behavior seen for these glasses. (C) 2002 Published by Elsevier Science B.V. C1 Iowa State Univ, Dept Mat Sci & Engn, Ames, IA 50011 USA. RP Martin, SW, Iowa State Univ, Dept Mat Sci & Engn, 3053 Gilman Hall, Ames, IA 50011 USA. 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Non-Cryst. Solids PD SEP PY 2002 VL 307 BP 981 EP 991 PG 11 SC Materials Science, Ceramics; Materials Science, Multidisciplinary GA 594FJ UT ISI:000178038100132 ER PT J AU Goncalves, D Irene, EA TI Fundamentals and applications of spectroscopic ellipsometry SO QUIMICA NOVA LA English DT Article DE ellipsometry; polarization; films ID THERMALLY GROWN OXIDE; OPTICAL-PROPERTIES; THIN-FILMS; SI; INTERFACE; MICROELECTRONICS; SIO2-FILMS; CONVERSION; PLASMA AB This paper describes the use of ellipsometry as a precise and accurate technique for characterizing substrates and overlayers. A brief historical development of ellipsometry and the basic principles necessary to understand how an ellipsometer works are presented. There are many examples of studies performed in addressing materials science issues, and several are presented here: measurements of thickness, optical properties, and modeling of surface roughness. These selected results obtained in our laboratory for substrates, Si/SiO2 interfaces, and polymers provide evidence that ellipsometry can play a critical role in characterizing different types of materials. C1 Univ N Carolina, Dept Chem, Chapel Hill, NC 27599 USA. Univ Sao Paulo, Inst Fis Sao Carlos, BR-13560970 Sao Carlos, SP, Brazil. RP Goncalves, D, Univ N Carolina, Dept Chem, CB 3290, Chapel Hill, NC 27599 USA. 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Nova PD SEP-OCT PY 2002 VL 25 IS 5 BP 794 EP 800 PG 7 SC Chemistry, Multidisciplinary GA 594TW UT ISI:000178067900015 ER PT J AU Feitelson, J Mauzerall, D TI Enthalpy and electrostriction in the electron-transfer reaction between triplet zinc uroporphyrin and ferricyanide SO JOURNAL OF PHYSICAL CHEMISTRY B LA English DT Article ID REACTION CENTERS; VOLUME CHANGES; RHODOBACTER-SPHAEROIDES; AQUEOUS-SOLUTIONS; ENTROPY CHANGES; RU(BPY)(3)(2+); ENERGY; STATE AB The electron-transfer reaction of triplet-state zinc uroporphyrin (ZnU) with ferricyanide ion, using pulsed, time-resolved photoacoustics, has a very large volume contraction of -35 +/- 2 Angstrom(3)/molecule and an enthalpy change of -1.5 +/- 0.15 eV/molecule. Via the known free energy of this reaction, -1.31 eV/molecule, the TDeltaS is -0.2 +/- 0.2 eV/molecule (T = 25 degreesC). The volume change is somewhat larger than that observed in bacterial reaction centers: the high charge of the ferri/ferrocyanides compensates for the much larger dielectric coefficient of water causing the electrostriction to be about the same. The classical Drude-Nernst equation predicts a volume change of about half the observed value. This failure for small or highly charged ions has been often noted in the literature. We partially account for this failure with a simple saturation function for the orientation polarization of the water dipoles in the electric field of the ions using the integral form of the Drude-Nernst equation. X-ray structural data show that the ions themselves do not change volume with change of charge. Electrochemical measurements show that the ferri- (+electron) to ferrocyanide reaction has a molar enthalpy of -1.15 +/- 0.1 eV and entropy (TDeltaS, T = 25 degreesC) of -0.65 +/- 0.15 eV at standard conditions versus the normal hydrogen electrode. Allowing for errors, we may assign the differences between the photoacoustic and electrochemical data to the ZnU --> ZnU+ (+electron) partial reaction. Its enthalpy is -0.35 +/- 0.2 eV and TDeltaS is +0.45 +/- 0.35 eV under the same condtions. Continuing in this manner, we can use the previously measured thermodynamic values for the triplet ZnU+ naphthoquinone-2-sulfonate (NQS) to obtain those for the partial reaction NQS (+electron) --> NQS(-). Its molar enthalpy is -0.75 +/- 0.3 eV and the TDeltaS is -0.7 +/- 0.4 eV. The entropy changes are clearly important contributions to the free energy. It is the unique ability of pulsed, time-resolved photoacoustics to easily obtain such thermodynamic data that renders it a most useful tool. C1 Rockefeller Univ, New York, NY 10021 USA. Hebrew Univ Jerusalem, Dept Chem Phys, IL-91904 Jerusalem, Israel. Hebrew Univ Jerusalem, Farkas Ctr Light Induced Proc, IL-91904 Jerusalem, Israel. RP Mauzerall, D, Rockefeller Univ, 1230 York Ave, New York, NY 10021 USA. 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Phys. Chem. B PD SEP 19 PY 2002 VL 106 IS 37 BP 9674 EP 9678 PG 5 SC Chemistry, Physical GA 593TY UT ISI:000178010700028 ER PT J AU Davenas, J Besbes, S Ben Ouada, H Majdoub, M TI Charge transfer processes in polymer light-emitting diodes SO MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS LA English DT Article DE charge transfer; PLED; PPV; Drude ID TRANSPARENT CONDUCTING OXIDES; PPV AB Optical characterisation of an organic soluble poly (paraphenylene vinylene) (PPV) derivative involving an alkyloxy pendant group on the phenylene ring has shown a shift of the absorption and emission towards longer wavelengths in comparison to PPV ones. The changes of the optical characteristics arc ascribed to the redistribution of the pi molecular orbital over the phenylene ring induced by the alkyloxy substituent. The comparison of the absorption and emission of the PPV derivative in solution or as a thin layer shows the role of the interchain interactions in condensed matter. Another example of the importance of charge transfer processes in PLED is provided by the indium tin oxide (ITO)/poly (vinyl carbazole) (PVK) hole transport layer interface. The weakening of the ITO absorption in the UV resulting from interband transitions has been interpreted by the depletion of the ITO free carriers at the contact of PVK. The shift towards longer wavelengths of the plasma frequency in the near infrared confirms the reduction of the free electron concentration in ITO, which has been estimated to 30% using the Drude free electron theory. The formation of a dipole layer at the interface can account for such charge transfers. (C) 2002 Elsevier Science B.V All rights reserved. C1 Univ Lyon 1, UMR 5627, CNRS, F-69100 Villeurbanne, France. Fac Sci, Lab Phys Interfaces, Monastir 5000, Tunisia. Fac Sci, Lab Polymeres & Membranes, Monastir 5000, Tunisia. RP Davenas, J, Univ Lyon 1, UMR 5627, CNRS, 43 Bd 11 Novembre, F-69100 Villeurbanne, France. CR BRADLEY JDD, 1987, J PHYS D, V201, P1389 BURROUGHES JH, 1990, NATURE, V347, P539 CASU MB, 2002, E MRS SPRING M 2001, V127, P185 CHUNG SJ, 1998, ADV MATER, V10, P684 COUTTS TJ, 2000, MRS BULL, V25, P58 DRUDE P, 1900, ANN PHYSIK, V3, P369 GINLEY DS, 2000, MRS BULL, V25, P15 GREENHAM NC, 1995, SOLID STATE PHYS, V49, P47 HILL IG, 2000, ORG ELECTRON, V1, P5 ISHII H, 1999, ADV MATER, V11, P605 MARTIN SJ, 1998, OPT MATER, V9, P88 NASSAU K, 1983, PHYSICS CHEM COLOR, P109 WESSLING RA, 1985, J POLYM SCI POLYM S, V72, P55 NR 13 TC 6 PU ELSEVIER SCIENCE BV PI AMSTERDAM PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS SN 0928-4931 J9 MAT SCI ENG C-BIOMIM SUPRAM S JI Mater. Sci. Eng. C-Biomimetic Supramol. Syst. PD SEP 1 PY 2002 VL 21 IS 1-2 SI Sp. Iss. SI BP 259 EP 264 PG 6 SC Materials Science, Multidisciplinary GA 592YD UT ISI:000177963700041 ER PT J AU Denicolai, M TI Optimal performance for Tesla transformers SO REVIEW OF SCIENTIFIC INSTRUMENTS LA English DT Article AB The previous work related to finding improved performance for Tesla transformers is shortly reviewed. The possibilities to reach the optimal working point by modifying the main components are discussed from a practical standpoint. A methodology for maximizing the secondary voltage by regulating the tuning ratio T and the coupling coefficient is examined in particular. It is shown that its results are valid only if primary and secondary inductor values remain unchanged, and the secondary capacitor value is decreased. All in all, the best improvement from the typical condition of T=1 increases the secondary voltage of only 18% and requires tide coupling. This, in turn, imposes severe engineering problems to avoid dielectric breakdown between the primary and secondary coils, and makes the practical utility of this result someway questionable. In a real Tesla transformer, the most practical mean to perform tuning is to move the tap feeding the primary coil, rather than rewinding the secondary coil or redesigning the secondary top terminal. The resonant circuits are not undamped and it is crucial to reach the maximum voltage at the secondary in the shortest time, to minimize losses. It is shown that, in order to achieve optimal performance, a better strategy is to tune the primary coil to achieve T=1 and then to increase the coupling coefficient as much as possible, aiming at one of the values selected from a given table. (C) 2002 American Institute of Physics. C1 Helsinki Univ Technol, High Voltage Inst, FIN-02015 Espoo, Finland. RP Denicolai, M, Helsinki Univ Technol, High Voltage Inst, POB 3000, FIN-02015 Espoo, Finland. CR BIENIOSEK FM, 1990, REV SCI INSTRUM, V61, P1717 DENICOLAI M, 2001, TKKSJT52 HELS U TECH DEQUEIROZ ACM, 2000, 2000 IEEE ISCAS, V5, P413 DEQUEIROZ ACM, 2001, UNPUB DRUDE P, 1904, ANN PHYS-BERLIN, V13, P512 FINKELSTEIN D, 1966, REV SCI INSTRUM, V37, P159 PHUNG BT, 1991, 7 INT S HIGH VOLT EN, V5, P133 REED JL, 1988, REV SCI INSTRUM, V59, P2300 SMYTHE WR, 1950, STATIC DYNAMIC ELECT TERMAN FE, 1943, RADIO ENG HDB NR 10 TC 0 PU AMER INST PHYSICS PI MELVILLE PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA SN 0034-6748 J9 REV SCI INSTR JI Rev. Sci. Instrum. PD SEP PY 2002 VL 73 IS 9 BP 3332 EP 3336 PG 5 SC Physics, Applied; Instruments & Instrumentation GA 586TC UT ISI:000177600300032 ER PT J AU Merrett, K Cornelius, RM McClung, WG Unsworth, LD Sheardown, H TI Surface analysis methods for characterizing polymeric biomaterials SO JOURNAL OF BIOMATERIALS SCIENCE-POLYMER EDITION LA English DT Review DE surface characterization; SEM; AFM; XPS; SIMS; contact angle; ellipsometry ID ATOMIC-FORCE MICROSCOPY; SELF-ASSEMBLED MONOLAYERS; AIR-WATER-INTERFACE; ION MASS-SPECTROMETRY; ORGANIZED MOLECULAR ASSEMBLIES; SOLID-LIQUID INTERFACE; NEUTRON REFLECTION; X-RAY; PROTEIN ADSORPTION; IN-VITRO AB Surface properties have an enormous effect on the success or failure of a biomaterial device, thus signifying the considerable importance of and the need for adequate characterization of the biomaterial surface. Microscopy techniques used in the analysis of biomaterial surfaces include scanning electron microscopy, transmission electron microscopy, atomic force microscopy, and confocal microscopy. Spectroscopic techniques include X-ray photoelectron spectroscopy, Fourier Transform infrared attenuated total reflection and secondary ion mass spectrometry. The measurement of contact angles, although one of the earlier techniques developed remains a very useful tool in the evaluation of surface hydrophobicity/ hydrophilicity. This paper provides a brief, easy to understand synopsis of these and other techniques including emerging techniques, which are proving useful in the analysis of the surface properties of polymeric biomaterials. Cautionary statements have been made, numerous authors referenced and examples used to show the specific type of information that can be acquired from the different techniques used in the characterization of polymeric biomaterials surfaces. C1 McMaster Univ, Dept Chem Engn, Hamilton, ON L8S 4L7, Canada. McMaster Univ, Dept Pathol, Hamilton, ON L8S 4L7, Canada. McMaster Univ, Dept Mol Med, Hamilton, ON L8S 4L7, Canada. Univ Ottawa, Dept Chem Engn, Ottawa, ON K1N 6N5, Canada. RP Sheardown, H, McMaster Univ, Dept Chem Engn, Hamilton, ON L8S 4L7, Canada. 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Biomater. Sci.-Polym. Ed. PY 2002 VL 13 IS 6 BP 593 EP 621 PG 29 SC Engineering, Biomedical; Materials Science, Biomaterials; Polymer Science GA 587NT UT ISI:000177648500001 ER PT J AU Fenistein, D Bonn, D Rafai, S Wegdam, GH Meunier, J Parry, AO da Gama, MMT TI What controls the thickness of wetting layers near bulk criticality? SO PHYSICAL REVIEW LETTERS LA English DT Article ID LIQUID VAPOR INTERFACE; TRANSITION AB We study the thickness of wetting layers in the binary-liquid mixture cyclohexane methanol. Far from the bulk critical point, the wetting layer thickness is independent of temperature, resulting from the competition between van der Waals and gravitational forces. Upon approaching the bulk critical temperature [t=(T-c-T)/T-c-->0], we observe that the wetting layer thickness diverges as t(-(β) over cap) with effective critical exponent (β) over cap =0.23+/-0.06. This is characteristic of a broad, intermediate scaling regime for the crossover from van der Waals wetting to critical scaling. We predict (β) over cap=beta/3approximate to0.11, with beta the usual bulk-order parameter critical exponent, showing a small but significant difference with experiment. C1 Ecole Normale Super, Phys Stat Lab, F-75231 Paris 05, France. Van der Waals Zeeman Inst, NL-1018 XE Amsterdam, Netherlands. Univ London Imperial Coll Sci Technol & Med, Dept Math, London SW7 2BZ, England. Univ Lisbon, Ctr Fis Mat Condensada, P-1699 Lisbon, Portugal. RP Fenistein, D, Ecole Normale Super, Phys Stat Lab, 24 Rue Lhomond, F-75231 Paris 05, France. 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Rev. Lett. PD AUG 26 PY 2002 VL 89 IS 9 AR 096101 DI ARTN 096101 PG 4 SC Physics, Multidisciplinary GA 585MR UT ISI:000177529000036 ER PT J AU Salem, RR TI Thermodynamics and electrostatics of a metal-solution interface SO PROTECTION OF METALS LA English DT Article ID DOUBLE-LAYER; ADSORPTION; SOLVENT; MODEL AB Based on the fundamental equations of thermodynamics and electrostatics, quantitative and qualitative analysis of the properties of a metal-electrolyte boundary showed that one should choose electronic rather than conventional models of the double layer structure. C1 Russian Acad Sci, High Chem Coll, Moscow 125047, Russia. RP Salem, RR, Russian Acad Sci, High Chem Coll, Miusskaya Pl 9, Moscow 125047, Russia. 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Met. PD JUL-AUG PY 2002 VL 38 IS 4 BP 297 EP 309 PG 13 SC Metallurgy & Metallurgical Engineering GA 584EW UT ISI:000177455100001 ER PT J AU Franta, D Ohlidal, I Klapetek, P Montaigne-Ramil, A Bonanni, A Stifter, D Sitter, H TI Influence of overlayers on determination of the optical constants of ZnSe thin films SO JOURNAL OF APPLIED PHYSICS LA English DT Article ID SPECTROSCOPIC ELLIPSOMETRY; GAAS; MULTISAMPLE; OXIDE AB In this article a multisample modification of variable angle spectroscopic ellipsometry is used to characterize ZnSe thin films prepared by molecular beam epitaxy on substrates formed by GaAs single crystals. Atomic force microscopy (AFM) is employed to characterize the morphology of the upper boundaries of these films. To interpret the ellipsometric data a relatively complicated physical model that contains a rough overlayer between the ambient and the ZnSe film and a transition layer between the GaAs substrate and the ZnSe film is employed. Several models of dispersion of the optical constants of the overlayers are examined to interpret the ellipsometric data. It is shown that the choice of overlayer dispersion model has a strong influence on determining the optical constants and dielectric function of the ZnSe films in the near-UV region. Within the visible region there are no differences between the overlayer dispersion models regarding determination of the ZnSe optical constants. The spectral dependences of the ZnSe dielectric function obtained are compared with those presented by other researchers. Further, by AFM it is shown that the upper boundaries of the ZnSe films are randomly rough and partially covered with small objects. (C) 2002 American Institute of Physics. C1 Masaryk Univ, Fac Sci, Lab Plasma Phys & Plasma Sources, CS-61137 Brno, Czech Republic. Masaryk Univ, Fac Sci, Dept Phys Elect, CS-61137 Brno, Czech Republic. Czech Metrol Inst, Brno 63800, Czech Republic. Johannes Kepler Univ, Inst Semicond Phys, A-4040 Linz, Austria. RP Franta, D, Masaryk Univ, Fac Sci, Lab Plasma Phys & Plasma Sources, Kotlarska 2, CS-61137 Brno, Czech Republic. CR ADACHI S, 1991, PHYS REV B, V43, P9569 ASPNES DE, 1981, J ELECTROCHEM SOC, V128, P590 BRUGGEMAN DAG, 1935, ANN PHYS-BERLIN, V24, P636 DAHMANI R, 1994, J APPL PHYS, V76, P514 DRUDE P, 1891, WIED ANN, V43, P136 FRANTA D, 1998, J MOD OPTIC, V45, P903 FRANTA D, 2000, ACTA PHYS SLOVACA, V50, P411 FRANTA D, 2000, MIKROCHIM ACTA, V132, P443 FRANTA D, 2000, SURF INTERFACE ANAL, V30, P574 FRANTA D, 2001, VACUUM, V61, P279 HERZINGER CM, 1998, J APPL PHYS, V83, P3323 HOLY V, 1994, J APPL CRYSTALLOGR 4, V27, P551 INNAMI T, 1999, J APPL PHYS, V86, P1382 KIM CC, 1996, PHYS REV B, V53, P1475 KIM YD, 1993, APPL PHYS LETT, V62, P2387 KOO MS, 2000, APPL PHYS LETT, V77, P3364 LEE J, 1996, APPL PHYS LETT, V69, P2273 OHLIDAL I, 1998, MIKROCHIM ACTA S, V15, P177 OHLIDAL I, 2000, ACTA PHYS SLOVACA, V50, P489 OHLIDAL I, 2000, PROGR OPTICS, V41, P181 RICE SO, 1951, COMMUN PURE APPL MAT, V4, P351 THEETEN JB, 1978, J APPL PHYS, V49, P6097 NR 22 TC 8 PU AMER INST PHYSICS PI MELVILLE PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA SN 0021-8979 J9 J APPL PHYS JI J. Appl. Phys. PD AUG 15 PY 2002 VL 92 IS 4 BP 1873 EP 1880 PG 8 SC Physics, Applied GA 579HC UT ISI:000177171700023 ER PT J AU Aguie-Beghin, V Baumberger, S Monties, B Douillard, R TI Formation and characterization of spread lignin layers at the air/water interface SO LANGMUIR LA English DT Article ID AIR-WATER-INTERFACE; SOLUBLE BLOCK-COPOLYMER; NEUTRON REFLECTIVITY; ELLIPSOMETRY; BEHAVIOR; SURFACE; MONOLAYERS; POLYMERS AB The structure and surface properties of spread layers of lignins at the air/water interface have been studied by neutron reflectivity, spectroscopic ellipsometry, and static and dynamic tensiometry. The layers hold 70% water, and the surface concentration of lignin measured by neutron reflectivity is less than the amount deposited. When the spread amount increases from 1 to 16 mg m(-2), 65-12.5% of the deposited lignin is recovered at the interface. The absolute value of the Brewster ellipticity decreases slowly after spreading and tends toward quasi-equilibrium after 30 h, a fact which could be explained by a slow desorption from the interfacial layer to the bulk. After a compression of the interfacial layers, the surface pressure and the Brewster ellipticity exhibit a strong relaxation due, at least in part, to a desorption. However, the diffusion of lignin molecules from the layer to the substrate is limited because at equilibrium the neutron reflectivity and ellipsometry data show that a significant layer covers the interface. Thus, the desorption is limited as shown also by the large values of the dilational modulus at quasi-equilibrium, suggesting that large interactions occur between adsorbed molecules at the interface. The refractive index and extinction coefficient spectra of lignin layers were calculated by a point by point numerical resolution of the ellipsometric data assuming isotropic and homogeneous layers and using the thickness obtained by neutron reflectivity. The absorption coefficient spectrum calculated from the extinction coefficient of the interfacial layer compares well with the bulk absorption spectrum of lignin solutions in a dioxane/water mixture. Thus, spectroscopic ellipsometry measurements are convenient for the characterization of the adsorbed lignins and show that they are not chemically modified at the air/water interface. C1 Ctr Rech Agron, Equipe Parois Vegetales & Mat Fibreux, UMR FARE INRA URCA, F-51686 Reims 2, France. INRA, INA PG, UMR Chim Biol, F-78850 Thiverval Grignon, France. RP Aguie-Beghin, V, Ctr Rech Agron, Equipe Parois Vegetales & Mat Fibreux, UMR FARE INRA URCA, 2 Esplanade Roland Garros,BP 224, F-51686 Reims 2, France. 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Analytical solutions for field enhancement by spheroidal particles are used to provide physical insight for probe design. These solutions indicate that probes need to be not only sharp, but also finite in length in order to generate the highest field enhancement. Finite difference time domain (FDTD) simulations of gold particles illuminated by near infrared radiation are performed. Field enhancements for right trigonal pyramids are found to be size and wavelength dependent. Furthermore, the enhancements for these pyramidal particles are higher than for similar length conical particles, which in turn perform better than quasi-infinite conical probes. The particles we design with FDTD can be made using current nanofabrication techniques, and therefore hold great promise as apertureless NSOM probes. These right trigonal pyramids are particularly well suited for use in tip enhanced nonlinear optical microscopy or near-field Raman microscopy. (C) 2002 American Institute of Physics. C1 Harvard Univ, Dept Chem, Cambridge, MA 02138 USA. Harvard Univ, Dept Biol Chem, Cambridge, MA 02138 USA. RP Xie, XS, Harvard Univ, Dept Chem, 12 Oxford St, Cambridge, MA 02138 USA. 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Chem. Phys. PD JUN 22 PY 2002 VL 116 IS 24 BP 10895 EP 10901 PG 7 SC Physics, Atomic, Molecular & Chemical GA 560DF UT ISI:000176066200040 ER PT J AU Carazza, B Robotti, N TI Explaining atomic spectra within classical physics: 1897-1913 SO ANNALS OF SCIENCE LA English DT Article ID DISCOVERY; ELECTRON AB In this paper we analyse the approach to interpreting atomic spectra in the framework of classical physics from the discovery of the electron in 1897 to Bohr's atomic model of 1913. Taken as a whole, efforts in this direction are part of a remarkable intellectual endeavour in which the classical theoretical framework seems to have been exploited to its full potential. By demonstrating the limits and weaknesses of classical physics in solving the problem of spectral emissions, these attempts opened the way to a complete break from traditional thought and the introduction of the new quantum ideas. C1 Univ Parma, Dept Phys, I-43100 Parma, Italy. Univ Genoa, Dept Phys, I-16146 Genoa, Italy. RP Carazza, B, Univ Parma, Dept Phys, Viale Sci 1, I-43100 Parma, Italy. 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Sci. PD JUL PY 2002 VL 59 IS 3 BP 299 EP 320 PG 22 SC History & Philosophy Of Science; History & Philosophy Of Science; History & Philosophy of Science GA 561RD UT ISI:000176155500003 ER PT J AU De, A Puri, A TI Cyclotron frequency coupled enhancement of Kerr rotation in low refractive index-dielectric/magneto-optic bilayer thin-film structures SO JOURNAL OF APPLIED PHYSICS LA English DT Article AB We investigate the enhancement of magneto-optic polar Kerr rotation over a broad range of optical frequencies. The Drude model for the dielectric tensor is considered. Resonance-like peaks in the Kerr rotation and ellipticity caused in the vicinity of a plasma edge is extended throughout the visible spectrum by deriving an expression for the cyclotron frequency such that Re(epsilon(xx))similar to1 at any given incident photon energy and plasma frequency of the material. The Kerr rotation obtained by use of this expression was studied for the case of InSb and further enhancement of Kerr rotation was achieved in the case of LiF/InSb bilayer thin-film structure, grown on a glass substrate. The numerical analysis was carried out using a 2 x 2 characteristic matrix, which takes into account multiple reflections and interface effects within the medium. In addition the role of various magneto-optic material parameters and layer thicknesses is investigated in determining the optical frequency at which the maximum Kerr rotation occurs, under the present cyclotron frequency condition. Enhanced Kerr rotation greater than 1.5degrees over a broad range of optical frequencies was obtained. Tables showing optimum figure of merit for repeated LiF/InSb bilayers at 3.1 eV for different plasma frequencies are also provided. (C) 2002 American Institute of Physics. C1 Univ New Orleans, Dept Phys, New Orleans, LA 70148 USA. 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PD JUN 15 PY 2002 VL 91 IS 12 BP 9777 EP 9787 PG 11 SC Physics, Applied GA 557JJ UT ISI:000175905200047 ER PT J AU Hussain, Z TI Dopant-dependent reflectivity and refractive index of microcrystalline molybdenum-bronze thin films SO JOURNAL OF APPLIED PHYSICS LA English DT Review ID OPTICAL DISPERSION PARAMETERS; RAY ELECTRON-SPECTROSCOPY; ENERGY-EFFICIENT WINDOWS; SMALL-POLARON ABSORPTION; ONE-DIMENSIONAL K0.3MOO3; TUNGSTEN-OXIDE FILMS; INSERTION COMPOUNDS; WO3 FILMS; ELECTROCHROMIC PROPERTIES; ANDERSON TRANSITION AB Reflectivity spectra of HxMoO3 and LixMoO3 thin films were measured over the photon energy range from 0.4 to 4.2 eV. It was found that microcrystalline molybdenum bronzes have reflectances between 6% and 30% over the concentration x, range 0less than or equal toxless than or equal to0.64. Values for the real part of the refractive index n were also determined from the refined reflectivity data using different numerical techniques depending upon the dispersive and nondispersive regions in the data. The values of high-frequency dielectric constant epsilon(hf) of Z(x)MoO(3) (Z=H+,Li+) bronzes were determined from the refractive index data to estimate the effective electronic masses involved in the optical and/or polaronic transitions. We interpret the optical data using the modified Drude-Zener model together with a single-oscillator model to differentiate between bound and free electronic states. Using a single-oscillator model, the oscillator energy E-a and the dispersion energy E-d were found to increase and decrease, respectively, with increasing x values, opposite to what occurs in crystalline molybdenum bronzes. These findings support the fact that Bloch electrons are almost absent in the investigated microcrystalline bronzes. The small reflectivity crests and the observed shift of the minimum reflectivity (or minimum refractive index) toward higher frequency with increasing x value in Z(x)MoO(3) appear to be consistent with polaronic hopping, which arises from the excitation of electrons from localized in-gap states of Mo5+ ions into higher impurity states of Mo6+ (or Mo4+) ions within the optical band gap. (C) 2002 American Institute of Physics. C1 Univ London Imperial Coll Sci Technol & Med, Dept Elect & Elect Engn, London SW7 2BT, England. RP Hussain, Z, Univ London Imperial Coll Sci Technol & Med, Dept Elect & Elect Engn, Exhibit Rd, London SW7 2BT, England. 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Appl. Phys. PD MAY 1 PY 2002 VL 91 IS 9 BP 5745 EP 5759 PG 15 SC Physics, Applied GA 542WR UT ISI:000175069000033 ER PT J AU Abouraddy, AF Toussaint, KC Sergienko, AV Saleh, BEA Teich, MC TI Entangled-photon ellipsometry SO JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS LA English DT Article ID QUANTUM CRYPTOGRAPHY; LIGHT AB Performing reliable measurements in optical metrology, such as those needed in ellipsometry, requires a calibrated source and detector, or a well-characterized reference sample. We present a novel interferometric technique to perform reliable ellipsometric measurements. This technique relies on the use of a nonclassical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric downconversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute, i.e., they require neither source nor detector calibration, nor do they require a reference. (C) 2002 Optical Society of America. C1 Boston Univ, Dept Elect & Comp Engn, Quantum Imaging Lab, Boston, MA 02215 USA. Boston Univ, Dept Phys, Boston, MA 02215 USA. RP Abouraddy, AF, Boston Univ, Dept Elect & Comp Engn, Quantum Imaging Lab, Boston, MA 02215 USA. 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Opt. Soc. Am. B-Opt. Phys. PD APR PY 2002 VL 19 IS 4 BP 656 EP 662 PG 7 SC Optics GA 541ZP UT ISI:000175017800005 ER PT J AU Kiselev, VD Shikhaab, MS Iskhakova, GG Konovalov, AI TI Solvent effect on the activation volume of the Diels-Alder reaction between tetracyanoethylene and trans,trans-1,4-diphenyl-1,3-butadiene SO RUSSIAN JOURNAL OF GENERAL CHEMISTRY LA English DT Article ID ISOMERIZATION AB The effect of increased hydrostatic pressure on the rate of the Diels-Alder reaction of tetracyanoethylene with trans,trans-1,4-diphenyl-1,3-butadiene at 25degreesC was studied to estimate the reaction volume and to show that it considerably varies with pi-donor properties of the medium. C1 Kazan VI Lenin State Univ, Butlerov Res Inst Chem, Kazan 420008, Tatarstan, Russia. RP Kiselev, VD, Kazan VI Lenin State Univ, Butlerov Res Inst Chem, Kazan 420008, Tatarstan, Russia. 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J. Gen. Chem. PD JAN PY 2002 VL 72 IS 1 BP 98 EP 104 PG 7 SC Chemistry, Multidisciplinary GA 537NA UT ISI:000174763500023 ER PT J AU Lakhtakia, A TI Optical properties of an isotropic optically active medium at oblique incidence: comment SO JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION LA English DT Article AB The constitutive relations used by Sah and Gowri Krishna [J. Opt. Soc. Am. A 18, 1388 (2001)] are inconsistent with energy and reciprocity requirements. (C) 2002 Optical Society of America. C1 Penn State Univ, Dept Engn Sci & Mech, Computat & Theoret Mat Sci Grp, University Pk, PA 16802 USA. RP Lakhtakia, A, Penn State Univ, Dept Engn Sci & Mech, Computat & Theoret Mat Sci Grp, University Pk, PA 16802 USA. CR DRUDE P, 1911, PRECIS OPTIQUE DRUDE P, 1959, THEORY OPTICS GRAY F, 1916, PHYS REV, V7, P472 KROWNE CM, 1984, IEEE T ANTENN PROPAG, V32, P1224 LAKHTAKIA A, 1991, PHYS ESSAYS, V4, P105 LAKHTAKIA A, 1994, BELTRAMI FIELDS CHIR POST EJ, 1997, FORMAL STRUCTURE ELE, P129 SAH Y, 2001, J OPT SOC AM A, V18, P1388 SILVERMAN MP, 1987, J OPT SOC AM A, V4, P1145 WEIGLHOFER WS, 1996, J OPT SOC AM A, V13, P385 WEIGLHOFER WS, 1998, AEU-INT J ELECTRON C, V52, P276 NR 11 TC 1 PU OPTICAL SOC AMER PI WASHINGTON PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA SN 0740-3232 J9 J OPT SOC AM A-OPT IMAGE SCI JI J. Opt. Soc. Am. A-Opt. Image Sci. Vis. PD APR PY 2002 VL 19 IS 4 BP 807 EP 808 PG 2 SC Optics GA 536EH UT ISI:000174687400018 ER PT J AU Hemakanthi, G Dhathathreyan, A Mobius, D TI Complexation of metal ions in monolayers of amphiphilic schiff bases at liquid/air interface SO COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS LA English DT Article DE air/water interface; amphiphilic schiff bases; metal ions ID LANGMUIR-BLODGETT-FILMS; AIR-WATER-INTERFACE; ZINC(II) COMPLEXES; DYE MONOLAYERS; AMINO-ACIDS; COPPER(II); REFLECTION; LIGAND; LIGHT AB New amphiphilic schiff bases 2.4 dihydroxy hexadecyl benzilideneamine (HDBA) and 2,4 dihydroxy benzilidene4'(hexadecylamino) benzylamine (HDBBA) have been synthesized and stable monolayers of these at air/water interface have been studied. Complexes of these ligands with metal ions Mn2+, Cu2+ and Zn2+ at the interface have been possible due mainly to the presence of the hydroxyl group adjacent to C=N in the head groups, in both the ligands. These metal complexes have been studied using surface pressure/molecular area (pi-A), surface potential! molecular area (DeltaV-A) isotherms and surface enhanced UV-Vis reflection spectroscopy. The rate of formation of the metal complexes with the ligands HDBA and HDBBA at the liquid/water interface has been studied. The Faster rate of formation of Cu2+ complex in the case of HDBBA indicates the specificity of binding of Cu2+ ion to its monolayer. (C) 2002 Elsevier Science B.V. All rights reserved. C1 Cent Leather Res Inst, Chem Lab, Madras 600020, Tamil Nadu, India. Max Planck Inst Biophys Chem, D-37077 Gottingen, Germany. RP Dhathathreyan, A, Cent Leather Res Inst, Chem Lab, Madras 600020, Tamil Nadu, India. CR COLLINS SJ, 2000, THIN SOLID FILMS, V358, P229 DHATHATHREYAN A, 1988, BIOPHYS BIOCH ACTA, V944, P268 DHATHATHREYAN A, 1999, MOL CRYST LIQ CRYS C, V11, P183 DRUDE P, 1889, ANN PHYS CHEM, V36, P532 GAINES GL, 1966, INSOLUBLE MONOLAYERS GARNOVSKII AD, 1993, COORDIN CHEM REV, V126, P1 GIROUDGODQUIN AM, 1998, COORDIN CHEM REV 2, V178, P1485 GRUNIGER H, 1983, J CHEM PHYS, V79, P3701 HEMAKANTHI G, 1999, LANGMUIR, V15, P3317 HEMAKANTHI G, 2001, CHEM PHYS LETT, V341, P407 IRVING H, 1953, J CHEM SOC, P3192 KALYANASUNDARAM K, 1998, COORDINATION CHEM RE, V77, P347 KANTHIMATHI M, 2000, MOL MATER, V12, P223 LIU MH, 1997, J PHYS CHEM B, V101, P1101 LIU MH, 1998, THIN SOLID FILMS, V327, P491 NAGEL J, 1997, LANGMUIR, V13, P4693 ORRIT M, 1986, J CHEM PHYS, V85, P4966 SAMAHA H, 1994, LANGMUIR, V10, P4517 SAUER BB, 1989, MACROMOLECULES, V22, P2332 SHYAMALASUNDARI S, 1997, LANGMUIR, V13, P4923 SMITH JW, 1970, CHEM CARBON NITROGEN, P235 VIJAYALAKSHMI R, 1999, LANGMUIR, V15, P2898 WANG GB, 1991, SYN REACT INORG MET, V21, P897 WANG GB, 1994, SYN REACT INORG MET, V24, P623 NR 24 TC 4 PU ELSEVIER SCIENCE BV PI AMSTERDAM PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS SN 0927-7757 J9 COLLOID SURFACE A JI Colloid Surf. A-Physicochem. Eng. Asp. PD FEB 18 PY 2002 VL 198 SI Sp. Iss. SI BP 443 EP 452 PG 10 SC Chemistry, Physical GA 532VM UT ISI:000174495800055 ER PT J AU Kiselev, AI Kononenko, VI Akashev, LA TI The optical properties of light rare-earth metals in the liquid state SO HIGH TEMPERATURE LA English DT Article AB The model of almost free electrons is used to analyze the experimentally obtained optical properties of liquid light rare-earth metals (REM) such as lanthanum, cerium, prascodymium, and neodynnium. The electrons involved in interband transitions are divided into different groups. In so doing, the contribution by these groups of electrons to the light conductivity is taken into account. The problem of determining partial values of functions is solved in a graphic representation using the method of successive approximations, by variational selection of three parameters, namely, the height of peak, its position, and half-width. It is demonstrated that, in order to explain the experimentally obtained dispersion curves of light conductivity of liquid lanthanum and cerium, it is sufficient to divide the electrons involved in interband transitions into no more than eight groups and, in the case of praseodymium and neodymium, into no more than nine groups. The electron characteristics of these groups of excited states are given. C1 Russian Acad Sci, Ural Div, Inst Solid State Chem, Ekaterinburg 620219, Russia. RP Kiselev, AI, Russian Acad Sci, Ural Div, Inst Solid State Chem, Ekaterinburg 620219, Russia. CR AKASHEV LA, 1989, THESIS URAL DIV DRUDE P, 1935, OPTIKA ELLIOTT RJ, 1964, P PHYS SOC LOND, V84, P63 ENDRIZ JG, 1970, PHYS REV B, V2, P1466 FREEMAN AJ, 1966, PHYS REV LETT, V16, P94 GUENTERODT GI, 1980, ZHIDK MET MAT 3 MEZH, P226 IRKHIN YP, 1981, ELECT STRUCTURE PHYS, P50 JEPSEN O, 1971, SOLID STATE COMMUN, V9, P1763 JOHANSEN G, 1970, SOLID STATE COMMUN, V8, P121 KISELEV AI, 1998, RUSS METALL+, P46 KNYZEV YV, 1981, ELEKT STRUKTURA FIZI, P3 KONONENKO VI, 1984, PHYS STATUS SOLIDI A, V84, P423 KUZMICHEV ND, 1988, T FIZ I AKAD NAUK SS, V190, P72 MACKINTOSH AR, 1962, PHYS REV LETT, V9, P90 MADELUNG O, 1980, TEORIYA TVERDOGO TEL MOTULEVICH GP, 1971, T FIAN SSSR, V55, P3 NOSKOV MM, 1981, ELEKT STRUKTURA FIZI, P22 NOSKOV MM, 1983, OPTICHESKIE MAGNETOO PETRAKIAN JP, 1974, THAN SOL FILMS, V20, P297 ZIMAN JM, 1972, PRINCIPLES THEORY SO NR 20 TC 0 PU MAIK NAUKA/INTERPERIODICA PI NEW YORK PA C/O KLUWER ACADEMIC-PLENUM PUBLISHERS, 233 SPRING ST, NEW YORK, NY 10013-1578 USA SN 0018-151X J9 HIGH TEMP-ENGL TR JI High Temp. PD JAN-FEB PY 2002 VL 40 IS 1 BP 44 EP 54 PG 11 SC Physics, Applied GA 526EK UT ISI:000174116400008 ER PT J AU Schroder, W Treder, HJ TI Post-newtonian corrections in the dynamics in the earth-moon system and their importance for the relativistic theories of gravitation: A historical case study SO FOUNDATIONS OF PHYSICS LA English DT Article AB As an example of a historical case study, some aspects of the post-Newtonian corrections in the Earth Moon dynamics are described and discussed. RP Schroder, W, Hechelstr 8, D-28777 Bremen, Germany. CR BOTTINGER KF, 1912, GRAVITATIONSTHEORIE BRUNN AV, 1919, SITZUNGSBER PREUSS A DRUDE P, 1897, ANN PHYS S, V62 DUBOISREYMOND P, 1888, NATURWISS RUNDSCHAU, V3 DYSON FJ, 1972, ASPECTS QUANTUM THEO, P213 EINSTEIN A, 1919, SITZUNGSBER PREUSS A EINSTEIN A, 1969, SPEZIELLE ALLGEMEINE EOTVOS R, 1909, PROPORTIONALITAT TRA EOTVOS R, 1953, GESAMMELTE ABHANDLUN EOTVOS RV, 1922, ANN PHYSIK, V68, P11 HECKER O, 1907, VEROFF GEOD I POTSDA, V32 ISENKRAHE C, 1879, RATHSEL SCHWERKRAFT JORDAN P, 1966, EXPANSION ERDE LAPLACE PS, 1882, MECH CELESTE MAJORANA Q, 1920, PHILOS MAG, V39, P488 MICHELSON AA, 1920, PHYS REV, V15, P144 OPPENHEIM S, 1920, ENCY MATH WISS, V6 RUSSEL HN, 1921, ASTROPHYS J, V54, P934 SCHRODER W, 1997, EOS, V78, P479 SEELIGER H, 1894, ASTRON NACHR, V137, P129 SEELIGER H, 1909, ANWENDUNG NATURGESET SLICHTER LB, 1965, J GEOPHYS RES, V70, P1541 TOMASCHEK R, 1955, NATURE, V175, P937 TREDER HJ, 1972, RELATIVITAT TRAGHEIT TREDER HJ, 1975, ELEMENTARE KOSMOLOGI WOOLARD EW, 1959, ASTRON J, V64, P140 YOURGRAU W, 1974, ASTRON NACHR, V295, P203 NR 27 TC 0 PU KLUWER ACADEMIC/PLENUM PUBL PI NEW YORK PA 233 SPRING ST, NEW YORK, NY 10013 USA SN 0015-9018 J9 FOUND PHYS JI Found. Phys. PD JAN PY 2002 VL 32 IS 1 BP 177 EP 186 PG 10 SC Physics, Multidisciplinary GA 527UW UT ISI:000174207200008 ER PT J AU Banakh, O Schmid, PE Sanjines, R Levy, F TI Electrical and optical properties of TiOx thin films deposited by reactive magnetron sputtering SO SURFACE & COATINGS TECHNOLOGY LA English DT Article DE titanium oxide; thin films; spectroscopic ellipsometry ID TITANIUM AB The present study of the electronic properties of titanium monoxide thin films is centered on the electrical and optical properties of nano-grain material. TiOx thin films with x ranging from 0.75 to 1.45 have been deposited by r.f. reactive magnetron sputtering in a mixed Ar/O-2 or Ar/H2O atmosphere. All films show a negative temperature coefficient of the resistivity. Spectroscopic ellipsometry measurements were performed in the Vis-U-V spectral range. The free carrier and interband contributions to the dielectric function have been sorted out. The most striking feature of the free carrier optical response is the very short scattering time of the order of 10(-15) s. Such an intense impurity scattering is beyond the validity range of the semi-classical Boltzmann equation and remains an open problem. (C) 2002 Elsevier Science B.V. All rights reserved. C1 Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland. RP Banakh, O, Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland. CR BALLY AR, 1998, SURF COAT TECH, V108, P166 BANUS MD, 1970, CHEM EXTENDED DEFECT, P488 BRUGGEMAN DAG, 1935, ANN PHYS-BERLIN, V24, P636 DELIN A, 1996, PHYS REV B, V54, P1673 DRUDE P, 1900, PHYS Z, V1, P161 GOKHALE S, 1995, PHYS REV B, V52, P14526 GRIGOROV KG, 1998, VACUUM, V51, P153 LEUNG CM, 1996, PHYS REV B, V54, P7857 MCLACHLAN DS, 1982, PHYS REV B, V25, P2285 NECKEL A, 1976, J PHYS C SOLID STATE, V9, P579 NIKOLIC B, 2000, PHYS REV B, V63 SCHMID PE, 1998, J VAC SCI TECHNOL A, V16, P2870 WATANABE D, 1967, ACTA CRYSTALLOGR, V23, P307 WOOTEN F, 1972, OPTICAL PROPERTIES S NR 14 TC 6 PU ELSEVIER SCIENCE SA PI LAUSANNE PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND SN 0257-8972 J9 SURF COAT TECH JI Surf. Coat. Technol. PD MAR 1 PY 2002 VL 151 BP 272 EP 275 PG 4 SC Materials Science, Coatings & Films GA 524KC UT ISI:000174011400055 ER PT J AU Yeow, EKL Braslavsky, SE TI Quenching of zinc tetraphenylporphine by oxygen and by 1,4-benzoquinone in nitrile solvents: An optoacoustic spectroscopy study SO PHYSICAL CHEMISTRY CHEMICAL PHYSICS LA English DT Article ID ELECTRON-TRANSFER REACTIONS; STRUCTURAL VOLUME CHANGES; MOLECULAR-OXYGEN; PHOTOACOUSTIC CALORIMETRY; TRIPLET-STATES; QUANTUM YIELDS; ABSORPTION-SPECTROSCOPY; BIPHENYL DERIVATIVES; ACCEPTOR COMPOUND; TRANSFER KINETICS AB The quenching of zinc tetraphenylporphine by oxygen and 1,4-benzoquinone was studied using laser-induced optoacoustic spectroscopy in a homologous series of aprotic nitrile solvents consisting of acetonitrile, propionitrile, butyronitrile, and valeronitrile. An inverse correlation exists between the oxygen quenching efficiency of triplet state zinc tetraphenylporphine and the efficiency of singlet oxygen formation, against solvent polarity, in agreement with the accepted involvement of a charge transfer complex during the quenching process. No structural volume change was observed for the triplet state formation of zinc tetraphenylporphine using the nitrile variation method, whereas electron transfer between zinc tetraphenylporphine and 1,4-benzoquinone resulted in a volume contraction in the four nitrile solvents used. Specific solute solvent interaction, in addition to electrostriction, is needed to fully understand the relatively large and solvent dependent structural volume change observed in the longer chain nitriles. This is due to the varying interaction strength between the electron-pair donor nitriles and the ZnTPP cation as one moves across the solvent series. The free energy of the electron transfer was, however, very similar within the solvent series. The effect of a specific solute solvent interaction on the rate of electron transfer is unclear at the moment since the latter is found to be limited by the solvent relaxation time, which is much shorter than the time window of the experiments. C1 Max Planck Inst Strahlenchem, D-45413 Mulheim, Germany. RP Braslavsky, SE, Max Planck Inst Strahlenchem, Postfach 101365, D-45413 Mulheim, Germany. 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Chem. Chem. Phys. PY 2002 VL 4 IS 2 BP 239 EP 247 PG 9 SC Chemistry, Physical; Physics, Atomic, Molecular & Chemical GA 514MX UT ISI:000173444900013 ER PT J AU Volkmann, UG Pino, M Altamirano, LA Taub, H Hansen, FY TI High-resolution ellipsometric study of an n-alkane film, dotriacontane, adsorbed on a SiO2 surface SO JOURNAL OF CHEMICAL PHYSICS LA English DT Article ID LIQUID NORMAL-ALKANES; GRAPHITE; INTERFACES; MOLECULES AB Using high-resolution ellipsometry and stray light intensity measurements, we have investigated during successive heating-cooling cycles the optical thickness and surface roughness of thin dotriacontane (n-C32H66) films adsorbed from a heptane (n-C7H16) solution onto SiO2-coated Si(100) single-crystal substrates. Our results suggest a model of a solid dotriacontane film that has a phase closest to the SiO2 surface in which the long-axis of the molecules is oriented parallel to the interface. Above this "parallel film" phase, a solid monolayer adsorbs in which the molecules are oriented perpendicular to the interface. At still higher coverages and at temperatures below the bulk melting point at T-b=341 K, solid bulk particles coexist on top of the "perpendicular film." For higher temperatures in the range T-bT-s, a uniformly thick fluid film wets to the parallel film phase. This structure of the alkane/SiO2 interfacial region differs qualitatively from that which occurs in the surface freezing effect at the bulk alkane fluid/vapor interface. In that case, there is again a perpendicular film phase adjacent to the air interface but no parallel film phase intervenes between it and the bulk alkane fluid. Similarities and differences between our model of the alkane/SiO2 interface and one proposed recently will be discussed. Our ellipsometric measurements also show evidence of a crystalline-to-plastic transition in the perpendicular film phase similar to that occurring in the solid bulk particles present at higher coverages. In addition, we have performed high-resolution ellipsometry and stray-light measurements on dotriacontane films deposited from solution onto highly oriented pyrolytic graphite substrates. After film deposition, these substrates proved to be less stable in air than SiO2. (C) 2002 American Institute of Physics. C1 Pontificia Univ Catolica Chile, Fac Fis, Santiago 22, Chile. Univ Missouri, Dept Phys & Astron, Columbia, MO 65211 USA. Univ Missouri, Res Reactor, Columbia, MO 65211 USA. Tech Univ Denmark, Dept Chem, IK DTU 207, DK-2800 Lyngby, Denmark. RP Volkmann, UG, Pontificia Univ Catolica Chile, Fac Fis, Casilla 6177, Santiago 22, Chile. 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Chem. Phys. PD FEB 1 PY 2002 VL 116 IS 5 BP 2107 EP 2115 PG 9 SC Physics, Atomic, Molecular & Chemical GA 514CG UT ISI:000173418600039 ER PT J AU Rotermund, HH TI Real time Imaging of surface catalytic reactions SO PHYSICA STATUS SOLIDI A-APPLIED RESEARCH LA English DT Article ID BEAM-EPITAXY GROWTH; PATTERN-FORMATION; CO OXIDATION; SPIRAL WAVES; PT(110); REFLECTANCE; PLATINUM; SPECTROSCOPY; TRANSITION; BOUNDARIES AB This review focuses on various methods to image surface reactions in real time. Development of the photoelectron emission microscope (PEEM), which is capable of following local work function changes in real time, was of fundamental importance in work dedicated to understanding pattern formation during catalytic reactions. The focus of this review is on optical methods using polarized light capable of imaging adsorbates on top of the surface, which are typically less than one monolayer (ML) thick. These imaging methods include Ellipso Microscopy for Surface Imaging (EMSI) and Reflection Anisotropy Microscopy (RAM), and the commercially available infrared (IR) technique, which nowadays can follow reaction fronts due to the temperature change even at low pressures. Some new results will be presented where in addition to the optical imaging a focused laser was used to change pattern formation during the CO-oxidation on a Pt(110) surface in various ways. C1 Max Planck Gesell, Fritz Haber Inst, D-14195 Berlin, Germany. RP Rotermund, HH, Max Planck Gesell, Fritz Haber Inst, Faradayweg 4-6, D-14195 Berlin, Germany. 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Status Solidi A-Appl. Res. PD DEC 16 PY 2001 VL 188 IS 4 BP 1537 EP 1548 PG 12 SC Physics, Condensed Matter GA 509BJ UT ISI:000173124200036 ER PT J AU Marsh, RJ Jones, RAL Sferrazza, M TI Adsorption and displacement of a globular protein on hydrophilic and hydrophobic surfaces SO COLLOIDS AND SURFACES B-BIOINTERFACES LA English DT Article DE globular protein; beta-lactoglobulin; ellipsometry ID SELF-ASSEMBLED MONOLAYERS; SOLID/LIQUID INTERFACE; SILICA SURFACES; OROGENIC DISPLACEMENT; NEUTRON REFLECTIVITY; BETA-LACTOGLOBULIN; WATER-INTERFACE; ELLIPSOMETRY; FIBRONECTIN; BEHAVIOR AB The adsorption of the globular protein beta-lactoglobulin on hydrophilic and hydrophobic surfaces has been investigated. Spectroscopic ellipsometry and Fourier transform infrared spectroscopy in the attenuated total reflection mode were used in our study. beta-lactoglobulin adsorbed in surface concentrations less than or equal to those corresponding to a closely packed monolayer of molecules. The amount of g-lactoglobulin removed from hydrophilic surfaces upon elution with buffer solution, as a fraction of the final amount reached upon adsorption, was observed to decrease at longer adsorption times. This provides evidence that the conformation of the adsorbed protein changes relatively slowly once adsorbed, leading to more irreversibly adsorbed states with stronger binding to the surface. The fraction of protein irreversibly adsorbed to the surface was generally higher on hydrophobic surfaces than hydrophilic surfaces, confirming the general principle that globular proteins exhibit stronger binding to hydrophobic surfaces than hydrophilic ones. The displacement of pre-adsorbed layers of the protein from hydrophobic and hydrophilic surfaces by the non-ionic surfactant octaethylene glycol monododecyl ether (C12E8) was also studied. We observed that the non-ionic surfactant caused partial displacement of adsorbed protein from hydrophobic surfaces. The displacement kinetics also reveal that the protein layers are more strongly bound to hydrophobic surfaces at longer than at shorter adsorption times, showing that slow protein binding changes and ageing effects are also important at hydrophobic surfaces. (C) 2002 Elsevier Science B.V. All rights reserved. C1 Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England. Univ Sheffield, Dept Phys & Astron, Sheffield S3 7RH, S Yorkshire, England. Univ Surrey, Sch Phys & Chem, Dept Phys, Guildford GU2 5XH, Surrey, England. 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B-Biointerfaces PD JAN PY 2002 VL 23 IS 1 BP 31 EP 42 PG 12 SC Biochemistry & Molecular Biology; Biophysics GA 509CX UT ISI:000173128300004 ER PT J AU Gadomsky, ON Kadochkin, AS TI Experimental detection of the near-field effect upon Brewster light reflection by a plane surface of a semi-infinite dielectric SO OPTICS AND SPECTROSCOPY LA English DT Article ID OPTICS AB Based on the near-field effect in the transition layer, a theoretical interpretation is given of experiments on Brewster light reflection from surfaces of certain liquids. The analysis is performed within the framework of the concept of a discrete-continuous dielectric, with allowance made for the fields of atomic dipoles discretely distributed inside the Lorentz sphere surrounding the point of observation. (C) 2001 MAIK "Nauka/Interperiodica". C1 Ulyanovsk State Univ, Ulyanovsk 432700, Russia. RP Gadomsky, ON, Ulyanovsk State Univ, Ulyanovsk 432700, Russia. 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Spectrosc. PD NOV PY 2001 VL 91 IS 5 BP 749 EP 756 PG 8 SC Optics; Spectroscopy GA 507KM UT ISI:000173026800013 ER PT J AU Gevorgyan, AH TI Reflection and transmission of light for a layer of a naturally gyrotropic medium found in an external magnetic field SO OPTICS AND SPECTROSCOPY LA English DT Article ID ELECTROMAGNETIC-WAVE PROPAGATION; CRYSTALS AB The propagation of electromagnetic waves through a layer of a naturally gyrotropic medium found in a magnetic field is studied. The problem is solved mathematically using 4 x 4 Berreinan matrices. The Berreman Delta matrix and exact Jones reflection ((R) over cap) and transmission ((T) over cap) matrices are constructed. The reflectivity, the transmittance, the azimuth, and the ellipticity of polarization of the transmitted wave are calculated. Specific features of the irreversibility of waves are studied. It is shown that multiple reflections in a finite layer lead to a manifold increase in irreversibility, which makes possible the use of such systems as optical diodes working in reflection or as unidirectional reflectors. It is shown that three eigenmodes are excited in such media under certain conditions. The relation between the azimuths of transmitted and incident waves is found and specific features of the relation are analyzed. (C) 2001 MAIK "Nauka/Interperiodica". C1 Yerevan State Univ, Yerevan 375049, Armenia. RP Gevorgyan, AH, Yerevan State Univ, Ul Manukyana 1, Yerevan 375049, Armenia. 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Spectrosc. PD NOV PY 2001 VL 91 IS 5 BP 762 EP 768 PG 7 SC Optics; Spectroscopy GA 507KM UT ISI:000173026800015 ER PT J AU Sondheimer, EH TI The mean free path of electrons in metals SO ADVANCES IN PHYSICS LA English DT Review C1 Royal Soc Mond Lab, Cambridge, England. RP Sondheimer, EH, Royal Soc Mond Lab, Cambridge, England. 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Phys. PD SEP PY 2001 VL 50 IS 6 BP 499 EP 537 PG 39 SC Physics, Condensed Matter GA 506NE UT ISI:000172978000001 ER PT J AU Abouraddy, AF Toussaint, KC Sergienko, AV Saleh, BEA Teich, MC TI Ellipsometric measurements by use of photon pairs generated by spontaneous parametric downconversion SO OPTICS LETTERS LA English DT Article ID ART. AB We present a novel interferometric technique for performing ellipsometric measurements. This technique relies on the use of a nonclassical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric downconversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme, Ellipsometric measurements acquired with this scheme are absolute; i.e., they do not require source and detector calibration. (C) 2001 Optical Society of America. C1 Boston Univ, Dept Elect & Comp Engn, Quantum Imaging Lab, Boston, MA 02215 USA. RP Abouraddy, AF, Boston Univ, Dept Elect & Comp Engn, Quantum Imaging Lab, Boston, MA 02215 USA. CR ABOURADDY AF, 2001, PHYS REV A, V64 AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ BRANNING D, 2000, PHYS REV A, V62 DRUDE P, 1890, ANN PHYS CHEM, V39, P481 FANO U, 1957, REV MOD PHYS, V29, P74 GLAUBER RJ, 1963, PHYS REV, V130, P2529 KLYSHKO DN, PHOTONS NONLINEAR OP, P88 KLYSHKO DN, 1988, ZH EKSP TEOR FIZ, V67, P1131 KWIAT PG, 1995, PHYS REV LETT, V75, P4337 MANSURIPUR M, 2000, OPT PHOTONICS NEWS, V11, P52 ROTHEN A, 1945, REV SCI INSTRUM, V16, P26 SALEH BEA, 1991, FUNDAMENTALS PHOTONI SALEH BEA, 2000, PHYS REV A, V62 TOMPKINS HG, 1999, SPECTROSCOPIC ELLIPS WINTERBOTTOM AB, 1946, T FARADAY SOC, V42, P487 ZEIDLER JR, 1974, APPL OPTICS, V13, P1938 NR 16 TC 4 PU OPTICAL SOC AMER PI WASHINGTON PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA SN 0146-9592 J9 OPTICS LETTERS JI Opt. Lett. PD NOV 1 PY 2001 VL 26 IS 21 BP 1717 EP 1719 PG 3 SC Optics GA 492HH UT ISI:000172162000027 ER PT J AU Hasegawa, T Nishijo, J Umemura, J Theiss, W TI Simultaneous evaluation of molecular-orientation and optical parameters in ultrathin films by oscillators-model simulation and infrared external-reflection spectrometry SO JOURNAL OF PHYSICAL CHEMISTRY B LA English DT Article ID LANGMUIR-BLODGETT-FILMS; THIN-FILMS; SPECTROSCOPY AB A new analytical technique is presented for the simultaneous evaluation of molecular orientation and optical parameters in organic ultrathin films on a dielectric substrate by integration of oscillators-model simulation analysis and infrared external-reflection (ER) spectroscopy. The surface-normal and -tangential components of vibrational TO and LO modes in the film were independently represented by two dielectric dispersion functions with the use of Kim's oscillators models. The reflection absorbance of each band in the ER spectra was analyzed by use of the two functions on the assumption of the anisotropic optical system. Two p-polarization infrared ER spectra observed at two angles of incidence were subjected to an optimization calculation, so that the parameters in the two functions were simultaneously converged. The converged results yielded refractive-index dispersions and orientation angles at the same time. As an example study, the molecular structure in a 5-monolayer cadmium stearate Langmuir-Blodgett (LB) film has been analyzed with the new technique. The evaluated optical parameters were consistent with other experimental results. The new technique has also revealed the fine molecular orientation around the alpha -carbon atom, which has not been shown experimentally thus far. The new method proved to enable us to discuss fine properties in thin condensed matter without using library values of optical parameters. C1 Kobe Pharmaceut Univ, Higashinada Ku, Kobe, Hyogo 6588558, Japan. Kyoto Univ, Inst Chem Res, Uji, Kyoto Fu 6110011, Japan. M Theiss Hard & Software, D-52078 Aachen, Germany. RP Hasegawa, T, Kobe Pharmaceut Univ, Higashinada Ku, Kobe, Hyogo 6588558, Japan. 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B PD NOV 15 PY 2001 VL 105 IS 45 BP 11178 EP 11185 PG 8 SC Chemistry, Physical GA 493DG UT ISI:000172206300017 ER PT J AU Singh, AV Mehra, RM Buthrath, N Wakahara, A Yoshida, A TI Highly conductive and transparent aluminum-doped zinc oxide thin films prepared by pulsed laser deposition in oxygen ambient SO JOURNAL OF APPLIED PHYSICS LA English DT Article ID SPRAY PYROLYSIS AB Highly conducting and transparent aluminum-doped zinc oxide films were prepared on quartz and corning glass 7059 substrate by ablating the sintered ZnO target containing 2 wt % Al2O3 with a XeCl excimer laser (lambda =308 nm). To grow the films, a repetition rate of 5 Hz and energy density of 1.5 J/cm2 was kept. The effect of substrate temperature from room temperature to 400 degreesC and oxygen pressure (0.1-5 mTorr) have been investigated by analyzing the optical and electrical properties of these films. The average transmittance was found to be in the range of 86%-92%, and a variable resistivity (rho) 3.56x10(-3)-7.0x10(-3) Omega cm have been obtained. The lowest resistivity was found to be 1.4x10(-4) Omega cm at 300 degreesC in 1 mTorr of oxygen pressure. Structural changes in the films were also investigated by determining the full width at half maximum of (002) x-ray diffraction peak. These results show improvement in the crystallinity of films, which support our conductivity and transmittance data. The sharp decrease in the transmittance or sharp increase in reflectance near the plasma edge in the near-infrared range has been attributed to impurity scattering, which is Al doping in our films. (C) 2001 American Institute of Physics. C1 Univ Delhi, Dept Elect Sci, New Delhi 110021, India. Toyohashi Univ Technol, Toyohashi, Aichi 4418580, Japan. RP Singh, AV, Univ Delhi, Dept Elect Sci, S Campus, New Delhi 110021, India. CR AKTARUZZAMAN AF, 1991, THIN SOLID FILMS, V198, P67 AZAROFF LV, 1968, ELEMENTS XRAY CRYSTA, P552 BOSNELL JR, 1973, THIN SOLID FILMS, V15, P141 CHRISEY BD, 1994, PULSED LASER DEPOSIT DRUDE P, 1900, PHYS Z, V1, P161 FAN JCC, 1977, J APPL PHYS, V48, P3524 FRANK G, 1981, THIN SOLID FILMS, V77, P107 GOYAL D, 1992, JPN J APPL PHYS PT 1, V31, P361 HAMBERG I, 1982, APPL PHYS LETT, V40, P362 HARTANGEL HL, 1955, SEMICONDUCTING TRANS HECQ M, 1972, THIN SOLID FILMS, V9, P341 HIRAMATSU M, 1998, J VAC SCI TECHNOL A, V16, P669 HU JH, 1992, J APPL PHYS, V71, P880 IGASAKI Y, 1988, APPL SURF SCI, V33, P926 IGASAKI Y, 1991, J APPL PHYS, V70, P3613 KIM H, 2000, APPL PHYS LETT, V76, P259 LEHMANN HW, 1975, THIN SOLID FILMS, V27, P359 LEJA E, 1981, THIN SOLID FILMS, V76, P283 LIDE DR, 1991, HDB CHEM PHYSICS MANIFACIER JC, 1982, THIN SOLID FILMS, V90, P297 MARTINEZ MA, 1994, SOL ENERG MAT SOL C, V31, P489 MINAMI T, 1985, JPN J APPL PHYS, V24, L605 MINAMI T, 1985, JPN J APPL PHYS, V24, L781 MINAMI T, 1990, THIN SOLID FILMS, V193, P721 MIYATA N, 1979, SURF SCI, V86, P384 ODA S, 1985, JPN J APPL PHYS PT 1, V24, P1607 PIDGEON CR, 1980, HDB SEMICONDUCTORS, V2, P231 SIMTH JF, 1980, THIN SOLID FILMS, V72, P469 SMITH RA, 1959, SEMICONDUCTORS SUZUKI A, 1996, JPN J APPL PHYS PT 2, V35, L56 TSUJI T, 2000, APPL SURF SCI, V47, P157 WEIHER RL, 1966, J APPL PHYS, V37, P299 YOSHIDA S, 1978, APPL OPTICS, V17, P145 NR 33 TC 21 PU AMER INST PHYSICS PI MELVILLE PA CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA SN 0021-8979 J9 J APPL PHYS JI J. Appl. Phys. PD DEC 1 PY 2001 VL 90 IS 11 BP 5661 EP 5665 PG 5 SC Physics, Applied GA 491UV UT ISI:000172129200032 ER PT J AU Regragui, M Jousseaume, V Addou, M Outzourhit, A Bernede, JC El Idrissi, B TI Electrical and optical properties of WO3 thin films SO THIN SOLID FILMS LA English DT Article DE spray pyrolysis; tungsten trioxide thin films; optical properties; electrical properties ID TIN OXIDE-FILMS; AMORPHOUS HXWO3; TRANSITION; DEPENDENCE; TRANSPORT AB Tungsten trioxide (WO,) thin films were prepared by spray pyrolysis. The optical and electrical properties of intensively colored films were studied. It was found that the near-infrared reflectivity increases in the colored state. This behavior is typical of degenerate semiconducting materials. However, the variations of the electrical conductivity with the temperature for these films, indicates semiconducting behavior, while the carrier concentration (n), measured by the Hall effect, is typical of degenerate material. The optical properties can be easily explained by the Drude theory, which is related to the bulk properties of the samples. It is shown that the value of n is also related to the bulk proper-ties of the films, while the conductivity is controlled by the grain boundary effect. The results are interpreted in terms of a modified version of Seto's model, taking into account thermionic emission and tunneling of carriers through the potential barriers at the grain boundaries. (C) 2001 Elsevier Science B.V. All rights reserved. C1 Univ Nantes, FSTN, Grp Couches Minces & Mat Nouveaux, Equipe Phys Solides Elect, F-44322 Nantes 3, France. Fac Sci, Dept Phys, Lab Optoelect & Phys Chim Mat, Kenitra, Morocco. Fac Sci & Tech, Dept Phys, LCP, Marrakech, Morocco. Fac Sci Semlalia, Lab Phys Solide & Couches Minces, Marrakech, Morocco. RP Bernede, JC, Univ Nantes, FSTN, Grp Couches Minces & Mat Nouveaux, Equipe Phys Solides Elect, 2 Rue Houssiniere,BP 9209, F-44322 Nantes 3, France. CR BUBE RH, 1968, APPL PHYS LETT, V13, P136 CRANDALL RS, 1977, PHYS REV LETT, V39, P232 DAUTREMONTSMITH WC, 1982, DISPLAYS, V3, P67 DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 DRUDE P, 1900, ANN PHYSIK, V3, P369 FAN JCC, 1975, J ELECTROCHEM SOC SO, V122, P1719 GARCIACUENCA MV, 1984, J APPL PHYS, V56, P1738 GOLDNER RB, 1984, SPIE P, V502, P54 GOLDNER RB, 1986, SOL ENERG MATER, V14, P195 HAWSON RP, 1979, APPL PHYS LETT, V39, P161 HUANG KF, 1987, THIN SOLID FILMS, V148, P7 JARZEBSKI ZM, 1982, PHYS STATUS SOLIDI A, V71, P13 MA HL, 1995, THIN SOLID FILMS, V263, P105 MESSAOUDI C, 1995, PHYS STATUS SOLIDI A, V151, P93 REGRAGUI M, IN PRESS SOL ENERGY REGRAGUI M, 1998, LEBANESE SCI RES REP, V34, P225 REGRAGUI M, 2000, THIN SOLID FILMS, V358, P40 SETO JYW, 1975, J APPL PHYS, V46, P5247 WEIHER RL, 1962, J APPL PHYS, V33, P2834 WERNER JH, 1994, POLYCRYSTALLINE SEMI, V3 WITTWER V, 1978, SOLID STATE COMMUN, V25, P977 NR 21 TC 6 PU ELSEVIER SCIENCE SA PI LAUSANNE PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND SN 0040-6090 J9 THIN SOLID FILMS JI Thin Solid Films PD OCT 1 PY 2001 VL 397 IS 1-2 BP 238 EP 243 PG 6 SC Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter GA 486WE UT ISI:000171839300037 ER PT J AU Makhnovskiy, DP Panina, LV Mapps, DJ Sarychev, AK TI Effect of transition layers on the electromagnetic properties of composites containing conducting fibres SO PHYSICAL REVIEW B LA English DT Article ID EFFECTIVE DIELECTRIC RESPONSE; MEDIA; INCLUSIONS; FILMS AB The approach to calculating the effective dielectric and magnetic response in bounded composite materials is developed. The method is essentially based on the renormalization of the dielectric matrix parameters to account for the surface polarization and the displacement currents at the interfaces. This makes possible the use of the effective-medium theory developed for unbounded materials, where the spatially dependent local dielectric constant and magnetic permeability are introduced. A detailed mathematical analysis is given for a dielectric laver having conducting fibres with in-plane positions. The surface effects are most essential at microwave frequencies in correspondence to the resonance excitation of fibres. In thin layers (having a thickness of the transition layer), the effective dielectric constant has a dispersion region at much higher frequencies compared to those for unbounded materials, exhibiting a strong dependence on the layer thickness. For the geometry considered, the effective magnetic permeability differs slightly from unity and corresponds to the renormalized matrix parameter. The magnetic effect is due entirely to the existence of the surface displacement currents. C1 Univ Plymouth, Dept Elect & Elect Commun Engn, Plymouth PL4 8AA, Devon, England. New Mexico State Univ, Dept Phys, Las Cruces, NM 88003 USA. RP Makhnovskiy, DP, Univ Plymouth, Dept Elect & Elect Commun Engn, Drake Circus, Plymouth PL4 8AA, Devon, England. CR ANTONOV AS, 1990, ELECTROPHYSICAL PROP BALBERG I, 1987, PHILOS MAG, V56, P1991 BARRERA RG, 1989, PHYS REV B, V39, P9998 BARRERA RG, 1993, PHYS REV B, V47, P8528 BERGMAN DJ, 1992, SOLID STATE PHYS, V46, P147 BORN M, 1933, OPTIK BORN M, 1968, PRINCIPLES OPTICS BRUGGEMAN DAG, 1935, ANN PHYS LPZ, V24, P635 DRUDE P, 1894, WIED ANN, V51, P77 GADOMSKII ON, 2000, OPT SPECTROSC+, V89, P261 GIBSON UJ, 1983, PHYS REV B, V27, P5046 HALLEN E, 1962, ELECTROMAGNETIC THEO HERMANDER L, 1983, ANAL LINEAR PARTIAL, V1 KALACHEV AA, 1991, MATER RES SOC S P, V214, P113 KING R, 1981, ANTENNAS MATTER FUND KOLESNIKOV AN, 1991, MATER RES SOC S P, V214, P119 LAGARKOV AN, 1996, PHYS REV B, V53, P6318 LAGARKOV AN, 1998, J APPL PHYS, V84, P3806 LANDAU LD, 1960, ELECTRODYNAMICS CONT LANDAUER R, 1978, AIP C P, V40, P2 MACLEOD HA, 1969, THIN FILM OPTICAL FI MARKUSHEVICH AI, 1985, THEORY FUNCTIONS COM NIKLASSON GA, 1984, J APPL PHYS, V55, P3382 NIKLASSON GA, 1986, NATO ADV STUDY I, V104 SHELKUNOFF SA, 1952, ANTENNAS THEORY PRAC SHENG P, 1980, PHYS REV LETT, V45, P60 SIVUKHIN DV, 1956, ZH EKSP TEOR FIZ, V3, P269 SOMMERFIELD A, 1964, PARTIAL DIFFERENTIAL STOCKMAN MI, 1996, PHYS REV B, V53, P2183 VINOGRADOV AP, 1999, J COMMUN TECHNOL EL+, V44, P317 ZUEV SA, 1985, TEORETICH MATEM FIZI, V62, P76 NR 31 TC 3 PU AMERICAN PHYSICAL SOC PI COLLEGE PK PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA SN 0163-1829 J9 PHYS REV B JI Phys. Rev. B PD OCT 1 PY 2001 VL 6413 IS 13 AR 134205 DI ARTN 134205 PG 12 SC Physics, Condensed Matter GA 479WM UT ISI:000171426700045 ER PT J AU Glasson, P Dotsenko, V Fozooni, P Lea, MJ Bailey, W Papageorgiou, G Andresen, SE Kristensen, A TI Observation of dynamical ordering in a confined Wigner crystal SO PHYSICAL REVIEW LETTERS LA English DT Article ID DIMENSIONAL ELECTRON-SYSTEM; LIQUID-HELIUM SURFACE; TRANSITION; MOBILITY AB We present measurements of the conduction of nondegenerate free electrons along a low-dimensional channel at low temperatures, using surface-state electrons on liquid helium in novel microelectronic devices. Above 1 K, the electrons form an ideal classical Drude conductor. Below 1 K, Coulomb interactions produce electronic spatial order, leading to strong non-Ohmic effects and negative differential conductivity. Evidence is presented for self-organized current filaments in the channel, created by a nonequilibrium phase transition. Periodic conductance oscillations suggest an anisotropic spatial order with lines of electrons along the channel edges. C1 Univ London, Royal Holloway & Bedford New Coll, Dept Phys, Egham TW20 0EX, Surrey, England. Univ Copenhagen, Niels Bohr Inst fAPG, Copenhagen, Denmark. RP Glasson, P, Univ London, Royal Holloway & Bedford New Coll, Dept Phys, Egham TW20 0EX, Surrey, England. CR ANDREI E, 1997, 2 DIMENSIONAL ELECT BAJAJ KMS, 1994, PHYSICA B 1, V194, P1235 DJERFI K, 1998, PHYS REV LETT, V80, P806 DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 DYKMAN MI, 1997, PHYS REV LETT, V78, P4813 DYKMAN MI, 2000, FORTSCHR PHYS, V48, P1095 GLASSON P, 2000, PHYSICA B 2, V284, P1916 ISAHARA A, 1989, SOLID STATE PHYS, V42, P271 KOVDRYA YZ, 2000, PHYSICA B 1, V284, P168 KRISTENSEN A, 1996, PHYS REV LETT, V77, P1350 LEA MJ, 2000, FORTSCHR PHYS, V48, P1109 LEHR M, 1990, PHYS REV B, V42, P9019 LI CC, 2000, PHYS REV B, V61, P10905 MARTY D, 1986, J PHYS C SOLID STATE, V19, P6097 MEHROTRA R, 1984, PHYS REV B, V29, P5239 PLATZMAN PM, 1999, SCIENCE, V284, P1967 RUBO YG, COMMUNICATION SAITOH M, 1977, J PHYS SOC JPN, V42, P201 SARACHIK MP, 2000, PHYS STATUS SOLIDI B, V218, P237 SCHON JH, 2000, SCIENCE, V288, P2338 SHIRAHAMA K, 1995, PHYS REV LETT, V74, P781 SOKOLOV SS, 1995, PHYS REV B, V51, P5977 THOMAS H, 1992, NONLINEAR DYNAMICS S VINEN VWF, 1999, J PHYS CONDENS MATT, V48, P9709 NR 24 TC 21 PU AMERICAN PHYSICAL SOC PI COLLEGE PK PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA SN 0031-9007 J9 PHYS REV LETT JI Phys. Rev. Lett. PD OCT 22 PY 2001 VL 8717 IS 17 AR 176802 DI ARTN 176802 PG 4 SC Physics, Multidisciplinary GA 484UX UT ISI:000171708900040 ER PT J AU Bertrand, E Bonn, D Kellay, H Binks, BP Meunier, J TI Fluctuation effects on wetting films SO EUROPHYSICS LETTERS LA English DT Article ID LONG-RANGE FORCES; LIQUID INTERFACES; AOT MONOLAYERS; TRANSITIONS; ALKANES; WATER; CONSTANT; SYSTEMS; LENGTH AB We provide a quantitative experimental determination of the fluctuation repulsion that stabilizes wetting lms in systems for which the interfacial tension of one of the two interfaces bounding the wetting lm is low. This is achieved by studying the wetting of different alkanes on water, in the presence of a surfactant. The results agree well with the theoretical calculation of the fluctuation repulsion of a membrane under vanishing surface tension. C1 Ecole Normale Super, Phys Stat Lab, F-75231 Paris 05, France. Univ Bordeaux 1, CPMOH, F-33405 Talence, France. Univ Hull, Dept Chem, Kingston Upon Hull HU6 7RX, N Humberside, England. RP Bertrand, E, Ecole Normale Super, Phys Stat Lab, 24 Rue Lhomond, F-75231 Paris 05, France. CR BERTRAND E, 2000, PHYS REV LETT, V85, P1282 BINKS BP, 1991, EUROPHYS LETT, V16, P53 BREZIN E, 1983, J PHYS-PARIS, V44, P775 BUFF FP, 1965, PHYS REV LETT, V15, P621 CAHN JW, 1977, J CHEM PHYS, V66, P3667 DIETRICH S, 1985, PHYS REV B, V31, P4718 DIETRICH S, 1991, PHYS REV A, V43, P1861 DRUDE P, 1959, THEORY OPTICS DZYALOSHINSKII IE, 1961, ADV PHYS, V10, P165 ELBAUM M, 1991, PHYS REV LETT, V66, P1713 FRADIN C, 2000, NATURE, V403, P871 HELFRICH W, 1984, NUOVO CIMENTO D, V3, P137 ISRAELACHVILI JN, 1985, INTERMOLECULAR SURFA KELLAY H, 1992, PHYS REV LETT, V69, P1220 LIPOWSKY R, 1984, PHYS REV LETT, V52, P2303 LIPOWSKY R, 1987, PHYS REV B, V36, P2126 LIPOWSKY R, 1988, RANDOM FLUCTUATIONS, P227 MAHANTY J, 1976, DISPERSON FORCES MEUNIER J, IN PRESS MEUNIER J, 1987, J PHYS-PARIS, V48, P1819 RAGIL K, 1996, J CHEM PHYS, V105, P5160 RAGIL K, 1996, PHYS REV LETT, V77, P1532 ROSS D, 1999, NATURE, V400, P737 ROSS D, 2001, J CHEM PHYS, V114, P2784 SAFINYA CR, 1986, PHYS REV LETT, V57, P2718 SHAHIDZADEH N, 1998, PHYS REV LETT, V80, P3992 SHENOY VB, 1995, PHYS REV LETT, V75, P4086 VONNEGUT B, 1942, REV SCI INSTRUM, V13, P6 WEAST RC, 1985, CRC HDB CHEM PHYSICS NR 29 TC 4 PU E D P SCIENCES PI LES ULIS CEDEXA PA 7, AVE DU HOGGAR, PARC D ACTIVITES COURTABOEUF, BP 112, F-91944 LES ULIS CEDEXA, FRANCE SN 0295-5075 J9 EUROPHYS LETT JI Europhys. Lett. PD SEP PY 2001 VL 55 IS 6 BP 827 EP 833 PG 7 SC Physics, Multidisciplinary GA 474CJ UT ISI:000171086500012 ER PT J AU Spehner, D Bellissard, J TI A kinetic model of quantum jumps SO JOURNAL OF STATISTICAL PHYSICS LA English DT Article DE open quantum systems; quantum kinetic models ID STATE DIFFUSION; OPEN SYSTEMS; DYNAMICS; OPTICS; LOCALIZATION; EQUATIONS; TRANSPORT AB A new class of models describing the dissipative dynamics of an open quantum system S by means of random time evolutions of pure states in its Hilbert space H is considered. The random evolutions are linear and defined by Poisson processes. At the random Poissonian times. the wavefunction experiences discontinuous changes (quantum jumps). These changes are implemented by some nonunitary linear operators satisfying a locality condition. If the Hilbert space H of S is infinite dimensional, the models involve an infinite number of independent Poisson processes and the total frequency of jumps may be infinite. We show that the random evolutions in H are then given by some almost-surely defined unbounded random evolution operators obtained by a limit procedure. The average evolution of the observables of S is given by a quantum dynamical semigroup, its generator having the Lindblad form.((1)) The relevance of the models in the field of electronic transport in Anderson insulators is emphasised. C1 Univ Toulouse 3, Inst Rech Syst Atom Mol Complexes, F-31062 Toulouse, France. CNRS, UMR 5626, F-31062 Toulouse, France. RP Spehner, D, Pontificia Univ Catolica Chile, Fac Fis, Casilla 6177, Santiago 22, Chile. 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Stat. Phys. PD AUG PY 2001 VL 104 IS 3-4 BP 525 EP 572 PG 48 SC Physics, Mathematical GA 470FU UT ISI:000170860400002 ER PT J AU Shahidzadeh, N Bonn, D Meunier, J Mavon, A TI Wetting of biological lipids on aqueous substrates SO PHYSICAL REVIEW E LA English DT Article ID WATER; ALKANES; FILMS AB We study the dynamics and final wetting state of skin lipids on water and brine by fluorescence microscopy and ellipsometry. When a lipid droplet is brought into contact with the water surface, a lipid wetting film spreads out rapidly by a Marangoni effect. Subsequently, this film undergoes a dewetting instability. However, the final equilibrium is not partial wetting. The film breaks up into droplets with a mesoscopic (approximate to 50 Angstrom) film in between. These observations result from a subtle interplay between short- and long-range forces: surfactants naturally present in the lipids favor wetting, while the van der Waals forces oppose it. In addition, this reveals the likely organization of the hydrolipid film that covers and protects the skin. C1 Inst Rech Pierre Fabre, Lab Pharmacocinet Cutanee, F-31322 Castanet Tolosan, France. Ecole Normale Super, Phys Stat Lab, F-75231 Paris, France. RP Shahidzadeh, N, LMSGC, F-77420 Chammps Sur Marne, France. CR BERTRAND E, 2000, PHYS REV LETT, V85, P1282 BLANC D, 1980, INT J COSMETIC SCI, V2, P243 BROCHARDWYART F, 1991, LANGMUIR, V7, P335 CREECH JL, 1998, CURR EYE RES, V17, P1058 DOWNING DT, 1982, ARCH DERMATOL RES, V272, P343 DRUDE P, 1959, THEORY OPTICS FANTON X, 1998, LANGMUIR, V14, P2554 GURBAUER G, 1989, J LIPID RES, V30, P89 HERRMANN F, 1953, J INVEST DERMATOL, V21, P397 HIRASAKI GJ, 1991, SURFACTANT SCI SERIE, V36, P23 HOLLY FJ, 1993, CONTACT ANGLE WETABI, P849 INDEKEU JO, 1999, J STAT PHYS, V95, P1009 ISRAELACHVILI JN, 1985, INTERMOLECULAR SURFA JENSEN OE, 1993, PHYS FLUIDS A-FLUID, V5, P58 KLIGMAN AM, 1958, J INVEST DERMATOL, V30, P90 LEVICH VG, 1962, PHYSICOCHEMICAL HYDR RAGIL K, 1996, PHYS REV LETT, V77, P1532 REDON C, 1991, PHYS REV LETT, V66, P715 SHAHIDZADEH N, 1998, PHYS REV LETT, V80, P3992 SILBERZAN P, 1991, PHYS REV LETT, V66, P185 STRAUSS JS, 1991, PHYSL BIOCH MOL BIOL, P712 STRAUSS JS, 1993, DERMATOLOGY GEN MED, P709 TIFFANY JM, 1995, CELL BIOCHEM FUNCT, V13, P177 TROIAN SM, 1989, PHYS REV LETT, V62, P1496 WERTZ PW, 1998, CHEM PHYS LIPIDS, V91, P85 NR 25 TC 3 PU AMERICAN PHYSICAL SOC PI COLLEGE PK PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA SN 1063-651X J9 PHYS REV E JI Phys. Rev. E PD AUG PY 2001 VL 6402 IS 2 PN Part 1 AR 021911 DI ARTN 021911 PG 4 SC Physics, Fluids & Plasmas; Physics, Mathematical GA 463TF UT ISI:000170492800079 ER PT J AU Gunther, H TI On the aberration of waves in classical spacetime SO ASTRONOMISCHE NACHRICHTEN LA English DT Article DE aberration; relativity; simultaneity ID RELATIVITY; CONVENTIONALITY; SIMULTANEITY AB Recently Liebscher & Brosche (1998) proposed a new procedure to derive astronomical aberration for electromagnetic waves in the linear v/c limit using a non-conventional definition of simultaneity for classical spacetime. The question of conventional and non-conventional simultaneity will be analysed in this context. C1 Univ Appl Sci, FH Bielefeld, D-33602 Bielefeld, Germany. RP Gunther, H, Univ Appl Sci, FH Bielefeld, D-33602 Bielefeld, Germany. CR BECKER R, 1957, THEORIE ELEKTRIZITAT, V1 BERZI V, 1969, J MATH PHYS, V10, P1518 DRUDE P, 2000, LEHRBUCH OPTIK GUNTHER H, 1994, PHYS STATUS SOLIDI B, V185, P335 GUNTHER H, 2000, ELEMENTARY THEORY RE LIEBSCHER DE, 1998, ASTRON NACHR, V319, P309 LORENTZ HA, 1904, P K AKAD WET-AMSTERD, V6, P809 LORENTZ HA, 1999, PR KON AKAD WET, V1, P427 MALAMENT D, 1977, NOUS, V11, P293 MUHLHOLZER F, 1983, ZEITBEGRIFF SPEZIELL POINCARE H, 1898, REV METAPHYS MORALE, V6, P1 REICHENBACH H, 1972, GESAMMELTE WERKE, V2 SARKAR S, 1999, PHILOS SCI, V66, P208 NR 13 TC 0 PU WILEY-V C H VERLAG GMBH PI BERLIN PA PO BOX 10 11 61, D-69451 BERLIN, GERMANY SN 0004-6337 J9 ASTRON NACHR JI Astro. Nachr. PY 2001 VL 322 IS 3 BP 153 EP 160 PG 8 SC Astronomy & Astrophysics GA 461PF UT ISI:000170372100003 ER PT J AU Duarte, HA TI Chemical reactivity indexes from density functional theory: Formalism and perspectives. SO QUIMICA NOVA LA Portuguese DT Review DE density functional theory; reactivity indexes; hardness; softness ID X = O; ELECTRONIC-STRUCTURE; EXCHANGE-ENERGY; BOND-ENERGIES; HARDNESS; APPROXIMATION; PRINCIPLE; ACCURATE; ISOMERIZATION; ADSORPTION AB The fundaments of the modern Density Functional Theory (DFT), its basic theorems, principles and methodology are presented. This review also discuss important and widely used concepts in chemistry but that had not been precisely defined until the development of the DFT. These concepts were proposed and used from an empirical base, but now their precise definition arc well established in the DFT formalism. Concepts such as chemical potential (electronegativity), hardness, softness and Fukui function are presented and their consequences to the understanding of chemical reactivity are discussed. C1 Univ Fed Minas Gerais, ICEx, Dept Quim, BR-31270901 Belo Horizonte, MG, Brazil. RP Duarte, HA, Univ Fed Minas Gerais, ICEx, Dept Quim, Av Antonio Carlos 6627, BR-31270901 Belo Horizonte, MG, Brazil. CR BAERENDS EJ, 1997, J PHYS CHEM A, V101, P5383 BECKE AD, 1986, J CHEM PHYS, V84, P4524 BECKE AD, 1988, PHYS REV A, V38, P3098 CHATTARAJ PK, 1991, J AM CHEM SOC, V113, P1855 CHERMETTE H, 1999, J COMPUT CHEM, V20, P129 DEPROFT F, 1997, J CHEM PHYS, V107, P3000 DIRAC PAM, 1930, P CAMB PHILOS SOC, V26, P376 DREIZLER RM, 1990, DENSITY FUNCTIONAL T DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 DRUDE P, 1900, ANN PHYSIK, V3, P369 DUARTE HA, 1998, J CHEM PHYS, V108, P743 DUARTE HA, 1998, J INORG BIOCHEM, V72, P71 DUARTE HA, 1999, INORG CHEM, V38, P3895 DUARTE HA, 1999, TOP CATAL, V9, P123 FERMI E, 1927, ATTI ACCAD NAZ LINCE, V6, P602 GILBERT TL, 1975, PHYS REV B, V12, P2111 GUTIERREZOLIVA S, 1999, MOL PHYS, V96, P61 GUTIERREZOLIVA S, 2000, J PHYS CHEM A, V104, P8955 GYFTOPOULOS EP, 1965, P NATL ACAD SCI USA, V60, P786 HASLETT TL, 2000, J AM CHEM SOC, V122, P6039 HOHENBERG P, 1964, PHYS REV B, V136, P864 JANAK JF, 1978, PHYS REV B, V18, P7165 JAQUE P, 2000, J PHYS CHEM A, V104, P995 KOHN W, 1965, PHYS REV, V140, A1133 KOHN W, 1996, J PHYS CHEM-US, V100, P12974 LADEIRA ACQ, 2001, GEOCHIM COSMOCHIM AC, V65, P1211 LEE C, 1987, THEOCHEM, V163, P305 LEE C, 1988, PHYS REV B, V37, P785 LEVY M, 1979, P NATL ACAD SCI USA, V76, P6062 LIU SB, 1997, J CHEM PHYS, V106, P5578 MERMIN ND, 1965, PHYS REV, V137, A1441 MINEVA T, 1997, J CHEM SOC FARADAY T, V93, P3309 MORGON NH, 1995, QUIM NOVA, V18, P44 MULLIKEN RS, 1934, J CHEM PHYS, V2, P782 OLIVEIRA M, 2000, J PHYS CHEM A, V104, P8256 PARR RG, 1978, J CHEM PHYS, V68, P3801 PARR RG, 1983, J AM CHEM SOC, V105, P105 PARR RG, 1989, DENSITY FUNCTIONAL T PARR RG, 1995, ANNU REV PHYS CHEM, V46, P701 PEARSON RG, 1963, J AM CHEM SOC, V85, P3533 PEARSON RG, 1987, J CHEM EDUC, V64, P561 PERDEW JP, 1981, PHYS REV B, V23, P5048 PERDEW JP, 1982, PHYS REV LETT, V49, P1691 PERDEW JP, 1985, NATO ASI SERIES B, V123 PERDEW JP, 1985, PHYS REV LETT, V55, P1665 PERDEW JP, 1986, PHYS REV B, V33, P8800 PERDEW JP, 1986, PHYS REV B, V33, P8822 PERDEW JP, 1996, INT J QUANTUM CHEM, V57, P309 PEREZ P, 2000, J PHYS CHEM A, V104, P1557 RUSSIER V, 1992, PHYS REV B, V45, P8894 SANDERSON RT, 1952, J CHEM EDUC, V29, P539 SANDERSON RT, 1971, CHEM BOUNDS BOUND EN SLATER JC, 1951, PHYS REV, V81, P385 SOLA M, 1999, J PHYS CHEM A, V103, P8847 TOROLABBE A, 1999, J PHYS CHEM A, V103, P4398 VOSKO SH, 1980, CAN J PHYS, V58, P1200 YANG WT, 1985, P NATL ACAD SCI USA, V82, P6723 NR 57 TC 1 PU SOC BRASILEIRA QUIMICA PI SAO PAULO PA CAIXA POSTAL 26037, 05599-970 SAO PAULO, BRAZIL SN 0100-4042 J9 QUIM NOVA JI Quim. Nova PD JUL-AUG PY 2001 VL 24 IS 4 BP 501 EP 508 PG 8 SC Chemistry, Multidisciplinary GA 457FR UT ISI:000170126900011 ER PT J AU McCrackin, FL Passaglia, E Stromberg, RR Steinberg, HL TI Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometry SO JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY LA English DT Article AB The use of the ellipsometer for the measurement of the thickness and refractive index of very thin films is reviewed. The Poincare sphere representation of the state of polarization of light is developed and used to describe the reflection process. Details of the operation of the ellipsometer are examined critically. A computational method is presented by which the thickness of a film of known refractive index on a reflecting substrate of known optical constants may be calculated directly from the ellipsometer readings. A method for computing both the refractive index and thickness of an unknown film is also developed. These methods have been applied to the determination of the thickness of an absorbed water layer on chromium ferrotype plates and on gold surfaces. In the former case the thickness was 23 to 27 Angstrom, and in the latter was 2 to 5 Angstrom. The measurement of the thickness and refractive index of barium fluoride films evaporated on chromium ferrotype surfaces is used as an illustration of the simultaneous determination of these two quantities. CR BARTELL LS, 1960, J PHYS CHEM-US, V64, P1075 BATEMAN JB, 1951, ANN NY ACAD SCI, V53, P1064 BORN M, 1959, PRINCIPLES OPTICS BOWDEN FP, 1951, P ROY SOC LOND A MAT, V209, P297 DRUDE P, 1889, ANN PHYS CHEM, V36, P532 DRUDE P, 1889, ANN PHYS CHEM, V36, P865 DRUDE P, 1890, ANN PHYS CHEM, V39, P481 FAUCHER JA, 1958, J OPT SOC AM, V48, P51 KRUGER J, 1959, J OPT SOC AM, V49, P1195 LUCY FA, 1948, J CHEM PHYS, V16, P167 PATRICK RL, COMMUNICATION PATRICK RL, 1961, J COLLOID SCI, V16, P93 ROTHEN A, 1945, REV SCI INSTRUM, V16, P26 ROTHEN A, 1948, REV SCI INSTRUM, V19, P839 ROTHEN A, 1949, REV SCI INSTRUM, V20, P66 ROTHEN A, 1951, ANN NY ACAD SCI, V53, P1054 ROTHEN A, 1957, REV SCI INSTRUM, V28, P283 SHURCLIFF WA, 1962, POLARIZED LIGHT STOKES GG, 1852, T CAMBRIDGE PHILOS S, V9, P399 TRONSTAD L, 1929, Z PHYS CHEM A-CHEM T, V142, P241 TRONSTAD L, 1931, 1 ROYAL NORW SCI SOC TRONSTAD L, 1935, T FARADAY SOC, V31, P1151 WINTERBOTTOM AB, 1946, T FARADAY SOC, V42, P487 NR 23 TC 2 PU US GOVERNMENT PRINTING OFFICE PI WASHINGTON PA SUPERINTENDENT DOCUMENTS,, WASHINGTON, DC 20402-9325 USA SN 1044-677X J9 J RES NATL INST STAND TECHNOL JI J. Res. Natl. Inst. Stand. Technol. PD MAY-JUN PY 2001 VL 106 IS 3 BP 589 EP 603 PG 15 SC Engineering, Multidisciplinary; Multidisciplinary Sciences GA 455CJ UT ISI:000170009700003 ER PT J AU Zukowska, K Oleszkiewicz, E TI Ellipsometry in optical studies of thin films conducted at the Institute of Physics of Wroclaw University of Technology SO OPTICA APPLICATA LA English DT Article ID LAYERS AB Ellipsometry is a very powerful and totally nondestructive technique for determining optical constants, film thickness in multilayered systems, surface and interfacial roughness and material microstructure. Ellipsometric measurements can be made in vacuum, air and other environments. Ellipsometry has traditionally been used to determine film thickness and optical constants of dielectrics and optical coatings, semiconductors and heterostructures, magneto-optic, magnetic and opto-electronic materials, electrochemical, biological and medical systems and in surface modifications and surface roughness investigations. In situ measurements during crystal growth or material deposition are useful to study constituent fractions (including void fractions) in deposited or grown materials, surface oxide formation and film growth kinetics. Ellipsometric studies of metal, dielectric, semiconductor and organic layers carried out at the Institute of Physics of Wroclaw University of Technology by members of Thin Films Group are presented. C1 Wroclaw Tech Univ, Inst Phys, PL-50370 Wroclaw, Poland. RP Zukowska, K, Wroclaw Tech Univ, Inst Phys, Wybrzeze Wyspianskiego 27, PL-50370 Wroclaw, Poland. CR ARCHER RJ, 1964, NATL BUREAU STANDARD, V256, P255 AZZAM RMA, 1977, ELIPSOMETRY POLARIZE BEATTIE JR, 1955, PHILOS MAG, V46, P235 BREWSTER D, 1831, OPTICS BRUDZEWSKI K, 1983, WSTEP DO ELIPSOMETRI BRUGGEMAN DAG, 1935, ANN PHYS-BERLIN, V24, P636 DRUDE P, 1889, ANN PHYS CHEM, V36, P532 DRUDE P, 1889, ANN PHYS CHEM, V36, P865 DRUDE P, 1891, ANN PHYS, V43, P126 DRUDE T, 2001, THEORY OPTICS GORSHKOV MM, 1974, ELLIPSOMETRIYA GOTZ G, 1982, NUCL INSTRUM METHODS, V199, P61 GRANDQUIST CG, 1977, PHYS REV B, V16, P351 IDCZAK E, 1973, SCI PAPERS I TECHNIC, V2 IDCZAK E, 1976, THIN SOLID FILMS, V34, P407 IDCZAK E, 1978, OPT APPL, V8, P55 IDCZAK E, 1979, OPT APPL, V9, P151 IDCZAK E, 1979, OPT APPL, V9, P233 IDCZAK E, 1979, OPT APPL, V9, P47 IDCZAK E, 1980, OPT APPL, V10, P83 IDCZAK E, 1980, OPT SPEKTROSK, V49, P570 IDCZAK E, 1980, OPT SPEKTROSK, V49, P797 IDCZAK E, 1980, THIN SOLID FILMS, V72, L21 IDCZAK E, 1981, OPT APPL, V11, P183 IDCZAK E, 1981, OPT APPL, V11, P307 IDCZAK E, 1981, THIN SOLID FILMS, V75, P139 IDCZAK E, 1981, THIN SOLID FILMS, V77, P301 IDCZAK E, 1988, OPT APPL, V18, P115 IDCZAK E, 1988, OPT APPL, V18, P41 IDCZAK E, 1989, J PHYS E, V22, P410 KISZA M, 1985, NUCL INSTRUM METH B, V7, P869 KISZA M, 1989, PHYS STATUS SOLIDI A, V112, P761 KULIK M, 1989, OPT APPL, V19, P203 KULIK M, 1989, PHYS STATUS SOLIDI A, V112, P785 MARCINOW T, 1975, THESIS WROCLAW MARCINOW T, 1985, OPT APPL, V15, P249 OLESZKIEWICZ E, 1985, OPT APPL, V15, P157 OLESZKIEWICZ W, 1999, P SOC PHOTO-OPT INS, V3820, P423 ROTHEN A, 1945, REV SCI INSTRUM, V16, P26 RZHANOV AV, 1979, OSNOVY ELLIPSOMETRII SCHULZ LG, 1954, J OPT SOC AM, V44, P362 SHKLYAREVSKII IN, 1957, OPT SPEKTROSK, V3, P361 SHKLYAREVSKII IN, 1971, SOLID STATE COMMUN, V9, P1737 SHKLYAREVSKII IN, 1972, OPT SPEKTROSK, V33, P1157 TOMPKINS HG, 1993, USERS GUIDE ELLIPSOM TOMPKINS HG, 1999, SPECTROSCOPIC ELLIPS VRIENS L, 1983, APPL OPTICS, V22, P4105 ZUKOWSKA K, 1981, THIN SOLID FILMS, V85, P327 ZUKOWSKA K, 1993, THIN SOLID FILMS, V224, P217 ZUKOWSKA K, 1998, P SOC PHOTO-OPT INS, V3320, P257 NR 50 TC 0 PU TECHNICAL UNIV WROCLAW PI WROCLAW PA WYBRZEZE WYSPIANSKIEGO 27, EXPORT-IMPORT DIVISION, 50-370 WROCLAW, POLAND SN 0078-5466 J9 OPT APPL JI Opt. Appl. PY 2001 VL 31 IS 1 BP 35 EP 51 PG 17 SC Optics GA 452WW UT ISI:000169883500003 ER PT J AU Sicard, E Boulmer-Leborgne, C Andreazza-Vignolle, C Frainais, M TI Excimer laser surface treatment of aluminum alloy in nitrogen SO APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING LA English DT Article ID INDUCED PLASMA; NITRIDED IRON AB The excimer laser nitriding process reported is developed to enhance the mechanical and chemical properties of aluminum alloys. An excimer laser beam is focused onto the alloy surface in a cell containing 1-bar nitrogen gas. A vapor plasma expands from the surface and a shock wave dissociates and ionizes nitrogen. It is assumed that nitrogen from plasma in contact with the surface penetrates to some depth. Thus it is necessary to work with a sufficient laser fluence to create the plasma, but this fluence must be limited to prevent laser-induced surface roughness. The nitrogen-concentration profiles are determined from Rutherford backscattering spectroscopy and scanning electron microscopy coupled to energy-dispersive X-ray analysis. Crystalline quality is evidenced by an X-ray diffraction technique. Transmission electron microscopy gives the in-depth. microstructure. Fretting coefficient measurements exhibit a lowering for some experimental conditions. The polycrystalline nitride layer obtained is several micrometers thick and composed of a pure AIN (columnar microstructure) top layer (200-500 nm thick) standing on an AIN (grains) in alloy diffusion layer. From the heat conduction equation calculation it is shown that a 308-nm laser wavelength would be better to increase the nitride thickness, as it corresponds to a weaker reflectance R value for aluminum. C1 Univ Orleans, CNRS, GREMI, F-45067 Orleans 2, France. CNRS, CRMD, F-45071 Orleans, France. PSA Puegeot Citroen, IPM, PBM, AMC, F-91578 Bievres, France. RP Boulmer-Leborgne, C, Univ Orleans, CNRS, GREMI, F-45067 Orleans 2, France. CR BARNICKEL J, 1997, HTM, V52, P2 BAUERLE D, 1996, SPRINGER SER MAT SCI, V1 BOULMERLEBORGNE C, 1998, APPL SURF SCI, V125, P137 CAO SQ, 1995, J MATER RES, V10, P54 DOOLITTLE LR, 1985, NUCL INSTRUM METH B, V9, P344 DRUDE P, 1966, THEORY OPTICS DU HL, 1994, CORROS SCI, V36, P631 HERMANN J, 1998, APPL SURF SCI, V127, P645 HERMANN J, 1998, J APPL PHYS, V83, P691 ILLGNER C, 1996, APPL PHYS A-MATER, V62, P231 ILLGNER C, 1997, APPL SURF SCI, V109, P150 ILLGNER C, 1997, NUCL INSTRUM METH B, V122, P420 MONDOLFO LF, 1976, ALUMINUM ALLOYS STRU PROKHOROV AM, 1990, LASER HEATING METALS SCHAAF P, 1995, HYPERFINE INTERACT, V95, P199 SCHAAF P, 1995, MAT SCI ENG A-STRUCT, V197, L1 SHAAF P, 1999, APPL PHYS LETT, V74, P153 SICARD E, 1998, APPL SURF SCI, V129, P726 SICARD E, 1998, SURFACE COATING TECH, V100, P440 SWANSON A, 1953, 359 US NAT BUR STAND, V359, P11 THOMANN AL, 1997, SURF COAT TECH, V97, P448 VIVIEN C, 1998, J PHYS D APPL PHYS, V31, P1263 VONALLMEN M, 1995, LASER BEAM INTERACTI, V2 NR 23 TC 4 PU SPRINGER-VERLAG PI NEW YORK PA 175 FIFTH AVE, NEW YORK, NY 10010 USA SN 0947-8396 J9 APPL PHYS A-MAT SCI PROCESS JI Appl. Phys. A-Mater. Sci. Process. PD JUL PY 2001 VL 73 IS 1 BP 55 EP 60 PG 6 SC Materials Science, Multidisciplinary; Physics, Applied GA 447QN UT ISI:000169584100008 ER PT J AU Cantrell, W Ewing, GE TI Thin film water on muscovite mica SO JOURNAL OF PHYSICAL CHEMISTRY B LA English DT Article ID AMBIENT-TEMPERATURES; NACL(001) SURFACE; VAPOR ADSORPTION; CONDENSATION AB We have shown that water adsorbed to the (001) plane of muscovite mica has an infrared spectrum consistent with a bonding network that is more structured than that found in bulk water. Isotherms taken at temperatures ranging from near the ice melting point to room temperature suggest that water wets mica incompletely. Additionally, we find that the enthalpy and entropy of the adsorbed water molecules imply a strongly bound first layer. Both enthalpy and entropy approach the bulk values as the thickness of the adsorbed layer increases. C1 Indiana Univ, Dept Chem, Bloomington, IN 47405 USA. RP Ewing, GE, Indiana Univ, Dept Chem, Bloomington, IN 47405 USA. 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Phys. Chem. B PD JUN 14 PY 2001 VL 105 IS 23 BP 5434 EP 5439 PG 6 SC Chemistry, Physical GA 443YP UT ISI:000169371400011 ER PT J AU Hou, JM Boichenko, VA Diner, BA Mauzerall, D TI Thermodynamics of electron transfer in oxygenic photosynthetic reaction centers: Volume change, enthalpy, and entropy of electron-transfer reactions in manganese-depleted photosystem II core complexes SO BIOCHEMISTRY LA English DT Article ID TYROSINE-Y-Z; CYANOBACTERIUM SYNECHOCYSTIS PCC-6803; RHODOBACTER-SPHAEROIDES R-26; P680(+CENTER-DOT) REDUCTION; ISOTOPE-EXCHANGE; EVOLVING COMPLEX; WATER OXIDATION; PURPLE BACTERIA; D1 POLYPEPTIDE; PRIMARY DONOR AB We have previously reported the thermodynamic data of electron transfer in photosystem I using pulsed time-resolved photoacoustics [Hou et al. (2001) Biochemistry 40, 7109-7116]. In the present work, using preparations of purified manganese-depleted photosystem II (PS II) core complexes from Synechocystis sp. PCC 6803, we have measured the DeltaV, DeltaH, and estimated T DeltaS of electron transfer on the time scale of 1 mus. At pH 6.0, the volume contraction of PS II was determined to be -9 +/- 1 Angstrom (3). The thermal efficiency was found to be 52 +/- 5%, which corresponds to an enthalpy change of -0.9 +/- 0.1 eV for the formation of the state P-680+Q(A)(-) from P-680*. An unexpected volume expansion on pulse saturation of PS II was observed, which is reversible in the dark. At pH 9.0, the volume contraction, the thermal efficiency, and the enthalpy change were -3.4 +/- 0.5 Angstrom (3), 37 +/- 7%, and -1.15 +/- 0.13 eV, respectively. The DeltaV of PS II, smaller than that of PS I and bacterial centers, is assigned to electrostriction and analyzed using the Drude-Nernst equation. To explain the small DeltaV for the formation of P-680+Q(A)(-) or Y-Z.Q(A)(-), we propose that fast proton transfer into a polar region is involved in this reaction. Taking the free energy of charge separation of PS II as the difference between the energy of the excited-state P-680* and the difference in the redox potentials of the donor and acceptor, the apparent entropy change (T DeltaS) for charge separation of PS II is calculated to be negative, -0.1 +/- 0.1 eV at pH 6.0 (P-680+Q(A)(-)) and -0.2 +/- 0.15 eV at pH 9.0 (Y-Z.Q(A)(-)) The thermodynamic properties of electron transfer in PS II core reaction centers thus differ considerably from those of bacterial and PS I reaction centers, which have DeltaV of similar to -27 Angstrom (3), DeltaH of similar to -0.4 eV, and T DeltaS of similar to +0.4 eV. C1 Rockefeller Univ, New York, NY 10021 USA. Russian Acad Sci, Inst Basic Biol Problems, Pushchino 142290, Russia. Dupont Co, Dept Cent Res & Dev, Expt Stn, Wilmington, DE 19880 USA. RP Mauzerall, D, Rockefeller Univ, 1230 York Ave, New York, NY 10021 USA. 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This theory generalizes classical kinematics to include continuous rotary degrees of freedom and introduces an additional balance law associated with the rotary degrees of freedom. Various constitutive relations are proposed in accordance with standard procedures of nonlinear continuum mechanics. The resulting set of equations provides a properly invariant and thermodynamically consistent theory that allows for constitutive nonlinearities. In particular, the classical Debye theory along with the Nernst-Einstein relations are shown to follow from a special case of linear constitutive relations and an assumption of ideality in which the free energy consists only of a classical entropic contribution. Within our theory, the notion of osmotic pressure arises naturally as a consequence of accounting for forces that act conjugate to the rotary degrees of freedom and serves as the driving force for rotary diffusion. C1 Univ Illinois, Dept Theoret & Appl Mech, Urbana, IL 61801 USA. Univ Coll London, Dept Geol Sci, London WC1E 5BT, England. RP Fried, E, Univ Illinois, Dept Theoret & Appl Mech, Urbana, IL 61801 USA. 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Ration. Mech. Anal. PY 2001 VL 158 IS 1 BP 1 EP 27 PG 27 SC Mathematics, Interdisciplinary Applications; Mechanics GA 442EB UT ISI:000169271300001 ER PT J AU Sah, Y Krishna, JG TI Optical properties of an isotropic optically active medium at oblique incidence SO JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION LA English DT Article AB The optical properties of an isotropic optically active medium at oblique incidence have been investigated. It was found that the amount of transmitted light converted from p polarization to s polarization and vice versa, through an isotropic optically active medium, is independent of the state of incident polarization. Though the optical rotation through the optically active medium is same for p and s polarization at normal incidence, it becomes different at oblique incidences. (C) 2001 Optical Society of America. C1 Mahindra British Telecom Ltd, Modeling & Simulat Grp, Pune 411007, Maharashtra, India. RP Sah, Y, Mahindra British Telecom Ltd, Modeling & Simulat Grp, Pune 411007, Maharashtra, India. CR ARAGO DF, 1811, MEM I, V1, P93 BASSIRI S, 1988, J OPT SOC AM A, V5, P1450 BERREMAN DW, 1972, J OPT SOC AM, V62, P502 BIOT JB, 1875, B SOC PHILOMATH, V190 CHANDRASEKHAR S, 1992, LIQUID CRYSTALS DRUDE P, 1922, THEORY OPTICS FRESNEL A, 1822, OEUVRES, V1, P731 LEKNER J, 1996, PURE APPL OPT, V5, P417 LONGHURST RS, 1981, GEOMETRICAL PHYSICAL RAMACHANDRAN GN, 1961, HDB PHYSIK 1, V25 SAH Y, 1994, J OPT SOC AM A, V11, P740 SILVERMAN MP, 1986, J OPT SOC AM A, V3, P830 YARIV A, 1983, OPTICAL WAVES CRYSTA NR 13 TC 3 PU OPTICAL SOC AMER PI WASHINGTON PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA SN 0740-3232 J9 J OPT SOC AM A-OPT IMAGE SCI JI J. Opt. Soc. Am. A-Opt. Image Sci. Vis. PD JUN PY 2001 VL 18 IS 6 BP 1388 EP 1392 PG 5 SC Optics GA 436MD UT ISI:000168938900020 ER PT J AU Michler, I Feis, A Rodriguez, MA Braslavsky, SE TI Structural volume changes upon photoisomerization: A laser-induced optoacoustic study with a water-soluble nitrostilbene SO JOURNAL OF PHYSICAL CHEMISTRY A LA English DT Article ID PHOTOACOUSTIC CALORIMETRY; TRANS PHOTOISOMERIZATION; SPECTROSCOPY LIOAS; ACCEPTOR COMPOUND; (MLCT)-M-3 STATE; ENTHALPY; PHOTOCHEMISTRY; PORPHYRINOIDS; COMPENSATION; PHOTOPHYSICS AB The trans to cis photoisomerization of 4,4 ' -dinitro-2,2 ' -disulfonylstilbene (DS) was studied by laser-induced optoacoustic spectroscopy (LIOAS) in aereated neat water and in aereated aqueous solutions of various monovalent cations (NH4+, N(CH3)(4)(+), Na+, K+, and Cs+) and the respective cis to trans photoisomerization only in the presence of NH4+. in every case, two single-exponential components were required to fit the data, one with an unresolved lifetime (< 20 ns) for the appearance of the triplet state mixture T (the perpendicular triplet state (3)p* in equilibrium with the lowest trans triplet state (3)t*) and one with a longer lifetime of (75 +/- 20) ns at 5.5 degreesC for the decay of the T mixture. The temperature dependence of the LIOAS amplitudes in combination with the determined isomerization quantum yields afforded a contraction of -(1.4 +/- 0.15) ml/ mol for the trans to T transition, whereas a smaller contraction of -(0.15 +/- 0.15) ml/mol was obtained for the cis to T transition. The different values of the contraction indicate a greater similarity between the average structures of the T components with the cis ground singlet state than with the trans ground singlet. The total. structural volume change for the trans to cis transition is in average DeltaV(tc) = - (1.2 +/- 0.1) ml/mol. The calculated contribution of electrostriction is at most 50% of this value. However, the nature of the countercation had no influence on the data as would be expected for changes in the specific interaction with the H-bond network in water upon photoisomerization. Thus, ca. 50% of the total contraction is attributed to intrinsic effects, related to a shorter C=C band and a smaller accessible Volume in the cis isomer. The LIOAS data show that cis-DS Lies (28 +/- 35) kJ/mol above trans-DS in agreement with the calculated value of 37 kJ/mol. C1 Max Planck Inst Strahlenchem, D-45413 Mulheim, Germany. RP Braslavsky, SE, Max Planck Inst Strahlenchem, Postfach 10 13 65, D-45413 Mulheim, Germany. 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Phys. Chem. A PD MAY 24 PY 2001 VL 105 IS 20 BP 4814 EP 4821 PG 8 SC Chemistry, Physical GA 436AT UT ISI:000168914900003 ER PT J AU Keddie, JL TI Structural analysis of organic interfacial layers by ellipsometry SO CURRENT OPINION IN COLLOID & INTERFACE SCIENCE LA English DT Review DE ellipsometry; adsorption; reflectivity; thin films; data inversion; surface excess; solution ambiguity; surfaces; interfaces; polymers; surfactants; critical phenomena ID AIR-WATER-INTERFACE; INFRARED SPECTROSCOPIC ELLIPSOMETRY; NONIONIC SURFACTANTS; PROTEIN ADSORPTION; BETA-CASEIN; SOLID/LIQUID INTERFACE; OVERFLOWING CYLINDER; NEUTRON REFLECTION; DIBLOCK COPOLYMERS; OPTICAL TECHNIQUES AB Ellipsometry has 'come of age' as a technique for the analysis of problems related to colloid and interface science. It has advanced far beyond applications of measuring film thickness or optical constants - although these remain important uses. Studies of the structure of polymers at the solid/liquid interface have been advanced significantly by the realisation of Fourier transform ellipsometry. Another important achievement has been the calibrated measurement of the dynamic surface excess at the flowing surface of a liquid jet. The uses of ellipsometry to study critical adsorption in binary liquids and to measure the width of liquid/liquid interfaces are also noteworthy. An important development is the use of infrared - rather than visible - light, which opens up numerous possibilities for the simultaneous structural and chemical interrogation of interfaces non-invasively. (C) 2001 Elsevier Science Ltd. Al rights reserved. C1 Univ Surrey, Dept Phys, Guildford GU2 7XH, Surrey, England. RP Keddie, JL, Univ Surrey, Dept Phys, Guildford GU2 7XH, Surrey, England. 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Opin. Colloid Interface Sci. PD APR PY 2001 VL 6 IS 2 BP 102 EP 110 PG 9 SC Chemistry, Physical GA 436CY UT ISI:000168920000004 ER PT J AU Robotti, N Badino, M TI Max Planck and the 'Constants of nature' SO ANNALS OF SCIENCE LA English DT Article AB When at the end of the 1900s Planck introduced the constant h into the black-body radiation law together with constant k. he provided no explanation of either its meaning or why it had that particular value. He simply introduced it. In reality the history of the constant was far from straightforward. Planck was confident enough to introduce it like this because he had been working on the question for over a year. In this paper we reconstruct the process that began with the first two constants (c' and C) introduced by Wien in 1896, continued with the constants a and b obtained by Planck in 1899 and was finally concluded with the constants h and k used by Planck in 1900. The questions that we shall try to answer are as follows. (1) What is the relationship between these three pairs of constants? (2) Why, at a certain point in his intellectual development, did Planck decide to introduce new constants with new names and what new meaning did these constants have? (3) How far and in what way did Planck's considerations on the constants influence the formulation of his famous law? An historical analysis of this type shows that, despite the simple numerical relationship between the three pairs of constants, the conceptual differences between them were so profound as to require different names even though the value in the case of one constant was the same. We also show how his analysis of the constants pointed Planck in the direction of 'Boltzmann's trend of ideas', allowing him to solve the black-body problem and, at the same time, to arrive at a general definition of entropy. C1 Univ Genoa, Dept Phys, I-16146 Genoa, Italy. Univ Genoa, Dept Philosophy, I-16126 Genoa, Italy. RP Robotti, N, Univ Genoa, Dept Phys, Via Dodecaneso 33, I-16146 Genoa, Italy. 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Sci. PD APR PY 2001 VL 58 IS 2 BP 137 EP 162 PG 26 SC History & Philosophy Of Science; History & Philosophy Of Science; History & Philosophy of Science GA 431TB UT ISI:000168645700002 ER PT J AU van Duijvenbode, RC van der Zeeuw, EA Koper, GJM TI High precision scanning angle ellipsometry SO REVIEW OF SCIENTIFIC INSTRUMENTS LA English DT Article ID POLY(PROPYLENE IMINE) DENDRIMERS; ADSORPTION; GLASS AB A home-built computer-controlled scanning angle ellipsometer setup is presented, together with a detailed method to derive the ellipsometric parameters psi and Delta by applying null ellipsometry. The high positioning accuracy obtained with the stepper motors and the long path length make it possible to assess various alignment methods. Some of the methods proposed in the literature do not give enough accuracy to apply high precision measurements. As a reflectometer, levels of reflection amplitudes as low as 10(-4.5) can be determined. In ellipsometry, null intensity is located using a simplex algorithm including corrections for angular beam deviations caused by component imperfections. With the presented method maximum accuracy is only achieved with four-zone averaging measurements, with the compensator fast axis fixed at 45 degrees. The four polarizer and compensator combinations in the different zones lead to variations in Delta up to 20 degrees for incidence angles close to the Brewster angle. With a first-order analysis of component imperfection effects on the ellipsometric parameters, it is shown that these large deviations are related to window birefringence, that contributes to the phase difference with a cot 2 psi dependency. Because in a four-zone average the window imperfections do not contribute significantly, values for the zone averaged values < psi > and < Delta > are accurate within 0.01 degrees and 0.1 degrees, respectively. (C) 2001 American Institute of Physics. C1 Leiden Univ, Leiden Inst Chem, Gorlaeus Labs, NL-2300 RA Leiden, Netherlands. Delft Univ Technol, Chem Phys Lab, NL-2628 BL Delft, Netherlands. RP van Duijvenbode, RC, Leiden Univ, Leiden Inst Chem, Gorlaeus Labs, POB 9502, NL-2300 RA Leiden, Netherlands. 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PD MAY PY 2001 VL 72 IS 5 BP 2407 EP 2414 PG 8 SC Physics, Applied; Instruments & Instrumentation GA 424VH UT ISI:000168254300029 ER PT J AU de Picciotto, R Stormer, HL Pfeiffer, LN Baldwin, KW West, KW TI Four-terminal resistance of a ballistic quantum wire SO NATURE LA English DT Article ID DIMENSIONAL ELECTRON-GAS; QUANTIZED CONDUCTANCE; POINT CONTACTS; CLEAVED EDGE; OVERGROWTH; TRANSPORT AB The electrical resistance of a conductor is intimately related to the relaxation of the momentum of charge carriers. In a simple model, the accelerating force exerted on electrons by an applied electric field is balanced by a frictional force arising from their frequent collisions with obstacles such as impurities, grain boundaries or other deviations from a perfect crystalline order(1). Thus, in the absence of any scattering, the electrical resistance should vanish altogether. Here, we observe such vanishing four-terminal resistance in a single-mode ballistic quantum wire. This result contrasts the value of the standard two-probe resistance measurements of h/2e(2) approximate to 13 k Omega. The measurements are conducted in the highly controlled geometry afforded by epitaxial growth onto the cleaved edge of a high-quality GaAs/AlGaAs heterostructure. Two weakly invasive voltage probes are attached to the central section of a ballistic quantum wire to measure the inherent resistance of this clean one-dimensional conductor. C1 Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA. NYU, Dept Phys, New York, NY 10003 USA. NYU, Dept Appl Phys, New York, NY 10003 USA. RP de Picciotto, R, Bell Labs, Lucent Technol, 600 Mt Ave, Murray Hill, NJ 07974 USA. 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The unified model is valid for arbitrary magnitude of the mean free path and arbitrary shape of the conduction band edge profile. Universal formulas are obtained for the current-voltage characteristic in the nondegenerate case and for the zero-bias conductance in the degenerate case, which describe in a transparent manner the interplay of ballistic and diffusive transport. The semiclassical approach is adopted, but quantum corrections allowing for tunnelling are included. Examples are considered, in particular the case of chains of grains in polycrystalline or microcrystalline semiconductors with grain size comparable to, or smaller than, the mean free path. Substantial deviations of the results of the unified model from those of the ballistic thermionic-emission model and of the drift-diffusion model are found. The formulation of the model is one-dimensional, but it is argued that its results should not differ substantially from those of a fully three-dimensional treatment. C1 Hehn Meitner Inst Berlin, Theoret Phys Abt, D-14109 Berlin, Germany. RP Lipperheide, R, Hehn Meitner Inst Berlin, Theoret Phys Abt, Glienicker Str 100, D-14109 Berlin, Germany. 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Rev. PD APR PY 2001 VL 101 IS 4 BP 893 EP 951 PG 59 SC Chemistry, Multidisciplinary GA 424YC UT ISI:000168260700003 ER PT J AU Mukhopadhyay, A Law, BM TI Casimir force in a critical film formed from an electrolytic solution SO PHYSICAL REVIEW E LA English DT Article ID BINARY-LIQUID MIXTURES; CRITICAL ADSORPTION; LIFSHITZ THEORY; WETTING LAYERS; SURFACE; AMPLITUDES AB We have studied the thickness of vapor adsorbed films of the critical binary liquid mixture acetic acid plus nonane adsorbed onto a silicon wafer substrate as a function of temperature near the critical temperature. This critical him possesses opposite boundary conditions (+ -) at its two surfaces and, due to the dissociation of acetic acid, both the electrostatic force and the dispersion force affect the adsorbed film thickness. On approaching the critical temperature T-c, an increase in the film thickness L is observed, implying that the sign of the universal Casimir amplitude Delta (+-) is positive, consistent with theoretical predictions. However, we find quantitative discrepancies in the value of Delta (+-) and the form of the critical Casimir pressure scaling function theta (+-) compared with previous experimental results. We attribute these discrepancies to the complex nature of the critical system studied in this experiment. C1 Kansas State Univ, Dept Phys, Condensed Matter Lab, Manhattan, KS 66506 USA. RP Mukhopadhyay, A, Kansas State Univ, Dept Phys, Condensed Matter Lab, Cardwell Hall, Manhattan, KS 66506 USA. 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Rev. E PD APR PY 2001 VL 6304 IS 4 PN Part 1 AR 041605 DI ARTN 041605 PG 7 SC Physics, Fluids & Plasmas; Physics, Mathematical GA 424CQ UT ISI:000168214900050 ER PT J AU Singh, AV Kumar, M Mehra, RM TI Study of ZnO : Al thin films prepared by ArF excimer laser ablation SO INDIAN JOURNAL OF ENGINEERING AND MATERIALS SCIENCES LA English DT Article ID ZINC-OXIDE FILMS; CHEMICAL-VAPOR-DEPOSITION; OPTICAL-PROPERTIES; SPRAY-PYROLYSIS; TEMPERATURE; ITO AB Thin films of aluminum doped zinc oxide (ZnO:Al) have been deposited on quartz/corning glass substrate by pulsed laser deposition technique using ArF excimer laser (lambda =193 nm) at room temperature. To grow the films, a repetition rate of 10 Hz, an energy density of 2-3 J/cm(2) and an irradiation time of 10-60 min (6000-36000 shots) were maintained. The electrical and optical properties were found to depend on irradiation time. It was observed that thickness and optical transmittance of the ZnO:Al increased and band gap decreased with the increase of number of laser shots. X-ray diffraction analysis showed that the crystallinity and grain size of the film improved with increase in number of laser shots. The films are found to be strongly c-axis oriented polycrystalline having a resistivity of 1.21x10(-3) Ohm -Cm for as grown films and a transmittance of 90-95% in the visible region. In these pulsed laser deposited films, transmittance is found to be better than those obtained by other deposition techniques such as RF and DC Magnetron sputtering, chemical vapour deposition, sol gel and spray pyrolysis. C1 Univ Delhi, Dept Elect Sci, New Delhi 110021, India. RP Singh, AV, Univ Delhi, Dept Elect Sci, South Campus, New Delhi 110021, India. 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Eng. Mat. Sci. PD OCT-DEC PY 2000 VL 7 IS 5-6 BP 259 EP 263 PG 5 SC Engineering, Multidisciplinary; Materials Science, Multidisciplinary GA 422ZK UT ISI:000168149300007 ER PT J AU le Noble, WJ Asano, T TI Comment on "Phantom activation volumes" SO JOURNAL OF PHYSICAL CHEMISTRY A LA English DT Article ID THERMAL Z/E ISOMERIZATION; DIELS-ALDER REACTION; N-BENZYLIDENEANILINES; SOLVENT FLUCTUATIONS; PRESSURE; ACCELERATION C1 SUNY Stony Brook, Dept Chem, Stony Brook, NY 11794 USA. Oita Univ, Fac Engn, Dept Appl Chem, Oita 8701192, Japan. RP le Noble, WJ, SUNY Stony Brook, Dept Chem, Stony Brook, NY 11794 USA. CR ASANO T, 1973, REV PHYS CHEM JPN, V43, P82 ASANO T, 1978, CHEM REV, V78, P407 ASANO T, 1996, B CHEM SOC JPN, V69, P551 ASANO T, 1997, B CHEM SOC JPN, V70, P239 BRUN C, 1972, TETRAHEDRON, V28, P3113 DACK MRJ, 1975, CHEM SOC REV, V4, P211 DIEDRICH MK, 1998, J AM CHEM SOC, V120, P6212 DRLJACA A, 1998, CHEM REV, V98, P2167 DRUDE P, 1894, Z PHYS CHEM, V15, P79 EYRING H, 1935, J CHEM PHYS, V3, P107 EYRING H, 1975, PHYSICAL CHEM ADV TR, V7 FIRESTONE RA, 1981, J ORG CHEM, V46, P2160 FIRESTONE RA, 1989, CHEM BER, V122, P1089 FLEISCHMANN FK, 1973, TETRAHEDRON LETT, P3773 GONIKBERG MG, 1949, ZH FIZ KHIM, V23, P1447 GRIEGER RA, 1970, J AM CHEM SOC, V92, P2918 HAMANN SD, 1958, T FARADAY SOC, V54, P507 HAMANN SD, 1974, MOD ASPECT ELECTROC, V9, P47 KIM JC, 1999, CHEM LETT, P3401 KIM JC, 2000, B CHEM SOC JPN, V74, P103 LENOBLE WJ, 1967, PROGR PHYS ORG CHEM, V5, P207 NICHOLSON AE, 1956, DISCUSS FARADAY SOC, V22, P97 OHGA Y, 1999, Z NATURFORSCH A, V54, P417 RONTGEN WC, 1892, ANN PHYS, V45, P98 ROTHMUND VZ, 1896, PHYS CHEM, V20, P168 SCHROEDER J, 1991, BER BUNSEN PHYS CHEM, V95, P233 SHUTO A, 2000, Z NATURFORSCH A, V55, P616 STEARN AE, 1941, CHEM REV, V29, P509 STEWART CA, 1972, J AM CHEM SOC, V94, P636 SWISS KA, 1999, J PHYS CHEM A, V103, P5369 SWISS KA, 2000, J PHYS CHEM A, V104, P3057 VANELDIK R, 1989, CHEM REV, V89, P549 WALLING C, 1959, J AM CHEM SOC, V81, P5365 NR 33 TC 9 PU AMER CHEMICAL SOC PI WASHINGTON PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA SN 1089-5639 J9 J PHYS CHEM A JI J. Phys. Chem. A PD APR 5 PY 2001 VL 105 IS 13 BP 3428 EP 3429 PG 2 SC Chemistry, Physical GA 419AV UT ISI:000167927900061 ER PT J AU Bertrand, E Bonn, D Meunier, J Segal, D TI Wetting of alkanes on water SO PHYSICAL REVIEW LETTERS LA English DT Article C1 Ecole Normale Super, Phys Stat Lab, F-75231 Paris 05, France. Univ Hull, Dept Chem, Hull HU6 7RX, N Humberside, England. RP Bertrand, E, Ecole Normale Super, Phys Stat Lab, 24 Rue Lhomond, F-75231 Paris 05, France. CR BERTRAND E, 2000, PHYS REV LETT, V85, P1282 DRUDE P, 1959, THEORY OPTICS PFOHL T, 1999, PHYS REV LETT, V82, P783 RAGIL K, 1996, PHYS REV LETT, V77, P1532 SHAHIDZADEH N, 1998, PHYS REV LETT, V80, P3992 NR 5 TC 1 PU AMERICAN PHYSICAL SOC PI COLLEGE PK PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA SN 0031-9007 J9 PHYS REV LETT JI Phys. Rev. Lett. PD APR 2 PY 2001 VL 86 IS 14 BP 3208 EP 3208 PG 1 SC Physics, Multidisciplinary GA 417ZX UT ISI:000167866300077 ER PT J AU Galuza, AI Beznosov, AB TI Optical functions of the Drude model: transformation of the spectra over wide ranges of parameters SO LOW TEMPERATURE PHYSICS LA English DT Article ID CU-O; MAGNETORESISTANCE; MANGANITES; TRANSITION; ENERGY; FILMS; GAP AB The spectral features of the optical functions of the Drude model are investigated over wide ranges of parameters - the plasma frequency omega (p) of the current carriers, their transport relaxation frequency g, and the dielectric constant epsilon (infinity) due to high-energy electronic transitions in the system. The conditions are determined for: a) the square-root frequency dependence of the modulus and phase of the reflection; b) linearity of the phase theta =2 omega/omega (p)root epsilon (infinity)theta (0); c) the existence of a plasma reflection edge. Approximate relations are obtained which permit simplifying the analysis of optical reflection and electron characteristic energy loss data both in "good" metals and in materials with a strong temperature dependence of the electrical conductivity (semiconductors, doped and nonstoichiometric oxides, granular metal films, and amorphous alloys). The parameters of the systems of conduction electrons in Al and U2Zn17 are determined. (C) 2001 American Institute of Physics. C1 Natl Acad Sci Ukraine, B Verkin Inst Low Temp Phys & Engn, UA-61164 Kharkov, Ukraine. RP Galuza, AI, Natl Acad Sci Ukraine, B Verkin Inst Low Temp Phys & Engn, Pr Lenina 47, UA-61164 Kharkov, Ukraine. 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Phys. PD MAR PY 2001 VL 27 IS 3 BP 216 EP 227 PG 12 SC Physics, Applied GA 412ER UT ISI:000167542500005 ER PT J AU Hemakanthi, G Dhathathreyan, A Ramasami, T Mobius, D TI Formation of nickelhydroxy sulfide precursor and nickel sulfide in Langmuir and Langmuir-Blodgett films of a nickel complex of octadecylsuccinic acid SO THIN SOLID FILMS LA English DT Article DE nickel bonding; Langmuir-Blodgett films; nanoparticles; nickel hydroxy sulfide; nickel sulfide ID AIR-WATER-INTERFACE; MONOLAYERS; PARTICLES; SILICA; MULTILAYERS; MICROSCOPY; SUPPORT; STATE AB The influence of parameters on size of NiS particles formed at ambient temperatures by reacting Na2S with the nickel salt of octadecylsuccinic acid (ODSA) at the air/water interface and in Langmuir-Blodgett films was investigated by changes in surface pressure-molecular area (pi -A) and surface potential-molecular area (DeltaV-A) isotherms. The contraction in area of ODSA on Ni2+ subphase is indicative of a strong interaction of the dibasic acid with Ni2+ leading to a monodentate complex of Ni2+ with ODSA. The Langmuir monolayers of the nickel complex of ODSA were analysed using Brewster angle microscopy (BAM). In the absence of nickel in the subphase, ODSA exhibited no domains in BAM. The sulfidation reaction on ODSA/Ni2+ complex at the air/water interface shows two steps as seen in the surface potential vs. time plot corresponding to formation of Ni(OH)S initially which then changes to NiS. The domain size seen with NiS formation increased with time and surface pressure indicating the growth of a two-dimensional solid complex in the monolayer at the air/water interface. The Langmuir-Blodgett (LB) films of ODSA/Ni2+ on sulfidation transferred onto solid substrates from the two steps in the reaction were characterized using diffuse reflectance UV-visible spectroscopy (DIR-UV-vis) and X-ray photoemission spectroscopy. These experiments confirmed the reduction process involved in the above reaction. Atomic force microscopy experiments on these LB films indicated that there is a variation in the structural organization in the monolayers and in the morphology of the LB film, depending on the initial Ni(OH)S formation which ultimately leads to NiS. The results show that the average particle size which varies between 2 and 3.5 nm depends on the nature of the nickel complexes formed at the air/water interface. (C) 2001 Elsevier Science B.V. All rights reserved. C1 Cent Leather Res Inst, Chem Lab, Adyar 600020, Chennai, India. Max Planck Inst Biophys Chem, Dept Mol Organised Syst, D-37077 Gottingen, Germany. RP Dhathathreyan, A, Cent Leather Res Inst, Chem Lab, Adyar 600020, Chennai, India. 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There is now substantial agreement between theory and experiment. In this paper we review recent experimental progress, provide a conceptual framework within which the majority of these experiments can now be understood, and discuss critically any remaining unresolved discrepancies between experiments or with theory. (C) 2001 Elsevier Science Ltd. All rights reserved. C1 Kansas State Univ, Dept Phys, Condensed Matter Lab, Manhattan, KS 66506 USA. RP Law, BM, Kansas State Univ, Dept Phys, Condensed Matter Lab, Manhattan, KS 66506 USA. 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THEORY STABILITY LYO WANG J, 1999, PHYS REV LETT, V83, P564 WANG JY, IN PRESS PHYS REV E WANG JY, 1999, PHYS REV LETT, V83, P3677 WIDOM B, 1972, PHASE TRANSITIONS CR, V2 WIDOM B, 1985, CHEM SOC REV, V14, P121 WIDOM B, 1996, J PHYS CHEM-US, V100, P13190 ZHAO H, 1995, PHYS REV LETT, V75, P1977 NR 225 TC 31 PU PERGAMON-ELSEVIER SCIENCE LTD PI OXFORD PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND SN 0079-6816 J9 PROG SURF SCI JI Prog. Surf. Sci. PD MAR-APR PY 2001 VL 66 IS 6-8 BP 159 EP 216 PG 58 SC Chemistry, Physical; Physics, Condensed Matter GA 411BN UT ISI:000167478400002 ER PT J AU Zhang, DH Yang, TL Wang, QP Zhang, DJ TI Electrical and optical properties of Al-doped transparent conducting ZnO films deposited on organic substrate by RF sputtering SO MATERIALS CHEMISTRY AND PHYSICS LA English DT Article DE Al-doped ZnO films; RF sputtering; Hall mobility; electrical property; optical property ID OXIDE THIN-FILMS AB This paper presents the structural, electrical and optical properties of transparent conducting At-doped ZnO films prepared on organic substrate by RF sputtering. Polycrystalline ZnO:Al films with good adherence to the substrate having a (0 0 2) preferred orientation have been obtained with resistivities in the range from 4.1 x 10(-3) to 5.3 x 10(-4) Ohm cm, with carrier densities more than 2.6 x 10(20) cm(-3) and Hall mobilities between 5.78 and 13.11 cm(2) V-1 s(-1) for films deposited on polyisocyanate (PI) substrate. The average transmittance reaches 82% for film deposited on polypropylene adipate (PPA) substrate in the visible spectrum. The scattering mechanisms of electronic carriers in these films are discussed based on temperature dependence of the mobility measured over a temperature range 30-300 K. (C) 2001 Elsevier Science B.V. All rights reserved. C1 Shandong Univ, Dept Phys, Shandong 250100, Peoples R China. Inst Zibo, Shandong 255091, Peoples R China. RP Zhang, DH, Shandong Univ, Dept Phys, Shandong 250100, Peoples R China. CR CHIOU BS, 1993, THIN SOLID FILMS, V229, P146 CULLITY B, 1959, ELEMENTS XRAY DIFFRA, P99 DRUDE P, 2000, Z PHYS, V1, P161 HAACKE G, 1976, J APPL PHYS, V47, P4086 KARASAWA T, 1993, THIN SOLID FILMS, V223, P135 LAN WS, 1987, J ELECT MAT, V141, P16 MA HL, 1995, THIN SOLID FILMS, V263, P105 MA HL, 1996, SOL ENERG MAT SOL C, V40, P371 MANSINGH A, 1988, THIN SOLID FILMS, V167, L11 MINAMI T, 1985, JPN J APPL PHYS, V24, L605 MUKHERJEE A, 1989, VACUUM, V39, P537 ROTH AP, 1981, SOLID STATE COMMUN, V39, P1269 SEMELIUS BE, 1988, PHYS REV B, V37, P10244 SHANTHI E, 1982, J APPL PHYS, V53, P1615 YANG TL, 1998, THIN SOLID FILMS, V326, P60 ZHANG DH, 1992, THIN SOLID FILMS, V213, P109 ZHANG DH, 1996, APPL PHYS A-MATER, V62, P487 NR 17 TC 5 PU ELSEVIER SCIENCE SA PI LAUSANNE PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND SN 0254-0584 J9 MATER CHEM PHYS JI Mater. Chem. Phys. PD FEB 15 PY 2001 VL 68 IS 1-3 BP 233 EP 238 PG 6 SC Materials Science, Multidisciplinary GA 397GM UT ISI:000166685000034 ER PT J AU Ross, D Bonn, D Meunier, J TI Wetting of methanol on the n-alkanes: Observation of short-range critical wetting SO JOURNAL OF CHEMICAL PHYSICS LA English DT Article ID MEAN-FIELD-THEORY; BINARY-LIQUID MIXTURES; CUBIC ISING-MODEL; CRITICAL-BEHAVIOR; 3 DIMENSIONS; INTERFACIAL STIFFNESS; CYCLOHEXANE-METHANOL; AMPLITUDE RATIOS; CRITICAL-POINT; TRANSITIONS AB We present results of the wetting properties of methanol at the liquid-vapor interface of different n-alkanes ranging from hexane to undecane. Measurement of the contact angle shows that, as the bulk critical point is approached, wetting transitions occur for long alkanes, whereas drying is found for short alkanes. Measurement of the wetting layer thickness, as well as precise contact angle measurements close to the wetting temperature T-w, reveal a change in the order of the transition. First order (discontinuous) wetting occurs for T-w far from the bulk critical point T-c. Critical (continuous) wetting is observed for T-w close to T-c. The observed critical wetting transition has all the features of the long-sought short-range critical wetting transition. We argue that it is possible to observe short-range critical wetting in this system, because the long-range van der Waals interactions are negligible for wetting transitions close to the bulk critical point. (C) 2001 American Institute of Physics. C1 Ecole Normale Super, Phys Stat Lab, F-75231 Paris 05, France. Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA. RP Ross, D, Ecole Normale Super, Phys Stat Lab, 24 Rue Lhomond, F-75231 Paris 05, France. 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Chem. Phys. PD FEB 8 PY 2001 VL 114 IS 6 BP 2784 EP 2792 PG 9 SC Physics, Atomic, Molecular & Chemical GA 397AQ UT ISI:000166671100029 ER PT J AU Borensztein, Y TI Linear optical spectroscopies for surface studies SO SURFACE REVIEW AND LETTERS LA English DT Article ID POLARIZATION-DEPENDENT REFLECTIVITY; REFLECTANCE-ANISOTROPY-SPECTROSCOPY; SINGLE-CRYSTALS; DIFFERENTIAL REFLECTIVITY; SUBSTRATE; ADSORPTION; SYSTEMS; FILMS; GAP; AG C1 Univ Paris 06, UMR CNRS 7601, Lab Opt Solides, F-75252 Paris 05, France. RP Borensztein, Y, Univ Paris 06, UMR CNRS 7601, Lab Opt Solides, 4 Pl Jussieu,Case 80, F-75252 Paris 05, France. 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Rev. Lett. PD AUG PY 2000 VL 7 IS 4 BP 399 EP 410 PG 12 SC Materials Science, Multidisciplinary; Physics, Atomic, Molecular & Chemical; Physics, Condensed Matter GA 395MG UT ISI:000166583700004 ER PT J AU Genchev, ZD Stoyanov, HY TI Metallic rough surface retrieval from the specular intensity of scattered optical waves SO CANADIAN JOURNAL OF PHYSICS LA English DT Article AB We present a solution to the direct determination of the statistical parameters (root mean square deviation and correlation length), characterizing the profile of a random rough metallic surface with small slopes and heights, thus producing single scattering as well as a slight multiple scattering. This is done from the specular, coherent, component of the mean intensity of the optical waves scattered from the surface. In the frame of second-order perturbation theory, analytical expressions are derived for the specular component of the scattered radiation, and a retrieval of the rough surface parameters from the measured optical intensity is described. C1 Bulgarian Acad Sci, Inst Elect, BU-1784 Sofia, Bulgaria. Univ Sofia, Fac Phys, BU-1126 Sofia, Bulgaria. RP Genchev, ZD, Bulgarian Acad Sci, Inst Elect, BU-1784 Sofia, Bulgaria. CR AGARWAL GS, 1975, OPT COMMUN, V14, P161 AGARWAL GS, 1976, PHYS REV B, V14, P846 DOBBERSTEIN P, 1970, PHYS LETT A, V31, P307 DRUDE P, 1922, THEORY OPTICS GARCIA N, 1993, PHYS REV LETT, V71, P3645 GENCHEV ZD, 1984, IZV VUZ RADIOFIZ+, V27, P48 GENCHEV ZD, 1992, WAVE RANDOM MEDIA, V2, P99 GENCHEV ZD, 1993, SUPERCOND SCI TECH, V6, P532 HILL NR, 1981, PHYS REV B, V24, P7112 MARADUDIN AA, 1975, PHYS REV B, V11, P1392 MARX E, 1990, APPL OPTICS, V29, P3613 NIETOVESPERINAS M, 1982, J OPT SOC AM, V72, P539 WINNEBRENNER D, 1985, RADIO SCI, V20, P161 YOLKEN HT, 1965, J OPT SOC AM, V55, P842 NR 14 TC 0 PU NATL RESEARCH COUNCIL CANADA PI OTTAWA PA RESEARCH JOURNALS, MONTREAL RD, OTTAWA, ONTARIO K1A 0R6, CANADA SN 0008-4204 J9 CAN J PHYS JI Can. J. Phys. PD NOV PY 2000 VL 78 IS 11 BP 1023 EP 1033 PG 11 SC Physics, Multidisciplinary GA 395UB UT ISI:000166598700008 ER PT J AU Tompkins, HG Smith, S Convey, D TI Optimizing the ellipsometric analysis of a transparent layer on glass SO SURFACE AND INTERFACE ANALYSIS LA English DT Article DE ellipsometry; glass; oxynitride AB In this work we show how to choose optimum analysis conditions to analyze a transparent film on a transparent substrate where the index of refraction for the film is not very different from that of the substrate. We show that there are three 'zones' from which to choose the angle of incidence and that one should choose one angle in each zone. We discuss theoretically the basis of these three zones and how to determine the boundaries. Oxynitride on glass and polymer on glass are used as examples and the data and analysis are shown. Copyright (C) 2000 John Wiley & Sons, Ltd. C1 Motorola Labs, Phys Sci Res Lab, Tempe, AZ 85284 USA. RP Tompkins, HG, Motorola Labs, Phys Sci Res Lab, Tempe, AZ 85284 USA. CR ASPNES DE, 1974, J OPT SOC AM, V64, P639 DRUDE P, 1889, ANN PHYS CHEM, V36, P865 JELLISON GE, 1991, APPL OPTICS, V30, P4310 TOMPKINS HG, 1993, USERS GUIDE ELLIPSOM TOMPKINS HG, 1999, SPECTROSCOPIC ELLIPS NR 5 TC 4 PU JOHN WILEY & SONS LTD PI W SUSSEX PA BAFFINS LANE CHICHESTER, W SUSSEX PO19 1UD, ENGLAND SN 0142-2421 J9 SURF INTERFACE ANAL JI Surf. Interface Anal. PD DEC PY 2000 VL 29 IS 12 BP 845 EP 850 PG 6 SC Chemistry, Physical GA 391EG UT ISI:000166340700006 ER PT J AU Gadomskii, ON TI Two electron problem and the nonlocal equations of electrodynamics SO USPEKHI FIZICHESKIKH NAUK LA Russian DT Review ID INTEGRAL-EQUATIONS; EXTINCTION THEOREM; NONLINEAR OPTICS; REFLECTION; SURFACE; MICROSCOPY; ENERGY; CAVITY; SHIFTS; LIGHT AB A survey is offered of the current knowledge of nonlocal electrodynamic equations which in some cases (e.g., in solving various boundary problems in optics) can replace Maxwell's equations. The nonlocal equations are derived using a semi-classical or a quantum-mechanical approach. The former approach involves an expansion of retarded potentials in appropriate parameters followed by a transition, to terms of order v(2)/c(2), to quantum mechanical operators in the Lagrangian of the system of moving charges. The quantum electrodynamics approach is to consider second- and third-order quantum electrodynamic effects for two hydrogen-like atoms arbitrarily far apart. Various nonlocal equations are derived for the propagation of photons and electromagnetic waves in spin systems, insulators, and metals, taking into account a variety of quantum transitions and intermediate states in the spectrum of the interacting atoms. By combining nonlocal field equations with relevant constitutive equations, a number of typical boundary value problems of optics are solved for semi-infinite media, superthin films, and for objects of dimension very small compared with a light wavelength. C1 Ulyanovsk State Univ, Ulyanovsk 432700, Russia. RP Gadomskii, ON, Ulyanovsk State Univ, Ul L Tolstogo 42, Ulyanovsk 432700, Russia. CR AKHIEZER AI, 1959, KVANTOVAYA ELEKTRODI ALLEN L, 1978, OPTICHESKII REZONANS ASHINO M, 1998, APPL PHYS LETT, V72, P1299 BACHELOT R, 1997, APPL OPTICS, V36, P2160 BARCHIESI D, 1996, PHYS REV E B, V54, P4285 BARUT AO, 1987, PHYS REV A, V36, P2550 BELOV AA, 1989, J PHYS B ATOM MOL PH, V22, L101 BENEDICT MG, 1991, PHYS REV A, V43, P3845 BETHE H, 1932, Z PHYS, V77, P296 BORN M, 1958, DINAMICHESKAYA TEORI BORN M, 1973, OSNOVY OPTIKI, P106 BOWDEN CM, 1993, PHYS REV A, V47, P1247 BOWDEN CM, 1994, PHYS REV A, V49, P1514 BREIT G, 1929, PHYS REV, V34, P553 CHANG CS, 1971, PHYS REV, V4, P630 CHEN H, 1987, J CHEM PHYS, V87, P1355 COOK RJ, 1987, PHYS REV A, V35, P5081 DARWIN CG, 1924, T CAMB PHILOS SOC, V23, P137 DAVYDOV AS, 1963, KVANTOVAYA MEKHANIKA DRAKE GWF, 1972, PHYS REV A, V5, P1979 DRUDE II, 1935, OPTIKA DRUDE P, 1994, ANN PHYS CHEM, V51, P77 FEDYUSHIN BK, 1952, ZH EKSP TEOR FIZ, V22, P140 GADOMSKII ON, 1973, ZH EKSP TEOR FIZ, V63, P813 GADOMSKII ON, 1976, ZH EKSP TEOR FIZ, V70, P435 GADOMSKII ON, 1990, OPTICHESKAYA EKHOSPE GADOMSKII ON, 1994, ZH EKSP TEOR FIZ, V106, P936 GADOMSKII ON, 1998, KVANTOVAYA ELEKTRON, V25, P529 GADOMSKII ON, 1998, ZH EKSP TEOR FIZ, V114, P1555 GADOMSKII ON, 1999, OPT SPEKTROSK, V87, P1017 GADOMSKII ON, 1999, PISMA ESKP TEOR FIZ, V69, P750 GADOMSKII ON, 1999, ZH PRIKL SPEKTROSK, V66, P765 GADOMSKII ON, 2000, OPT SPEKTROSK, V89, P287 GADOMSKII ON, 2001, IN PRESS OPT SPEKTR, V90 GADOMSKY ON, 1996, J OPT SOC AM B, V13, P1679 GADOMSKY ON, 1997, QUANTUM SEMICL OPT, V9, P343 GADOMSKY ON, 1998, IZV AKAD NAUK FIZ+, V62, P293 GHINER AV, 1994, PHYS REV A, V49, P1313 GHINER AV, 1994, PHYS REV A, V50, P714 GHINER AV, 1997, PHYS REV E B, V56, P6123 HINDS EA, 1991, PHYS REV A, V43, P398 ISIMARU A, 1981, RASPROSTRANENIE RASS JARQUE EC, 1997, J MOD OPTIC, V44, P563 KAWATA A, 1994, JPN J APPL PHYS PT 2, V33, P1725 KILIN SY, 1999, USP FIZ NAUK+, V169, P507 KITTEL C, 1962, VVEDENIE FIZIKU TVER, P189 KIZEL VA, 1955, ZH EKSP TEOR FIZ, V29, P659 KIZEL VA, 1973, OTRAZHENIE SVETA KRUTITSKII KV, 2000, OPT SPEKTR KRUTITSKY KV, 1997, J PHYS B-AT MOL OPT, V30, P5341 LANDAU LD, 1935, PHYS Z SOWJETUNION, V8, P487 LANDAU LD, 1960, TEORIYA POLYA LANDAU LD, 1963, KVANTOVAYA MEKHANIKA LIFSHITZ EM, 1948, ZH EKSP TEOR FIZ, V18, P562 LUMMER O, 1910, ANN PHYS-BERLIN, V31, P325 MALYSHEV V, 1996, PHYS REV A, V53, P416 MALYSHEV V, 1997, J OPT SOC AM B, V14, P1167 MALYSHEV VA, 1997, OPT SPEKTROSK, V82, P630 NORDLANDER P, 1990, PHYS REV B, V42, P5564 PARKINS AS, 1989, PHYS REV A, V40, P3796 POHL DW, 1993, NATO ASI SERIES E, V242 RAMAN CV, 1925, P ROY SOC LONDON, V109, P272 RAMAN CV, 1927, PHILOS MAG, V3, P220 RAYLEIGH L, 1892, PHILOS MAG, V33, P1 RAYLEIGH R, 1908, PHILOS MAG, V16, P444 ROZENBERG GV, 1958, OPTIKA TONKOSLOINYKH SCHMIDT KEF, 1894, ANN PHYS-LEIPZIG, V52, P75 SIVUKHIN DV, 1948, ZH EKSP TEOR FIZ, V18, P976 SIVUKHIN DV, 1951, ZH EKSP TEOR FIZ, V21, P367 SIVUKHIN DV, 1956, ZH EKSP TEOR FIZ, V30, P376 VALIEV KA, 1999, USP FIZ NAUK+, V169, P691 XIAO MF, 1997, J OPT SOC AM A, V14, P2977 ZAYATS AV, 1999, OPT COMMUN, V161, P156 NR 73 TC 15 PU MEZHDUNARODNAYA KNIGA PI MOSCOW PA 39 DIMITROVA UL., 113095 MOSCOW, RUSSIA SN 0042-1294 J9 USP FIZ NAUK JI Uspekhi Fiz. Nauk PD NOV PY 2000 VL 170 IS 11 BP 1145 EP 1179 PG 35 SC Physics, Multidisciplinary GA 390UH UT ISI:000166314900001 ER PT J AU Adamson, PV TI The influence of a multilayer system of inhomogeneous ultrathin films on reflection of light from dielectric materials SO OPTICS AND SPECTROSCOPY LA English DT Article AB The influence of surface layers on reflection of light in the absence of absorption is studied. The contribution of an ultrathin N-layer film system to the light reflection coefficient is calculated by the small-parameter method within the framework of electrodynamics of continua. The angular dependence of the reflectivity in s- and p-polarization is analyzed, new possibilities for photometric diagnostics of ultrathin layers are demonstrated, and the extension of approximate Drude formulas to the multilayer case is presented. (C) 2000 MAIK "Nauka/Interperiodica". C1 Univ Tartu, Inst Phys, EE-51014 Tartu, Estonia. RP Adamson, PV, Univ Tartu, Inst Phys, EE-51014 Tartu, Estonia. CR ABELES FA, 1950, ANN PHYS-PARIS, V5, P596 ADAMSON PV, 1999, OPT SPECTROSC+, V86, P408 DRUDE P, 1912, LEHRBUCH OPTIK KIZEL VA, 1973, REFLECTION LIGHT KUZMIN VL, 1992, OPT SPEKTROSK, V73, P3 LEKNER J, 1987, THEORY REFLECTION EL SIVUKHIN DV, 1943, ZH EKSP TEOR FIZ, V13, P361 TYRAS G, 1969, RAD PROPAGATION ELEC NR 8 TC 1 PU OPTICAL SOC AMER PI WASHINGTON PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA SN 0030-400X J9 OPT SPECTROSC JI Opt. Spectrosc. PD OCT PY 2000 VL 89 IS 4 BP 624 EP 630 PG 7 SC Optics; Spectroscopy GA 376UC UT ISI:000165474300023 ER PT J AU Mukhopadhyay, A Law, BM TI Casimir effect in critical films of binary liquid mixtures SO PHYSICAL REVIEW E LA English DT Article ID FLUCTUATION-INDUCED FORCES; THIN ISING FILMS; CRITICAL ADSORPTION; LIFSHITZ THEORY; WETTING LAYERS; COMPETING WALLS; MONTE-CARLO; SURFACE; AMPLITUDES; POINT AB We present experimental evidence for the Casimir effect within critical films of binary liquid mixtures possessing opposite boundary conditions (+ -) by studying the thickness of these vapor-adsorbed films on a silicon wafer as a function of temperature near the critical temperature. Our results fur two different critical mixtures demonstrate that the critical Casimir pressure scaling function theta (+ -)(y) scales with y = L/xi, where L is the equilibrium film thickness and xi is the bulk correlation length. Additionally, on approaching the critical temperature T-c an increase in the film thickness L is observed, implying that the sign of the universal Casimir amplitude Delta (+ -) = theta (+ -)(0)/2 at T-c is positive, consistent with theoretical predictions. However, the magnitude of the Casimir amplitude that we measure is approximately two orders of magnitude smaller than that given by prevailing, theories. In the two-phase region of the liquid mixture, preliminary evidence suggests that the adsorbed him undergoes a surface phase transition from a film near the critical composition at T less than or similar to T-c to a film near one of the bulk phases at T much less than T-c. This low temperature film composition most likely corresponds to the bulk phase rich in the component that preferentially adsorbs at the silicon surface. C1 Kansas State Univ, Dept Phys, Condensed Matter Lab, Manhattan, KS 66506 USA. RP Mukhopadhyay, A, Kansas State Univ, Dept Phys, Condensed Matter Lab, Cardwell Hall, Manhattan, KS 66506 USA. 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Rev. E PD OCT PY 2000 VL 62 IS 4 PN Part B BP 5201 EP 5215 PG 15 SC Physics, Fluids & Plasmas; Physics, Mathematical GA 365YA UT ISI:000089977000004 ER PT J AU van der Lem, H Moroz, A TI Towards two-dimensional complete photonic bandgap structures below infrared wavelengths SO JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS LA English DT Article DE photonic bandgap materials; fibre waveguides; wave optics; nonlinear optical materials; integrated optics ID LOW-FREQUENCY PLASMONS; 2-DIMENSIONAL SYSTEMS; SPONTANEOUS EMISSION; METALLIC COMPONENTS; CRYSTALS; SCATTERING; GAPS; TRANSMISSION; BISTABILITY; EXTRACTION AB Bandgaps in two- and three-dimensional photonic crystals are hard to achieve due to the limited contrast in the dielectric permeability available with conventional dielectric materials. The situation changes for periodic arrangements of scatterers consisting of materials with a Drude-like behaviour of the dielectric function. We show for two-dimensional square and triangular lattices that such systems have in-plane complete photonic bandgaps (CPBGs) below infrared wavelengths. Of the two geometries, the optimal one for ideal Drude-like behaviour is a square lattice, whereas for Drude-like behaviour in silver, using experimental data (Palik E D 1991 Handbook of Optical Consrants of Solids vol 1 (San Diego: Academic)), the optimal geometry is a triangular lattice. If the lattice spacing is tuned to a characteristic plasma wavelength, several CPBGs open in the spectrum and their relative gap width can be as large as 36.9% (9.9% in a nonabsorptive window) even if the host dielectric constant epsilon(h) = 1. Such structures can provide CPBG structures with bandgaps down to ultraviolet wavelengths. C1 FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands. Univ Hamburg, Inst Theoret Phys, D-20355 Hamburg, Germany. RP van der Lem, H, FOM, Inst Atom & Mol Phys, Kruislaan 407, NL-1098 SJ Amsterdam, Netherlands. CR ANDERSON CM, 1996, PHYS REV LETT, V77, P2949 BARRA A, 1998, APPL PHYS LETT, V72, P627 BENNINK RS, 1999, OPT LETT, V24, P1416 BOHREN CF, 1984, ABSORPTION SCATTERIN, P12 BORODITSKY M, 1999, APPL PHYS LETT, V75, P1036 BYKOV VP, 1972, SOV PHYS JETP, V35, P269 BYKOV VP, 1975, SOV J QUANTUM ELECTR, V4, P861 CHEMLA DS, 1986, OPT LETT, V11, P522 DEALMEIDA AMO, 1975, ACTA CRYSTALLOGR A, V31, P435 DEALMEIDA AMO, 1975, ACTA CRYSTALLOGR A, V31, P442 DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 DRUDE P, 1900, ANN PHYSIK, V3, P369 FAN SH, 1997, PHYS REV LETT, V78, P3294 FAN SH, 1998, PHYS REV LETT, V80, P960 FAULKNER JS, 1988, PHYS REV B, V38, P1686 GRIER D, 1997, PHYS WORLD JUL, P24 HO KM, 1990, PHYS REV LETT, V65, P3152 HORNREICH RM, 1994, PHYS REV B, V49, P10914 JOHNSON PB, 1972, PHYS REV B, V6, P4370 JOHNSON SG, 1998, OPT LETT, V23, P1855 KNIGHT JC, 1998, SCIENCE, V282, P1476 KOHN W, 1954, PHYS REV, V94, P1111 KORRINGA J, 1947, PHYSICA, V13, P392 KRAUSS T, 1994, ELECTRON LETT, V30, P1444 KRAUSS TF, 1996, NATURE, V383, P699 KUZMIAK V, 1994, PHYS REV B, V50, P16835 KUZMIAK V, 1997, PHYS REV B, V55, P7427 LABILLOY D, 1997, PHYS REV LETT, V79, P4147 LEUNG KM, 1986, PHYS REV A, V33, P2461 LIN SY, 1998, NATURE, V394, P251 MCGURN AR, 1993, PHYS REV B, V48, P17576 MEADA T, 1999, APPL SURF SCI, V143, P174 MEKIS A, 1996, PHYS REV LETT, V77, P3787 MOROZ A, IN PRESS SYNTHETIC M MOROZ A, 1995, PHYS REV B, V51, P2068 MOROZ A, 1999, PHYS REV LETT, V83, P5274 MOROZ A, 2000, EUROPHYS LETT, V50, P466 PALIK ED, 1991, HDB OPTICAL CONSTANT, V1 PAN GS, 1997, PHYS REV LETT, V78, P3860 PENDRY JB, 1996, J PHYS-CONDENS MAT, V8, P1085 PENDRY JB, 1996, PHYS REV LETT, V76, P4773 PENDRY JB, 1998, J PHYS-CONDENS MAT, V10, P4785 PLIHAL M, 1991, OPT COMMUN, V80, P199 PLIHAL M, 1991, PHYS REV B, V44, P8565 QIU M, 1999, PHYS REV B, V60, P10610 SIEVENPIPER DF, 1996, PHYS REV LETT, V76, P2480 SIEVENPIPER DF, 1998, PHYS REV LETT, V80, P2829 TIP A, BLOCH DECOMPOSITION VILLENEUVE PR, 1996, PHYS REV B, V54, P7837 YABLONOVITCH E, 1987, PHYS REV LETT, V58, P2059 YABLONOVITCH E, 1991, PHYS REV LETT, V67, P2295 YABLONOVITCH E, 1991, PHYS REV LETT, V67, P3380 NR 52 TC 23 PU IOP PUBLISHING LTD PI BRISTOL PA DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND SN 1464-4258 J9 J OPT A-PURE APPL OPT JI J. Opt. A-Pure Appl. Opt. PD SEP PY 2000 VL 2 IS 5 BP 395 EP 399 PG 5 SC Optics GA 364TZ UT ISI:000089910200013 ER PT J AU Scott, JF Bohn, HG Schenk, W TI Ionic Wiedemann-Franz law SO APPLIED PHYSICS LETTERS LA English DT Article ID NUCLEAR-SPIN RELAXATION; CONDUCTIVITY-RELAXATION; NMR; CONDUCTORS; GLASSES AB The Wiedemann-Franz law for electron transport in metals was historically a linch pin for the free-electron theory of metals; it states that, at moderately low temperatures, the ratio of thermal conductivity K to electrical conductivity sigma is proportional to absolute temperature, with a proportionality constant called "the Lorenz number" of L = 2.45 x 10(-8) W Omega/K-2. Here we describe work on yttrium-stabilized zirconia in which we have found that a similar relationship is valid above 1350 K, where nearly all the electrical conduction and thermal conduction arise from ionic currents. (C) 2000 American Institute of Physics. [S0003-6951(00)04042-0]. C1 Univ Cambridge, Dept Earth Sci, Symetrix Ctr Ferro, Cambridge CB2 3EQ, England. KFA Julich GmbH, Forschungszentrum, Inst Festkorperforsch, D-52425 Julich, Germany. RP Scott, JF, Univ Cambridge, Dept Earth Sci, Symetrix Ctr Ferro, Cambridge CB2 3EQ, England. CR ASHCROFT NW, 1976, SOLID STATE PHYS, P23 BERMAN R, 1976, THERMAL CONDUCTION S, P125 BJORKSTAM JL, 1999, SOLID STATE IONICS, V125, P13 BORSA F, 1992, PHYS REV B, V49, P76 DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 DRUDE P, 1900, ANN PHYSIK, V3, P369 ESTALJI S, 1992, J PHYS-PARIS, P159 FLOWERS BH, 1970, PROPERTIES MATTER, P250 FUNKE K, 1978, SOLID ELECT, P77 FUNKE K, 1979, FAST ION TRANSPORT S, P609 HAYES W, 1978, CONTEMP PHYS, V19, P469 KANASHIRO T, 1980, 3 INT M SOL EL JAP S, P391 KANERT O, 1994, PHYS REV B, V49, P76 KITTEL C, 1976, INTRO SOLID STATE PH LAHAJNAR G, 1997, SOLID STATE IONICS, V97, P141 LEVYS L, 1976, PRINCIPLES SOLID STA, P276 LORENTZ HA, 1935, COLLECTED PAPERS, V8 LORENZ L, 1881, ANN PHYS, V13, P422 LORENZ L, 1881, ANN PHYS, V13, P582 MAHAN GD, 1976, SUPERIONIC CONDUCTOR, P115 NGAI KL, 1993, J CHEM PHYS, V98, P6424 NGAI KL, 1993, PHYS REV B, V48, P13481 NGAI KL, 1999, SOLID STATE IONICS, V125, P81 SOLOMON MB, 1979, PHYSICS SUPERIONIC C SOMMERFELD A, 1928, Z PHYS, V47, P1 SOMMERFELD A, 1931, REV MOD PHYS, V3, P1 SVARE I, 1993, PHYS REV B, V48, P9336 TATSUMISAGO M, 1992, J CHEM PHYS, V97, P6868 WIEDEMANN GH, 1853, POGGENDORF ANN, V89, P497 WIEDEMANN GH, 1854, LIEBIGS ANN CHEM, V41, P107 ZEMANSKY MW, 1957, HEAT THERMODYNAMICS, P86 NR 31 TC 0 PU AMER INST PHYSICS PI MELVILLE PA 2 HUNTINGTON QUADRANGLE, STE 1NO1, MELVILLE, NY 11747-4501 USA SN 0003-6951 J9 APPL PHYS LETT JI Appl. Phys. Lett. PD OCT 16 PY 2000 VL 77 IS 16 BP 2599 EP 2600 PG 2 SC Physics, Applied GA 362HK UT ISI:000089772400055 ER PT J AU Gadomskii, ON Sukhov, SV TI Microscopic theory of a transition layer on the ideal surface of semiinfinite dielectric media and the near-field effect SO OPTICS AND SPECTROSCOPY LA English DT Article ID OPTICS AB The microscopic theory of a transitional layer on the ideal surface of a semi-infinite absorbing or nonabsorbing isotropic dielectric is developed within the framework of classical optics when the polarization vector of the medium is a linear function of the electric field strength inside the medium. The concentration of atoms (molecules) of the medium and their polarizability are independent of coordinates and are constant inside the medium and close to its surface. The consideration is carried out within the framework of the concept of a discrete-continuous dielectric, in which the fields of dipoles of discretely distributed atoms (molecules) inside the Lorentz sphere surrounding the observation point are taken into account. The near-field effect is shown to result in a nonexponential behavior of the field nearby the surface. The thickness of the transitional layer can be found from experimental values of the reflected wave amplitude. (C) 2000 MAIK "Nauka/Interperiodica". C1 Ulyanovsk State Univ, Ulyanovsk 432700, Russia. Russian Acad Sci, Ulyanovsk Div, Inst Radio Engn & Elect, Ulyanovsk 432011, Russia. RP Gadomskii, ON, Ulyanovsk State Univ, Ulyanovsk 432700, Russia. CR BORN M, 1969, PRINCIPLES OPTICS DRUDE P, 1894, WIED ANN, V51, P77 DRUDE PKL, 1902, THEORY OPTICS GADOMSKII ON, 1994, ZH EKSP TEOR FIZ, V106, P936 GADOMSKII ON, 1998, ZH PRIKL SPEKTROSK, V65, P236 GADOMSKY ON, 1996, J OPT SOC AM B, V13, P1679 KIZEL VA, 1956, SOV PHYS JETP, V2, P533 KIZEL VA, 1973, LIGHT REFLECTION KRUTITSKY KV, 1997, J PHYS B-AT MOL OPT, V30, P5341 LUMMER O, 1910, ANN PHYS-BERLIN, V31, P325 RAMAN CV, 1925, P ROY SOC LOND A MAT, V109, P252 RAMAN CV, 1927, PHILOS MAG, V3, P220 RAYLEIGH, 1892, PHILOS MAG, V16, P1 RAYLEIGH, 1908, PHILOS MAG, V33, P444 ROZENBERG GV, 1958, OPTICS THIN LAYER CO SCHMIDT KEF, 1894, ANN PHYS-LEIPZIG, V52, P75 SIVUKHIN DV, 1948, ZH EKSP TEOR FIZ, V18, P976 SIVUKHIN DV, 1951, ZH EKSP TEOR FIZ, V21, P367 SIVUKHIN DV, 1956, ZH EKSP TEOR FIZ, V3, P269 NR 19 TC 8 PU OPTICAL SOC AMER PI WASHINGTON PA 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USA SN 0030-400X J9 OPT SPECTROSC JI Opt. Spectrosc. PD AUG PY 2000 VL 89 IS 2 BP 261 EP 267 PG 7 SC Optics; Spectroscopy GA 359XZ UT ISI:000089638500018 ER PT J AU Ferro, R Rodriguez, JA TI Influence of F-doping on the transmittance and electron affinity of CdO thin films suitable for solar cells technology SO SOLAR ENERGY MATERIALS AND SOLAR CELLS LA English DT Article DE cadmium oxide; spray pyrolysis; electron affinity; work function; heterostructure ID OXIDE-FILMS AB CdO thin films were deposited by spray pyrolysis on glass substrates from a solution of cadmium acetate in water and methanol. The films are doped with fluorine by adding NH4F to the spray solution to improve the electrooptical properties. A decrease of the transmittance for wavelengths higher than about 800 nm depending on deposition temperature and doping level is observed. The electron affinity and work function for the deposited films are determined and the effect of F-doping on these parameters is considered. (C) 2000 Published by Elsevier Science B.V. All rights reserved. C1 Univ Havana, Fac Phys, Havana 10400, Cuba. RP Rodriguez, JA, Univ Havana, Fac Phys, San Lazaro & L, Havana 10400, Cuba. CR ALQURAINI AA, 1997, P 26 IEEE PHOT SPEC, P415 ANDERSON RL, 1962, SOLID STATE ELECT, V5, P34 ATHWAL YS, 1985, SOLID STATE ELECT, V28, P1165 CHU TL, 1990, J ELECTRON MATER, V19, P1003 DRUDE P, 2000, Z PHYS, V1, P161 FEREKIDES CS, 1999, P EUR MAT C E MRS 19 FERRO R, UNPUB THIN SOLID FIL FERRO R, 1999, THIN SOLID FILMS, V347, P295 FERRO R, 2000, PHYS STATUS SOLIDI A, V177, P477 FERRO R, 2000, PHYS STATUS SOLIDI B, V220, P299 ISLAM MN, 1986, J MATER SCI LETT, V5, P63 KNIGIN PI, 1991, APPL SOL ENERGY, V27, P41 SANDERSON RT, 1960, CHEM PERIODICITY SHANTHI E, 1980, J APPL PHYS, V51, P6243 NR 14 TC 7 PU ELSEVIER SCIENCE BV PI AMSTERDAM PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS SN 0927-0248 J9 SOLAR ENERG MATER SOLAR CELLS JI Sol. Energy Mater. Sol. Cells PD NOV PY 2000 VL 64 IS 4 BP 363 EP 370 PG 8 SC Materials Science, Multidisciplinary; Energy & Fuels GA 358YY UT ISI:000089585800007 ER PT J AU Coutts, TJ Young, DL Li, XN TI Characterization of transparent conducting oxides SO MRS BULLETIN LA English DT Article C1 NREL, Natl Ctr Photovolt, Golden, CO USA. RP Coutts, TJ, NREL, Natl Ctr Photovolt, Golden, CO USA. CR ASHCROFT NW, 1976, SOLID STATE PHYSICS BURSTEIN E, 1954, PHYS REV, V93, P632 CHOPRA KL, 1983, THIN SOLID FILMS, V102, P1 DRUDE P, 1900, ANN PHYSIK, V3, P369 FINKENRATH H, 1966, Z ANGEW PHYS, V21, P512 FINKENRATH H, 1967, SOLID STATE COMMUN, V5, P875 FINKENRATH H, 1982, LANDOLT BORNSTEIN, V3, P161 HAACKE G, 1977, ANNU REV MATER SCI, V7, P73 HAACKE G, 1978, THIN SOLID FILMS, V55, P67 HAMBERG I, 1986, J APPL PHYS, V60, P123 HARTNAGEL HL, 1995, SEMICONDUCTING TRANS JACKSON JD, 1975, CLASSICAL ELECTRODYN JOSEPH M, 1999, JPN J APPL PHYS 2, V38, L1205 KAMMLER DR, 1999, ELECTROCHEMICAL SOC, V9911, P68 KOLODZIEJCAK J, 1964, PHYS STATUS SOLIDI, V5, P145 LI X, 2000, IN PRESS J VAC SCI T LIDE DR, 1993, CRC HDB CHEM PHYSICS MULLIGAN WP, 1997, THESIS COLORADO SCH, P198 NOZIK AJ, 1972, PHYS REV B, V6, P453 PANKOVE JI, 1971, OPTICAL PROCESSES SE PUTLEY E, 1960, HALL EFFECT RELATED VOSSEN JL, 1977, PHYSICS THIN FILMS WYSZECKI G, 1978, HDB OPTICS, P9 YOUNG DL, 2000, IN PRESS J VAC SCI A YOUNG DL, 2000, REV SCI INSTRUM 1, V71, P462 ZHITINSKAYA MK, 1966, SOV PHYS-SOLID STATE, V8, P295 NR 26 TC 65 PU MATERIALS RESEARCH SOCIETY PI WARRENDALE PA 506 KEYSTONE DR, WARRENDALE, PA 15086 USA SN 0883-7694 J9 MRS BULL JI MRS Bull. PD AUG PY 2000 VL 25 IS 8 BP 58 EP 65 PG 8 SC Materials Science, Multidisciplinary; Physics, Applied GA 346GH UT ISI:000088862100027 ER PT J AU Ohlidal, I Franta, D TI Matrix formalism for imperfect thin films SO ACTA PHYSICA SLOVACA LA English DT Article ID SLIGHTLY ROUGH BOUNDARIES; REFLECTOMETRY AB In this review paper a uniform matrix formalism enabling us to include the important defects of thin film systems into the formulae for their optical quantities is presented. The following defects are discussed: roughness of the boundaries; inhomogeneity represented by profiles of the refractive indices; transition interface layers and volume inhomogeneity. It is shown that this formalism is relatively very efficient. This fact is demonstrated using a theoretical example representing a complicated thin film system exhibiting defects. C1 Masaryk Univ, Fac Sci, Dept Phys Elect, CS-61137 Brno, Czech Republic. Masaryk Univ, Fac Sci, Joint Lab Modern Metrol, CS-61137 Brno, Czech Republic. Tech Univ Brno, Czech Metrol Inst, Brno 61137, Czech Republic. Tech Univ Brno, Fac Mech Engn, Brno 61137, Czech Republic. RP Ohlidal, I, Masaryk Univ, Fac Sci, Dept Phys Elect, Kotlarska 2, CS-61137 Brno, Czech Republic. CR BRUGGEMAN DAG, 1935, ANN PHYS-BERLIN, V24, P636 DRUDE P, 1891, WIED ANN, V43, P136 FRANTA D, 1998, J MOD OPTIC, V45, P903 FRANTA D, 1998, OPT COMMUN, V147, P349 FRANTA D, 1999, THIN SOLID FILMS, V343, P295 FRANTA D, 2000, IN PRESS SURF INTERF, V29 FRANTA D, 2000, MIKROCHIM ACTA, V132, P443 JACOBSSON R, 1966, PROGR OPTICS, V5, P249 KITTEL C, 1976, INTRO SOLID STATE PH KNITTL Z, 1976, OPTICS THIN FILMS MAXWELLGARNETT JC, 1904, PHILOS T ROY SOC LON, V203, P385 NEVOT L, 1988, REV PHYS APPL, V23, P1675 OHLIDAL I, 1995, PROGR OPTICS, V34, P249 OHLIDAL I, 1998, MIKROCHIM ACTA S, V15, P177 OHLIDAL I, 1999, SURF INTERFACE ANAL, V28, P240 OHLIDAL I, 2000, IN PRESS PROGR OPTIC, V41 RICE SO, 1951, COMMUN PURE APPL MAT, V4, P351 SCHIFFER R, 1987, APPL OPTICS, V26, P704 SZCZYRBOWSKI J, 1985, THIN SOLID FILMS, V130, P57 VASICEK A, 1960, OPTICS THIN FILMS YEH P, 1980, SURF SCI, V96, P41 NR 21 TC 16 PU SLOVAK ACAD SCIENCES INST PHYSICS PI BRATISLAVA PA DUBRAVSKA CESTA 9, 842 28 BRATISLAVA, SLOVAKIA SN 0323-0465 J9 ACTA PHYS SLOVACA JI Acta Phys. Slovaca PD AUG PY 2000 VL 50 IS 4 BP 489 EP 500 PG 12 SC Physics, Multidisciplinary GA 347DD UT ISI:000088911400009 ER PT J AU Bertrand, E Dobbs, H Broseta, D Indekeu, J Bonn, D Meunier, J TI First-order and critical wetting of alkanes on water SO PHYSICAL REVIEW LETTERS LA English DT Article ID LONG-RANGE FORCES; CAHN-TYPE THEORY; CRITICAL-POINT; TRANSITIONS; INTERFACE; SYSTEMS AB Ellipsometry measurements of the wetting behavior of different alkanes on water show a sequence of two wetting transitions: a first-order (discontinuous) transition followed by a critical (continuous) one. We report temperature-induced wetting transitions for different alkanes and a novel pressure-induced wetting transition for an alkane mixture. The experiments enable us to determine the global wetting phase diagram as a function of chain length and temperature which we subsequently calculate theoretically. The two transition lines are found to be approximately parallel, in accordance with basic theoretical arguments. C1 Ecole Normale Super, Phys Stat Lab, F-75231 Paris 05, France. Katholieke Univ Leuven, Vaste Stof Fys Magnetisme Lab, B-3001 Louvain, Belgium. Inst Francais Petr, F-92852 Rueil Malmaison, France. RP Bertrand, E, Ecole Normale Super, Phys Stat Lab, 24 Rue Lhomond, F-75231 Paris 05, France. CR AKATSUKA S, 1995, J COLLOID INTERF SCI, V172, P335 BONN D, 1992, PHYS REV LETT, V69, P1975 CAHN JW, 1977, J CHEM PHYS, V66, P3667 CAREY BS, 1978, AICHE J, V24, P1076 CAYIAS JL, 1976, SOC PET ENG J, V16, P351 CHENG E, 1993, REV MOD PHYS, V65, P557 DIETRICH S, 1985, PHYS REV B, V31, P4718 DIETRICH S, 1988, PHASE TRANSITIONS CR DOBBS H, 1999, LANGMUIR, V15, P2586 DOBBS HT, IN PRESS DRUDE P, 1959, THEORY OPTICS DZYALOSHINSKII IE, 1961, ADV PHYS, V10, P165 HAMAKER HC, 1937, PHYSICA, V4, P1058 INDEKEU JO, 1999, J STAT PHYS, V95, P1009 ISRAELACHVILI JL, 1985, INTERMOLECULAR SURFA, P145 JASPERSON SN, 1969, REV SCI INSTRUM, V40, P761 KALAYDJIAN F, 1993, SOC PET ENG, P26671 LIPOWSKY R, 1984, PHYS REV LETT, V52, P2303 PENG D, 1976, IND ENG CHEM FUND, V15, P59 PFOHL T, 1999, PHYS REV LETT, V82, P783 RABE JP, 1991, SCIENCE, V253, P424 RAGIL K, 1996, J CHEM PHYS, V105, P5160 RAGIL K, 1996, PHYS REV LETT, V77, P1532 ROSS D, 1999, NATURE, V400, P737 RUTLEDGE JE, 1992, PHYS REV LETT, V69, P937 SCHMIDT JW, 1993, J CHEM PHYS, V99, P582 SHAHIDZADEH N, 1998, PHYS REV LETT, V80, P3992 SHENOY VB, 1995, PHYS REV LETT, V75, P4086 WU XZ, 1993, PHYS REV LETT, V70, P958 NR 29 TC 33 PU AMERICAN PHYSICAL SOC PI COLLEGE PK PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA SN 0031-9007 J9 PHYS REV LETT JI Phys. Rev. Lett. PD AUG 7 PY 2000 VL 85 IS 6 BP 1282 EP 1285 PG 4 SC Physics, Multidisciplinary GA 341VN UT ISI:000088611800036 ER PT J AU Polgar, O Fried, M Lohner, T Barsony, I TI Comparison of algorithms used for evaluation of ellipsometric measurements - Random search, genetic algorithms, simulated annealing and hill climbing graph-searches SO SURFACE SCIENCE LA English DT Article DE computer simulations; ellipsometry; oxygen; silicon ID SPECTROSCOPIC ELLIPSOMETRY AB On the base of an extended criteria function and two different point selection strategies, two hill climbing searches were applied in ellipsometry, and were compared with the well known random search (RS), genetic algorithms (GA) and simulated annealing (SA) to evaluate ellipsometric measurements. For the evaluation of an ellipsometric measurement an adaptive optical model has to be assumed because of the lack of the inverse equations. Finding the appropriate parameters of the optical model of the plan-parallel thin layer-structure by minimising the difference (error) between the measured and the simulated (computed with the optical model) spectra leads to a classical global optimisation task. To demonstrate the methods, spectroscopic ellipsometric samples were evaluated using two different types of optical models: separation by implantation of oxygen and electrochemically prepared porous silicon. The ellipsometric evaluation gives real examples to demonstrate the difficulties and the differences among the evaluating possibilities and capabilities. The results prove that the well-known gradient method (Levenberg-Marquardt) needs some pre-searches to give enough reliability, because of the hilly error surfaces. The comparison also shows that by increasing the complexity of the optical model, and thus the number of the parameters and the dimensions of the search space, the difference of convergence speed (effectiveness) and reliability between RS and the more complicated methods also increase. (C) 2000 Elsevier Science B.V. All rights reserved. C1 Res Inst Tech Phys & Mat Sci, H-1525 Budapest, Hungary. RP Polgar, O, Res Inst Tech Phys & Mat Sci, POB 49, H-1525 Budapest, Hungary. CR AARTS EHL, 1989, SIMULATED ANNEALING AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ BRUGGEMANN DAG, 1935, ANN PHYS LEIPZIG, V24 CERNY V, 1985, J OPTIMIZ THEORY APP, V45, P41 COLLINS RW, 1998, THIN SOLID FILMS, P313 DRUDE P, 1890, ANN PHYS CHEM, V39, P481 FLETCHER R, 1971, MODIFIED MARQUARDT S FRIED M, 1996, CHARACTERIZATION DIF, V276, P233 FRIED M, 1997, SEMICONDUCT SEMIMET, V46, P24 GOLDBERG DE, 1985, P 1 INT C GEN ALG TH, P154 GOLDBERG DE, 1989, OPTIMIZATION MACHINE, P126 HAYKIN S, 1994, NEURAL NETWORKS COMP HOLLAND JH, 1975, ADAPTATION NATURAL A JELLISON GE, 1993, APPL PHYS LETT, V62, P3348 KIRKPATRICK S, 1983, SCIENCE, V220, P671 METROPOLIS N, 1953, J CHEM PHYS, V21, P1087 MORE J, 1977, LECT NOTES MATH, V630 RICH E, 1991, ARTIFICIAL INTELLIGE VANHELLEMONT J, 1991, VACUUM, V42, P359 NR 19 TC 4 PU ELSEVIER SCIENCE BV PI AMSTERDAM PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS SN 0039-6028 J9 SURFACE SCI JI Surf. Sci. PD JUN 1 PY 2000 VL 457 IS 1-2 BP 157 EP 177 PG 21 SC Chemistry, Physical GA 325XW UT ISI:000087703000026 ER PT J AU Bonn, D Bertrand, E Meunier, J Blossey, R TI Dynamics of wetting layer formation SO PHYSICAL REVIEW LETTERS LA English DT Article ID CRITICAL DROPLETS; LINE TENSION; TRANSITIONS; NUCLEATION; INTERFACE; FILMS AB We study the formation and growth of wetting layers in the binary liquid mixture cyclohexane-methanol. By progressively deuterating the methanol we can tune the equilibrium wetting layer thickness, Hysteresis of the transition is observed for large thicknesses and is absent for thinner ones. This can be understood by calculating the activation energy for wetting layer nucleation as a function of the film thickness. We also show that the late-stage growth of the wetting layer after the nucleation process follows a power law in time, in agreement with a diffusion-limited growth mechanism proposed theoretically. C1 Ecole Normale Super, Phys Stat Lab, F-75231 Paris 05, France. Katholieke Univ Leuven, Lab Vaste Stoffys Magnet, B-3001 Louvain, Belgium. RP Blossey, R, Ecole Normale Super, Phys Stat Lab, 24 Rue Lhomond, F-75231 Paris 05, France. CR BAUSCH R, 1991, EUROPHYS LETT, V14, P125 BAUSCH R, 1992, Z PHYS B CON MAT, V86, P273 BAUSCH R, 1993, PHYS REV E, V48, P1131 BAUSCH R, 1994, PHYS REV E, V50, R1759 BLOSSEY R, 1992, THESIS HHU DUSSELDOR BLOSSEY R, 1995, INT J MOD PHYS B, V9, P3489 BONN D, 1992, PHYS REV LETT, V69, P1975 BONN D, 1993, J CHEM PHYS, V99, P7115 BONN D, 1995, PHYS REV LETT, V74, P3844 CAHN JW, 1977, J CHEM PHYS, V66, P3367 CHENG E, 1993, PHYS REV LETT, V70, P1854 CHENG E, 1993, REV MOD PHYS, V65, P557 DEGENNES PG, 1981, J PHYSIQUE LETT, V42, P377 DOBBS H, 1999, LANGMUIR, V15, P2586 DRUDE P, 1959, THOERY OPTICS FOLTIN G, 1997, J PHYS A-MATH GEN, V30, P2937 INDEKEU JO, 1992, PHYSICA A, V183, P492 ISRAELACHVILI JN, 1985, INTERMOLECULAR SURFA JASPERSON SN, 1969, REV SCI INSTRUM, V40, P761 JOANNY JF, 1986, CR HEBD ACAD SCI, V303, P337 JOANNY JF, 1986, J COLLOID INTERF SCI, V111, P94 KELLAY H, 1993, PHYS REV LETT, V71, P2607 LAW BM, 1992, PHYS REV LETT, V69, P1781 LIPOWSKY R, 1986, PHYS REV LETT, V57, P353 MOLDOVER MR, 1984, PHYSICA D, V12, P351 ROWLINSON JS, 1982, MOL THEORY CAPILLARI RUTLEDGE JE, 1992, PHYS REV LETT, V69, P937 SCHICK M, 1992, PHYS REV B, V46, P7312 SCHMIDT JW, 1983, J CHEM PHYS, V79, P379 WANG JY, 1999, PHYS REV LETT, V83, P3677 NR 30 TC 12 PU AMERICAN PHYSICAL SOC PI COLLEGE PK PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA SN 0031-9007 J9 PHYS REV LETT JI Phys. Rev. Lett. PD MAY 15 PY 2000 VL 84 IS 20 BP 4661 EP 4664 PG 4 SC Physics, Multidisciplinary GA 313JT UT ISI:000086997100037 ER PT J AU Brusa, MA Churio, MS Grela, MA Bertolotti, SG Previtali, CM TI Reaction volume and reaction enthalpy upon aqueous peroxodisulfate dissociation: S2O82--> 2SO(4)(center dot-) SO PHYSICAL CHEMISTRY CHEMICAL PHYSICS LA English DT Article ID RESOLVED PHOTOACOUSTIC CALORIMETRY; ELECTRON-TRANSFER REACTION; PEROXYNITRITE DECOMPOSITION; RADICAL REACTIONS; (MLCT)-M-3 STATE; ENTROPY CHANGES; THERMOCHEMISTRY; ACTIVATION; SPECTROSCOPY; PEROXIDES AB The dissociation of aqueous peroxodisulfate induced by laser photolysis at 266 nm has been studied by photoacoustic calorimetry at variable temperature. Data treatment considered the temperature dependence of reaction quantum yields and the difference of thermal expansivities between the sample and the calorimetric reference solutions. The method yielded the reaction volume and enthalpy changes, amounting respectively to 8.9 +/- 0.5 ml mol(-1) and 120 +/- 11 kJ mol(-1). Both results are interpreted as pointing to a differential solvation of the involved species. C1 Univ Mar del Plata, Dept Quim, RA-7600 Mar Del Plata, Argentina. Univ Nacl Rio Cuarto, Dept Quim & Fis, RA-5800 Rio Cuarto, Argentina. RP Brusa, MA, CONICET, RA-1033 Buenos Aires, DF, Argentina. 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Chem. Chem. Phys. PY 2000 VL 2 IS 10 BP 2383 EP 2387 PG 5 SC Chemistry, Physical; Physics, Atomic, Molecular & Chemical GA 312DM UT ISI:000086928000046 ER PT J AU Fried, M Redei, L TI Non-destructive optical depth profiling and real-time evaluation of spectroscopic data SO THIN SOLID FILMS LA English DT Article DE spectroscopic ellipsometry; depth profiling; neural networks; ion implantation; porous silicon; wafer mapping ID ION-IMPLANTED SILICON; AMORPHOUS-SILICON; NONDESTRUCTIVE DETERMINATION; BACKSCATTERING SPECTROMETRY; REFRACTIVE-INDEX; THIN-FILM; ELLIPSOMETRY; SEMICONDUCTORS; TRANSMISSION; REFLECTION AB The interpretation of optical measurements is based on a simulation and regression program which minimizes the difference between calculated and measured spectra. A complicated multilayer structure is usually modelled as a system built up of plane-parallel thin films consisting a mixture of two (or more) components. The quality of this interpretation thus depends on the realism of the proposed optical model, on the quality of the reference files for the refractive indices, on the theory of the optical response of mixed layers and on the regression algorithm. For depth profiling a simple model consisting of a few layers can be used to get a first approximation of the thickness of the buried layer and of a possible top layer. The next step is to replace this simple model by a more complex model. Two approaches can be followed for profiles with (a) unknown or (b) known depth variations. Ion-implanted, electrochemically etched silicon and other examples will be presented. Traditionally the evaluation of spectroscopic ellipsometry and reflectometry needs a predetermined multilayer optical model which possesses initial parameters close enough to the targeted ones, because a non-linear gradient descent algorithm uses the initial guess. However, erroneous results may appear when the algorithm falls into the trap of a local minimum. Backpropagation trained feedforward neural networks proved to be able to give good initial estimations in most cases for avoiding problems. Moreover, a set of neural networks can be trained to perform successive refining of the estimation regions, providing the capability of real-time monitoring of process parameters or fast evaluation of wafer mapping measurements. (C) 2000 Elsevier Science S.A. All rights reserved. C1 Res Inst Tech Phys & Mat Sci, H-1525 Budapest, Hungary. RP Fried, M, Res Inst Tech Phys & Mat Sci, POB 49, H-1525 Budapest, Hungary. 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The quasi-optical method was modified and used to study absorption, reflection, and complex permittivity of aqueous solutions of nonelectrolytes in the high-frequency region of the millimeter band (80-120 GHz). In low-concentration (<14 mol %) solutions of acetone, and in the whole frequency range, a single Debye-type relaxation process occurs. To within the accuracy of measurements, additional absorption and additional molecular relaxation processes in the high-frequency region of the millimeter band were not detected. The obtained dielectric relaxation times in solutions of acetone were substantially longer than in water at all temperatures (288-308 K). Such changes are determined by stabilizing hydrophobic hydration effects. It appears that acetone molecules in voids of the pseudoclathrate structure built of water molecules do not experience free rotation, as was earlier believed. C1 Russian Acad Sci, Kurnakov Inst Gen & Inorgan Chem, Moscow 117907, Russia. RP Lyashchenko, AK, Russian Acad Sci, Kurnakov Inst Gen & Inorgan Chem, Leninskii Pr 31, Moscow 117907, Russia. CR *I RAD, 1997, 11 ALL RUSS S MILL W AKERLOF G, 1932, J AM CHEM SOC, V54, P4125 AKHADOV YY, 1977, DIELEKTRICHESKIE SVO BARTHEL J, 1995, ELECTROLYTE DATA C 2, V12 BRANDT AA, 1963, SHF STUDIES DIELECTR, P227 BUSHUEV YG, 1998, IZV ROSS AKAD NAUK K, P592 CHEKALIN NV, 1968, VESTN MOSK U KHIM, V4, P96 DRUDE P, 1897, ANN PHYS, V61, P466 FINNEY JL, 1994, CHEM SOC REV GOLDAMMER EV, 1970, J PHYS CHEM-US, V74, P3734 GOUGH SR, 1973, J PHYS CHEM-US, V77, P2969 GOUGH SR, 1977, J PHYS CHEM-US, V81, P2158 HAWKINS RE, 1966, J PHYS CHEM-US, V70, P1889 KAATZE U, 1995, RADIAT PHYS CHEM, V45, P549 KOKOVINA GV, 1983, ZH STRUKT KHIM, V24, P152 LISNYANSKII LI, 1964, VESTN LENINGR U, P48 LYASHCHENKO AK, 1994, ADV CHEM PHYS, V87, P379 LYASHCHENKO AK, 1995, 10 RUSS S MILL WAV M, P226 LYASHCHENKO AK, 1997, ZH FIZ KHIM+, V71, P828 MUNDALL AG, 1957, CAN J PHYS, V35, P995 SHAKHPARONOV MI, 1965, ZH STRUKT KHIM, V6, P21 SHAKHPARONOV MI, 1970, ZH STRUKT KHIM, V11, P599 SHAKHPARONOV MI, 1972, FIZIKA FIZIKO KHIMIY, P15 NR 23 TC 0 PU INTERPERIODICA PI BIRMINGHAM PA PO BOX 1831, BIRMINGHAM, AL 35201-1831 USA SN 0036-0244 J9 RUSSIAN J PHYS CHEM JI Russ. J. Phys. Chem. PD APR PY 2000 VL 74 IS 4 BP 529 EP 534 PG 6 SC Chemistry, Physical GA 305RT UT ISI:000086554600007 ER PT J AU Tompkins, HG Baker, JH Convey, D TI Effect of process parameters on the optical constants of thin metal films SO SURFACE AND INTERFACE ANALYSIS LA English DT Article DE thin film; Cr; ellipsometry ID THICKNESS AB In this study, we show that the optical constants of sputter-deposited chromium depend on the argon pressure used for the deposition, Higher argon pressure gives lower extinction coefficients. Sheet resistance measurements show that those materials with lower extinction coefficients also have lower conductivity, Whereas the argon pressure strongly affects the resulting optical constants of the film material, the choice of substrate material does not affect the resulting optical constants of the film, Copyright (C) 2000 John Wiley & Sons, Ltd. C1 Motorola Labs, Phys Sci Res Labs, Tempe, AZ 85284 USA. RP Tompkins, HG, Motorola Labs, Phys Sci Res Labs, Tempe, AZ 85284 USA. CR AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ BUNSHAH RF, 1982, DEPOSITION TECHNOLOG CULLITY BD, 1967, ELEMENTS XRAY DIFFRA, P99 DRUDE P, 1891, ANN PHYS, V43, P126 GRAY DE, 1972, AM I PHYSICS HDB HEAVENS OS, 1965, OPTICAL PROPERTIES T MAISSEL LI, 1970, HDB THIN FILM TECHNO PALIK ED, 1985, HDB OPTICAL CONSTANT PALIK ED, 1991, HDB OPTICAL CONSTA 2 PALIK ED, 1991, HDB OPTICAL CONSTA 2, P374 PALIK ED, 1998, HDB OPTICAL CONSTA 3 TOMPKINS HG, UNPUB J VAC SCI TECH TOMPKINS HG, 1992, SURF INTERFACE ANAL, V18, P93 TOMPKINS HG, 1993, USERS GUIDE ELLIPSOM TOMPKINS HG, 1998, J VAC SCI TECHNOL 1, V16, P1297 TOMPKINS HG, 1999, S APPL SURFACE ANAL TOMPKINS HG, 1999, SPECTROSCOPIC ELLIPS WAITS RK, 1998, THIN FILM DEPOSITION NR 18 TC 1 PU JOHN WILEY & SONS LTD PI W SUSSEX PA BAFFINS LANE CHICHESTER, W SUSSEX PO19 1UD, ENGLAND SN 0142-2421 J9 SURF INTERFACE ANAL JI Surf. Interface Anal. PD MAR PY 2000 VL 29 IS 3 BP 227 EP 231 PG 5 SC Chemistry, Physical GA 298GK UT ISI:000086130800009 ER PT J AU Weber, MF Stover, CA Gilbert, LR Nevitt, TJ Ouderkirk, AJ TI Giant birefringent optics in multilayer polymer mirrors SO SCIENCE LA English DT Article ID FILMS; ANGLES; MEDIA AB Multilayer mirrors that maintain or increase their reflectivity with increasing incidence angle can be constructed using polymers that exhibit Large birefringence in their indices of refraction. The most important feature of these multilayer interference stacks is the index difference in the thickness direction (z axis) relative to the in-plane directions of the film. This z-axis refractive index difference provides a variable that determines the existence and value of the Brewster's angle at layer interfaces, and it controls both the interfacial Fresnel reflection coefficient and the phase relations that determine the optics of multilayer stacks. These films can yield optical results that are difficult or impossible to achieve with conventional multilayer optical designs. The materials and processes necessary to fabricate such films are amenable to Large-scale manufacturing. C1 3M Ctr, 3M Film Light Management Technol Ctr, St Paul, MN 55144 USA. RP Ouderkirk, AJ, 3M Ctr, 3M Film Light Management Technol Ctr, St Paul, MN 55144 USA. CR ALFREY T, 1969, POLYM ENG SCI, V9, P400 AZZAM RMA, 1987, ELLIPSOMETRY POLARIZ, P119 AZZAM RMA, 1987, ELLIPSOMETRY POLARIZ, P357 BANNING M, 1947, J OPT SOC AM, V37, P792 BAUMEISTER P, 1970, SCI AM, V223, P58 BERREMAN DW, 1972, J OPT SOC AM, V62, P502 BORN M, 1975, PRINCIPLES OPTICS, P40 BORN M, 1975, PRINCIPLES OPTICS, P66 BREWSTER D, 1839, TREATISE OPTICS CAKMAK M, 1989, POLYM ENG SCI, V29, P1534 COSTICH VR, 1970, APPL OPTICS, V9, P866 DRUDE P, 1891, ANN PHYS CHEM, V38, P865 DRUDE P, 1891, WIED ANN, V43, P146 FINK Y, 1998, SCIENCE, V282, P1679 HEAVENS OS, 1966, APPL OPTICS, V5, P373 HEFFELFINGER CJ, 1971, SCI TECHNOLOGY POLYM, P587 HODGKINSON I, 1993, J OPT SOC AM A, V10, P2065 HOLMES DA, 1966, J OPT SOC AM, V56, P1763 ITO T, 1996, 5579159, US JONES RL, 1999, NATURE, V400, P146 KIM JC, 1998, POLYMER, V39, P4225 LEKNER J, 1993, J OPT SOC AM A, V10, P2059 LISSBERGER PH, 1970, REP PROG PHYS, V33, P197 MACLEOD HA, 1986, THIN FILM OPTICAL FI, P334 SEFERIS JC, 1989, POLYM HDB, P45 THELEN A, 1963, J OPT SOC AM, V53, P1266 THELEN A, 1976, APPL OPTICS, V15, P2983 THELEN A, 1980, J OPT SOC AM, V70, P118 YEH P, 1979, J OPT SOC AM, V69, P742 NR 29 TC 56 PU AMER ASSOC ADVANCEMENT SCIENCE PI WASHINGTON PA 1200 NEW YORK AVE, NW, WASHINGTON, DC 20005 USA SN 0036-8075 J9 SCIENCE JI Science PD MAR 31 PY 2000 VL 287 IS 5462 BP 2451 EP 2456 PG 6 SC Multidisciplinary Sciences GA 299MK UT ISI:000086202200035 ER PT J AU Knock, MM Bain, CD TI Effect of counterion on monolayers of hexadecyltrimethylammonium halides at the air-water interface SO LANGMUIR LA English DT Article ID FREQUENCY VIBRATIONAL SPECTROSCOPY; NEUTRON REFLECTION; SURFACTANT MONOLAYER; FASCINATING PHENOMENA; OVERFLOWING CYLINDER; HYDROCARBON CHAIN; MICELLES; BROMIDE; BEHAVIOR; RHEOLOGY AB Sum-frequency spectroscopy (SFS), ellipsometry, and surface tensiometry have been used to study the effect of halide counterion on monolayers of the cationic surfactant CTAX (CH3(CH2)(15)N+(CH3)(3); X-; X = F-, Cl-, Br-, and I-) at the air-water interface. The counterion was found to change the efficiency and effectiveness of the surfactant, both decreasing in order Br- > Cl (-) > F-. Aqueous solutions of CTAI were well below the Krafft point at room temperature, and CTAI therefore functioned ineffectively as a surfactant under ambient conditions. Adding salt in the form of 0.1 M KX was found to reduce the cmc but appeared to have little effect on the limiting area per molecule attained at the cmc, which increased from 44 Angstrom(2) for CTAB to 65 Angstrom(2) for CTAC and ca. 94 Angstrom(2) for CTAF. Neither SFS nor ellipsometry provided any firm evidence for specific effects of the halide ions on the structure of the surfactant monolayers. SFS was used to study monolayers of CTAB as a function of concentration. For surface coverages greater than 1 x 10(-6) mol m(-2) the mean tilt of the terminal methyl group from the surface normal was independent of the area per molecule. A decrease in the strength of the SF signal arising from the methylene groups at low surface coverages, which would be expected for molecules lying flat on the surface, was not observed. In the course of the analysis of the ellipsometric data, the contribution of the double layer to the coefficient of ellipticity was evaluated and was shown to be linear in the surface coverage and insensitive to the thickness of the double layer. C1 Univ Oxford, Phys & Theoret Chem Lab, Oxford OX1 3QZ, England. RP Bain, CD, Univ Oxford, Phys & Theoret Chem Lab, S Parks Rd, Oxford OX1 3QZ, England. CR *CRC, 1984, HDB CHEM PHYS ANACKER EW, 1979, SOLUTION CHEM SURFAC, P247 BAIN CD, 1995, J CHEM SOC FARADAY T, V91, P1281 BAIN CD, 1999, MODERN CHARACTIZATIO, CH9 BEAGLEHOLE D, 1980, PHYSICA B, V100, P163 BELL GR, 1996, J CHEM SOC FARADAY T, V92, P515 BELL GR, 1997, J AM CHEM SOC, V119, P10227 BELL GR, 1998, J PHYS CHEM B, V102, P218 BELL GR, 1998, J PHYS CHEM B, V102, P9461 BINKS BP, 1999, MODERN CHARACTERIZAT, CH1 CONBOY JC, 1997, J PHYS CHEM B, V101, P6724 DRUDE P, 1959, THEORY OPTICS DUFFY DC, 1994, J AM CHEM SOC, V116, P1125 DUFFY DC, 1995, J PHYS CHEM-US, V99, P15241 EISENTHAL KB, 1996, CHEM REV, V96, P1343 GOATES SR, 1999, LANGMUIR, V15, P1400 GRAVSHOLT S, 1976, J COLLOID INTERF SCI, V57, P575 HATTORI N, 1999, COLLOID POLYM SCI, V277, P95 HERB CA, 1994, ACS S SERIES, V578 HIEMENZ PC, 1997, PRINCIPLES COLLOID S, P361 HOFFMANN H, 1985, ACS SYM SER, V272, P41 HOFFMANN H, 1988, ANGEW CHEM INT EDIT, V27, P902 HOFFMANN H, 1994, ACS SYM SER, V578, P2 HOFFMANN H, 1994, ADV MATER, V6, P116 ISRAELACHVILI JN, 1976, J CHEM SOC FARADAY T, V72, P1525 ISRAELACHVILI JN, 1995, INTERMOLECULAR SURFA, P252 ISRAELACHVILI JN, 1995, INTERMOLECULAR SURFA, P256 LINDBLOM G, 1973, J COLLOID INTERF SCI, V42, P400 LINDMAN B, 1980, TOP CURR CHEM, V87, P1 LU JR, IN PRESS J ADV COLLO LU JR, 1994, J PHYS CHEM-US, V98, P11519 LU JR, 1994, PHYSICA B, V198, P120 LU JR, 1995, J COLLOID INTERF SCI, V174, P441 LU JR, 1995, J PHYS CHEM-US, V99, P8233 LYKLEMA J, 1993, FUNDAMENTALS INTERFA, V1, CH7 LYTTLE DJ, 1995, LANGMUIR, V11, P1001 MANNINGBENSON S, 1997, J COLLOID INTERF SCI, V189, P109 MANNINGBENSON S, 1998, LANGMUIR, V14, P990 MARION JB, 1980, CLASSICAL ELECTROMAG, P289 MORGAN JD, 1994, LANGMUIR, V10, P797 MUKERJEE P, 1971, CRITICAL MICELLE CON, P36 PARADES S, 1984, J PHYS CHEM-US, V88, P1871 PENFOLD J, 1997, J CHEM SOC FARADAY T, V93, P3899 PORTE G, 1994, MICELLES MEMBRANES M, CH2 REHAGE H, 1983, FARADAY DISCUSS, V76, P363 SHEN YR, 1989, NATURE, V337, P519 SHIKATA T, 1994, LANGMUIR, V10, P3470 SMALL DM, 1986, HDB LIPID RES, V4, P196 SOLTERO JFA, 1995, LANGMUIR, V11, P3337 SOLTERO JFA, 1996, LANGMUIR, V12, P2654 SU TJ, 1997, J PHYS CHEM B, V101, P937 UNDERWOOD AL, 1987, J COLLOID INTERF SCI, V117, P242 WARD RN, 1994, J PHYS CHEM-US, V98, P8536 WARD RN, 1996, MOL PHYS, V88, P269 ZUIDEMA HH, 1941, IND ENG CHEM, V13, P312 NR 55 TC 26 PU AMER CHEMICAL SOC PI WASHINGTON PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA SN 0743-7463 J9 LANGMUIR JI Langmuir PD MAR 21 PY 2000 VL 16 IS 6 BP 2857 EP 2865 PG 9 SC Chemistry, Physical GA 295TT UT ISI:000085984500063 ER PT J AU Edens, GJ Gunner, MR Xu, Q Mauzerall, D TI The enthalpy and entropy of reaction for formation of P(+)Q(A)(-) from excited reaction centers of Rhodobacter sphaeroides SO JOURNAL OF THE AMERICAN CHEMICAL SOCIETY LA English DT Article ID PHOTOSYNTHETIC REACTION CENTERS; REACTION-CENTER PROTEIN; STREPTOMYCES SUBTILISIN INHIBITOR; ELECTRON-TRANSFER; RHODOPSEUDOMONAS-SPHAEROIDES; VOLUME CHANGES; SIGNIFICANT DISCREPANCIES; BACTERIAL PHOTOSYNTHESIS; CALORIMETRIC ENTHALPIES; GLOBULAR-PROTEINS AB The enthalpy and volume changes for the charge-transfer reaction between excited donor and ionized donor and acceptor in bacterial reaction centers were determined using pulsed photoacoustics. Excitation in the lowest absorption band of the centers at 860 nm minimized the thermal signal caused by degradation of excess energy. Knowing the free energy of this reaction, -0.86 eV, the determination of the enthalpy, -0.44 eV, fixes the entropy at 25 degrees C as about one-half (T Delta S = +0.42 eV) of the free energy for the normal ubiquinone-10 containing centers. This is a larger contribution than anticipated from previous estimates of the enthalpy. The unexpected sign of the entropy is assigned to the release of counterions from the reaction center surfaces when the charge transfer cancels the dominant opposite charges at the interfaces. The enthalpy and entropy of six reaction centers containing exchanged quinones did not correlate with their free energies. The volume contractions ranged from -28 to -42 Angstrom(3) and roughly correlated with the size of the quinone as expected from electrostriction. C1 Rockefeller Univ, New York, NY 10021 USA. CUNY, Dept Phys, New York, NY 10031 USA. RP Mauzerall, D, Rockefeller Univ, 1230 York Ave, New York, NY 10021 USA. CR 1975, HDB CHEM PHYSICS, F5 1989, POLYM HDB 5 ALDEN RG, 1995, J AM CHEM SOC, V117, P12284 ARATA H, 1981, BIOCHIM BIOPHYS ACTA, V636, P70 ARATA H, 1981, BIOCHIM BIOPHYS ACTA, V638, P201 ARNAUT LG, 1992, REV SCI INSTRUM, V63, P5381 BLANKENSHIP RE, 1995, ANOXYGENIC PHOTOSYNT, V2 BRASLAVSKY SE, 1992, CHEM REV, V92, P1381 CASE GD, 1973, BIOCHIM BIOPHYS ACTA, V292, P677 CHA Y, 1992, PLANT PHYSIOL, V100, P1869 CHALIKIAN TV, 1996, J MOL BIOL, V260, P588 CLAYTON RK, 1971, METHOD ENZYMOL, V23, P696 DEVAULT D, 1980, Q REV BIOPHYS, V13, P387 DRUDE P, 1894, Z PHYS CHEM, V15, P79 DUTTON PL, 1973, FEBS LETT, V36, P169 FEITELSON J, 1996, J PHYS CHEM-US, V100, P7698 GEKKO K, 1989, J PHYS CHEM-US, V93, P426 GENSCH T, 1997, J PHYS CHEM B, V101, P101 GUNNER MR, 1986, J PHYS CHEM-US, V90, P3783 GUNNER MR, 1988, THESIS U PENNSYLVANI GUNNER MR, 1989, J AM CHEM SOC, V111, P3400 GUNNER MR, 1996, J PHYS CHEM-US, V100, P4277 GURNEY RW, 1953, IONIC PROCESSES SOLU, P18 HOLTEN D, 1978, BIOCHIM BIOPHYS ACTA, V501, P112 KAKITANI T, 1981, BIOCHIM BIOPHYS ACTA, V635, P498 KLEINFELD D, 1984, BIOCHEMISTRY-US, V23, P5780 KONG JL, 1998, J AM CHEM SOC, V120, P7371 LANGE NA, 1985, LANGES HDB CHEM, P5 LIN X, 1994, P NATL ACAD SCI USA, V91, P10265 LIU YF, 1995, PROTEIN SCI, V4, P2559 LOGUNOV SL, 1997, J PHYS CHEM B, V101, P6629 MALKIN S, 1979, PHOTOCHEM PHOTOBIOL, V29, P803 MALKIN S, 1994, J PHOTOCH PHOTOBIO B, V23, P79 MARCUS RA, 1985, BIOCHIM BIOPHYS ACTA, V811, P265 MARINETTI T, 1983, P NATL ACAD SCI USA, V80, P178 MAROTI P, 1997, BIOPHYS J, V73, P367 MAUZERALL D, 1982, BIOL EVENTS PROBED U, P215 MAUZERALL DC, 1995, BIOPHYS J, V68, P275 MCMAHON BH, 1998, BIOPHYS J, V74, P2567 MOSS DA, 1991, FEBS LETT, V283, P33 NAGHIBI H, 1995, P NATL ACAD SCI USA, V92, P5597 NITSCH C, 1989, BIOCHIM BIOPHYS ACTA, V975, P88 OKAMURA MY, 1975, P NATL ACAD SCI USA, V72, P3492 PARSON WW, 1990, BIOCHIM BIOPHYS ACTA, V1017, P251 PUCHENKOV OV, 1995, BBA-BIOENERGETICS, V1231, P197 RUTHERFORD AW, 1980, FEBS LETT, V110, P257 SARVAZYAN AP, 1979, BIOPOLYMERS, V18, P3015 STRALEY SC, 1973, BIOCHIM BIOPHYS ACTA, V305, P597 TAMURA A, 1995, J MOL BIOL, V249, P625 TAMURA A, 1995, J MOL BIOL, V249, P636 TANG CK, 1999, BIOCHEMISTRY-US, V38, P8794 VOS MH, 1997, J PHYS CHEM B, V101, P9820 WOODBURY NW, 1986, BIOCHIM BIOPHYS ACTA, V851, P6 YEATES TO, 1987, P NATL ACAD SCI USA, V84, P6438 NR 54 TC 23 PU AMER CHEMICAL SOC PI WASHINGTON PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA SN 0002-7863 J9 J AMER CHEM SOC JI J. Am. Chem. Soc. PD FEB 23 PY 2000 VL 122 IS 7 BP 1479 EP 1485 PG 7 SC Chemistry, Multidisciplinary GA 289TZ UT ISI:000085639200026 ER PT J AU Sedev, R Exerowa, D Findenegg, GH TI Poly(ethylene oxide)-poly(propylene oxide) - poly(ethylene)oxide triblock copolymers at the water/air interface and in foam films SO COLLOID AND POLYMER SCIENCE LA English DT Article DE amphiphilic block copolymer; polymeric surfactant; brush; ellipticity; foam film ID NEUTRON REFLECTION; AQUEOUS-SOLUTIONS; BLOCK-COPOLYMERS; CHAIN MOLECULES; TETHERED CHAINS; SURFACE FORCES; ADSORPTION; POLYMERS; DYNAMICS AB The behavior of commercial poly(ethylene oxide)(PEO)-poly(propylene oxide)(PPO)-PEO triblock copolymers at the water/air interface and in microscopic foam films is studied. In aqueous solution these amphiphilic nonionic substances exhibit a surfactant-like aggregation and adsorption behavior. Even below the critical micelle concentration (cmc) the surface concentration is so high that the PEO chains are squeezed and protrude into the solution in order to accommodate to the situation at the interface. As evidenced by measurements of the ellipticity of light reflected from the free surface of the solution a PEO brush is created at the fluid interface. The microscopic foam him is used as a tool for investigating the normal interaction between two PEO brushes facing each other. Stable foam films are obtained at concentrations below the cmc and steric repulsion predominates (in 0.1 M NaCl). A brush-to-brush contact is established only at higher capillary pressures and the disjoining pressure isotherm follows de Gennes' scaling prediction. At lower pressure a softer steric repulsion occurs. It is governed by the bulk copolymer concentration and hence is fundamentally different from the brush-to-brush repellency. On the whole PEO-PPO-PEO copolymers behave as nonionic surfactants, but the large size of their molecules exemplifies the excluded-volume features. C1 Tech Univ Berlin, Iwan N Stranski Inst Phys & Theoret Chem, D-10623 Berlin, Germany. Bulgarian Acad Sci, Inst Phys Chem, BU-1113 Sofia, Bulgaria. RP Sedev, R, Tech Univ Berlin, Iwan N Stranski Inst Phys & Theoret Chem, Str 17 Juni 112, D-10623 Berlin, Germany. CR ALEXANDER S, 1977, J PHYS, V38, P983 ALEXANDRIDIS P, 1995, COLLOID SURFACE A, V96, P1 ALEXANDRIDIS P, 1996, CURR OPIN COLLOID IN, V1, P490 ALEXANDRIDIS P, 1997, AMPHIPHILIC BLOCK CO BAHADUR P, 1991, TENSIDE SURFACT DET, V28, P173 BRANDRUP J, 1989, POLYM HDB, P460 CARAGHEORGHEOPOL A, 1997, LANGMUIR, V13, P6912 CLIFTON BJ, 1998, PHYSICA B, V248, P289 DEGENNES PG, 1980, MACROMOLECULES, V13, P1069 DEGENNES PG, 1985, CR ACAD SCI II-MEC P, V300, P839 DEGENNES PG, 1987, ADV COLLOID INTERFAC, V27, P189 DHOOT S, 1994, COLLOID SURFACE A, V86, P47 DRUDE P, 1959, THEORY OPTICS EXEROWA D, 1998, FOAM FOAM FILMS FLEER GJ, 1993, POLYM INTERFACES HALPERIN A, 1992, ADV POLYM SCI, V100, P31 HEIDEL B, 1986, THESIS U RUHR BOCHUM HEIDEL B, 1987, J CHEM PHYS, V87, P706 JASPERSON SN, 1969, REV SCI INSTRUM, V40, P761 KLEIN J, 1992, PURE APPL CHEM, V64, P1577 LEE LT, 1996, PHYSICA B, V221, P320 LU JR, 1998, J CHEM SOC FARADAY T, V94, P995 MIANO F, 1992, COLLOID SURFACE, V68, P9 MILNER ST, 1991, SCIENCE, V251, P905 NACE VM, 1996, NONIONIC SURFACTANTS PENFOLD J, 1997, J CHEM SOC FARADAY T, V93, P3899 PROKOP RM, 1996, MACROMOLECULES, V29, P5902 PURCELL IP, 1998, LANGMUIR, V14, P1637 RIOU SA, 1997, J POLYM SCI POL PHYS, V35, P2843 SEDEV R, 1997, J DISPER SCI TECHNOL, V18, P751 SEDEV R, 1999, COLLOID SURFACE A, V156, P65 SEDEV R, 1999, IN PRESS ADV COLLOID SEDEV R, 1999, UNPUB J COLLOID INTE THOMAS RK, 1996, CURR OPIN COLLOID IN, V1, P23 TIROSH O, 1998, BIOPHYS J, V74, P1371 TIRRELL M, 1997, CURR OPIN SOLID ST M, V2, P668 TRIPP CP, 1996, LANGMUIR, V12, P3952 NR 37 TC 12 PU SPRINGER VERLAG PI NEW YORK PA 175 FIFTH AVE, NEW YORK, NY 10010 USA SN 0303-402X J9 COLLOID POLYM SCI JI Colloid Polym. Sci. PD FEB PY 2000 VL 278 IS 2 BP 119 EP 123 PG 5 SC Chemistry, Physical; Polymer Science GA 284UK UT ISI:000085350800005 ER PT J AU Amusia, MY Connerade, JP TI The theory of collective motion probed by light SO REPORTS ON PROGRESS IN PHYSICS LA English DT Review ID PHOTOIONIZATION CROSS-SECTIONS; GIANT-RESONANCES; CLUSTERS; C-60; IONIZATION; ELECTRONS; ATOMS; GASES; EXCITATIONS; TRANSITION AB A review of collective phenomena in atomic and quasi-atomic systems is presented. The fundamental unity of the subject is stressed by appealing to a simple conceptual scheme, namely the Landau theory of wave propagation applied to a Fermi fluid. Collective giant resonances in nuclei, atoms, metallic clusters and fullerenes are all discussed and related to each other. Single-photon dipole, two-photon and quadrupole excitation are considered, as well as the observation of harmonics, and the enhancement of double excitations by a giant resonance. Other near-threshold phenomena are discussed, and experiments involving strong-field lasers are also considered in this context. C1 Univ London Imperial Coll Sci Technol & Med, Blackett Lab, London SW7 2BZ, England. Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel. RP Amusia, MY, Univ London Imperial Coll Sci Technol & Med, Blackett Lab, Prince Consort Rd, London SW7 2BZ, England. 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Prog. Phys. PD JAN PY 2000 VL 63 IS 1 BP 41 EP 70 PG 30 SC Physics, Multidisciplinary GA 282MX UT ISI:000085223600002 ER PT J AU Sakamoto, N Sakai, K Takagi, K TI Layering transition at the free surface of 12CB observed by scanning angle reflectometry SO JOURNAL OF CHEMICAL PHYSICS LA English DT Article ID NEMATIC LIQUID-CRYSTALS; AIR-WATER-INTERFACE; OPTICAL-PROPERTIES; THIN-FILMS; ELLIPSOMETRY; MONOLAYERS; TENSION; SPECTROSCOPY; GROWTH; ORDER AB The free surface of dodecylcyanobiphenyl (12CB) in its isotropic phase was observed by scanning angle reflectometry between 67.8 and 57.8 degrees C, the temperature slightly above the bulk phase transition temperature T-IA. Reflectivities of both P- and S-polarized incident light were measured, and the magnitude of ellipticity coefficient \<(rho)over bar>\ was calculated. \<(rho)over bar>\ proved to have a steplike dependence on temperature. It suggests the quantized nature of layering, which has already been observed by x-ray reflectivity and ellipsometry studies. As temperature approaches T-IA, two discrete transitions corresponding to the formation of a single additional layer were observed. On the other hand, refractive index of the sample liquid also measured at the above temperature range showed no such unusual temperature dependence. Thickness l of a single layer is estimated to be 3.42 nm by use of formulas based on geometrical optics together with some assumptions for the anisotropic optical properties of the molecule. Expressions for various reflectivities of light incident to the interface are briefly reviewed and comparison is made between ellipsometry and reflectometry. (C) 2000 American Institute of Physics. [S0021-9606(00)70802-6]. C1 Univ Tokyo, Inst Ind Sci, Dept 1, Minato Ku, Tokyo 1068558, Japan. RP Sakamoto, N, Univ Tokyo, Inst Ind Sci, Dept 1, Minato Ku, 7-22-1 Roppongi, Tokyo 1068558, Japan. CR ABELES F, 1976, THIN SOLID FILMS, V34, P291 AYOUB GT, 1978, J OPT SOC AM, V68, P978 BEAGLEHOLE D, 1980, PHYSICA B, V100, P163 BEAGLEHOLE D, 1982, MOLEC CRYSTALS LIQ C, V89, P319 BEAGLEHOLE D, 1983, J PHYS-PARIS, V44, P147 BERGE B, 1993, EUROPHYS LETT, V21, P773 BORN M, 1964, PRINCIPLES OPTICS CASSON BD, 1997, LANGMUIR, V13, P5465 CHARRON JR, 1996, J PHYS CHEM-US, V100, P3179 DAVIES M, 1976, J CHEM SOC FARAD T 2, V72, P1447 DIGNAM MJ, 1971, T FARADAY SOC, V67, P3306 DRUDE P, 1925, THEORY OPTICS DUCHARME D, 1987, REV SCI INSTRUM, V58, P571 GANNON MGJ, 1978, PHILOS MAG A, V37, P117 HOSODA M, 1996, REV SCI INSTRUM, V67, P4224 IMMERSCHITT S, 1992, J CHEM PHYS, V96, P6249 KARAT PP, 1976, MOL CRYST LIQ CRYST, V36, P51 KASTEN H, 1995, J CHEM PHYS, V103, P6768 KORJENEVSKY VA, 1993, LIQ CRYST, V15, P643 KRISHNASWAMY S, 1976, MOL CRYST LIQUID CRY, V35, P253 KRISHNASWAMY S, 1977, MOL CRYST LIQ CRYST, V38, P353 LANGEVIN D, 1983, J PHYS-PARIS, V44, P155 LUCHT R, 1998, J CHEM PHYS, V108, P3716 MARTINEZRATON Y, 1998, J CHEM PHYS, V108, P2583 OCKO BM, 1986, PHYS REV LETT, V57, P94 OCKO BM, 1990, PHYS REV LETT, V64, P2160 PFOHL T, 1998, LANGMUIR, V14, P5285 SAKAI K, 1991, REV SCI INSTRUM, V62, P1192 SAKAMOTO N, 1997, PHYS REV E, V56, P1838 NR 29 TC 1 PU AMER INST PHYSICS PI WOODBURY PA CIRCULATION FULFILLMENT DIV, 500 SUNNYSIDE BLVD, WOODBURY, NY 11797-2999 USA SN 0021-9606 J9 J CHEM PHYS JI J. Chem. Phys. PD JAN 8 PY 2000 VL 112 IS 2 BP 946 EP 953 PG 8 SC Physics, Atomic, Molecular & Chemical GA 269ZB UT ISI:000084507000051 ER PT J AU Hasegawa, T Myrzakozha, DA Imae, T Nishijo, J Ozaki, Y TI Thermal property of an octadecyldimethylamine oxide multilayer Langmuir-Blodgett film studied by an expanded model for quantitative molecular orientation analysis with infrared reflection-absorption spectrometry SO JOURNAL OF PHYSICAL CHEMISTRY B LA English DT Article ID AIR-WATER-INTERFACE; ACID; SPECTROSCOPY; MICROSCOPY; AMPHIPHILE; MONOLAYERS AB The thermal property of octadecyldimethylamine oxide (C(18)DAO) multilayer Langmuir-Blodgett (LB) film was investigated by infrared reflection-absorption (IRRA) spectrometry and two techniques of molecular orientation analysis. A conventional estimation theory of molecular orientation is expanded in the present study so that the first layer of the LB film that shows thermal properties significantly different from other layers is discussed separately. The results by the conventional analytical technique suggest that the multilayer LB film is thermally disordered at 50 degrees C and melts at 60 degrees C. The new technique, on the other hand, suggests that only the first layer of the LB film is greatly disordered between 50 and 60 degrees C, prior to the entire melting above 60 degrees C. The newly proposed technique gives insight into the structure of a LB film that is not uniform in structure that depends on thickness. The differing of thermal properties of the first and the rest of the layers revealed by the new method suggests that the headgroup of C(18)DAO has a uniquely strong interaction potential with,the gold surface, probably due to its strong dipole. C1 Kwansei Gakuin Univ, Sch Sci, Nishinomiya, Hyogo 6628501, Japan. Nagoya Univ, Res Ctr Mat Sci, Chikusa Ku, Nagoya, Aichi 4648602, Japan. Kobe Pharmaceut Univ, Higashinada Ku, Kobe, Hyogo 6588558, Japan. RP Hasegawa, T, Kobe Pharmaceut Univ, Higashinada Ku, Kobe, Hyogo 6588558, Japan. 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Phys. Chem. B PD DEC 16 PY 1999 VL 103 IS 50 BP 11124 EP 11128 PG 5 SC Chemistry, Physical GA 268PJ UT ISI:000084424500020 ER PT J AU Pinto, F TI Engine cycle of an optically controlled vacuum energy transducer SO PHYSICAL REVIEW B LA English DT Review ID KALUZA-KLEIN THEORIES; VANDERWAALS FORCES; CASIMIR ENERGY; DIELECTRIC FUNCTIONS; ANALYTIC REPRESENTATIONS; CARRIER RECOMBINATION; RADIATIVE CORRECTION; MACROSCOPIC BODIES; LIFSHITZ THEORY; DOPED SILICON AB An idealized system composed of two parallel, semiconducting boundaries separated by an empty gap of variable width is considered. A gedanken experiment is discussed to show that, in general, the total work done by the Casimir force along a closed path that includes appropriate transformations does not vanish. It is shown that, in the limit of an engine cycle bringing the two boundaries to a relatively small distance, positive net exchange of energy associated with the Casimir force field could quite possibly be achieved. Viable technological implementations of this idealized system are analyzed in some quantitative detail, in particular, in the case of doped and undoped c-Si boundaries. For the purpose of direct experimentation, measurements with both macroscopic and microelectromechanical de vices are suggested. A full theoretical and experimental study of systems of this kind on every scale will greatly contribute to a much deeper understanding of the nature of the Casimir force and associated concepts, including the possible manipulation of semiconducting nanostructures and the noninvasive optical characterization of semiconducting samples. In the event of no other alternative explanations, one should conclude that major technological advances in the area of endless, by-product free-energy production could be achieved. [S0163-1829(99)05345-X]. C1 CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA. RP Pinto, F, InterStellar Technol Corp, 639 W Foothill Blvd, Monrovia, CA 91016 USA. 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V61, P1 WILLARDSON RK, 1967, SEMICONDUCTORS SEMIM, V3 YAM P, 1997, SCI AM, V277, P82 ZEMANSKI MW, 1968, HEAT THERMODYNAMICS NR 151 TC 10 PU AMERICAN PHYSICAL SOC PI COLLEGE PK PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA SN 0163-1829 J9 PHYS REV B JI Phys. Rev. B PD DEC 1 PY 1999 VL 60 IS 21 BP 14740 EP 14755 PG 16 SC Physics, Condensed Matter GA 263TQ UT ISI:000084141700054 ER PT J AU de Hoog, EHA Lekkerkerker, HNW Schulz, J Findenegg, GH TI Ellipsometric study of the liquid/liquid interface in a phase-separated colloid-polymer suspension SO JOURNAL OF PHYSICAL CHEMISTRY B LA English DT Article ID MIXTURES; BEHAVIOR AB An investigation of the interface in a phase-separated colloid-polymer suspension with ellipsometry is presented. The coefficient of ellipticity at the Brewster angle of light reflected at the interface between the coexisting colloid-rich and polymer-rich phase was measured along two trajectories through the phase diagram. Interpreting the data in terms of a diffuse interface model, an interfacial thickness in the order of the diameter of the colloidal particles is found. C1 Univ Utrecht, Vant Hoff Lab Phys & Colloid Chem, NL-3584 CH Utrecht, Netherlands. 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B PD DEC 2 PY 1999 VL 103 IS 48 BP 10657 EP 10660 PG 4 SC Chemistry, Physical GA 263EZ UT ISI:000084113300016 ER PT J AU Gensch, T Viappiani, C Braslavsky, SE TI Structural volume changes upon photoexcitation of porphyrins: Role of the nitrogen - Water interactions SO JOURNAL OF THE AMERICAN CHEMICAL SOCIETY LA English DT Article ID RESOLVED PHOTOACOUSTIC CALORIMETRY; INDUCED OPTOACOUSTIC SPECTROSCOPY; RESONANCE RAMAN-SPECTROSCOPY; EXCITED SINGLET-STATE; ELECTRON-TRANSFER; AQUEOUS-SOLUTIONS; MOLECULAR-OXYGEN; SOLUBLE PORPHYRINS; ACCEPTOR COMPOUND; ENTHALPY CHANGES AB The molecular structural volume change (as determined by laser-induced optoacoustics), Delta V-R similar to-18 Angstrom(3), accompanying triplet state formation of free base 5,10,15,20-tetrakis-(4-sulfonatophenyl)-porphine (TSPP4-) in aqueous solutions of pH > 5.5, was markedly decreased to -5 Angstrom(3) for the dimer, to -3.5 Angstrom(3) for ZnTSPP2- and to -4 Angstrom(3) for the nonionic micelle-included free base tetraphenyl porphyrin. For the free bases of other meso-substituted porphyrins with cationic side-groups such as 5,10, 15,20-tetrakis-(4-methylaminophenyl)-porphine (TMAPP(4+)) and 5,10,15,20-tetrakis-(4-methylpyridyl)-porphine, similar large contractions as for monomeric TSPP4- were determined upon tripler formation, that decreased also on lowering pH to similar to-5 Angstrom(3) for H2TSPP2- (pH 4) and to similar to-4 Angstrom(3) for H(2)TMAPP(6+) (pH 2.2). The tripler state quantum yield was not markedly affected by pH changes, oligomerization (mostly as a dimer), or complexation. The value of pK(a) = 5.1-5.2 derived from the titration of Delta V-R for formation (and decay) of triplet TSPP4- is identical to that for the equilibrium of free base and monoprotonated forms, derived from fittings of the pH-dependent absorption and fluorescence data. For TMAPP(4+) the pK(a) = 3.5 from titration of the contraction (triplet formation) coincided with that for the transition mono-/diprotonated species, whereas upon tripler decay the expansion showed a pK(a) = 4.0 similar to the value for monoprotonated/free-base equilibrium. The contraction upon triplet formation in the free base porphyrins mainly originates in the rearrangement of water around the excited macrocycle nitrogen atoms and to a minor extent in a contraction due to bonds shortening upon excitation. The contribution of the chromophore-solvent interactions is thus reduced upon impairment of hydrogen bridges between the nitrogen lone electron pairs and water by dimer formation, metal complexation, and protonation. C1 Max Planck Inst Strahlenchem, D-45413 Mulheim, Germany. Univ Parma, Dipartimento Fis, I-43100 Parma, Italy. INFM, I-43100 Parma, Italy. RP Braslavsky, SE, Max Planck Inst Strahlenchem, Postfach 101365, D-45413 Mulheim, Germany. 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Am. Chem. Soc. PD NOV 17 PY 1999 VL 121 IS 45 BP 10573 EP 10582 PG 10 SC Chemistry, Multidisciplinary GA 258UP UT ISI:000083857800015 ER PT J AU Hufner, S Claessen, R Reinert, F Straub, T Strocov, VN Steiner, P TI Photoemission spectroscopy in metals: band structure-Fermi surface-spectral function SO JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA LA English DT Article DE photoemission; band structure; Fermi surface; many-body effects ID ANGLE-RESOLVED PHOTOEMISSION; ENERGY ELECTRON-DIFFRACTION; QUASI-PARTICLE LIFETIMES; REFERENCE COMPOUND TITE2; ONE-DIMENSIONAL METALS; EXCITED-STATE BANDS; TEMPERATURE-DEPENDENCE; LIQUID BEHAVIOR; VACUUM LEVEL; CU AB Angular resolved photoelectron spectroscopy plays a key role in the study of the electronic structure of solids. We discuss recent methodical developments in its application to metallic systems. These include a new procedure for absolute E(k) band structure determination, which allows complete control of the three-dimensional wave-vector k, as well as a method for Fermi surface mapping based on measurements of the angular photoelectron intensity distribution. Going beyond a simple one-electron picture, we examine under which conditions the photoemission signal can be interpreted in terms of the electron removal spectrum of an interacting electron system and discuss an experimental test on a suitable Fermi liquid metal, which supports this many-body interpretation. (C) 1999 Elsevier Science B.V. All rights reserved. C1 Univ Saarlandes, Fachbereich Phys, D-66123 Saarbrucken, Germany. Univ Gothenburg, SE-41296 Gothenburg, Sweden. Chalmers Univ Phys, Dept Phys, SE-41296 Gothenburg, Sweden. RP Claessen, R, Univ Augsburg, D-86135 Augsburg, Germany. 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Electron Spectrosc. Relat. Phenom. PD OCT PY 1999 VL 100 SI Sp. Iss. SI BP 191 EP 213 PG 23 SC Spectroscopy GA 251JM UT ISI:000083442300012 ER PT J AU Bose, A Totlani, MK TI Ellipsometric and electrochemical studies of the surface films on AISI 304 SS in acidic KCNS solution SO INDIAN JOURNAL OF ENGINEERING AND MATERIALS SCIENCES LA English DT Article ID PRIOR COLD WORK; STAINLESS-STEEL; PASSIVE FILMS; FE-CR; SENSITIZATION; ALLOYS AB Surface films formed on solution annealed and sensitised AISI 304 SS in 0.5 M H2SO4 solution in the absence and presence of 0.01 M KCNS have been evaluated for their refractive index and thickness using ellipsometry. The results are correlated to the protectiveness of the surface films formed in this environment, as determined by electrochemical potentio-kinectic reactivation (EPR) tests. It has been observed that surface films (189-363 Angstrom thick) formed on the sensitised AISI 304 SS in the acidic solution without and with KCNS are non-protective, whereas those formed on the solution annealed SS (123-134 Angstrom) in the same environment are protective in nature. C1 Bhabha Atom Res Ctr, Surface Engn Sect, Mat Proc Div, Bombay 400085, Maharashtra, India. RP Bose, A, Bhabha Atom Res Ctr, Surface Engn Sect, Mat Proc Div, Bombay 400085, Maharashtra, India. 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Eng. Mat. Sci. PD AUG PY 1999 VL 6 IS 4 BP 213 EP 218 PG 6 SC Engineering, Multidisciplinary; Materials Science, Multidisciplinary GA 240GA UT ISI:000082816500006 ER PT J AU Shafranov, MD TI E. Lommel and Lambert law of photometry SO OPTIK LA English DT Article AB The Lambert law is describing the isotropic source radiation. For usual sources this law is fulfilled only approximately. But it is strictly fulfilled for the absolute black body and radiation of absolutely mat surfaces. The German physicist E. Lommel, who contributed much to the studies of fluorescence, derived an equation of light spreading in the media and indicated the conditions under which his equations turned to the Lambert law. C1 Joint Inst Nucl Res, Dubna 141980, Russia. RP Shafranov, MD, Joint Inst Nucl Res, Dubna 141980, Russia. 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Optical constants of electrochromic materials change upon ion intercalation, usually with H+ or Li+. Of primary concern for device design are the optical constants in both the intercalated and deintercalated states. In situ and ex situ ellipsometric data are used to characterize both the deposition process and the optical constants of the films. Ex situ data from a UV-Vis-NIR ellipsometer are combined with data from a mid-infrared Fourier-transform-infrared-based ellipsometer to provide optical constants over a spectral range of 0.031-6.1 eV. (C) 1999 American Vacuum Society. [S0734-2101(99)04905-2]. C1 Univ Nebraska, Ctr Microelect & Opt Mat Res, Lincoln, NE 68588 USA. Univ Nebraska, Dept Elect Engn, Lincoln, NE 68588 USA. JA Woollam Co Inc, Lincoln, NE 68508 USA. RP DeVries, MJ, Univ Nebraska, Ctr Microelect & Opt Mat Res, Lincoln, NE 68588 USA. 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Vac. Sci. Technol. A-Vac. Surf. Films PD SEP-OCT PY 1999 VL 17 IS 5 BP 2906 EP 2910 PG 5 SC Materials Science, Coatings & Films; Physics, Applied GA 236JN UT ISI:000082596600072 ER PT J AU Ohlidal, I Franta, D Pincik, E Ohlidal, M TI Complete optical characterization of the SiO2/Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy SO SURFACE AND INTERFACE ANALYSIS LA English DT Article DE optical constants of Si and SiO2; spectroscopic reflectometry; spectroscopic ellipsometry ID CONSTANTS; PARAMETERS; SILICON; SI AB In this paper results concerning optical analysis of the SiO2/Si system performed by the combined ellipsometric and reflectometric method used in multiple-sample modification will be presented, This method is based on combining both the single-wavelength method and the dispersion method. Three models of the system mentioned, i.e. the model of the substrate and the layer with the smooth boundaries, the same model with a transition layer and the model of the substrate and the layer with rough boundaries, will be used to interpret the experimental data. The spectral dependences of the optical constants of silicon and SiO2 with the values of the other parameters will be determined. It will be shown that the simplest model with the smooth boundary is the most convenient,vith the experimental data. Copyright (C) 1939 John Wiley & Sons, Ltd. C1 Masaryk Univ, Fac Sci, Dept Solid State Phys, CS-61137 Brno, Czech Republic. Masaryk Univ, Fac Sci, Dept Phys Elect, CS-61137 Brno, Czech Republic. Slovak Acad Sci, Inst Phys, Bratislava 84228, Slovakia. Tech Univ, Fac Engn, Inst Engn Phys, Brno 61669, Czech Republic. RP Ohlidal, I, Masaryk Univ, Fac Sci, Dept Solid State Phys, Kotlarska 2, CS-61137 Brno, Czech Republic. 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PD AUG PY 1999 VL 28 IS 1 BP 240 EP 244 PG 5 SC Chemistry, Physical GA 234JZ UT ISI:000082482200053 ER PT J AU Oldano, C Becchi, M TI Natural optical activity and liquid crystals SO PRAMANA-JOURNAL OF PHYSICS LA English DT Article DE optical activity; chiral liquid crystals; homogeneous models ID ANISOTROPIC DIELECTRIC GRATINGS; MEDIA AB Optical activity of matter is related to the chirality of its constitutive molecules. In liquid crystals, chiral molecules can give rise to superstructures in which the local dielectric tensor rotates in space describing a helix, a fact which greatly enhances the optical activity of the medium. The structures and the optical properties of some helical phases are well-known, as for instance the cholesteric and some chiral smectic phases. For short enough helix pitches, the periodic medium can be considered optically as homogeneous and described by the same constitutive equations used to define the optical properties of solid crystals. Such liquid crystal phases represent an ideal tool to apply the methods, used since a long time in optics, to define homogeneous models for non homogeneous media and to discuss their limits of validity. A brief account is given of the main results recently found in this research area. C1 Politecn Turin, Dipartimento Fis, I-10129 Turin, Italy. Politecn Turin, INFM, I-10129 Turin, Italy. RP Oldano, C, Politecn Turin, Dipartimento Fis, Corso Duca Abruzzi 24, I-10129 Turin, Italy. 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Phys. PD JUL PY 1999 VL 53 IS 1 BP 131 EP 143 PG 13 SC Physics, Multidisciplinary GA 230GA UT ISI:000082242400011 ER PT J AU Mahurin, SM Compton, RN Zare, RN TI Demonstration of optical rotatory dispersion of sucrose SO JOURNAL OF CHEMICAL EDUCATION LA English DT Article C1 Univ Tennessee, Dept Phys, Knoxville, TN 37996 USA. Univ Tennessee, Dept Chem, Knoxville, TN 37996 USA. Stanford Univ, Dept Chem, Stanford, CA 94305 USA. RP Mahurin, SM, Univ Tennessee, Dept Phys, Knoxville, TN 37996 USA. 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PD SEP PY 1999 VL 76 IS 9 BP 1234 EP 1236 PG 3 SC Chemistry, Multidisciplinary; Education, Scientific Disciplines GA 228RK UT ISI:000082149300024 ER PT J AU Kojevnikov, A TI Freedom, collectivism, and quasiparticles: Social metaphors in quantum physics SO HISTORICAL STUDIES IN THE PHYSICAL AND BIOLOGICAL SCIENCES LA English DT Review C1 Ctr Hist Phys, Amer Inst Phys, College Pk, MD 20740 USA. RP Kojevnikov, A, Ctr Hist Phys, Amer Inst Phys, College Pk, MD 20740 USA. 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Stud. Phys. Biol. Sci. PY 1999 VL 29 PN Part 2 BP 295 EP 331 PG 37 SC History & Philosophy Of Science; History & Philosophy Of Science; History & Philosophy of Science GA 228JL UT ISI:000082133300002 ER PT J AU Sokolov, IM Blumen, A Klafter, J TI Drude approach to anomalous diffusion: Application to Richardson dispersion in turbulent flows SO EUROPHYSICS LETTERS LA English DT Article ID ENHANCED DIFFUSION; SCALE AB We investigate two-particle dispersion in fully developed turbulence within a Levy-walk stochastic model using a generalized Drude approach. Different from one-particle pictures we focus here on the time evolution of the relative distance between two particles. Based on the Kolmogorov-Obukhov energy spectrum and on the temporal correlations in the flow the Richardson t(3)-law follows as a Levy-type enhancement of rare events. C1 Univ Freiburg, D-79104 Freiburg, Germany. RP Sokolov, IM, Univ Freiburg, Hermann Herder Str 3, D-79104 Freiburg, Germany. CR BARKAI E, 1998, CHAOS KINETICS NONLI, P373 BATCHELOR GK, 1950, QUART J ROY MET SOC, V76, P133 DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 EFFINGER H, 1990, ANN PHYS-LEIPZIG, V47, P577 ELLIOTT FW, 1996, PHYS FLUIDS, V8, P1052 FUNG JCH, 1998, PHYS REV E A, V57, P1677 GAGNE Y, 1994, J PHYS II, V4, P1 GROSSMANN S, 1997, Z PHYS B CON MAT, V103, P469 HANSEN AE, 1997, PHYS REV LETT, V79, P1845 HANSEN AE, 1998, PHYS REV E A, V58, P7261 JIANG D, 1983, PHYS REV A, V27, P1266 JULLIEN MC, 1999, PHYS REV LETT, V82, P2872 KLAFTER J, 1993, PHYSICA A, V196, P102 LANDAU LD, 1987, FLUID MECH RICHARDSON LF, 1926, P R SOC LOND A-CONTA, V110, P709 SCHULZBALDES H, 1997, PHYS REV LETT, V78, P2176 SHLESINGER MF, 1987, PHYS REV LETT, V58, P1100 SOKOLOV IM, 1999, PHYS REV E B, V59, P5412 SOLOMON TH, 1993, PHYS REV LETT, V71, P3975 TABELING P, 1998, CHAOS KINETICS NONLI VIECELLI JA, 1998, J ATMOS SCI, V55, P677 ZUMOFEN G, 1993, PHYS REV E, V47, P851 NR 22 TC 12 PU E D P SCIENCES PI LES ULIS CEDEXA PA 7, AVE DU HOGGAR, PARC D ACTIVITES COURTABOEUF, BP 112, F-91944 LES ULIS CEDEXA, FRANCE SN 0295-5075 J9 EUROPHYS LETT JI Europhys. Lett. PD JUL PY 1999 VL 47 IS 2 BP 152 EP 157 PG 6 SC Physics, Multidisciplinary GA 223KU UT ISI:000081840900003 ER PT J AU Beam, DA Yeh, NC Vasquez, RP TI Vortex-state complex Hall conductivity of superconducting YBa2Cu3O7-delta epitaxial films at radio frequencies SO PHYSICAL REVIEW B LA English DT Article ID HIGH-TEMPERATURE SUPERCONDUCTORS; QUASI-PARTICLE SCATTERING; T-C SUPERCONDUCTORS; SINGLE-CRYSTALS; TRANSPORT-PROPERTIES; II SUPERCONDUCTORS; DYNAMICS; BI2SR2CACU2O8+DELTA; UNIVERSALITY; PSEUDOGAP AB The vortex-state complex Hall conductivity (sigma(xy)) of superconducting YBa2Cu3O7 epitaxial films is investigated from de to radio frequencies (up to7 x 10(6)Hz), using a direct transport measurement technique. The experimental results are analyzed in terms of a model generalized from that for the de Hall conductivity. This generalized model assumes that (1) the occurrence of sign revers;cll in the de vortex-state Hall conductivity is the result of different carrier densities within and Ear away from the vortex core; (2) the Drude approximation is applicable; and (3) the anomalous sign reversal occurs in the Aux-flow limit. We. find that the temperature and frequency dependencies of our compiler Hall conductivity data are in good agreement with our phenomenological model. In addition, when extended to higher frequencies, the same model provides consistent description for the complex Hall conductivity data at 100-800 GHz. Moreover, the magnetic-field (B) dependence of the complex Hall conductivity data reveals that both vortices (sigma(xy)(upsilon)) and quasiparticles (sigma(xy)(q)) contribute to the vortex-state Hall conduction, where sigma(xy)(upsilon)proportional to B-1 and sigma(xy)(q)proportional to B, in agreement with the model. The magnitude of the real part, sigma(xy)', is also consistent with the theoretical estimate, while the magnitude of the imaginary part, sigma(xy)" is significantly larger than the theoretical prediction, This discrepancy may be attributed to the unconventional electronic structures in vortices of cuprate: superconductors with d-wave or mixed-pairing symmetries. [S0163-1829(99)05225-X]. C1 CALTECH, Dept Phys, Pasadena, CA 91125 USA. CALTECH, Jet Prop Lab, Ctr Space Microelect Technol, Pasadena, CA 91109 USA. RP Yeh, NC, CALTECH, Dept Phys, Pasadena, CA 91125 USA. 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Rev. B PD JUL 1 PY 1999 VL 60 IS 1 BP 601 EP 609 PG 9 SC Physics, Condensed Matter GA 218KE UT ISI:000081551100084 ER PT J AU Carcelli, M Pelagatti, P Viappiani, C TI Determination of the pK(a) of the aci-nitro intermediate in o-nitrobenzyl systems SO ISRAEL JOURNAL OF CHEMISTRY LA English DT Article ID STATE PROTON-TRANSFER; RESOLVED PHOTOACOUSTIC CALORIMETRY; REACTION VOLUME; CAGED COMPOUNDS; PHOTOCHEMISTRY; NITROBENZALDEHYDE; PHOTOLYSIS; ABSORPTION; ENERGETICS; DYNAMICS AB The structural volume changes following photoexcitation of o-nitrobenzyl systems are used to estimate the excited state pK(a) of the aci-nitro intermediate in aqueous solutions. The rather large contractions induced in solution by UV excitation are due to the rapid deprotonation of the shea-lived aci-nitro intermediate, which leads to the formation of two charged species. The magnitude of the measured contraction as a function of the pH in acidic solutions follows a sigmoidal curve, from which it is possible to extract the pK(a) of the aci-nitro intermediate. This method is generally applicable to short-lived intermediates with stronger acid character than the parent compound, provided they undergo irreversible chemical transformations to a produce that cannot rebind the photodetached proton. The reaction volume for water formation from its ionic constituents at basic pH allows the determination of the deprotonation quantum yields. C1 Univ Parma, Dipartimento Fis, I-43100 Parma, Italy. Ist Nazl Fis Mat, I-43100 Parma, Italy. Univ Parma, Dipartimento Chim Gen & Inorgan Chim Analit Chim, I-43100 Parma, Italy. RP Viappiani, C, Univ Parma, Dipartimento Fis, Viale Sci, I-43100 Parma, Italy. 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J. Chem. PY 1998 VL 38 IS 3 BP 213 EP 221 PG 9 SC Chemistry, Multidisciplinary GA 218TF UT ISI:000081567200009 ER PT J AU Ravindran, P Delin, A James, P Johansson, B Wills, JM Ahuja, R Eriksson, O TI Magnetic, optical, and magneto-optical properties of MnX (X=As, Sb, or Bi) from full-potential calculations SO PHYSICAL REVIEW B LA English DT Article ID ELECTRIC-FIELD GRADIENTS; FIRST-PRINCIPLES; MAGNETOCRYSTALLINE ANISOTROPY; 1ST-PRINCIPLES CALCULATION; HYPERFINE FIELDS; HEUSLER ALLOYS; BAND-STRUCTURE; MNBIAL FILMS; MNSB; SYSTEMS AB The magneto-optic (MO) Kerr and Faraday spectra for manganese pnictides are calculated using the all electron, relativistic, full-potential linear muffin-tin orbital method. The amplitude of our calculated spectra are found to be in good agreement with corresponding experimental spectra. Although the MO property is a rather complicated function of the diagonal and off-diagonal elements of the optical conductivity tenor, present theory nevertheless provides very practical insight about its origin in these compounds. The largest Kerr effect observed in MnBi can be understood as a combined effect of maximal exchange splitting of Mn 3d states and the nearly maximal spin-orbit (s-o) coupling of Bi. The frequency-dependent optical properties, namely reflectivity, absorption coefficient, electron-energy-loss spectra, refractive index, extinction coefficient are given. From our calculations (including spin-orbit coupling and orbital polarization) the site-projected spin and orbital moments are also obtained and compared to the available experimental values and a good agreement is found. The magnetic anisotropy energy is calculated with a minimal number of approximations for the three systems. A disagreement between theory and experiment is found. Using the generalized gradient corrected full-potential Linear augmented plane-wave method we have calculated the unscreened plasma frequencies and the hyperfine parameters such as electric-field gradient as well as the hyperfine field. [S0163-1829(99)01419-8]. C1 Univ Uppsala, Dept Phys, Condensed Matter Theory Grp, S-75121 Uppsala, Sweden. Univ Calif Los Alamos Natl Lab, Div Theoret, Los Alamos, NM 87545 USA. RP Ravindran, P, Univ Uppsala, Dept Phys, Condensed Matter Theory Grp, Box 530, S-75121 Uppsala, Sweden. 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Rev. B PD JUN 15 PY 1999 VL 59 IS 24 BP 15680 EP 15693 PG 14 SC Physics, Condensed Matter GA 210ZD UT ISI:000081134700018 ER PT J AU Toca-Herrera, JL Muller, HJ Krustev, R Pfohl, T Mohwald, H TI Influence of ethanol on the thickness and free energy of film formation of DMPC foam films SO COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS LA English DT Article DE foam film thickness; free energy of film formation; hydration forces; DMPC; ethanol ID THIN LIQUID-FILMS; INTERACTION FORCES; PHOSPHATIDYLCHOLINE; TRANSITIONS; BILAYERS; WATER AB Foam films prepared from 1,2-dimirystoil-sn-glycero-3-phosphorylcholine (DMPC) dispersions in water-ethanol mixtures were investigated. Their thickness and contact angle (foam film/meniscus) were measured. Experimental results show that an increase of EtOH concentration in the him forming dispersions leads to a decrease in the film thickness. At EtOH concentrations above 40% v/v the foam films have a bilayer structure without any noticeable core of solvent. The film thickness remains constant with the further increasing of the EtOH concentration up until 50% v/v. This behaviour is corroborated by the strong increase in the contact angles (a decrease in the free energy of him formation) with increasing EtOH concentration. Ellipsometric measurements on the thickness of adsorbed DMPC monolayers and surface pressure isotherms of DMPC spread on the water-ethanol subphases show that the effective area per lipid molecule decreases, resulting in a larger monolayer thickness, when the EtOH concentration in the subphase is increased. An increase of the EtOH concentration leads to a dehydration of the DMPC molecules and a reduction in strength and range of the repulsive hydration force between the film monolayers. The film thickness and the free energy of film formation are governed by the balance of the van der Waals attraction and the repulsive hydration force between the foam him surfaces. (C) 1999 Elsevier Science B.V. All rights reserved. C1 Max Planck Inst Kolloid & Grenzflachenforsch, D-12489 Berlin, Germany. Univ Sofia, Dept Chem Phys, BU-1126 Sofia, Bulgaria. RP Muller, HJ, Max Planck Inst Kolloid & Grenzflachenforsch, Rudower Chaussee 5, D-12489 Berlin, Germany. 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A-Physicochem. Eng. Asp. PD JUL 31 PY 1999 VL 152 IS 3 BP 357 EP 365 PG 9 SC Chemistry, Physical GA 210QU UT ISI:000081116800013 ER PT J AU Jungk, G Jahne, E TI Optical properties of film-substrate systems with an anisotropic, spatially varying dielectric function of the surface layer SO THIN SOLID FILMS LA English DT Article DE optical properties; semiconductors; surface state; interface state; reflection spectroscopy; ellipsometry ID SPECTROSCOPY; ELLIPSOMETRY; SPECTRA; GAAS AB The optical properties of a film-substrate system with a non-abrupt interface are studied solving Maxwell's equations. The resulting relations include the transverse and longitudinal response both local but spatially varying. They involve the differences between the dielectric functions of the film and the adjacent isotropic bulk medium as integrals. The equations are used for a discussion of the experimental methods: reflectivity, ellipsometry, absorptivity, reflectance difference spectroscopy and spectroscopic difference ellipsometry. As an actual example the limits for the thickness determination of ultrathin SiO2-films on Si from ellipsometric data are pointed out. (C) 1999 Elsevier Science S.A. All rights reserved. C1 Paul Drude Inst Solid State Elect, D-10117 Berlin, Germany. RP Jungk, G, Paul Drude Inst Solid State Elect, Hausvogteipl 5-7, D-10117 Berlin, Germany. CR APELL P, 1985, PHYS SCRIPTA, V32, P408 ASPNES DE, 1973, J OPT SOC AM, V63, P1380 ASPNES DE, 1983, PHYS REV B, V27, P985 ASPNES DE, 1997, SOLID STATE COMMUN, V101, P85 BAGCHI A, 1979, PHYS REV B, V20, P4824 DASGUPTA BB, 1981, PHYS REV B, V23, P3710 DELSOLE R, 1995, PHOTONIC PROBES SURF DREVILLON B, 1994, PHYSICS THIN FILMS, V19 DRUDE P, 1902, THEORIE OPTIK FEIBELMAN PJ, 1982, PROG SURF SCI, V12, P287 HINGERL K, 1993, SURF SCI, V287, P686 JAHNE E, 1996, PHYS STATUS SOLIDI B, V194, P279 JUNGK G, 1993, THIN SOLID FILMS, V234, P428 JUNGK G, 1994, PHILOS MAG B, V70, P493 JUNGK G, 1997, PHYS STATUS SOLIDI B, V199, P605 JUNGK G, 1998, THIN SOLID FILMS, V335 KISEL VA, 1973, REFLECTION LIGHT KLIEWER KL, 1980, SURF SCI, V101, P57 LANGRETH DC, 1989, PHYS REV B, V39, P10020 LEKNER J, 1987, THEORIES REFLECTION MAYER H, 1950, PHYSIK DUNNER SCHICH MCINTYRE JD, 1971, SURF SCI, V24, P417 OLMSTEAD MA, 1987, SURF SCI REP, V6, P159 PASQUARELLO A, 1996, APPL PHYS LETT, V68, P625 PLIETH WJ, 1977, SURF SCI, V64, P484 RASHBA EI, 1996, J APPL PHYS 1, V79, P4306 ROSSOW U, 1996, OPTICAL CHARACTERIZA UWAI K, 1997, PHYS REV LETT, V78, P959 WANG YB, 1997, J APPL PHYS, V82, P5868 WASSERMEIER M, 1996, PHYS REV B, V53, P13542 NR 30 TC 2 PU ELSEVIER SCIENCE SA PI LAUSANNE PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND SN 0040-6090 J9 THIN SOLID FILMS JI Thin Solid Films PD JUL 6 PY 1999 VL 348 IS 1-2 BP 279 EP 284 PG 6 SC Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter GA 208YH UT ISI:000081019700045 ER PT J AU Petrov, JG Pfohl, T Mohwald, H TI Ellipsometric chain length dependence of fatty acid Langmuir monolayers. A heads-and-tails model SO JOURNAL OF PHYSICAL CHEMISTRY B LA English DT Article ID AIR-WATER-INTERFACE; X-RAY-DIFFRACTION; ARACHIDIC ACID; REFLECTION; FILMS AB Langmuir monolayers of even n-fatty acids with increasing number N of carbon atoms in the hydrocarbon chain (N = 11-23) were investigated on 1 x 10(-2) M HCl aqueous subsolutions by means of Brewster angle ellipsometry. Isotherms, relating the coefficient of ellipticity Delta rho to the area per molecule F, were continuously recorded and interpreted on the basis of literature phase diagrams and in situ X-ray reflectivity and diffraction investigations. Delta rho/N dependencies for the liquid-expanded (LE), super-liquid or solid (LS/S), and condensed-solid (CS) monolayer phases were extracted from the isotherms at constant areas per molecule. F-LE = 28 +/- 1 A(2), F-LS/S = 19.2 +/- 0.3 A(2), F-CS = 18.5 +/- 0.3 A(2). They show Delta rho-discontinuities at the LE-LS and S-CS transitions but no change at the LS-S transition. The experimental ap/N data for the solid condensed monolayer were compared with calculated Delta rho/N dependencies using the "one-layer" ellipsometric model with bulk isotropic or theoretical anisotropic n/N data. A very good agreement of d Delta rho(exp)/dN, with the slope of the calculated "isotropic" dependence, and a significant difference from the "anisotropic" slope was observed. The calculated "isotropic" Delta rho/N dependence was shifted to higher Delta rho-values probably due to a different hydration state of the carboxyl groups in the bulk solid phase and Langmuir monolayer. The "one-layer" model was also used in the alternative calculation of the isotropic refractive indices of the LE, LS-S, and CS phases from our Delta rho/N data. The obtained n/N dependencies were compared with bulk n/N data for n-fatty acids and n-alkanes which differ only by a terminal COOH group. No agreement was found between bulk and monolayer values. A similarity of the trends was observed for the RCOOH system; both the bulk and monolayer n/N dependencies show discontinuities at the liquid-solid, as well as the LE-LS, phase transition. In contrast, the n/N dependence of the bulk n-alkanes is smooth for N between 5 and 30. Such a behavior shows that the headgroups contribute specifically to the optical characteristics of Langmuir monolayers. A simple "heads-and-tails" model based on the Lorentz-Lorentz relationship was proposed to relate the ellipsometric signal of the monolayer to the polarizability and thickness of the headgroup and hydrocarbon chain regions and to the optical anisotropy of the latter. Application of this model to our Delta rho/N data under some physical restrictions shows that the anisotropy of the methyl group in closely packed vertical chains is below 3.3% of the isotropic value. The ellipsometric dimension of the monolayer headgroups obtained implies that they have hydration shells approximately one water molecule thick. The model explains the observation reported in the literature(10) that Cd2+ and Pb2+ dissolved in the water substrate shift the ellipsometric chain length dependence to higher Delta rho-values without affecting its slope. This effect seems to be due to the increased polarizability and decreased thickness (partial dehydration) of the headgroup region resulting from Cd2+ and Pb2+ binding to the carboxyl groups. C1 Max Planck Inst Colloids & Interfaces, D-12489 Berlin, Germany. RP Petrov, JG, Max Planck Inst Colloids & Interfaces, Rudower Chaussee 5, D-12489 Berlin, Germany. CR ALLARA DL, 1985, LANGMUIR, V1, P45 BEAGLEHOLE D, 1986, FLUID INTERFACIAL PH, CH11 BEAGLEHOLE D, 1994, PICOMETER ELLIPSOMET BIBO AM, 1990, ADV MATER, V2, P309 DRUDE P, 1891, ANN PHYS, V43, P126 DUCHARME D, 1990, J PHYS CHEM-US, V94, P1925 ENGELSEN DD, 1974, J CHEM SOC FARADAY T, V1, P70 ENGELSEN DD, 1976, SURF SCI, V56, P272 FANG JP, 1996, J COLLOID INTERF SCI, V182, P31 GAINES G, 1966, INSOLUBLE MONOLAYERS, P192 HOFMEISTER E, 1953, Z PHYS, V136, P137 KIM MW, 1990, LANGMUIR, V6, P236 KJAER K, 1989, J PHYS CHEM-US, V93, P3200 KNOBLER CM, 1992, ANNU REV PHYS CHEM, V43, P207 KOBAYASHI K, 1988, THIN SOLID FILMS, V159, P267 LARSSEN K, 1996, HDB LIPID RES, V4, P417 LIDE DR, 1993, CRC HDB CHEM PHYSICS, P10 LUNDQUIST M, 1971, CHEM SCR, V1, P197 PAUDLER M, 1992, LANGMUIR, V8, P184 PETROV JG, 1982, J COLLOID INTERF SCI, V88, P29 POLYMEROPOULOS EE, COMMUNICATION THOMA M, 1996, LANGMUIR, V12, P1822 TIPPMANNKRAYER P, 1991, LANGMUIR, V7, P2303 ULMAN A, 1991, INTRO ULTRATHIN ORGA, P3 WASSERMAN SR, 1989, J AM CHEM SOC, V111, P5852 WOLGAST S, UNPUB NR 26 TC 8 PU AMER CHEMICAL SOC PI WASHINGTON PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA SN 1089-5647 J9 J PHYS CHEM B JI J. Phys. Chem. B PD APR 29 PY 1999 VL 103 IS 17 BP 3417 EP 3424 PG 8 SC Chemistry, Physical GA 192DU UT ISI:000080063700018 ER PT J AU Schmidt, R Shafii, F Hild, M TI The mechanism of the solvent perturbation of the a(1)Delta(g)-> X-3 Sigma(-)(g) radiative transition of O-2 SO JOURNAL OF PHYSICAL CHEMISTRY A LA English DT Article ID SINGLET MOLECULAR-OXYGEN; RATE-CONSTANT; TRIPLET-STATE; INFRARED LUMINESCENCE; ACTIVATION VOLUMES; QUANTUM YIELDS; PHOSPHORESCENCE; O2; O2(1-DELTA-G); SENSITIZATION AB The rate constants k(b-a) and k(a-X) of the b(1)Sigma(g)(+) --> a(1)Delta(g) and a(1)Delta(g) --> X(3)Sigma(g)(-) emissions of O-2 have been determined in liquid CCl4, C2Cl4, and C4Cl6. The ratios k(a-X)/k(b-a) range from 4.4 x 10(-4) (CCl4) to 8 x 10(-4) (C4Cl6). In addition, rate constants k(a-X) have been determined in several solvents and in the binary solvent mixtures H2O/acetone, acetone/C6H6, and CH3OH/CHCl3. k(a-X) depends for H2O/acetone and CH3OWCHC4 in a strongly anomalous way on the bulk polarizability P of the solvent, emonstrating that no general smooth correlation of k(a-X) with P exists. Our results confirm the perturbation model developed by Minaev. According to this model, the collision-enhanced b --> a radiative transition lends intensity to the transition a --> X. Both radiative transitions are bimolecular processes. For the pure solvents, the second-order rate constants k(a-X)(c) correlate roughly with the square of the molar refraction R of the solvent. If the effects of the solvent refractive index, of the collision frequency, and of the dependence of the probability Pa-X of the collision-induced radiative transition per collision on the size of the collider, are removed, a direct and linear proportionality of the transition moment of the collision-induced emission with the collider's molecular polarizability is discovered. For mixtures, k(a-X) is additively composed of the contributions of the individual components. These results explain for the first time consistently and quantitatively the solvent effects on k(a-X). C1 Univ Frankfurt, Inst Phys & Theoret Chem, D-60439 Frankfurt, Germany. RP Schmidt, R, Univ Frankfurt, Inst Phys & Theoret Chem, Marie Curie Str 11, D-60439 Frankfurt, Germany. 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Phys. Chem. A PD APR 15 PY 1999 VL 103 IS 15 BP 2599 EP 2605 PG 7 SC Chemistry, Physical GA 189YH UT ISI:000079933500016 ER PT J AU Losi, A Vecli, A Viappiani, C TI Photoinduced structural volume changes in aqueous solutions of blepharismin SO PHOTOCHEMISTRY AND PHOTOBIOLOGY LA English DT Article ID RESOLVED PHOTOACOUSTIC CALORIMETRY; INDUCED OPTOACOUSTIC SPECTROSCOPY; UP PHOTOPHOBIC RESPONSE; STENTOR-COERULEUS; ACTION SPECTRA; PHOTOSENSORY TRANSDUCTION; ANTIVIRAL AGENT; HYPERICIN; JAPONICUM; FLUORESCENCE AB Employing time-resolved photoacoustics we measured the structural volume changes (Delta V-ri) occurring after photoexcitation of blepharismin (BPR) aqueous solutions; an expansion occurring in the subnanosecond timescale is followed by a back contraction within some hundreds of nanoseconds. The magnitude of the Delta V-ri strongly depends on pH, allowing the determination of the pK(a) of BPR with this method. The values so measured are very close to those found by means of UV-visible absorption spectroscopy. The presence of water-soluble electron accepters or donors (hexacyanoferrate [III] hexacyanoferrate [II]) as well as the concentration of oxygen do not affect the magnitude or the kinetics of the structural volume changes. On the contrary, we detect a strong deuterium effect; this suggests that the observed Delta V-ri are related to an altered hydrogen bond pattern of the excited state of the pigment with respect to the ground state. Comparative measurements with the parent compound hypericin are also reported, suggesting that the photoinduced expansion-contraction pattern is a general characteristic of polyhydroxylated quinones. C1 Univ Parma, Dipartimento Fis, I-43100 Parma, Italy. RP Losi, A, Max Planck Inst Strahlenchem, Stiftstr 34-36, D-45470 Mulheim, Germany. 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Photobiol. PD APR PY 1999 VL 69 IS 4 BP 435 EP 442 PG 8 SC Biochemistry & Molecular Biology; Biophysics GA 186XC UT ISI:000079755300007 ER PT J AU Borsarelli, CD Braslavsky, SE TI Enthalpy, volume, and entropy changes associated with the electron transfer reaction between the (MLCT)-M-3 state of Ru(Bpy)(3)(2+) and methyl viologen cation in aqueous solutions SO JOURNAL OF PHYSICAL CHEMISTRY A LA English DT Article ID CAGE ESCAPE YIELDS; TRANSFER EXCITED-STATES; OPTOACOUSTIC SPECTROSCOPY; PHOTOACOUSTIC CALORIMETRY; WIDE-BAND; CHARGE; COMPLEXES; ION; METAL; (2+) AB The electron-transfer reaction between the metal-to-ligand charge-transfer triplet ((MLCT)-M-3) state of Ru(bpy)(3)(2+) and the methyl viologen cation MV2+ was studied by laser-induced optoacoustic spectroscopy in the 8-35 degrees C temperature range in aqueous solutions in the absence and in the presence of various 0.1 M sodium salts. The enthalpy and the structural volume changes for the formation of the (MLCT)-M-3 state, Delta H-MLCT = (196 +/- 3) kJ/mol and Delta V-MLCT = (-3.6 +/- 0.2) cm(3)/mol, were independent of the presence of quencher or salt. The values of Delta H-R and Delta V-R for the production of the radical ion pair upon quenching of the 3MLCT state by MV2+ strongly depended on the added salt. In neat water the expansion Delta V-R (+10.1 +/- 1.2) cm(3)/mol is due to a decrease in solute-solvent interaction after electron transfer. This value can be calculated with the classical Drude-Nernst equation for electrostriction only if a semiempirical constant is employed instead of the theoretical one. The linear dependence between the relatively large changes in Delta H-R and Delta V-R along the series of added salts is explained in terms of enthalpy-entropy compensation effects due to the perturbation by the salts of the H-bond network in water. With the reported salt-independent reaction free energy a correlation between the reaction entropy and Delta V-R was found, i.e., Delta S-R = X/T Delta V-R, with X = (14.4 +/- 0.8) kJ/cm(3), similar to the (c(p)rho/beta)(T) value at 303 K (near the isokinetic temperature, ca. 300 K) in aqueous solutions (c(p) = heat capacity; rho mass density; beta = volume expansion coefficient). The large values of the entropy term are due to the reorganization of the water network around the photoproduced radical ion pair, before recombination. C1 Max Planck Inst Strahlenchem, D-45413 Mulheim, Germany. Univ Nacl Rio Cuarto, Dept Quim & Fis, RA-5800 Rio Cuarto, Argentina. RP Braslavsky, SE, Max Planck Inst Strahlenchem, Postfach 10 13 65, D-45413 Mulheim, Germany. 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Phys. Chem. A PD MAR 25 PY 1999 VL 103 IS 12 BP 1719 EP 1727 PG 9 SC Chemistry, Physical GA 182JV UT ISI:000079496600005 ER PT J AU Schofield, AJ TI Non-Fermi liquids SO CONTEMPORARY PHYSICS LA English DT Review ID DIMENSIONAL ORGANIC CONDUCTORS; MULTICHANNEL KONDO PROBLEM; NORMAL-STATE; LUTTINGER-LIQUID; BEHAVIOR; TEMPERATURE; SUPERCONDUCTORS; PHOTOEMISSION; DISORDER; SYSTEMS AB Our present understanding of how the interactions between electrons affect the metallic state has, for forty years, rested on the foundations of Landau's Fermi-liquid theory. It provides the basis for understanding metals in terms of weakly interacting electron (-like) particles. Recent years have seen the discovery of metals which appear to fall outside this framework-perhaps most notably in the normal state of the high temperature cuprate superconductors. While the theory for understanding the cuprate metals remains controversial, there are a number of clear examples where we do believe we understand the new underlying theoretical concepts. In this article I illustrate four such routes towards forming a non-Fermi liquid metal and illustrate, where possible, how these have been realized in a number of materials. The proximity to a quantum phase transition and reduced effective dimensionality cart both pay important roles. C1 Univ Cambridge, Cavendish Lab, Dept Phys, Condensed Matter Theory Grp, Cambridge CB3 0HE, England. RP Schofield, AJ, Univ Cambridge, Cavendish Lab, Dept Phys, Condensed Matter Theory Grp, Madingley Rd, Cambridge CB3 0HE, England. 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Phys. PD MAR-APR PY 1999 VL 40 IS 2 BP 95 EP 115 PG 21 SC Physics, Multidisciplinary GA 177GM UT ISI:000079202300001 ER PT J AU Nishikawa, M Itoh, K Holroyd, RA TI Electron attachment to CO2 in supercritical ethane SO JOURNAL OF PHYSICAL CHEMISTRY A LA English DT Article ID NONPOLAR-SOLVENTS; CARBON-DIOXIDE; FLUIDS; SOLVATION; PRESSURE; LIQUIDS; METHANE AB Thermal electrons attach reversibly to CO2 in supercritical ethane. The equilibrium constants range from 40 to 2 x 10(4) m(-1) for pressures from 50 to 220 bar at 33 and 37 degrees C. The attachment rate increases and the detachment rate decreases as the pressure increases. The lifetime of CO2- is between 20 and 100 ns in the high-pressure range. The reaction volume changes more than an order of magnitude, from -20.0 to -0.5 L/mol over the pressure and temperature ranges studied. The activation volume is approximately 50% of the reaction volume. Electrostriction volumes of the CO2- ion, calculated by a compressible continuum model, account for the main part of the observed reaction volumes. The calculation shows that the high-density region around each CO2- extends to 1 nm. C1 Brookhaven Natl Lab, Dept Chem, Upton, NY 11973 USA. Univ Tokyo, Dept Pure & Appl Sci, Tokyo 153, Japan. Kanazawa Inst Technol, Fac Engn, Astugi 24302, Japan. RP Holroyd, RA, Brookhaven Natl Lab, Dept Chem, Upton, NY 11973 USA. 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Phys. Chem. A PD JAN 28 PY 1999 VL 103 IS 4 BP 550 EP 556 PG 7 SC Chemistry, Physical GA 174PA UT ISI:000079042500013 ER PT J AU Goates, SR Schofield, DA Bain, CD TI A study of nonionic surfactants at the air-water interface by sum-frequency spectroscopy and ellipsometry SO LANGMUIR LA English DT Article ID NEUTRON REFLECTION; LIQUID INTERFACE; VIBRATIONAL SPECTROSCOPY; OPTICAL-PROPERTIES; HYDROCARBON CHAIN; STRETCHING MODES; GLYCOL; MONOLAYERS; GENERATION; FORMULAS AB Sum-frequency spectroscopy and ellipsometry have been used to study monolayers of the nonionic surfactants poly(ethylene glycol) monododecyl ethers (C12Em; m = 2-8) at the air-water interface. SF spectra were acquired for areas of 30-70 Angstrom(2) per molecule, as determined from literature adsorption isotherms. These spectra show an increase in conformational disorder with increasing area per molecule and, surprisingly, an apparent decrease in the angle of tilt of the methyl group. There was no systematic variation in the SF spectra as a function of the length of the poly(ethylene glycol) chain at fixed areas of 45 and 62 Angstrom(2) per molecule. For m greater than or equal to 4, the ellipsometric data suggested that the density of the hydrocarbon region of the chain was independent of m at fixed coverage but that the density decreased for m. = 2 and 3. This study suggests that the value of m does not, per se, affect the structure of a monolayer of C12Em at the air-mater interface for m = 4-8. C1 Univ Oxford, Phys & Theoret Chem Lab, Oxford OX1 3QZ, England. Brigham Young Univ, Dept Chem & Biochem, Provo, UT 84602 USA. RP Bain, CD, Univ Oxford, Phys & Theoret Chem Lab, S Parks Rd, Oxford OX1 3QZ, England. EM Colin.Bain@chem.ox.ac.uk CR ASPNES DE, 1982, THIN SOLID FILMS, V89, P249 ATKINS PW, 1986, PHYSICAL CHEM AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ BAIN CD, 1991, LANGMUIR, V7, P1563 BAIN CD, 1995, J CHEM SOC FARADAY T, V91, P1281 BEAGLEHOLE D, 1980, PHYSICA B, V100, P163 BEAGLEHOLE D, 1986, FLUID INTERFACIAL PH, CH11 BELL GR, 1998, J PHYS CHEM B, V102, P218 BOYD RM, 1992, NONLINEAR OPTICS BUTCHER PN, 1990, ELEMENTS NONLINEAR O CASSON BD, 1996, FARADAY DISCUSS, V104, P209 CASSON BD, 1997, LANGMUIR, V13, P5465 DRUDE P, 1891, ANN PHYS, V43, P126 GELBART WM, 1994, MICELLES MEMBRANES M HIROSE C, 1992, APPL SPECTROSC, V46, P1051 HIROSE C, 1992, J CHEM PHYS, V96, P997 HUNT JH, 1987, CHEM PHYS LETT, V133, P189 ISRAELACHVILI JN, 1985, INTERMOLECULAR SURFA, CH16 JASPERSON SN, 1969, REV SCI INSTRUM, V40, P761 LOBAU J, 1997, J OPT SOC AM B, V14, P2505 LU JR, 1993, J PHYS CHEM-US, V97, P8012 LU JR, 1993, LANGMUIR, V9, P1352 LU JR, 1993, LANGMUIR, V9, P2408 LU JR, 1993, LANGMUIR, V9, P2417 LU JR, 1994, J PHYS CHEM-US, V98, P6559 LU JR, 1995, J PHYS CHEM-US, V99, P8233 LU JR, 1997, J PHYS CHEM B, V101, P10332 MACPHAIL RA, 1984, J PHYS CHEM-US, V88, P334 MANNINGBENSON S, 1998, LANGMUIR, V14, P990 MARIONB JB, 1980, CLASSICAL ELECTROMAG, P288 MEUNIER J, 1987, J PHYS-PARIS, V48, P1819 MEUNIER J, 1992, LIGHT SCATTERING LIQ, CH17 MOILLIET JL, 1961, SURFACE ACTIVITY MYERS D, 1992, SURFACTANT SCI TECHN PENFOLD J, 1997, J CHEM SOC FARADAY T, V93, P3899 PORTER MR, 1994, HDB SURFACTANTS, CH7 ROSEN MJ, 1989, SURFACTANTS INTERFAC SCHICK MJ, 1967, NONIONIC SURFACTANTS SCHICK MJ, 1987, NONIONIC SURFACTANTS, CH1 SCHONFELDT N, 1969, SURFACE ACTIVE ETHYL SHEN YR, 1984, PRINCIPLES NONLINEAR SHEN YR, 1989, NATURE, V337, P519 SMALL DE, 1985, PHYSICAL CHEM LIPIDS SNYDER RG, 1978, SPECTROCHIM ACTA A, V34, P395 TIBERG F, 1994, LANGMUIR, V10, P2294 WARD AFH, 1946, J CHEM PHYS, V14, P453 WARD RN, 1994, J PHYS CHEM-US, V98, P8536 NR 47 TC 54 PU AMER CHEMICAL SOC PI WASHINGTON PA 1155 16TH ST, NW, WASHINGTON, DC 20036 USA SN 0743-7463 J9 LANGMUIR JI Langmuir PD FEB 16 PY 1999 VL 15 IS 4 BP 1400 EP 1409 PG 10 SC Chemistry, Physical GA 168GB UT ISI:000078682400073 ER PT J AU Pfohl, T Riegler, H TI Critical wetting of a liquid/vapor interface by octane SO PHYSICAL REVIEW LETTERS LA English DT Article ID HYDROCARBON ADSORPTION; NONVOLATILE LIQUIDS; LIFSHITZ THEORY; N-ALKANES; WATER; SURFACE; COEFFICIENTS; TRANSITION; VAPORS; FILMS AB The wetting of the planar interface between air saturated with octane vapor and an aqueous solution by octane is investigated by ellipsometry and interfacial tension measurements. The interfacial interactions are varied through the concentration of the uncharged solute (glucose). We observe abrupt and continuous increases of the octane coverage with growing solute concentration. This we attribute to short- and long-range (dispersion) interactions, respectively. The continuous thickness growth is analyzed as a critical wetting transition. C1 Max Planck Inst Kolloid & Grenzflachenforsch, D-12489 Berlin, Germany. RP Pfohl, T, Max Planck Inst Kolloid & Grenzflachenforsch, Rudower Shaussee 5, D-12489 Berlin, Germany. CR BAUMER D, 1982, J COLLOID INTERF SCI, V85, P118 BEAGLEHOLE D, 1980, PHYSICA B, V100, P163 BEAGLEHOLE D, 1983, J PHYS-PARIS, V44, P147 BROCHARDWYART F, 1990, CAN J PHYS, V68, P1084 BROCHARDWYART F, 1991, LANGMUIR, V7, P335 DEGENNES PG, 1985, REV MOD PHYS, V57, P827 DELCERRO C, 1980, J COLLOID INTERF SCI, V78, P362 DIETRICH S, 1988, PHASE TRANSITIONS CR, V12, P1 DRUDE P, 1891, ANN PHYS, V43, P126 DUSSAUD A, 1997, LANGMUIR, V13, P581 GOODRICH FC, 1969, SURFACE COLLOID SCI, V1 HAUXWELL F, 1970, J COLLOID INTERF SCI, V34, P473 HAUXWELL F, 1992, LANGMUIR, V8, P602 HIRASAKI GJ, 1993, CONTACT ANGLE WETTAB, P183 HOUGH DB, 1980, ADV COLLOID INTERFAC, V14, P3 INDEKEU JO, IN PRESS J STAT PHYS ISRAELACHVILI J, 1991, INTERMOLECULAR SURFA LEKNER J, 1987, THEORY REFLECTION LOU AJ, 1997, LANGMUIR, V13, P4933 PAUDLER M, 1992, LANGMUIR, V8, P184 PETHICA BA, 1996, LANGMUIR, V12, P5851 PFOHL T, 1998, LANGMUIR, V14, P5285 PFOHL T, 1998, THESIS U POTSDAM GER RAGIL K, 1996, J CHEM PHYS, V105, P5160 RAGIL K, 1996, PHYS REV LETT, V77, P1532 RICHMOND P, 1973, J COLLOID INTERF SCI, V45, P69 SCHICK M, 1990, LIQUIDS INTERFACES, P415 SEMMLER A, 1996, LANGMUIR, V12, P4165 SHAHIDZADEH N, 1998, PHYS REV LETT, V80, P3992 TAKII T, 1993, J COLLOID INTERF SCI, V161, P31 TIDSWELL IM, 1991, PHYS REV B, V44, P10869 VALIGNAT MP, 1993, LANGMUIR, V9, P3255 YOON DY, 1995, MONTE CARLO MOL DYNA, P433 NR 33 TC 17 PU AMERICAN PHYSICAL SOC PI COLLEGE PK PA ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA SN 0031-9007 J9 PHYS REV LETT JI Phys. Rev. Lett. PD JAN 25 PY 1999 VL 82 IS 4 BP 783 EP 786 PG 4 SC Physics, Multidisciplinary GA 160DN UT ISI:000078215300028 ER PT J AU Jungk, G Grabolla, T TI Spectroscopic ellipsometry on silicon-oxide films on silicon SO THIN SOLID FILMS LA English DT Article DE ellipsometry; silicon; silicon-oxide ID THERMAL-OXIDATION; SEMICONDUCTOR STRUCTURES; OPTICAL-PROPERTIES; SIO2; PARAMETERS; MECHANISM; DEFECTS; GROWTH; PLASMA; O-2 AB We present ellipsometric investigations performed within the spectral range 2 less than or equal to <(h)over bar omega> less than or equal to 4 eV on samples with film thicknesses h below 30 nm. The calculated thicknesses are dependent on the supposed model and on the wavelength. The discussion shows the sensitivity of h against the variation of the input data and throws some light on difficulties with this essential parameter for nanoscale devices. (C) 1998 Elsevier Science S.A. All rights reserved. C1 Paul Drude Inst Festkorperelekt, D-10117 Berlin, Germany. Inst Semicond Phys, D-15230 Frankfurt, Germany. RP Jungk, G, Paul Drude Inst Festkorperelekt, Hausvogteipl 5-7, D-10117 Berlin, Germany. CR ANWAND W, 1997, J PHYS-CONDENS MAT, V9, P2947 ASPNES DE, 1976, OPTICAL PROPERTIES S ASPNES DE, 1980, J ELECTROCHEM SOC, V127, P1359 ASPNES DE, 1982, PHYS REV B, V25, P1358 ASPNES DE, 1982, THIN SOLID FILMS, V89, P249 ASPNES DE, 1983, PHYS REV B, V27, P985 AZZAM RMA, 1975, ELLIPSOMETRY POLARIZ BOCCARA AC, 1993, SPECTROSCOPIC ELLIPS BORN M, 1991, PRINCIPLES OPTICS BRUGGEMAN DAG, 1935, ANN PHYS-BERLIN, V24, P636 BURGE DK, 1964, J OPT SOC AM, V54, P1428 CALLOT P, 1985, PHILOS MAG B, V52, P1051 DANIEL ES, 1997, J VAC SCI TECHNOL B, V15, P1089 DIMARIA DJ, 1997, APPL PHYS LETT, V70, P2708 DRUDE P, 1889, ANN PHYS CHEM, V36, P532 DRUDE P, 1889, ANN PHYS CHEM, V36, P865 DRUDE P, 1890, ANN PHYS CHEM, V39, P481 FANG SJ, 1997, J ELECTROCHEM SOC, V144, P2886 GANEM JJ, 1997, J APPL PHYS, V81, P8109 HELMS CR, 1993, PHYSICS CHEM SIO2 SI ISHIKAWA M, 1997, J APPL PHYS, V82, P2655 JELLISON GE, 1993, APPL PHYS LETT, V62, P3348 JUNGK G, 1970, PHYS STATUS SOLIDI A, V3, P965 JUNGK G, 1987, PHYS STATUS SOLIDI B, V139, P627 JUNGK G, 1993, THIN SOLID FILMS, V234, P428 JUNGK G, 1994, PHILOS MAG B, V70, P493 KAGESHIMA H, 1997, SURF SCI, V380, P61 KHEMKA V, 1997, J ELECTROCHEM SOC, V144, P1137 LIN HC, 1997, J VAC SCI TECHNOL 1, V15, P790 LIU Q, 1995, J VAC SCI TECHNOL A, V13, P1977 MARTINET C, 1997, J APPL PHYS, V81, P6996 MAYNARD HL, 1997, J VAC SCI TECHNOL B, V15, P109 MCCRACKIN FL, 1963, J RES NBS A, V67, P363 MOREAU P, 1997, PHYS REV B, V56, P6774 OURMAZD A, 1987, PHYS REV LETT, V59, P213 PANTELIDES ST, 1979, PHYSICS SIO2 ITS INT PANTELIDES ST, 1988, MAT RES SOC S P, V105 PHILIPP HR, 1985, HDB OPTICAL CONSTANT PICKERING C, 1995, PHOTONIC PROBES SURF, P1 REINBERG AR, 1972, APPL OPTICS, V11, P1273 ROSS FM, 1991, PHILOS MAG A, V63, P1 SCHROTTKE L, 1994, REV SCI INSTRUM, V65, P3657 SOFIELD CJ, 1995, SEMICOND SCI TECH, V10, P215 THEETEN JB, 1981, ANNU REV MATER SCI, V11, P97 VANHELLEMONT J, 1993, APPL SURF SCI, V63, P45 WAGNER JF, 1979, J APPL PHYS, V50, P874 WELDON MK, 1997, PHYS REV LETT, V79, P2851 WEN HJ, 1997, J VAC SCI TECHNOL 1, V15, P784 WEN HJ, 1997, J VAC SCI TECHNOL B, V15, P1080 WU CX, 1997, PHYS REV B, V55, P10922 YOKOZAWA A, 1997, PHYS REV B, V55, P13783 NR 51 TC 2 PU ELSEVIER SCIENCE SA PI LAUSANNE PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND SN 0040-6090 J9 THIN SOLID FILMS JI Thin Solid Films PD DEC 14 PY 1998 VL 335 IS 1-2 BP 253 EP 257 PG 5 SC Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter GA 154AW UT ISI:000077866700045 ER PT J AU Meng, Z Yang, Q Yip, PC Eyink, KG Taferner, WT Igelnik, B TI Combined use of computational intelligence and materials data for on-line monitoring and control of MBE experiments SO ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE LA English DT Article DE guided evolutionary simulated annealing (GESA); stochastic search; optimization; ellipsometry; molecular beam epitaxy (MBE); process monitoring and control ID REAL-TIME; ALXGA1-XAS; GROWTH; NET AB This paper describes the combined use of computational intelligence procedures and materials data for monitoring and controlling the growth of thin films using molecular beam epitaxy (MBE). Given ellipsometry data (Psi and Delta) at a specific wavelength, a genetic algorithm-like method is used to solve an inverse problem, and estimate values of the complex refractive index and the deposition rate. Using a set of such values at different wavelengths, and combining the use of multiwavelength spectroscopic materials data and computational intelligence procedures, it is then possible to provide an optimal estimate of the composition of the material being deposited. Control of the film growth is then accomplished through adjustments of cell temperatures. This procedure is described in this paper, and examples of monitoring and control results are reported for the system of AlxGa1-xAs film on GaAs substrate. (C) 1998 Published by Elsevier Science Ltd. All rights reserved. C1 Comp Associates Int Inc, AI Ware Div, Beachwood, OH 44122 USA. USAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA. Case Western Reserve Univ, Cleveland, OH 44106 USA. RP Meng, Z, Comp Associates Int Inc, AI Ware Div, 3659 Green Rd, Beachwood, OH 44122 USA. CR ASPNES DE, 1990, APPL PHYS LETT, V57, P2707 ASPNES DE, 1992, APPL PHYS LETT, V60, P1244 AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ DRUDE P, 1889, ANN PHYS CHEM, V36, P865 FOGEL LJ, 1966, ARTIFICIAL INTELLIGE GOLDBERG DE, 1989, GENETIC ALGORITHMS S KIRKPATRICK S, 1983, SCIENCE, V220, P671 MCCRACKIN FL, 1969, 479 NBS PAO YH, 1994, NEUROCOMPUTING, V6, P163 PARK GH, 1996, IEEE T NEURAL NETWOR, V7, P816 PASSAGLIA E, 1964, NBS MISCELLANEOUS PU, V256 TOMPKINS HG, 1993, USERS GUIDE ELLIPSOM URBAN FK, 1992, THIN SOLID FILMS, V220, P247 YIP PC, 1993, THESIS CASE W RESERV YIP PPC, 1994, IEEE T SYST MAN CYB, V24, P1383 NR 15 TC 0 PU PERGAMON-ELSEVIER SCIENCE LTD PI OXFORD PA THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, ENGLAND SN 0952-1976 J9 ENG APPL ARTIF INTELL JI Eng. Appl. Artif. Intell. PD OCT PY 1998 VL 11 IS 5 BP 587 EP 595 PG 9 SC Computer Science, Artificial Intelligence; Engineering, Electrical & Electronic; Engineering, Multidisciplinary; Automation & Control Systems GA 149VF UT ISI:000077626300003 ER PT J AU Urban, FK Barton, D Boudani, NI TI Extremely fast ellipsometry solutions using cascaded neural networks alone SO THIN SOLID FILMS LA English DT Article DE ellipsometry; thin film; in situ sensor; artificial neural network; real-time growth control AB In ellipsometry, the thickness and optical properties of thin films may be determined by light reflection, both in situ and ex situ. However, these useful film parameters are not measured directly but must be computed from the measured parameters (angles psi and Delta) using an appropriate system of equations derived from reflecting surface morphology. The most popular solving method, variably damped least squares (VDLS), is slow and troubled by local minima in the solution surface. Artificial neural networks (ANN) avoid these problems but have not been trained to be better than about 5% accurate. The work presented here demonstrates a cascade of three ANN levels exhibiting a typical overall accuracy better than 0.4% with speed orders of magnitude faster than that of VDLS methods. This ANN cascade for a material system contains 1800 three-layer perceptrons with ten hidden neurons, each requiring 70 weights plus 20 range variables and other statistics which comes to 16.2 MB for 100 wavelengths. Assuming the ranges of film material optical properties can be fitted into 30 such 'subranges' yields 486 MB uncompressed. This data can easily fit onto a CD-ROM in the form of a semantic database for efficient storage and selective retrieval. (C) 1998 Published by Elsevier Science S.A. All rights reserved. C1 Florida Int Univ, Miami, FL 33199 USA. RP Urban, FK, Florida Int Univ, Miami, FL 33199 USA. CR *MATHW INC, 1995, MATL HIGH PERF NUM C *MICR CORP, FORTR POW 4 0 MICR D AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ DRUDE P, 1889, ANN PHYS CHEM, V36, P865 RUMELHART DE, 1987, PARALLEL DISTRIBUTED, V2, P318 URBAN FK, 1992, THIN SOLID FILMS, V220, P247 NR 6 TC 2 PU ELSEVIER SCIENCE SA PI LAUSANNE PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND SN 0040-6090 J9 THIN SOLID FILMS JI Thin Solid Films PD NOV 2 PY 1998 VL 332 IS 1-2 BP 50 EP 55 PG 6 SC Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter GA 142LT UT ISI:000077202500011 ER PT J AU Mielenz, KD TI Algorithms for Fresnel diffraction at rectangular and circular apertures SO JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY LA English DT Article DE algorithms; circular apertures; diffraction; Fresnel approximation; personal computers; radiometry; rectangular apertures; slits AB This paper summarizes the theory of Fresnel diffraction by plane rectangular and circular apertures with a view; toward numerical computations. Approximations found in the earlier literature, ind,now obsolete, have been eliminated and replaced by algorithms suitable for use on a personal computer. C1 NIST, Radiometr Phys Div, Gaithersburg, MD 20899 USA. CR ABRAMOWITZ M, 1972, HDB MATH FUNCTIONS BLEVIN WR, 1970, METROLOGIA, V6, P39 BOISVERT RF, 1994, ARCHITECTURE INTELLI, V36, P269 BOIVIN LP, 1975, APPL OPTICS, V14, P2002 BORN M, 1970, PRINCIPLES OPTICS DRUDE P, 1933, THEORY OPTICS FOCKE J, 1956, OPT ACTA, V3, P161 FRESNEL A, 1819, MEMOIR DIFFRACTION L GUENTHER RD, 1990, MODERN OPTICS LOMMEL E, 1885, ABH BAYER AKAD, V15, P233 LOZIER DW, 1994, NUMERICAL EVALUATION, P79 MIELENZ KD, 1997, J RES NATL INST STAN, V103, P363 SCHWARZSCHILD K, 1898, SITZ BER BAYER AKAD, V28, P271 SHIRLEY EL, 1997, 7 S INFR RAD SENS CA SOMMERFELD A, 1950, OPTIK DIETERICHSCHE STEEL WH, 1972, J OPT SOC AM, V62, P1099 NR 16 TC 10 PU US GOVERNMENT PRINTING OFFICE PI WASHINGTON PA SUPT OF DOCUMENTS, WASHINGTON, DC 20402-9325 USA SN 1044-677X J9 J RES NATL INST STAND TECHNOL JI J. Res. Natl. Inst. Stand. Technol. PD SEP-OCT PY 1998 VL 103 IS 5 BP 497 EP 509 PG 13 SC Engineering, Multidisciplinary; Multidisciplinary Sciences GA 143JZ UT ISI:000077253200003 ER PT J AU Asnacios, A Langevin, D Argillier, JF TI Mixed monolayers of cationic surfactants and anionic polymers at the air-water interface: Surface tension and ellipsometry studies SO EUROPEAN PHYSICAL JOURNAL B LA English DT Article ID POLYELECTROLYTE; MICELLES AB Equilibrium surface tension measurements have been carried out on mixed solutions of a non-surface active polyelectrolyte (polyacrylamide sulfonate) and cationic surfactants. A strong synergistic lowering of the surface tension is found in the concentration range where no appreciable complexation of surfactant and polymer occurs in the bulk solution (as seen from viscosity measurements). The surface tension decrease does not depend upon the polymer molecular weight, and there is a limited influence of the surfactant chain length. The influence of the degree of charge of the polymer is more important: for small degree of charge, the complexation is less cooperative, and the structure of the surface complex is looser. C1 Univ Marne La Vallee, IFI, Lab Phys Mat Divises, F-77454 Marne La Vallee 2, France. Univ Paris 11, Phys Solides Lab, F-91405 Orsay, France. Inst Francais Petr, F-92852 Rueil Malmaison, France. RP Asnacios, A, Univ Marne La Vallee, IFI, Lab Phys Mat Divises, 2 Cite Descartes,Champs Sur Marne, F-77454 Marne La Vallee 2, France. EM langevin@lps.psud.fr CR ARGILLIER JF, 1991, J COLLOID INTERF SCI, V146, P242 ASNACIOS A, 1996, MACROMOLECULES, V29, P7412 BABAK VG, 1996, COLLOID J RUSS ACAD+, V2, P145 BARRAT JL, 1996, ADV CHEM PHYS, V94, P1 BERGERON V, 1996, LANGMUIR, V12, P1550 BIANNALIMBELE W, 1987, MACROMOLECULES, V20, P1331 BUCKINGHAM JH, 1978, J COLLOID INTERF SCI, V67, P423 CABANE B, 1982, J PHYS-PARIS, V43, P1529 CHANDAR P, 1988, MACROMOLECULES, V21, P950 DENENGELSEN D, 1974, J CHEM SOC F1, V70, P1603 DROLET JP, 1994, J OPT SOC AM A, V11, P3284 DRUDE P, 1889, ANN PHYS CHEM, V36, P865 DUBIN PL, 1988, MACROMOLECULES, V21, P2555 ESPERT A, UNPUB GODDARD ED, 1986, COLLOID SURFACE, V19, P301 GODDARD ED, 1993, INTERACTION SURFACTA IBRAGIMOVA ZK, 1986, POLYM SCI USSR, V28, P1826 IBRAGIMOVA ZK, 1986, VYSOKOMOL SOEDIN A+, V28, P1640 ILIOPOULOS I, 1994, J PHYS CHEM-US, V98, P1500 JAYALAKSHMI Y, UNPUB LI XB, 1995, J PHYS CHEM-US, V99, P10865 MANN EK, 1992, THESIS PARIS MEUNIER J, 1987, J PHYS, V48, P1818 NAHRINGBAUER I, 1997, LANGMUIR, V13, P2242 PICULELL L, 1992, ADV COLLOID INTERFAC, V41, P149 SHUBIN V, 1994, LANGMUIR, V10, P1093 NR 26 TC 25 PU SPRINGER VERLAG PI NEW YORK PA 175 FIFTH AVE, NEW YORK, NY 10010 USA SN 1434-6028 J9 EUR PHYS J B JI Eur. Phys. J. B PD OCT PY 1998 VL 5 IS 4 BP 905 EP 911 PG 7 SC Physics, Condensed Matter GA 141HJ UT ISI:000077137100008 ER PT J AU Liebscher, DE Brosche, P TI Aberration and relativity SO ASTRONOMISCHE NACHRICHTEN LA English DT Article DE relativity; aberration; astrometry ID STELLAR ABERRATION AB The aberration of starlight seems to be one of the simplest phenomena of astronomical observation. However, the story of misunderstandings is long and lasts till now. It is nearly forgotten that the problem of stellar aberration was the cornerstone of the development and the acceptance of relativity. In addition, there seems to be no essentially final point in the discussion of its interpretation, the discussion seems to merely be given up. Of course, with the correct relativistic formulas, there is no need of interpretation any more. The price of this consists in the many incorrect descriptions and interpretations that arise if a textbook tries to explain in words the mere formulas. We try to review the problems discussed in the last three centuries and to give them a final, i.e. geometrical form. We are convinced that this teaches a lot about the geometry of the space-time union. C1 Inst Astrophys, D-14482 Potsdam, Germany. Univ Bonn, Observ Hoher List, Daun, Germany. RP Liebscher, DE, Inst Astrophys, Sternwarte 16, D-14482 Potsdam, Germany. 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Nachr. PY 1998 VL 319 IS 5 BP 309 EP 318 PG 10 SC Astronomy & Astrophysics GA 139AN UT ISI:000077005400003 ER PT J AU Keiter, H Rosenberg, M TI On the probability distributions of relaxation times in glasses SO EUROPEAN PHYSICAL JOURNAL B LA English DT Article AB The scale of relaxation times in glasses has led to generalizations of the Drude model of the dielectric function in terms of an integral, containing a Drude kernel and a probability distribution. This integral equation is solved by a Mellin or a Stieltjes transform. Beyond known results, we obtain the probability distribution of the Havriliak-Negami dielectric function. Even more general classes of dielectric models can be dealt with, using Mellin's transform. They may serve as checks for numerical procedures applied to the underlying ill-posed problem, if experimental data fdr the dielectric function are used. C1 Univ Dortmund, Inst Phys, D-44221 Dortmund, Germany. RP Keiter, H, Univ Dortmund, Inst Phys, D-44221 Dortmund, Germany. CR ARSENIN AV, 1977, SOLUTION ILL POSED P COLE KS, 1941, J CHEM PHYS, V9, P341 DAVIDSON DW, 1951, J CHEM PHYS, V19, P1484 DRUDE P, 1900, ANN PHYSIK, V3, P369 ERDELY A, 1953, HIGHER TRANSCENDENTA, V1 ERDELY A, 1954, TABLES INTEGRAL TRAN, V1 HAVRILIAK S, 1966, J POLYM SCI C, V14, P69 LINK N, 1991, J APPL PHYS, V69, P2795 MATHAY AM, 1978, H FUNCTION WITHE APP ROSENBERG M, 1995, THESIS U DORTMUND TITCHMARCH EC, 1967, INTRO THEORY FOURIER URBANEK MP, COMMUNICATION NR 12 TC 5 PU SPRINGER PI NEW YORK PA 233 SPRING STREET, NEW YORK, NY 10013 USA SN 1434-6028 J9 EUR PHYS J B JI Eur. Phys. J. B PD OCT PY 1998 VL 5 IS 3 BP 599 EP 603 PG 5 SC Physics, Condensed Matter GA 138HJ UT ISI:000076966100039 ER PT J AU Giuliani, G TI What are physicists talking about? The case of electrons and holes SO NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA D-CONDENSED MATTER ATOMIC MOLECULAR AND CHEMICAL PHYSICS FLUIDS PLASMAS BIOPHYSICS LA English DT Article AB The problems posed by the basic realistic foundation of science are briefly reviewed and a tempered realistic position is advocated. This approach is applied to the ease of electrons and holes in solids, as a working and illustrative example. A little moral follows. C1 Dipartimento Fis A Volta, I-27100 Pavia, Italy. RP Giuliani, G, Dipartimento Fis A Volta, I-27100 Pavia, Italy. CR ANTONIAZZI A, 1997, GIORN FIS, V38, P87 CAMPBELL LL, 1923, GALVANOMAGNETIC THER, P69 CAMPBELL NR, 1919, THEOR ELECT MODERNE, P89 CASELLA A, 1996, ANCORA REALISMO ASPE, P13 CORBINO OM, 1938, C DISC OM CORB, P21 DRUDE P, 1900, ANN PHYS-BERLIN, V1, P566 DRUDE P, 1900, ANN PHYSIK, V3, P369 GALDABINI S, 1991, ANN SCI, V48, P21 PEIERLS RE, 1929, Z PHYS, V53, P255 NR 9 TC 0 PU EDITRICE COMPOSITORI BOLOGNA PI BOLOGNA PA VIA STALINGRADO 97/2, I-40128 BOLOGNA, ITALY SN 0392-6737 J9 NUOVO CIMENTO D-COND MATT AT JI Nuovo Cimento Soc. Ital. Fis. D-Condens. Matter At. Mol. Chem. Phys. Fluids Plasmas Biophys. PD JUL-AUG PY 1998 VL 20 IS 7-8 BP 1183 EP 1186 PG 4 SC Physics, Multidisciplinary GA 132GL UT ISI:000076621900044 ER PT J AU Casson, BD Colin, D TI Phase transitions in mixed monolayers of sodium dodecyl sulfate and dodecanol at the air/water interface SO JOURNAL OF PHYSICAL CHEMISTRY B LA English DT Article ID AIR-WATER-INTERFACE; FREQUENCY VIBRATIONAL SPECTROSCOPY; SUM-FREQUENCY; SURFACE-TENSION; 1-ALCOHOL MONOLAYERS; HYDROPHOBIC SURFACE; 2D CRYSTALLIZATION; NEUTRON REFLECTION; DIMENSIONS; GENERATION AB A two-dimensional phase transition has been studied in a mixed monolayer of sodium dodecyl sulfate (SDS) and dodecanol at the air/water interface by sum-frequency spectroscopy and ellipsometry. At low temperatures, a monolayer at the surface of a 6 mM solution containing 99.9% SDS and 0.1% dodecanol (w/w) is conformationally ordered and has a surface coverage comparable td that of a monolayer of pure dodecanol at the same temperature. At 16 degrees C there is a first-order transition to a phase that is less dense and more conformationally disordered. The high-temperature monolayer phase is more disordered than the corresponding liquid phase in pure dodecanol. The solid phase contains equimolar amounts of SDS and dodecanol while the liquid phase contains SDS and dodecanol in a ratio of approximately 3:2. The change in composition of the mixed monolayer can be understood qualitatively by a reduction in the interaction parameter in the monolayer at the phase transition. C1 Univ Oxford, Phys & Theoret Chem Lab, Oxford OX1 3QZ, England. RP Colin, D, Univ Oxford, Phys & Theoret Chem Lab, S Parks Rd, Oxford OX1 3QZ, England. 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Phys. Chem. B PD SEP 17 PY 1998 VL 102 IS 38 BP 7434 EP 7441 PG 8 SC Chemistry, Physical GA 125RV UT ISI:000076251600022 ER PT J AU Cohen, ML TI Predicting new materials and their properties SO SOLID STATE COMMUNICATIONS LA English DT Article DE fullerenes; nanostructures; semiconductors; electronic band structure; mechanical properties ID NONLOCAL-PSEUDOPOTENTIAL APPROACH; STRUCTURAL-PROPERTIES; CARBON NANOTUBES; SUPERCONDUCTIVITY; DIAMOND; SOLIDS; NANOCRYSTALS; FORMALISM; TUBULES; PHASES AB For a large fraction of solids, it is now possible to construct a useful first-principles model which is sufficiently robust to explain and predict physical properties and to predict the existence of new materials. This "standard model" is described and its use in the development of empirical theories and in determining properties of novel materials are discussed along with some historical perspectives about this area of physics. Examples are given of applications to semiconductors, high pressure properties of solids, superconductivity, nanotubes and nanodevices, fullerenes and superhard materials. Speculations about future developments are also given. (C) 1998 Elsevier Science Ltd. All rights reserved. C1 Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA. Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA. RP Cohen, ML, Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA. 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PY 1998 VL 107 IS 11 BP 589 EP 596 PG 8 SC Physics, Condensed Matter GA 113KV UT ISI:000075550900002 ER PT J AU Kobayashi, J Asahi, T Sakurai, M Kagomiya, I Asai, H Asami, H TI The optical activity of lysozyme crystals SO ACTA CRYSTALLOGRAPHICA SECTION A LA English DT Article ID PHASE-TRANSITION; HAUP; RESOLUTION; ACIDS AB The components of the gyration tensor of the enzyme lysozyme were measured by using the HAUP method: g(11) = - 0.90 x 10(-5) and g(33) = 1.05 x 10(-5) at 303.4 K and a wavelength of 4880 Angstrom. The optical rotatory powers along the a and c axes in the same conditions were calculated: rho(a) = -21.3 and rho(c) = -24.8 degrees cm(-1). The optically active property of lysozyme is strange in that, although it contains a considerable quantity of alpha-helices (about 30%), the rotatory powers are unexpectedly small in magnitude, one order of magnitude less than those of quartz and with very large anisotropy. A conceptual consideration of this phenomenon is given. In order to assess the difference between the structures in both crystalline and solution states, the chirality index r was calculated to be 0.16. This value indicates that the structural change of lysozyme from the solution into the crystalline state is expressed by an increase of 19% in optical activity. From the NMR results [Smith et al. (1993), J. Mol. Biol. 229, 930-944], it is anticipated that the r value reflects the increased constraint in atomic motion in the side chains of exposed amino acid residues in the crystalline state. C1 Waseda Univ, Kagami Mem Lab Mat Sci & Technol, Shinjuku Ku, Tokyo 169, Japan. Waseda Univ, Dept Phys, Shinjuku Ku, Tokyo 169, Japan. RP Kobayashi, J, Waseda Univ, Kagami Mem Lab Mat Sci & Technol, Shinjuku Ku, 2-8-26 Nishiwaseda, Tokyo 169, Japan. 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Sect. A PD SEP 1 PY 1998 VL 54 PN Part 5 BP 581 EP 590 PG 10 SC Crystallography GA 120HM UT ISI:000075951000005 ER PT J AU Egorov, I Rikte, S TI Forerunners in bigyrotropic materials SO JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION LA English DT Article ID PULSE-PROPAGATION; WAVE-PROPAGATION; LORENTZ MEDIUM; CHIRAL MEDIA; OMEGA-MEDIUM; SLAB AB Forerunners (precursors) in linear, temporally dispersive, bigyrotropic materials are investigated with time-domain techniques. Bigyrotropic materials are characterized by 12 constitutive parameters (integral kernels). Specifically, the four susceptibility dyadics are all gyrotropic with a common gyrotropic axis. Pulse propagation along this axis is analyzed with dispersive (noncoupling) wave splitting and complex, time-dependent field vectors. Two numerical examples illustrating the method are presented. (C) 1998 Optical Society of America. C1 Lund Inst Technol, Dept Electromagnet Theory, S-22100 Lund, Sweden. RP Egorov, I, Lund Inst Technol, Dept Electromagnet Theory, POB 118, S-22100 Lund, Sweden. 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Opt. Soc. Am. A-Opt. Image Sci. Vis. PD SEP PY 1998 VL 15 IS 9 BP 2391 EP 2403 PG 13 SC Optics GA 116BC UT ISI:000075700600016 ER PT J AU Gussoni, M Rui, M Zerbi, G TI Electronic and relaxation contribution to linear molecular polarizability. An analysis of the experimental values SO JOURNAL OF MOLECULAR STRUCTURE LA English DT Review DE response functions; electronic polarizability; relaxation polarizability; vibrational intensities; charge distribution ID PHASE INTENSITY MEASUREMENTS; ABSOLUTE INFRARED INTENSITIES; NORMAL COORDINATE ANALYSIS; DIPOLE-MOMENT DERIVATIVES; ATOMIC POLAR TENSORS; HARMONIC FORCE-FIELD; EFFECTIVE CHARGES; ELECTROOPTICAL PARAMETERS; LONGITUDINAL POLARIZABILITIES; DEUTERATED MODIFICATIONS AB This paper reports and comments on the experimental values of <(alpha)over bar>(e) and <(alpha)over bar>(r) of more than 650 molecules, where <(alpha)over bar>(e) and <(alpha)over bar>(r) are the mean values of the electronic polarizability tensor alpha(e) and of the relaxation polarizability tenser alpha(r), respectively. It is assumed that alpha(e) and alpha(r) sum up to alpha, the static polarizability of the molecule that can be directly measured through the dielectric constant. Thus, only values of alpha(e) independent of the frequency are reported. The principal targets of this paper are: (1) to collect from literature the largest amount of experimental data of <(alpha)over bar>(e) and <(alpha)over bar>(r) and try to group the data for classification and characterization of the electrical behaviour of molecules; (2) to find out which classes of molecules have unusual <(alpha)over bar>(e) and/or <(alpha)over bar>(r); (3) to interpret the data in terms of charge distribution; and (4) to provide a basis for comparing with experiment the values <(alpha)over bar>(e) and <(alpha)over bar>(r) calculated by quantum chemical methods. The main conclusions are: <(alpha)over bar>(e) increases with the number Z of electrons in the molecule so that the polarizability per electron (<(alpha)over bar>(e)/Z) is reasonably constant except for conjugated molecules (where it is slightly larger) and for halogenated molecules (where it is much smaller); <(alpha)over bar>(r) ranges from very low to rather large values, apparently without any correlation nor with the corresponding <(alpha)over bar>(e) or the number Z of electrons or the number nu of oscillators in the molecule; the largest values of <(alpha)over bar>(r) are reached for molecules having spherical shape and the largest ratio <(alpha)over bar>(r)/<(alpha)over bar>(e) is attained by molecules containing several halogen atoms. These data seem to suggest an additive scheme for the mean value of the electronic polarizability. On the contrary, <(alpha)over bar>(r) does not obey any additive scheme; large <(alpha)over bar>(r) and large <(alpha)over bar>(r)/<(alpha)over bar>(e) Seem to be connected to large charge fluxes associated to vibrations and therefore to large electron-phonon coupling. All the above considerations hold for the mean values of the polarizability tensors. A different behaviour of the single components of alpha(e) and alpha(r) is also discussed. (C) 1998 Elsevier Science B.V. All rights reserved. C1 Univ Milan, Dipartimento Chim Fis & Elettrochim, CNR, CSRSRC, I-20133 Milan, Italy. Dipartimento Chim & Chim Ind, I-16146 Genoa, Italy. Politecn Milan, Dipartimento Chim Ind & Ingn Chim, I-20133 Milan, Italy. RP Gussoni, M, Univ Milan, Dipartimento Chim Fis & Elettrochim, CNR, CSRSRC, Via Golgi 19, I-20133 Milan, Italy. 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CHEM SOC, V112, P2184 WILSON EB, 1955, MOL VIBRATIONS YAKSHIN MM, 1961, J INORG CHEM, V6, P1229 ZEBI G, 1993, ORGANC MAT PHOTONICS ZHAO MT, 1988, J CHEM PHYS, V89, P5535 NR 171 TC 13 PU ELSEVIER SCIENCE BV PI AMSTERDAM PA PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS SN 0022-2860 J9 J MOL STRUCT JI J. Mol. Struct. PD JUN 22 PY 1998 VL 447 IS 3 BP 163 EP 215 PG 53 SC Chemistry, Physical GA 113WD UT ISI:000075576100001 ER PT J AU Esser, HG Karduck, P Rubel, M Almqvist, N Grobusch, L von Seggern, J Weschenfelder, F Wienhold, P TI Comparison of different methods to characterize thin a-Si : H films SO MIKROCHIMICA ACTA LA English DT Article DE a-Si : H thin films; EPMA; ellipsometry; interference fringe analysis; RBS; wall conditioning ID THICKNESS; TEXTOR AB The objective of this work is to determine the materials properties of thin layers typically deposited for wall conditioning in fusion devices. As reference material, a sequence of thin amorphous hydrogenated silicon layers with different thicknesses were produced on polished glassy carbon by Plasma Chemical Vapour Deposition PCVD, The films were characterised using AES, AFM, EPMA, ellipsometry, interference fringe analysis and RES. A second aim was to study the accuracy and reliability of EPMA and RES measurements. The techniques applied provided values for refractive index, absorption coefficient, roughness, thickness and elemental areal density. From the latter two, the density of the film could be determined. It turned out that the density derived by combining the results from different techniques was in good agreement. For the range of thickness investigated, the combination of ellipsometry and EPMA gave the most consistent values for the density with a maximum uncertainty of +/-5%. C1 KFA Julich GmbH, Forschungszentrum, Inst Plasma Phys, EURATOM Assoc, D-52425 Julich, Germany. Aachen Univ Technol, D-52056 Aachen, Germany. Royal Inst Technol, Assoc EURATOM NFR, Phys Dept Frescati, S-10405 Stockholm, Sweden. Lulea Univ Technol, Dept Phys, S-97187 Lulea, Sweden. RP Esser, HG, KFA Julich GmbH, Forschungszentrum, Inst Plasma Phys, EURATOM Assoc, Postfach 1913, D-52425 Julich, Germany. 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Acta PY 1998 SU Suppl. 15 BP 163 EP 170 PG 8 SC Chemistry, Analytical GA 109KR UT ISI:000075322100023 ER PT J AU Schulz-Baldes, H Bellissard, J TI A kinetic theory for quantum transport in aperiodic media SO JOURNAL OF STATISTICAL PHYSICS LA English DT Article DE Kubo formula in aperiodic media; anomalous transport ID NONCOMMUTATIVE GEOMETRY; FRACTAL SPECTRUM; QUASI-CRYSTALS; 2 DIMENSIONS; DIFFUSION; LOCALIZATION; CONDUCTIVITY; SYSTEMS; DISORDER; DYNAMICS AB Transport theory is reinvestigated in a one-particle model including dissipation mechanisms through a phenomenological time-dependent part. Using the description of an aperiodic crystal in terms of noncommutative geometry, it is then possible to rigorously derive Kubo formulas for the electric conductivity. Within the framework of the relaxation time approximation, a fractal analysis applied to the spectral measures entering in the Kubo formula allows us to examine anomalous transport owing to quantum interferences. This leads to anomalies in Drude's formula. C1 Univ Toulouse 3, Phys Quant Lab, CNRS, F-31062 Toulouse, France. Univ Toulouse 3, CNRS, UMR 5626, F-31062 Toulouse, France. RP Schulz-Baldes, H, Univ Toulouse 3, Phys Quant Lab, CNRS, F-31062 Toulouse, France. 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Stat. Phys. PD JUN PY 1998 VL 91 IS 5-6 BP 991 EP 1026 PG 36 SC Physics, Mathematical GA 101ED UT ISI:000074855900008 ER PT J AU Viappiani, C Abbruzzetti, S Small, JR Libertini, LJ Small, EW TI An experimental methodology for measuring volume changes in proton transfer reactions in aqueous solutions SO BIOPHYSICAL CHEMISTRY LA English DT Article DE photoacoustics; volume changes; proton transfer; laser pH jump ID RESOLVED PHOTOACOUSTIC CALORIMETRY; ELECTRON-TRANSFER; PHOTOCHEMISTRY; ACTIVATION; ENTHALPY; OXYGEN AB A fast perturbation in proton concentration can be induced in aqueous solution using a pulsed ultraviolet laser and suitable photolabile compounds which, upon photoexcitation, irreversibly release protons. The volume change and the rate constant for the reaction of the photodetached protons with proton-accepting groups in solution can be monitored using time resolved photoacoustics, A typical proton concentration jump of 1 mu M can be obtained with a 200-mu J laser pulse at 308 nm. Reaction dynamics from 20 ns to 5 mu s can be easily followed. The methodology we establish represents a direct, time-resolved measurement of the reaction volume in proton transfer processes and an extension to the nanosecond-microsecond range of traditional relaxation techniques, such as stopped-flow. We report example applications to reactions involving simple molecules and polypeptides. (C) 1998 Elsevier Science B.V. All rights reserved. C1 Univ Parma, Dipartimento Fis, I-43100 Parma, Italy. Ist Nazl Fis Mat, Parma, Italy. Eastern Washington Univ, Dept Chem & Biochem, Cheney, WA 99004 USA. Quantum NW Inc, Spokane, WA USA. RP Viappiani, C, Univ Parma, Dipartimento Fis, Vile Sci, I-43100 Parma, Italy. 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Chem. PD JUL 13 PY 1998 VL 73 IS 1-2 BP 13 EP 22 PG 10 SC Chemistry, Physical; Biochemistry & Molecular Biology; Biophysics GA 100UG UT ISI:000074833300003 ER PT J AU Djurisic, AB TI Elite genetic algorithms with adaptive mutations for solving continuous optimization problems - application to modeling of the optical constants of solids SO OPTICS COMMUNICATIONS LA English DT Article DE genetic algorithms; model parameter estimation; optical constants ID INTERBAND ABSORPTION; GLOBAL OPTIMIZATION; FILMS AB The elite genetic algorithm with adaptive mutations is proposed as a tool for solving continuous optimization problems. The new algorithm and the corresponding classical genetic algorithm were severely tested on three families of multiminima test functions for 20, 50 and 100 variables. All performed tests proved that the introduced adaptive mutations significantly improve the ability of the algorithm to find a global minimum. After verifying the superiority of the proposed algorithm over the classical one on the test functions, an elite genetic algorithm with adaptive mutations was applied for solving the model parameter determination problem for modeling optical constants of the following metals: beryllium, chromium, nickel and palladium. Good agreement between calculated and experimental data was obtained for all four metals. (C) 1998 Elsevier Science B.V. All rights reserved. C1 Univ Hong Kong, Dept EEE, Hong Kong, Peoples R China. RP Djurisic, AB, Univ Hong Kong, Dept EEE, Pokfulam Rd, Hong Kong, Peoples R China. 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Commun. PD MAY 15 PY 1998 VL 151 IS 1-3 BP 147 EP 159 PG 13 SC Optics GA ZY489 UT ISI:000074626900024 ER PT J AU Hui-Litwin, H Servant, L Dignam, MJ Moskovits, M TI Effective electric surface susceptibility tensor as a probe of the thermal behavior of Langmuir-Blodgett films SO JOURNAL OF PHYSICAL CHEMISTRY B LA English DT Article ID ORIENTED MOLECULAR LAYERS; INFRARED-SPECTROSCOPY; OPTICAL-PROPERTIES; TRANSITIONS AB The thermal behavior of Langmuir-Blodgett (LB) monolayers of DL-dipalmitoyl phosphatidylethanolamine (DPPE) deposited onto a ZnSe substrate was studied by polarized infrared attenuated total reflection (ATR), over the temperature range 25-140 degrees C. The results are discussed in terms of the imaginary part of the effective electric susceptibility tensor [gamma] of the monolayer, a function that approximately corrects for the effect of the local field. We show that the spectra of the imaginary parts of the principal components of [gamma], Im(gamma(t)) and Im(gamma(n)) (the subscripts t and n representing the directions tangent to and normal to the film, respectively), can be straightforwardly obtained from polarized reflection spectra. The results obtained using Im(gamma(t)) and Im(gamma(n)) are compared with those obtained from the extinction coefficients k(t) and k(n), which were calculated from adapted Kramers-Kronig relations. We show that Im(gamma(t)) and Im(gamma(n)) provide a better account of the molecular processes occurring in the DPPE LB films as a function of temperature. No abrupt phase transition was observed. This is attributed to positional disorder in the headgroups of the monolayer as it was initially transferred onto the ATR prism. C1 Univ Toronto, Dept Chem, Toronto, ON M5S 1A1, Canada. RP Servant, L, Univ Bordeaux 1, CNRS, UMR 5803, Lab Physicochim Mol, 351 Cours Liberat, F-33405 Talence, France. 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Phys. Chem. B PD JUN 25 PY 1998 VL 102 IS 26 BP 5055 EP 5062 PG 8 SC Chemistry, Physical GA ZY137 UT ISI:000074590000007 ER PT J AU Calderwood, JH TI The behavior of the Debye rotator SO IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION LA English DT Article AB When an electric field is created in a liquid containing polar molecules, the resulting buildup of polarization is hindered by the chaotic thermal motion of the molecules of the environment of the dipoles. The dipoles are represented as being embedded in hard spheres, sometimes called Debye rotators, and these spheres are subjected to a frictional torque somewhat analagous to that which would be exerted on a rotating sphere in a viscous liquid, but which is in fact caused by collisions between the rotator and other molecules, and on that account is named 'inner friction'. In addition, the environmental thermal energy greatly reduces the response of the rotators to the applied field, so that only a very slight degree of order is imposed on the random dipole orientation. This effect is often taken into account by the inclusion of a Brownian motion term in the dynamic equation describing the motion of the rotators. The system can be seen as one consisting of orderly processes, namely the field driven and friction retarded motion of the rotators, against a background of the disorderly thermal behavior of the molecules. The relative importance of these factors may vary from system to system, and in principle it is of interest to know what would be the outcome of the operation of the orderly processes alone. That has been examined in what follows, and while it turns out that what is predicted, though as expected is not in accordance with predictions when a Brownian motion term is included, nevertheless has more resemblance to them than might have been anticipated. However, an interesting difference is that the present analysis leads to the expectation of a distribution of relaxation times. C1 Bolton Inst, Bolton, England. RP Calderwood, JH, Bolton Inst, Bolton, England. CR BOTTCHER CJF, 1978, THEORY ELECT POLARIZ CALDERWOOD JH, 1991, J MOL LIQ, V49, P119 CALDERWOOD JH, 1992, C DIEL MAT MEAS APPL, V363, P249 DEBYE P, 1929, POLAR MOL DRUDE P, 1897, Z PHYS CHEM, V23, P267 EVANS MW, 1982, MOL DYNAMICS SCAIFE BKP, 1989, PRINCIPLES DIELECTRI NR 7 TC 2 PU IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC PI NEW YORK PA 345 E 47TH ST, NEW YORK, NY 10017-2394 USA SN 1070-9878 J9 IEEE TRANS DIELECT ELECTR IN JI IEEE Trns. Dielectr. Electr. Insul. PD JUN PY 1998 VL 5 IS 3 BP 316 EP 320 PG 5 SC Engineering, Electrical & Electronic GA ZY024 UT ISI:000074579000003 ER PT J AU Redhead, PA TI The birth of electronics: Thermionic emission and vacuum SO JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS LA English DT Article AB The early developments in the field of thermionic electron emission are reviewed with emphasis on the importance of improved vacuum technology in understanding the physical mechanism and in the production of reliable vacuum tubes. The period covered is from the discovery of the Edison effect in 1883 until 1920, when improved vacuum technology had resolved the controversy about the source of electrons in thermionic emission and the fledgling electronics industry had started the large scale production of vacuum tubes for radio receivers. (C) 1998 American Vacuum Society. C1 Natl Res Council Canada, Ottawa, ON K1A 0R6, Canada. RP Redhead, PA, Natl Res Council Canada, Ottawa, ON K1A 0R6, Canada. 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Vac. Sci. Technol. A-Vac. Surf. Films PD MAY-JUN PY 1998 VL 16 IS 3 PN Part 1 BP 1394 EP 1401 PG 8 SC Materials Science, Coatings & Films; Physics, Applied GA ZT991 UT ISI:000074150400094 ER PT J AU Nishikawa, M Holroyd, R Itoh, K TI Electron attachment to NO in supercritical ethane SO JOURNAL OF PHYSICAL CHEMISTRY B LA English DT Article ID PARTIAL MOLAR VOLUMES; NONPOLAR-SOLVENTS; PRESSURE; FLUIDS; CO2; 2,2-DIMETHYLBUTANE; EQUILIBRIUM; TEMPERATURE; MOBILITY; METHANE AB Electron attachment to NO was studied in supercritical ethane at 33, 37, and 47 degrees C as a function of pressure (35-110 bar). The rate constant for electron attachment increases with increasing pressure at all temperatures studied. The most dramatic increases are observed near the critical pressure. The activation volume for this reaction is negative and quite large in magnitude, especially in this region. The activation volume depends on the isothermal compressibility. The results are compared to volume changes predicted by a compressible continuum model. C1 Brookhaven Natl Lab, Dept Chem, Upton, NY 11973 USA. Kanagawa Inst Technol, Fac Engn, Atsugi, Kanagawa 24302, Japan. Univ Tokyo, Dept Pure & Appl Sci, Tokyo 153, Japan. RP Holroyd, R, Brookhaven Natl Lab, Dept Chem, Upton, NY 11973 USA. 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Phys. Chem. B PD MAY 21 PY 1998 VL 102 IS 21 BP 4189 EP 4192 PG 4 SC Chemistry, Physical GA ZR647 UT ISI:000073999700024 ER PT J AU Vedam, K TI Spectroscopic ellipsometry: a historical overview SO THIN SOLID FILMS LA English DT Article DE spectroscopic ellipsometry; dielectric functions; characterization of surfaces, interfaces; real-time monitoring and control; thin films; multilayer structures; non-destructive ID REAL-TIME SPECTROELLIPSOMETRY; GE+-IMPLANTED SI; OPTICAL-PROPERTIES; INSITU CHARACTERIZATION; SCANNING ELLIPSOMETER; DIELECTRIC FUNCTION; SURFACE-ROUGHNESS; SOLAR-CELLS; THIN-FILMS; SILICON AB The historical development of spectroscopic ellipsometry (SE) from the very early stages to the present will be briefly reviewed. It is shown that SE is a truly powerful technique of great interest and use to physicists, chemists, electrochemists, electrical and chemical engineers, etc., as will be evident from the following few of the many reasons. (a) Firstly, the full spectra of the ellipsometric parameters Delta and Psi as a function of wavelength from UV to IR can now be determined with a high degree of precision and accuracy in a few seconds. (b) Such data can also be processed to provide (i) the most accurate values to date of the dielectric functions (i.e. the real and the imaginary parts of the optical dielectric constant as a function of wavelength) of semiconductors, metals and even wide band gap materials available only as thin films; (ii) depth-profiles of interfaces, thin films and multilayer structures with almost atomic resolution; (iii) the composition for any layers (bulk, interface, or surface) that are composites or alloys; (iv) the microroughness of the surface layer; and (v) the true near-surface temperature of the samples in their preparation chamber in the case of semiconductors. Furthermore, it will be shown that the above results obtained by SE are reliable and trustworthy, by the excellent corroboration with the results of XTEM, RES and AFM studies on the same multilayer structures. In real-time spectroscopic ellipsometry (RTSE), which has just been developed and perfected, most of the above capabilities of SE can be achieved again through analysis of data collected in a matter of a few seconds, and hence RTSE is now ready for use in real-time monitoring and control during the growth of multilayer structures, thin films, etc. Thus the full potentialities and capabilities of this non-destructive, non-perturbing and non-invasive technique are yet to be realized. (C) 1998 Elsevier Science S.A. C1 Penn State Univ, Mat Res Lab, University Pk, PA 16802 USA. Penn State Univ, Dept Phys, University Pk, PA 16802 USA. RP Vedam, K, Penn State Univ, Mat Res Lab, University Pk, PA 16802 USA. CR ABELES F, 1971, PHYS THIN FILMS, V6, P151 AN I, 1994, REV SCI INSTRUM, V65, P3489 ARWIN H, 1998, THIN SOLID FILMS, V313, P764 ASPNES DE, 1975, APPL OPTICS, V14, P220 ASPNES DE, 1978, REV SCI INSTRUM, V49, P291 ASPNES DE, 1979, PHYS REV B, V20, P3292 ASPNES DE, 1980, J VAC SCI TECHNOL, V17, P1057 ASPNES DE, 1981, APPL PHYS LETT, V39, P316 ASPNES DE, 1981, P SOC PHOTO-OPT INS, V276, P188 ASPNES DE, 1983, J PHYS C SOLID STATE, V10, P3 ASPNES DE, 1983, PHYS REV B, V27, P985 ASPNES DE, 1986, J APPL PHYS, V60, P754 ASPNES DE, 1992, APPL PHYS LETT, V60, P1244 ASPNES DE, 1993, J OPT SOC AM A, V10, P974 AZZAM RMA, 1977, ELLIPSOMETRY POLARIZ BARTH J, 1991, HDB OPTICAL CONSTANT, V2, P213 BELL KA, 1997, IN PRESS J VAC SCI T BRUGGEMAN DAG, 1935, ANN PHYS-BERLIN, V24, P636 CHINDAUDOM P, 1994, PHYS THIN FILMS, V19, P191 COLLINS RW, 1990, REV SCI INSTRUM, V61, P2029 DRUDE P, 1887, ANN PHYS, V32, P584 DRUDE P, 1888, ANN PHYS, V34, P489 DRUDE P, 1889, ANN PHYS CHEM, V36, P532 DRUDE P, 1889, ANN PHYS CHEM, V36, P865 DRUDE P, 1890, ANN PHYS CHEM, V39, P481 FATHY D, 1987, APPL PHYS LETT, V51, P1337 HAUGE PS, 1980, SURF SCI, V96, P108 HOLLAND OW, 1987, APPL PHYS LETT, V51, P520 HUMLICEK J, 1989, J APPL PHYS, V65, P2827 JELLISON GE, 1991, APPL OPTICS, V30, P3354 JELLISON GE, 1993, THIN SOLID FILMS, V234, P416 KIM S, 1995, APPL PHYS LETT, V67, P3010 KIM S, 1996, J APPL PHYS, V80, P2420 KIM YT, 1990, SURF SCI, V233, P341 KIM YT, 1991, J ELECTROCHEM SOC, V138, P3266 KOH J, 1995, APPL PHYS LETT, V67, P2669 KOH J, 1996, APPL PHYS LETT, V69, P1297 KONG FP, 1998, THIN SOLID FILMS, V313, P775 LAUTENSCHLAGER P, 1987, PHYS REV B, V36, P4821 LEE J, 1997, APPL PHYS LETT, V70, P1527 LOHNER T, 1992, MAT SCI ENG B-SOLID, V12, P177 MCMARR PJ, 1986, J APPL PHYS, V59, P694 MULLER RH, 1976, SURF SCI, V56, P19 MULLER RH, 1984, REV SCI INSTRUM, V55, P371 NGUYEN HV, 1992, PHYS REV LETT, V68, P994 NGUYEN HV, 1993, PHYS REV B, V47, P3947 NGUYEN NV, 1990, J APPL PHYS, V67, P599 PAIK WK, 1971, SURF SCI, V28, P61 PALIK ED, 1985, HDB OPTICAL CONSTANT, V1 PALIK ED, 1991, HDB OPTICAL CONSTANT, V2 ROESELER A, 1990, INFRARED ELLIPSOMETR ROTHEN A, 1945, REV SCI INSTRUM, V16, P26 SRIVATSA AR, 1989, J APPL PHYS, V65, P4028 TRONSTAD L, 1933, T FARADAY SOC, V29, P502 VEDAM K, 1985, APPL PHYS LETT, V47, P339 VINA L, 1986, PHYS REV B, V34, P2586 WAKAGI M, 1995, J VAC SCI TECHNOL A, V13, P1917 WITHAM HS, 1993, J VAC SCI TECHNOL 2, V11, P1881 NR 58 TC 27 PU ELSEVIER SCIENCE SA PI LAUSANNE PA PO BOX 564, 1001 LAUSANNE, SWITZERLAND SN 0040-6090 J9 THIN SOLID FILMS JI Thin Solid Films PD FEB PY 1998 VL 313 BP 1 EP 9 PG 9 SC Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter GA ZP520 UT ISI:000073761700002 ER PT J AU Rivory, J TI Characterization of inhomogeneous dielectric films by spectroscopic ellipsometry SO THIN SOLID FILMS LA English DT Article DE inhomogeneous films; index gradients; ellipsometry; dielectric films ID REFRACTIVE-INDEX; THIN-FILMS; GRADIENTS; PROFILES; LAYER; ION AB The increasing interest in graded index dielectric films for complex optical coatings has stimulated a great effort in terms of characterization by optical techniques either during deposition or a posteriori. This paper is concerned essentially with post-characterization by spectroscopic ellipsometry. Instrumental developments and computer facilities now make possible the acquisition of ellipsometric and photometric data at different angles of incidence, over wide spectral range, in different configurations as well as treatment of data by numerical methods. Refractive index profiles are determined for the most part by fitting of experimental data following two approaches: a discrete description in which the inhomogeneous film is divided into a small number of homogeneous sublayers and a continuous description using a model-function for the index (or composition) variation. Upon consideration of two examples, namely, gradients of composition in silicon oxynitride films and refractive index profile in a Ta2O5 film implanted with Ti ions (with film thickness of around 400 nm in both cases), the discrete description appears useful when the shape of the profile is not known, and in all cases it supplies initial values in the fitting procedure for parameters of the model-function. (C) 1998 Elsevier Science S.A. C1 Univ Paris 06, Lab Opt Solides, URA CNRS 781, F-75252 Paris 05, France. RP Rivory, J, Univ Paris 06, Lab Opt Solides, URA CNRS 781, 4 Pl Jussieu,Case 80, F-75252 Paris 05, France. 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One interesting feature of the method is the possibility of detailed and accurate determination of real-time adsorption kinetics of proteins without labelling of the protein. It is else possible to detect protein adsorption with the use of antibodies that adsorb onto the antigen-coated surfaces and to detect antibodies by their adsorption behaviour with regard to antigen-coated surfaces. Compared to other solid phase methods such as enzyme linked